CN204789913U - Novel circuit board test fixture - Google Patents
Novel circuit board test fixture Download PDFInfo
- Publication number
- CN204789913U CN204789913U CN201520408274.4U CN201520408274U CN204789913U CN 204789913 U CN204789913 U CN 204789913U CN 201520408274 U CN201520408274 U CN 201520408274U CN 204789913 U CN204789913 U CN 204789913U
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- test
- circuit board
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- test probe
- moving spring
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Abstract
The utility model provides a novel circuit board test fixture, including dial, drum, test interface, many test probes and many conductor wires, many the test probes interval can be alternated in the dial with setting up movablely from top to bottom, the one end of many conductor wires and test interface connection, other end interval wears to establish on the drum with setting up, and every conductor wire wears to establish one end on the drum and be equipped with reset spring, and reset spring's lower extreme and conductor wire are connected and are fixed, and the upper end coiling has the connection portion of inserting, test probes's lower extreme is equipped with the anti -sticking end, the horizontal width of anti -sticking end and the patchhole aperture looks adaptation of being connected the portion of inserting and the aperture that is greater than reset spring, in test probes's lower extreme inserts the portion of inserting that connects one to one, and the anti -sticking end presses in reset spring's the drill way outside, realizes switching on even with the conductor wire. Like this, the contact of test probes's lower extreme and reset spring is connected with to reset the separation all reliable and stable, long service life, and simple structure, practicality, easily processing produce.
Description
[technical field]
The utility model relates to a kind of Novel jig for circuit board testing.
[background technology]
Electronic component on circuit board should with suitable circuit connected in series or parallel connection, to reach a certain specific effect.As being short-circuited or open circuit, circuit board cannot use.Therefore, have to pass through test before circuit board dispatches from the factory, the circuit on circuit board is complicated and number of electronic components is too many, needs again to rely on measurement jig in the test process of electronic component, coordinates Test Host to complete the test job of electronic component.
Existing measurement jig is probe press formula tool, and it is made up of dials, drum, probe, pilot pin, spring connecting wire, test interface; Dials is made up of one or more insulcrete, dials has the hole corresponding with printed board to be measured, places probe in hole; Drum is made up of one or more insulcrete, drum has in the hole, hole corresponding with last block plate of dials and places spring connecting wire, and one section of spring connecting wire is connected with test interface, and test interface is connected with test machine.
Dials and drum are grouped together, and the probe end thereof contacts board under test other end is by spring connecting wire, and spring connecting wire is by test interface, and test interface completes test by test machine.
[utility model content]
At present, the probe of these existing measurement jigs is all only common elongated and two ends are a same up and down metal needle, the upper end (head) of probe contacts the pad of wiring board, the upper end (head) of lower end (afterbody) contact spring, the lower end (afterbody) of spring connects conductor wire, conductor wire connecting test port, test port is connected with test machine; And spring be adopt be wound around processes out, spring eye can be formed in spring, when probe pressurized moves down with spring contact, because probe lower end diameter is less than spring eye aperture, cause the lower end of test probe easily to be inserted to be stuck in the spring eye of spring, thus cannot reset, cause measurement jig normally to work, have a strong impact on the test result of circuit board under test, even can not complete test job; And pressurized very easily departs from when moving down process and cannot contact with back-moving spring and connects or contact link position and offset, cause probe to bend, be out of shape, even damage, make tool cannot carry out proper testing again, also can testing circuit board be caused damage, be scrapped simultaneously, especially existing automatic test, seriously adds test scrappage.
In order to solve the above-mentioned technical matters existed in prior art, the lower end that the utility model provides a kind of test probe contact with back-moving spring connect be separated with reset all stable, reliable, test result is accurate, long service life, the scrappage of testing circuit board is low, and structure is simple, practical, be easy to the Novel circuit board measurement jig of processing.
The technical scheme that the utility model solution prior art problem adopts is:
A kind of Novel circuit board measurement jig, comprises dials, drum, test interface, many test probes and many conductor wires; Described many test probe intervals can be interted in dials with arranging up and downly; One end of described many conductor wires is connected with test interface, and other end interval is located on drum with arranging, and one end that described in every bar, conductor wire is located on drum is provided with back-moving spring, and lower end and the conductor wire of described back-moving spring are connected and fixed; The upper end of described back-moving spring is wound with to be integrally connected and connects insertion section, and the lower end of described test probe is provided with anti-sticking termination, and the transverse width of described anti-sticking termination is suitable with the patchhole aperture being connected insertion section and be greater than the aperture of back-moving spring; The lower end of the test probe that pressurized moves down is inserted one to one in a detachable fashion and is connected in insertion section, and anti-sticking termination is pressed in outside the aperture of back-moving spring, to realize being connected with conductor wire conducting.
