JPH0351766A - Conductive contact element - Google Patents

Conductive contact element

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Publication number
JPH0351766A
JPH0351766A JP18683289A JP18683289A JPH0351766A JP H0351766 A JPH0351766 A JP H0351766A JP 18683289 A JP18683289 A JP 18683289A JP 18683289 A JP18683289 A JP 18683289A JP H0351766 A JPH0351766 A JP H0351766A
Authority
JP
Japan
Prior art keywords
contact
receptacle
plunger
slot
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18683289A
Other languages
Japanese (ja)
Inventor
Hiroyuki Sakuranaka
桜中 博幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Miyagi Electronics Ltd
Original Assignee
Fujitsu Miyagi Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Miyagi Electronics Ltd filed Critical Fujitsu Miyagi Electronics Ltd
Priority to JP18683289A priority Critical patent/JPH0351766A/en
Publication of JPH0351766A publication Critical patent/JPH0351766A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To eliminate contact inferiority by rotating a contact point by bringing the projection provided to the side wall of a plunger into engagement with the spiral slot of a receptacle and allowing the projection to slide along the slot when the plunger slides. CONSTITUTION:A spiral slot 6 is provided to the wall surface of a receptacle 2 in the longitudinal direction thereof and the projection 7 of a plunger 4 is engaged with the slot 6 and one end of the plunger 4 is pressed by a spring 5. When the plunger 4 slides in the cylinder of the receptacle 2, the projection 7 slides along the slot 6 and, therefore, a contact point 3 is elastically brought into contact with an object under rotation and no contact inferiority is generated. Further, by making the shape of the contact point columnar, a good contact state is obtained even in such a case that contact inferiority is generated in a conventional conductive contact element and the object is not damaged. Therefore, the inspection efficiency of a printed circuit board is enhanced to a large extent.

Description

【発明の詳細な説明】 〔概 要〕 導電接触子に係わり、特にプリント板などの接触対象物
の検査に用いる導電接触子に関し、接触対象物の接触部
との接触が確実にできて、しかも、接触を傷つけないこ
とを目的とし、円筒状のレセプタクルと、前記レセプタ
クルの長さよりも短くて、そのレセプタクルの内部に摺
動可能に設けられ、かつ円柱状の接点が出っ張るように
設けられた一方の端部が、そのレセプタクルから抜けな
いように支持された柱状のプランジャと、前記レセプタ
クルの内部に設けられ、かつプランジャの一方の端部に
設けられた接点が、レセプタクルの端部から常に突き出
るように、そのプランジャの他方の端部を押圧するばね
とを有し、前記レセプタクルの壁面の長手方向に、螺旋
状の長孔が設けられ、前記プランジャの側壁に突起が設
けられ、前記プランジャがレセプタクルの筒内を摺動す
るときに、突起が長孔に嵌まった状態で滑動するように
構成する。
[Detailed Description of the Invention] [Summary] Regarding conductive contacts, particularly conductive contacts used for inspecting contact objects such as printed circuit boards, the present invention relates to conductive contacts that can reliably make contact with the contact portion of the contact object and that , a cylindrical receptacle, and a cylindrical receptacle, which is shorter than the length of the receptacle, is slidably provided inside the receptacle, and is provided with a cylindrical contact protruding from the receptacle for the purpose of not damaging the contact. A column-shaped plunger supported so that the end thereof does not come out of the receptacle, and a contact point provided inside the receptacle and provided at one end of the plunger so as to always protrude from the end of the receptacle. a spring for pressing the other end of the plunger; a spiral elongated hole is provided in the longitudinal direction of the wall surface of the receptacle; a protrusion is provided on the side wall of the plunger; When sliding inside the cylinder, the protrusion is configured to slide while being fitted into the elongated hole.

〔産業上の利用分野〕[Industrial application field]

本発明は、導電接触子に係わり、特に導電接触子の接点
と接触対象物の接触部との接触状態の改良に関する。
The present invention relates to a conductive contact, and particularly to improvement of the contact state between a contact point of a conductive contact and a contact portion of a contact object.

