CN107607753A - A kind of measurement jig novel probe - Google Patents
A kind of measurement jig novel probe Download PDFInfo
- Publication number
- CN107607753A CN107607753A CN201710855106.3A CN201710855106A CN107607753A CN 107607753 A CN107607753 A CN 107607753A CN 201710855106 A CN201710855106 A CN 201710855106A CN 107607753 A CN107607753 A CN 107607753A
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- probe
- test
- testing needle
- fpc
- spring
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Abstract
The present invention discloses a kind of measurement jig novel probe, including tests end, middle part, connects bottom and through test end, middle part, the testing needle for connecting bottom, metal spring is connected with positioned at the end of the testing needle of connection bottom；Before probe use, need to drill to FPC pad locations, probe is placed in hole after drilling and fixed, the testing needle of test end protrudes slightly above in the surface in hole and touches FPC test point, it is connected with FPC, play a part of engaged test conducting, the testing needle of connection bottom is connected with metal spring, the elastic toughness of spring will be better than conventional probe itself spring performance, buffer protection function is played to testing needle, impression will not be caused to product, durable abrasion is small, productivity ratio improves, with good elasticity, metal spring is connected to above insert row, insert row is connected by dedicated data line with computer, so as to reach the effect of test.
Description
Technical field
The present invention relates to probe preparing technical field, and in particular to a kind of measurement jig novel probe.
Background technology
FPC refers generally to flexible PCB, and flexible PCB is using polyimides or polyester film to be a kind of made of base material
With height reliability, excellent flexible printed circuit, have high Distribution density, in light weight, thickness of thin, bending property good
Feature, it is mainly used in the hard-core technologies such as Aero-Space, communication.
Electrical measurement is to examine the unique method of product electrical characteristic, and ensures the maximally effective means of product final quality, existing
Having and detect main organic survey and hand survey two ways in technology to FPC plates, machine, which is surveyed, to be drilled according to corresponding FPC pad locations,
Dress probe makes fixed test fixture, and a kind of test mode with open-short circuit tester connecting test, its test speed is fast, surveys
It is high to try quality, while insulation impedance can be judged, automatic test counts, and test impression is slight, and FPC plates are detected at present
Probe one is syringe needle, and syringe needle rear is connected with spring, and (spring is located in probe bodies for syringe needle and spring formation probe bodies
Portion), probe bodies are cased with needle guard outside, probe connecting line are connected with needle guard, this probe is in test process due to unbalance stress
It is even not enough to cause this probe easily to occur bending and deformation and fracture damage plus itself compression strength and toughness, replacement frequency
Height, production efficiency is influenceed, and the measurement accuracy of this probe is not high, in-convenience in use, dismounting and change is all not convenient enough and flexible；
So as to cause production cost high, production efficiency is reduced.
The content of the invention
According to an aspect of the invention, there is provided a kind of measurement jig novel probe, including test end, middle part, company
Connect bottom and through test end, middle part, the testing needle for connecting bottom, gold is connected with positioned at the end of the testing needle of connection bottom
Belong to spring.
Probe of the present invention probe is placed in hole before use, need to drill to FPC pad locations, after drilling it is fixed,
The testing needle of test end protrudes slightly above in the surface in hole and touches FPC test point, is connected with FPC, plays contact and surveys
The effect of conducting is tried, the testing needle for connecting bottom is connected with metal spring, and the elastic toughness of spring will be better than conventional probe itself
Spring performance, buffer protection function is played to testing needle, while the metal spring setting of one end will not cause impression to product, gold
Category spring is connected to above insert row, and insert row is connected by dedicated data line with computer, so as to reach the effect of test.
The elastic anchor of average probe is the middle part of testing needle, is wrapped among probe, and its elastic force is fixed elastic force, can not
Elastic force is adjusted, minimum elastic force can be accomplished 15 grams (bearing 15 grams of FPC hollow plates), and the elastic force of probe of the present invention is survey
The bottom of test point, can carry out the adjustment of elastic force according to testing requirement, and adjustable 5~60 grams of elastic force (bears 5~60 grams of FPC
Hollow plate), so as to can all there is lifting to improve very much weighing wounded for FPC hollow plate.