Further, described anti-sticking termination is flat termination, is integrally connected with test probe.
Further, described flat termination is formation flattened by employing instrument flat evagination termination in the lower end of test probe.
Further, described anti-sticking termination is spheroid or hemisphere, is integrally connected with test probe.
Further, described spheroid or hemisphere and test probe one-body molded by lathe in machining.
Further, described test probe is metal needle, and described conductor wire is enameled wire or OK line.
The beneficial effects of the utility model are as follows:
The utility model passes through technique scheme, both can avoid test probe test time pressurized move down process very easily depart from thus its lower end cannot contact with back-moving spring connect or contact position inaccurate, test probe is caused to bend, distortion, the problem even damaged, in the spring eye that the lower end of test probe can be avoided again to stick into back-moving spring thus the problem that cannot reset, the lower end of test probe contact with back-moving spring connect be separated with reset all stable, reliably, test result is accurate, long service life, greatly can reduce the scrappage of testing circuit board simultaneously, and structure is very simple, practical, be easy to processing.
[accompanying drawing explanation]
Fig. 1 is the structural representation of a kind of Novel circuit board measurement jig embodiment described in the utility model;
Fig. 2 is the structure for amplifying schematic diagram in A portion in Fig. 1;
Fig. 3 is the structural representation of a kind of Novel circuit board measurement jig embodiment test mode described in the utility model;
Fig. 4 is the structure for amplifying schematic diagram in B portion in Fig. 3.
[embodiment]
In order to make the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the utility model, and be not used in restriction the utility model.
As shown in Figure 1 to Figure 4:
The utility model embodiment provides a kind of Novel circuit board measurement jig, comprises dials 1, drum 2, test interface 3, many test probes 4 and many conductor wires 5, described many test probes 4 interval can be interted in dials 1 with arranging up and downly, one end of described many conductor wires 5 is connected with test interface 3, other end interval is located on drum 2 with arranging, and every bar conductor wire 5 one end be located on drum 2 is provided with back-moving spring 6, lower end and the conductor wire 5 of described back-moving spring 6 are connected and fixed, the lower end of the test probe 4 that upper end and pressurized move down contacts connection in a detachable fashion one to one, concrete structure is: the upper end of described back-moving spring 6 is wound with to be integrally connected and connects insertion section 61, the lower end of described test probe 4 is provided with anti-sticking termination 41, the transverse width of described anti-sticking termination 41 is suitable with the patchhole aperture being connected insertion section 61 (namely the transverse width of anti-sticking termination 41 is less than the patchhole aperture connecting insertion section 61), and be greater than the aperture of back-moving spring 6, the lower end of the test probe 4 that pressurized moves down is inserted one to one in a detachable fashion and is connected in insertion section 61, and anti-sticking termination 41 is pressed in outside the aperture of back-moving spring 6, to realize being connected with conductor wire 5 conducting, wherein, described test probe 4 is metal needles, and described conductor wire 5 is enameled wire or OK line, described anti-sticking termination 41 can be flat termination, and this flat termination can be formation flattened by employing instrument flat evagination termination in the lower end of test probe 4, and itself and test probe 4 are integrally connected.
When adopting tool described in the utility model to test, circuit board under test 7 is placed on the dials face 11 of dials 1, the pressure that test probe 4 on dials face 11 is subject to circuit board under test 7 moves down, continue to move down in the connection insertion section 61 making to insert with the lower end of test probe 4 back-moving spring 6 under the patchhole guide effect connecting insertion section 61, until anti-sticking termination 41 is pressed in outside the aperture of back-moving spring 6, be connected with the upper-end contact of back-moving spring 6, realize being connected with conductor wire 5 conducting, now back-moving spring 6 forced contraction; When the test is finished, taken out from dials face 11 by circuit board 7, test probe 4 moves up under the restoring force effect of back-moving spring 6, and the lower end of test probe 4 keeps trickle with the connection insertion section 61 of back-moving spring 6 and is separated.