半導体装置などの電子部品の試験工程などにおいては、
ばねによって接触圧が付与された導電接触子が用いられ
ている。
In the testing process of electronic components such as semiconductor devices,
A conductive contact to which contact pressure is applied by a spring is used.

この導電接触子は、プランジャ、レセプタクルおよびば
ねから構成されている。
This conductive contact consists of a plunger, a receptacle and a spring.

そして、通常は、円柱状のプランジャが円筒状のレセプ
タクルの中に収まって摺動し、プランジャは、押しばね
によって常にレセプタクルの外へ突き出る方向に与圧が
加えられている。
Normally, a cylindrical plunger slides within a cylindrical receptacle, and the plunger is always pressurized by a pressure spring in the direction of protruding out of the receptacle.

従って、プランジャの先端の接点は、接触対象物となる
、例えばプリント板上に設けられた端子などの接触部に
弾接し、導通が取れるようになっている。
Therefore, the contact point at the tip of the plunger comes into elastic contact with a contacting object, such as a terminal provided on a printed board, to establish electrical continuity.

このプランジャの先端の接点と接触対象物の接触部との
接触が不具合であると、接触部分での導通不良なのか、
それとも接触対象物自体の不良なのか、はっきりしなく
なる。
If there is a problem in the contact between the contact at the tip of the plunger and the contact part of the contact object, it may be due to poor conduction at the contact part.
Or, it becomes unclear whether the contact object itself is defective.

そこで、プランジャの先端の接点と接触対象物の接触部
との接触を、確実に行うことのできる導電接触子の開発
が要望れさている。
Therefore, there is a need for the development of a conductive contact that can reliably make contact between the contact point at the tip of the plunger and the contact portion of the object to be contacted.

〔従来の技術〕[Conventional technology]

第4図は従来の導電接触子を説明する断面図、第5図は
第4図のX部の拡大図、第6図は従来の導電接触子の動
作中の側面図である。
FIG. 4 is a sectional view illustrating a conventional conductive contact, FIG. 5 is an enlarged view of the X section in FIG. 4, and FIG. 6 is a side view of the conventional conductive contact during operation.

第4図において、柱状のプランジャ4は、筒状のレセプ
タクル2の中に収まっており、プランジャ4の一方の端
部は、レセプタクル2の一方の端部から細く突き出てい
て、その先端には接点3が設けられている。
In FIG. 4, a columnar plunger 4 is housed in a cylindrical receptacle 2, and one end of the plunger 4 protrudes thinly from one end of the receptacle 2, with a contact point at the tip. 3 is provided.

また、プランジャ4の他方の端部は、レセプタクル2の
他方の端部との間に介在するばね5によって、常に押し
出される方向に弾発的に支持されている。
Further, the other end of the plunger 4 is elastically supported by a spring 5 interposed between it and the other end of the receptacle 2 in a direction in which it is always pushed out.

一方、プランジャ4の先端に設けられた接点3の形状は
、例えば、第5図の(イ)に示したように円柱型であっ
たり、(ロ)に示したように円錐型であったり、(ハ)
に示したように王冠カット型であったりする。
On the other hand, the shape of the contact point 3 provided at the tip of the plunger 4 may be, for example, a cylindrical shape as shown in (a) of FIG. 5, or a conical shape as shown in (b) of FIG. (c)
As shown in the figure, it may be a crown-cut type.

そして、この導電接触子lは、第6図に示したように、
接点3が上を向くようにレセプタクル2を垂直に支持し
、接触対象物9の接触部10を下向きにして接点3と弾
接し、導通を取る。
As shown in FIG. 6, this conductive contact l is
The receptacle 2 is supported vertically so that the contact point 3 faces upward, and the contact part 10 of the object to be contacted 9 is turned downward and makes elastic contact with the contact point 3 to establish electrical conduction.

このようにして、例えば、プリント板検査装置の場合に
は、この導電接触子lを複数本組み込み、検査しようと
するプリント板に設けられたパッド部分とか接触部部分
とかに一括して弾接させ、回路パターンなどの検査を行
う。
In this way, for example, in the case of a printed board inspection device, a plurality of these conductive contacts l are installed and brought into elastic contact with the pad portion or contact portion provided on the printed board to be inspected all at once. , inspect circuit patterns, etc.

しかし、接点3と接触部10との接触は、例えば、30
g重の静圧による当接である。
However, the contact between the contact point 3 and the contact portion 10 is, for example, 30
This is contact due to static pressure of g weight.

従って、接触部10の表面に酸化膜が形成していたり、
塵などの異物が付着したりしていると、確実な接触がで
きないことが間々起こる。
Therefore, an oxide film may be formed on the surface of the contact portion 10,
If foreign matter such as dust is attached, reliable contact may not be possible from time to time.

また、接点3が(ロ)や(ハ)の形状は、接点3と接触
対象物9の接触部10とが弾接したとき、よく導通が取
れるように工夫された形状であるが、この場合には、接
触対象物9の接触部10を傷つけ、複数回繰り返すと破
壊してしまうことが間々起こる。
In addition, the shapes (B) and (C) of the contact 3 are devised to ensure good conduction when the contact 3 and the contact portion 10 of the contact object 9 come into elastic contact. In this case, the contact portion 10 of the contact object 9 may be damaged and destroyed if repeated multiple times.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

以上述べたように、従来の導電接触子は、例えば、プリ
ント板などの接触対象物の接触部に、酸化膜の形成とか
、塵などの異物の付着によって、確実な接触ができない
問題があった。
As mentioned above, conventional conductive contacts have the problem of not being able to make reliable contact with objects such as printed circuit boards due to the formation of an oxide film or the adhesion of foreign matter such as dust. .

また、接触をよくするために、導電接触子の接点の形状
を円錐型にしたり、王冠カット型にすると、接触性能は
向上するが、接触対象物の接触部を傷つけてしまう問題
があった。
Further, in order to improve the contact, if the shape of the contact point of the conductive contactor is made into a conical shape or a crown-cut shape, the contact performance is improved, but there is a problem of damaging the contact portion of the object to be contacted.

本発明は、接触対象物の接触部に 酸化膜の形成や異物
の付着があっても、確実に接触ができ、しかも、接触対
象物の接触部を傷つけない導電接触子を提供することを
目的としている。
The purpose of the present invention is to provide a conductive contact that can reliably contact even if an oxide film is formed or foreign matter adheres to the contact part of the contact object, and does not damage the contact part of the contact object. It is said that

〔課題を解決するための手段〕[Means to solve the problem]

上で述べた課題は、円筒状のレセプタクルと、前記レセ
プタクルの長さよりも短くて、そのレセプタクルの内部
に摺動可能に設けられ、かつ円柱状の接点が出っ張るよ
うに設けられた一方の端部が、そのレセプタクルから抜
けないように支持された柱状のプランジャと、前記レセ
プタクルの内部に設けられ、かつプランジャの一方の端
部に設けられた接点が、レセプタクルの端部から常に突
き出るように、そのプランジャの他方の端部を押圧する
ばねとを有し、前記レセプタクルの壁面の長手方向に、
螺旋状の長孔が設けられ、前記プランジャの側壁に突起
が設けられ、前記プランジャがレセプタクルの筒内を摺
動するときに、突起が長孔に嵌まった状態で滑動するよ
うに構成された導電接触子によって解決される。
The above-mentioned problems include a cylindrical receptacle and one end portion that is shorter than the length of the receptacle, is slidably provided inside the receptacle, and is provided such that a cylindrical contact protrudes. The columnar plunger is supported so that it does not come out of the receptacle, and the contact point provided inside the receptacle and provided at one end of the plunger always protrudes from the end of the receptacle. a spring that presses the other end of the plunger, in the longitudinal direction of the wall surface of the receptacle;
A spiral elongated hole is provided, a protrusion is provided on the side wall of the plunger, and the plunger is configured to slide with the protrusion fitted into the elongated hole when the plunger slides inside the cylinder of the receptacle. Solved by conductive contacts.

〔作 用〕[For production]

本発明においては、柱状のプランジャが筒状のレセプタ
クルの中をばねで押されなから摺動し、プランジャの先
に出っ張って設けられた接点によって、プリント板など
の接触対象物の接触部に弾接する従来の導電接触子に替
えて、レセプタクルの壁に螺旋状の長孔を穿ち、その長
孔に滑らかに嵌合する突起をプランジャの壁に設けるよ
うにしている。
In the present invention, a columnar plunger slides inside a cylindrical receptacle without being pushed by a spring, and a contact point protruding from the tip of the plunger causes the plunger to bounce against the contact portion of a contact object such as a printed board. Instead of a conventional conductive contact, a spiral elongated hole is bored in the wall of the receptacle, and a protrusion is provided on the wall of the plunger that smoothly fits into the elongated hole.

そうして、接点を接触対象物の接触部に押し当ててレセ
プタクルをぐっと押したとき、プランジャがレセプタク
ルの中を摺動しなから回転するようにしている。
In this way, when the contact point is pressed against the contact portion of the object to be contacted and the receptacle is pushed firmly, the plunger does not slide inside the receptacle but rotates.

すなわち、接点が接触対象物の接触部に回転しなから接
触して、接触部の表面を擦るようにし、もし、接触部の
表面に異物が付着していても拭い去るようにしている。
That is, the contact contacts the contact portion of the object to be contacted without rotating, and rubs the surface of the contact portion, so that even if foreign matter adheres to the surface of the contact portion, it is wiped off.

一方、接点の先端の形状を円柱状にして、接点が接触対
象物の接触部を擦っても傷つけることがないようにして
いる。
On the other hand, the shape of the tip of the contact point is cylindrical so that even if the contact point rubs against the contact part of the object to be contacted, it will not cause any damage.

こうして、本発明になる導電接触子によれば、プリント
板などの接触対象物の接触部に傷をつすることなく、安
定な接触を得ることができる。
Thus, according to the conductive contactor of the present invention, stable contact can be achieved without damaging the contact portion of the contact target such as a printed board.

〔実施例] 第1図は本発明の実施例の斜視図、第2図は第1図の断
面図、第3図は第1図の動作時の側面図である。
[Embodiment] FIG. 1 is a perspective view of an embodiment of the present invention, FIG. 2 is a sectional view of FIG. 1, and FIG. 3 is a side view of FIG. 1 during operation.

第1図において、本発明になる導電接触子1は、レセプ
タクル2に外径4smφ、内径3+*mφ、長さ30a
nの真鍮の管を用いた。
In FIG. 1, a conductive contact 1 according to the present invention has a receptacle 2 having an outer diameter of 4 smφ, an inner diameter of 3+*mφ, and a length of 30a.
n brass tube was used.

また、プランジャ4は真鍮製で、直径3IIIIlφ、
長さ15閣の丸棒の一方の端部に、直径Lmmφ、長さ
lO■の突出し棒8を介して、直径2IllIφ、長さ
3IIIImの円柱状の接点3を設けた。
In addition, the plunger 4 is made of brass and has a diameter of 3IIIlφ.
A cylindrical contact point 3 with a diameter of 2IllIφ and a length of 3IIIm was provided at one end of a round bar with a length of 15 mm via a protruding rod 8 with a diameter of Lmmφ and a length of lO.

この接点3には、Auめっきを施した。This contact 3 was plated with Au.

レセプタクル2の壁には幅0.5閣、長さ12鴫の螺旋
状の長孔6を穿ち、この長孔6に滑らかに嵌合する突起
7をプランジャ4の壁に固着した。
A spiral long hole 6 having a width of 0.5 mm and a length of 12 mm is bored in the wall of the receptacle 2, and a projection 7 that smoothly fits into the long hole 6 is fixed to the wall of the plunger 4.

そして、レセプタクル2の中を摺動しなから押し込まれ
たプランジャ4が、押圧が除がたとき自発的を戻るよう
に、コイル状のばね5をレセプタクル2の中に仕組んだ
A coiled spring 5 is installed in the receptacle 2 so that the plunger 4, which is slid and pushed into the receptacle 2, returns spontaneously when the pressure is released.

こうして、プランジャ4がレセプタクル2の中に押し込
まれるとき、プランジャ4とそれに連なる接点3が回転
しなから、第3図に示したように、接触対象物9の接触
部10に弾接し、本発明になる導電接触子1の機能が発
揮される。
In this manner, when the plunger 4 is pushed into the receptacle 2, the plunger 4 and the contact point 3 connected thereto do not rotate and come into elastic contact with the contact portion 10 of the contact object 9, as shown in FIG. The functions of the conductive contact 1 are exhibited.

従来の導電接触子lとこの実施例によって製作した導電
接触子1とを25本用いた、接触部の個数が25個のプ
リント板検査装置によって、性能の比較を行った。
Performance comparisons were made using a printed board inspection device with 25 contact parts, using 25 conventional conductive contacts 1 and 25 conductive contacts 1 manufactured according to this example.

その結果、接触部の個数が、延べ1 、000個に対し
て、従来の導電接触子1による接触不良が6個あった。
As a result, out of a total of 1,000 contact parts, there were 6 contact failures due to the conventional conductive contact 1.

それに対して、本発明になる導電接触子1による接触不
良は皆無であった。
In contrast, there were no contact failures caused by the conductive contact 1 of the present invention.

こ−で実施した導電接触子を構成するレセプタクルやプ
ランジャ、接点などの形状、寸法には、種々の変形が可
能である。
Various modifications can be made to the shapes and dimensions of the receptacle, plunger, contacts, etc. that constitute the conductive contact implemented here.

また、本発明になる導電接触子は、ニーで述べたような
、複数本の導電接触子を所定の位置に支持して検査する
、プリント板検査装置のような規模の大きな用途に限ら
ず、例えば、1本の導電接触子を手に持って操作する、
手作業の使い方においても適用できる。
Furthermore, the conductive contact of the present invention is not limited to large-scale applications such as printed board inspection equipment that supports and inspects multiple conductive contacts at predetermined positions as described in Nee. For example, holding and operating a single conductive contact,
It can also be applied to manual usage.

〔発明の効果〕〔Effect of the invention〕

以上述べたように、従来の導電接触子が接触不良を起こ
したり、接触対象物の接触部を傷つけたりするのに対し
て、本発明になる2!!電接触子によれば、接点を接触
対象物の接触部に当てて、レセプタクルをぐっと押し込
むと、接点で回転しなから接触対象物の接触部に弾接す
るので、接触不良を起こすことがなくなる。
As described above, whereas conventional conductive contacts cause poor contact or damage the contact portion of the object to be contacted, the present invention provides 2! ! According to the electric contact, when the contact point is applied to the contact part of the object to be contacted and the receptacle is firmly pushed in, the receptacle does not rotate at the contact point and comes into elastic contact with the contact part of the object to be contacted, so there is no possibility of contact failure.

さらに、接点の形状を円柱状にすることによって、従来
の導電接触子ならば接触不良になるところを、接触対象
物の接触部を傷つけずに、良好な接触状態を得ることが
できる。
Furthermore, by making the contact point cylindrical in shape, it is possible to obtain a good contact state without damaging the contact portion of the object to be contacted, whereas conventional conductive contacts would result in poor contact.

従って、本発明になる導電接触子によれば、例えば、プ
リント板などの検査の大幅な効率向上に寄与することが
できる。
Therefore, the conductive contact according to the present invention can contribute to a significant improvement in the efficiency of inspecting, for example, printed boards.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例の斜視図、 第2図は第1図の断面図、 第3図は第1図の動作時の側面図、 第4図は従来の導電接触子を説明する断面図、第5図は
第4図のX部の拡大図、 第6図は従来の導電接触子の動作中の側面図、である。 図において、 ■は導電接触子、 3は接点、 5はばね、 7は突起、 である。 2はレセプタクル、 4はプランジャ、 6は長孔、 第 1 図 第 3 図 第 2 図
Fig. 1 is a perspective view of an embodiment of the present invention, Fig. 2 is a sectional view of Fig. 1, Fig. 3 is a side view of Fig. 1 during operation, and Fig. 4 explains a conventional conductive contact. 5 is an enlarged view of the X section in FIG. 4, and FIG. 6 is a side view of a conventional conductive contact during operation. In the figure, ① is a conductive contact, 3 is a contact, 5 is a spring, and 7 is a protrusion. 2 is a receptacle, 4 is a plunger, 6 is a long hole, Fig. 1 Fig. 3 Fig. 2

Claims (1)

【特許請求の範囲】 円筒状のレセプタクル(2)と、 前記レセプタクル(2)の長さよりも短くて、該レセプ
タクル(2)の内部に摺動可能に設けられ、かつ円柱状
の接点(3)が出っ張るように設けられた一方の端部が
、該レセプタクル(2)から抜けないように支持された
柱状のプランジャ(4)と、前記レセプタクル(2)の
内部に設けられ、かつ前記プランジャ(4)の一方の端
部に設けられた前記接点(3)が、前記レセプタクル(
2)の端部から常に突き出るように、該プランジャ(4
)の他方の端部を押圧するばね(5)とを有し、 前記レセプタクル(2)の壁面の長手方向に、螺旋状の
長孔(6)が設けられ、 前記プランジャ(4)の側壁に突起(7)が設けられ、 前記プランジャ(4)が前記レセプタクル(2)の筒内
を摺動するときに、前記突起(7)が前記長孔(6)に
嵌まった状態で滑動することを特徴とする導電接触子。
[Scope of Claims] A cylindrical receptacle (2); and a cylindrical contact (3) that is shorter than the length of the receptacle (2) and is slidably provided inside the receptacle (2). a columnar plunger (4) whose one end protruding from the receptacle (2) is supported so that it does not come off from the receptacle (2); The contact (3) provided at one end of the receptacle (
said plunger (4) so that it always protrudes from the end of said plunger (4).
), a spiral elongated hole (6) is provided in the longitudinal direction of the wall surface of the receptacle (2), and a spiral elongated hole (6) is provided in the side wall of the plunger (4). A protrusion (7) is provided, and when the plunger (4) slides inside the cylinder of the receptacle (2), the protrusion (7) slides while being fitted into the elongated hole (6). A conductive contact featuring:
JP18683289A 1989-07-19 1989-07-19 Conductive contact element Pending JPH0351766A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18683289A JPH0351766A (en) 1989-07-19 1989-07-19 Conductive contact element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18683289A JPH0351766A (en) 1989-07-19 1989-07-19 Conductive contact element

Publications (1)

Publication Number Publication Date
JPH0351766A true JPH0351766A (en) 1991-03-06

Family

ID=16195400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18683289A Pending JPH0351766A (en) 1989-07-19 1989-07-19 Conductive contact element

Country Status (1)

Country Link
JP (1) JPH0351766A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100813280B1 (en) * 2006-11-01 2008-03-13 주식회사 오킨스전자 Probe pin and test socket including the same
JP2008197009A (en) * 2007-02-14 2008-08-28 Hioki Ee Corp Electronic component inspection probe
JP2013167601A (en) * 2012-02-17 2013-08-29 Citizen Tohoku Kk Inspection device using contact probe
JP2017015581A (en) * 2015-07-01 2017-01-19 富士通コンポーネント株式会社 contact

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100813280B1 (en) * 2006-11-01 2008-03-13 주식회사 오킨스전자 Probe pin and test socket including the same
JP2008197009A (en) * 2007-02-14 2008-08-28 Hioki Ee Corp Electronic component inspection probe
JP2013167601A (en) * 2012-02-17 2013-08-29 Citizen Tohoku Kk Inspection device using contact probe
JP2017015581A (en) * 2015-07-01 2017-01-19 富士通コンポーネント株式会社 contact

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