In some embodiments, the diameter at middle part is more than test end and connects the diameter of bottom, it is possible thereby to more preferably
Probe is fixed in drilling, the larger part of mid diameter is firmly fixed so that the up and down scope of testing needle
Further it is restricted；Enhance the stability and crushing resistance of probe.
In some embodiments, end, middle part and connection bottom is tested to be made by high-carbon steel material, and average probe
Material be copper so that testing needle is relatively more resistant to abrasive wear, is hardly damaged, and improves operating efficiency.
In some embodiments, a diameter of 0.2~0.6mm of testing needle, testing needle minimum can accomplish 0.2mm, can
Effectively solve the testing requirement of tiny circuit, it is ensured that the use range of probe, while measurement accuracy is also high so that improve production
Efficiency.
In some embodiments, it is to be detachably connected with metal spring positioned at the end for the testing needle for connecting bottom；From
And facilitate the dismounting and replacing of novel probe.
It should be noted that the length and test end of probe of the present invention, middle part and connection bottom each position
Length can need to be set according to actual test.
It should be noted that test of the novel probe of the present invention except can be used for FPC, is also applied for PCB and electricity
The related test of road plate.
Tested by the upper and lower mould pressure of tool, the average probe testing time life-span is 500,000 times, and the present invention visits
The pin testing time life-span can reach more than 1,000,000 times, and average probe diameter most I accomplishes 0.4MM, and probe of the present invention is minimum
0.2MM can be accomplished, touch that the position of FPC test points is small, positive and negative 0.05MM tolerance is had in pressure, thus can be more
FPC test point is accurately touched so as to reach the precision of test, improves measuring stability.
Brief description of the drawings
Fig. 1 is the probe structure schematic diagram of an embodiment of the present invention；
Fig. 2 is the schematic diagram when drilling of FPC pads is fixed on using the probe of one embodiment of the invention mode.
Embodiment
The invention will now be described in further detail with reference to the accompanying drawings.
Fig. 1 schematically shows the probe structure schematic diagram according to one embodiment of the present invention.As illustrated, bag
Include test end 1, middle part 2, connect bottom 3 and through test end 1, middle part 2, the testing needle 4 for connecting bottom 3, positioned at even
The end for connecing the testing needle 43 of bottom 3 is connected with metal spring 5.
Probe of the present invention probe is placed in hole before use, need to drill to FPC pad locations, after drilling it is fixed,
It is fixed in the middle part of testing needle in insulating materials so that testing needle is not acted on by cross force only by longitudinal force, enhances probe
Stability and compressive property；The testing needle 41 of test end protrudes slightly above in the surface in hole and touches FPC test point, with
FPC is connected, and plays a part of engaged test conducting, and the testing needle 43 for connecting bottom is connected with metal spring 5, spring it is elastic tough
Property will be better than conventional probe itself spring performance, buffer protection function be played to testing needle, while the metal spring 5 of one end is set
Impression will not be caused to product by putting, and metal spring is connected to above insert row, and insert row is connected by dedicated data line with computer, from
And reach the effect of test.
The elastic anchor of average probe is the middle part of testing needle, is wrapped among probe, and its elastic force is fixed elastic force, can not
Elastic force is adjusted, minimum elastic force can be accomplished 15 grams (bearing 15 grams of FPC hollow plates), and the elastic force of probe of the present invention is survey
The bottom of test point, can carry out the adjustment of elastic force according to testing requirement, and adjustable 5~60 grams of elastic force (bears 5~60 grams of FPC
Hollow plate), so as to can all there is lifting to improve very much weighing wounded for FPC hollow plate.
In the present embodiment, the diameter at middle part 2 is more than test end 1 and connects the diameter of bottom 3, it is possible thereby to preferably will
Probe is fixed in drilling, and the part that middle part 2 is relatively large in diameter is firmly fixed so that the up and down scope of testing needle 4 is entered
One step is restricted；Enhance the stability and crushing resistance of probe.
In the present embodiment, test end 1, middle part 2 and connection bottom 3 are made by high-carbon steel material, and average probe
Material is copper so that testing needle is relatively more resistant to abrasive wear, is hardly damaged, and improves operating efficiency.
In the present embodiment, a diameter of 0.2~0.6mm of testing needle 4, testing needle minimum can accomplish 0.2mm, can effectively solve
The testing requirement of certainly tiny circuit, it is ensured that the use range of probe, while measurement accuracy is also high so that improve production efficiency.
In the present embodiment, end and metal spring 5 positioned at the testing needle 43 of connection bottom 3 are to be detachably connected；So as to
Facilitate the dismounting and replacing of novel probe.
Specifically, one end of metal spring 5 is connecting line, and the other end is the shape of similar cup, the end card of testing needle 43
In the cup-shape of metal spring 5, it is detachably connected so as to realize with metal spring 5, the end of probe 43 is stuck in metal elastic
In the cup-shape of spring 5, both contacts area are also increased so that its conduction is more preferable.
It should be noted that the length and test end 1 of probe of the present invention, middle part 2 and connection 3 each position of bottom
Length can according to actual test need be set.
In the present embodiment, the total length of probe is 10~15mm, and test end 1 is the 25% of probe overall length, and middle part 2 is total
Long 25%, connection bottom 3 is the 50% of overall length, and metal spring length is 8~10mm.
It should be noted that test of the novel probe of the present invention except can be used for FPC, is also applied for PCB and electricity
The related test of road plate.
Novel probe service life described in the embodiment 1 of embodiment 2 is tested
FPC metal covering is pushed using probe test end when testing the probe life-span, it is up and down and record number,
Identical experiment is carried out using average probe simultaneously, every 100,000 times are checked, when proceeding to 100,000 times, check probe test
Novel probe and average probe are all without abnormal, the bullet of inspection discovery average probe when proceeding to 500,000 times during end contact face
Spring does not have elastic force, can not upspring, and novel probe continues test to novel probe when arrival 1,000,000 again without any exception
Find that probe tip has slight wear trace when secondary, this test terminates.
Therefore deducing that the service life for the probe that embodiment is prepared can reach more than 1,000,000 times, and common
The service life of probe is 500,000 times.
Above-described is only some embodiments of the present invention.For the person of ordinary skill of the art, not
On the premise of departing from the invention design, various modifications and improvements can be made, these belong to the protection model of the present invention
Enclose.
Claims (5)
1. a kind of measurement jig novel probe, it is characterised in that including test end (1), middle part (2), connection bottom (3) and pass through
Test end (1), middle part (2), the testing needle (4) for connecting bottom (3) are through at, positioned at the testing needle (43) for connecting bottom (3)
End is connected with metal spring (5).
2. measurement jig novel probe according to claim 1, it is characterised in that the diameter of the middle part (2) is more than institute
State test end (1) and connect the diameter of bottom (3).
3. measurement jig novel probe according to claim 1, it is characterised in that test end (1), middle part (2)
It is made with connection bottom (3) by high-carbon steel material.
4. measurement jig novel probe according to claim 1, it is characterised in that a diameter of the 0.2 of its testing needle (4)~
0.6mm。
5. measurement jig novel probe according to claim 1, it is characterised in that positioned at the testing needle of connection bottom (3)
(43) end is to be detachably connected with metal spring (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710855106.3A CN107607753B (en) | 2017-09-20 | 2017-09-20 | Novel probe of test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710855106.3A CN107607753B (en) | 2017-09-20 | 2017-09-20 | Novel probe of test fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107607753A true CN107607753A (en) | 2018-01-19 |
| CN107607753B CN107607753B (en) | 2021-08-17 |
Family
ID=61061442
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710855106.3A Active CN107607753B (en) | 2017-09-20 | 2017-09-20 | Novel probe of test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107607753B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109188033A (en) * | 2018-10-15 | 2019-01-11 | 东莞市盈之宝电子科技有限公司 | A kind of new-type probe |
Citations (14)
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| JPH04157370A (en) * | 1990-10-19 | 1992-05-29 | Hitachi Ltd | Spiral spring probe |
| CN2590004Y (en) * | 2002-12-05 | 2003-12-03 | 曾家棠 | Switch probe for printed circuit board testing arrangement |
| CN2658473Y (en) * | 2003-10-23 | 2004-11-24 | 王云阶 | Spring special for electronic and test industry |
| JP3878578B2 (en) * | 2003-05-06 | 2007-02-07 | 一彦 後藤 | Contact probe, semiconductor and electrical inspection apparatus using the same |
| CN101109767A (en) * | 2006-07-17 | 2008-01-23 | 范伟芳 | Improved structure of two sheet type modularized elastic probe |
| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN102213727A (en) * | 2010-04-09 | 2011-10-12 | 山一电机株式会社 | Probe pin and an IC socket with the same |
| CN102866380A (en) * | 2012-09-21 | 2013-01-09 | 郑州云涌科技有限责任公司 | Bundling type flexible combined probe |
| CN103562733A (en) * | 2011-05-27 | 2014-02-05 | 精炼金属股份有限公司 | Spring contact pin arrangement |
| CN204389626U (en) * | 2015-01-14 | 2015-06-10 | 南昌友星电子电器有限公司 | A kind of dock module of motor harness test table |
| CN204789913U (en) * | 2015-06-12 | 2015-11-18 | 珠海拓优电子有限公司 | Novel circuit board test fixture |
| CN105759086A (en) * | 2016-05-11 | 2016-07-13 | 深圳市顺天祥电子有限公司 | Mini-connector test probe module for circuit board |
| CN205484690U (en) * | 2015-12-31 | 2016-08-17 | 东莞市连威电子有限公司 | Mini -probe suitable for PCB test fixture |
| CN106706974A (en) * | 2016-12-23 | 2017-05-24 | 深圳市瑞能实业股份有限公司 | Low-impedance contact conductive test electrode |
-
2017
- 2017-09-20 CN CN201710855106.3A patent/CN107607753B/en active Active
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04157370A (en) * | 1990-10-19 | 1992-05-29 | Hitachi Ltd | Spiral spring probe |
| CN2590004Y (en) * | 2002-12-05 | 2003-12-03 | 曾家棠 | Switch probe for printed circuit board testing arrangement |
| JP3878578B2 (en) * | 2003-05-06 | 2007-02-07 | 一彦 後藤 | Contact probe, semiconductor and electrical inspection apparatus using the same |
| CN2658473Y (en) * | 2003-10-23 | 2004-11-24 | 王云阶 | Spring special for electronic and test industry |
| CN101109767A (en) * | 2006-07-17 | 2008-01-23 | 范伟芳 | Improved structure of two sheet type modularized elastic probe |
| CN102213727A (en) * | 2010-04-09 | 2011-10-12 | 山一电机株式会社 | Probe pin and an IC socket with the same |
| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN103562733A (en) * | 2011-05-27 | 2014-02-05 | 精炼金属股份有限公司 | Spring contact pin arrangement |
| CN102866380A (en) * | 2012-09-21 | 2013-01-09 | 郑州云涌科技有限责任公司 | Bundling type flexible combined probe |
| CN204389626U (en) * | 2015-01-14 | 2015-06-10 | 南昌友星电子电器有限公司 | A kind of dock module of motor harness test table |
| CN204789913U (en) * | 2015-06-12 | 2015-11-18 | 珠海拓优电子有限公司 | Novel circuit board test fixture |
| CN205484690U (en) * | 2015-12-31 | 2016-08-17 | 东莞市连威电子有限公司 | Mini -probe suitable for PCB test fixture |
| CN105759086A (en) * | 2016-05-11 | 2016-07-13 | 深圳市顺天祥电子有限公司 | Mini-connector test probe module for circuit board |
| CN106706974A (en) * | 2016-12-23 | 2017-05-24 | 深圳市瑞能实业股份有限公司 | Low-impedance contact conductive test electrode |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109188033A (en) * | 2018-10-15 | 2019-01-11 | 东莞市盈之宝电子科技有限公司 | A kind of new-type probe |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107607753B (en) | 2021-08-17 |
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Effective date of registration: 20211203 Address after: 435100 No. 91, Sike Avenue East, Jinshan street, Huangshi economic and Technological Development Zone, Huangshi City, Hubei Province Patentee after: LEADER-TECH (HUANGSHI) Inc. Address before: 518104 floors 1-4, 2-3, building a, Huangpu Runhe Industrial Park, South Ring Road, Huangpu Community, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: LEADER-TECH ELECTRONICS (SHENZHEN) Inc. |