Like this, insertion section 61 and anti-sticking termination 41 is connected by arranging respectively with the lower end of test probe 4 in the upper end of back-moving spring 6, both can avoid test probe 4 test time pressurized move down process very easily depart from thus its lower end cannot contact with back-moving spring 6 connect or contact position inaccurate, test probe 4 is caused to bend, distortion, the problem even damaged, in the spring eye that the lower end of test probe 4 can be avoided again to stick into back-moving spring 6 thus the problem that cannot reset, the lower end of test probe 4 contact with back-moving spring 6 connect be separated with reset all stable, reliably, test result is accurate, long service life, greatly can reduce the scrappage of testing circuit board simultaneously, and structure is very simple, practical, be easy to processing.
Certainly, described anti-sticking termination 41 also can be spheroid or hemisphere, is integrally connected with test probe 4, and it is one-body molded that such as described spheroid or hemisphere and test probe 4 pass through lathe in machining.
Above content is in conjunction with concrete optimal technical scheme further detailed description of the utility model, can not assert that concrete enforcement of the present utility model is confined to these explanations.For the utility model person of an ordinary skill in the technical field, without departing from the concept of the premise utility, some simple deduction or replace can also be made, all should be considered as belonging to protection domain of the present utility model.
Claims (6)
1. a Novel circuit board measurement jig, comprises dials (1), drum (2), test interface (3), many test probes (4) and many conductor wires (5); Described many test probes (4) interval can be interted in dials (1) with arranging up and downly; One end of described many conductor wires (5) is connected with test interface (3), other end interval is located on drum (2) with arranging, and conductor wire (5) one end be located on drum (2) is provided with back-moving spring (6) described in every bar, lower end and the conductor wire (5) of described back-moving spring (6) are connected and fixed; It is characterized in that: the upper end of described back-moving spring (6) is wound with to be integrally connected and connects insertion section (61), the lower end of described test probe (4) is provided with anti-sticking termination (41), and the transverse width of described anti-sticking termination (41) is suitable with the patchhole aperture being connected insertion section (61) and be greater than the aperture of back-moving spring (6); The lower end of the test probe (4) that pressurized moves down is inserted one to one in a detachable fashion and is connected in insertion section (61), and anti-sticking termination (41) are pressed in outside the aperture of back-moving spring (6), to realize being connected with conductor wire (5) conducting.
2. Novel circuit board measurement jig according to claim 1, is characterized in that: described anti-sticking termination (41) is flat termination, is integrally connected with test probe (4).
3. Novel circuit board measurement jig according to claim 2, is characterized in that: described flat termination is formation flattened by employing instrument flat evagination termination in the lower end of test probe (4).
4. Novel circuit board measurement jig according to claim 1, is characterized in that: described anti-sticking termination (41) is spheroid or hemisphere, is integrally connected with test probe (4).
5. Novel circuit board measurement jig according to claim 4, is characterized in that: described spheroid or hemisphere and test probe (4) one-body molded by lathe in machining.
6. the Novel circuit board measurement jig according to claim 1 or 2 or 3 or 4 or 5, is characterized in that: described test probe (4) is metal needle, described conductor wire (5) is enameled wire or OK line.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520408274.4U CN204789913U (en) | 2015-06-12 | 2015-06-12 | Novel circuit board test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520408274.4U CN204789913U (en) | 2015-06-12 | 2015-06-12 | Novel circuit board test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204789913U true CN204789913U (en) | 2015-11-18 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520408274.4U Active CN204789913U (en) | 2015-06-12 | 2015-06-12 | Novel circuit board test fixture |
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| CN (1) | CN204789913U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106680695A (en) * | 2017-02-28 | 2017-05-17 | 珠海拓优电子有限公司 | One needle and two wires testing jig imitating four wires |
| CN107607753A (en) * | 2017-09-20 | 2018-01-19 | 上达电子（深圳）股份有限公司 | A kind of measurement jig novel probe |
| CN112767864A (en) * | 2021-01-15 | 2021-05-07 | 深圳市韦德勋光电科技有限公司 | Debugging device of LCD logic board control module and use method |
-
2015
- 2015-06-12 CN CN201520408274.4U patent/CN204789913U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106680695A (en) * | 2017-02-28 | 2017-05-17 | 珠海拓优电子有限公司 | One needle and two wires testing jig imitating four wires |
| CN107607753A (en) * | 2017-09-20 | 2018-01-19 | 上达电子（深圳）股份有限公司 | A kind of measurement jig novel probe |
| CN107607753B (en) * | 2017-09-20 | 2021-08-17 | 上达电子（深圳）股份有限公司 | Novel probe of test fixture |
| CN112767864A (en) * | 2021-01-15 | 2021-05-07 | 深圳市韦德勋光电科技有限公司 | Debugging device of LCD logic board control module and use method |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |