CN204789913U - Novel circuit board test fixture - Google Patents

Abstract

The utility model provides a new circuit board test fixture, which includes a needle plate, a wire plate, a test interface, a plurality of test probes and a plurality of conductive wires; the plurality of test probes are arranged at intervals and can be moved up and down and interspersed in the Inside the dial; one end of a plurality of conductive wires is connected to the test interface, and the other end is threaded on the wire disk at intervals, and one end of each conductive wire threaded on the wire disk is provided with a return spring, and the lower end of the return spring is connected to the conductive wire. The connection is fixed, and the upper end is wound with a connection insertion part; the lower end of the test probe is provided with an anti-snap terminal, and the transverse width of the anti-snap terminal is adapted to the hole diameter of the connection insertion part and is larger than the hole diameter of the return spring; the test The lower ends of the probes are inserted one-to-one into the connection insertion part, and the anti-jamming end is pressed against the outside of the opening of the return spring to realize the conduction connection with the conductive wire. In this way, the contact connection and reset separation between the lower end of the test probe and the return spring are stable and reliable, the service life is long, and the structure is simple, practical and easy to process and produce.

Description

A new circuit board test fixture

【Technical field】

The utility model relates to a new fixture used for circuit board testing.

【Background technique】

The electronic components on the circuit board should be connected in series or in parallel with an appropriate circuit to achieve a specific function. In the event of a short or open circuit, the board will not be usable. Therefore, the circuit board must be tested before leaving the factory. The circuit on the circuit board is complex and the number of electronic components is too large. During the testing process of electronic components, it is necessary to rely on test fixtures and cooperate with the test host to complete the testing of electronic components.

The existing test fixture is a probe press-type fixture, which consists of a needle plate, a wire plate, a probe, a positioning pin, a spring connection, and a test interface; the needle plate is composed of one or more insulating plates, and the needle There are holes corresponding to the printed board to be tested on the reel, and probes are placed in the holes; the reel is composed of one or more insulating plates, and the spring connector is placed in the hole corresponding to the last board of the needle reel on the reel. One section of the spring wire is connected to the test interface, and the test interface is connected to the testing machine.

The needle reel and wire reel are combined together, one end of the probe contacts the board to be tested and the other end is connected by a spring, the spring connection passes through the test interface, and the test interface is tested by the testing machine.

【Content of utility model】

At present, the probes of these existing test fixtures are only a common slender metal needle with the same upper and lower ends. The upper end (head) of the probe contacts the pad of the circuit board, and the lower end (tail) contacts the upper end of the spring. (head), the lower end (tail) of the spring is connected to the conductive wire, the conductive wire is connected to the test port, and the test port is connected to the testing machine; while the spring is processed by winding process, a spring hole will be formed in the spring, when the probe is pressed When moving down to contact with the spring, because the diameter of the lower end of the probe is smaller than the diameter of the spring hole, the lower end of the test probe is easily inserted into the spring hole of the spring, so that it cannot be reset, causing the test fixture to not work normally, seriously affecting the test The test results of the circuit board cannot even complete the test work; and it is easy to deviate during the downward movement under pressure and cannot be in contact with the return spring or the contact connection position is offset, causing the probe to bend, deform, or even be damaged. Fixtures can no longer perform normal tests, and will also cause damage and scrap to the test circuit board, especially the existing automated testing, which seriously increases the test scrap rate.

In order to solve the above-mentioned technical problems in the prior art, the utility model provides a stable and reliable contact connection and reset separation between the lower end of the test probe and the return spring, accurate test results, long service life, and scrapping of the test circuit board. It is a new circuit board test fixture with low efficiency, simple structure, practicality, and easy processing and production.

The technical solution adopted by the utility model to solve the problems of the prior art is:

A new type of circuit board test fixture, including a dial, a wire reel, a test interface, a plurality of test probes and a plurality of conductive wires; the plurality of test probes are arranged at intervals and can be inserted into the dial in a movable manner up and down; One end of the plurality of conductive wires is connected to the test interface, and the other end is threaded on the wire reel at intervals, and one end of each conductive wire threaded on the wire reel is provided with a return spring, and the lower end of the return spring is connected to the reel. The conductive wire is connected and fixed; the upper end of the return spring is wound with an integrated connection insertion part, and the lower end of the test probe is provided with an anti-jamming terminal, and the transverse width of the anti-jamming terminal is the same as the insertion hole of the connection insertion part. The hole diameter is suitable and larger than the hole diameter of the return spring; the lower end of the test probe that moves down under pressure is inserted into the connection insertion part one by one in a detachable manner, and the anti-jamming end is pressed on the outside of the hole of the return spring, To realize the conduction connection with the conductive wire.

Further, the anti-seize terminal is a flat terminal connected with the test probe in one piece.

Further, the flat end is a flat protruding end formed by flattening the lower end of the test probe with a tool.

Further, the anti-seize terminal is a sphere or a hemisphere, which is integrally connected with the test probe.

Further, the sphere or hemisphere and the test probe are integrally formed by CNC lathe processing.

Further, the test probes are metal needles, and the conductive wires are enameled wires or OK wires.

The beneficial effects of the utility model are as follows:

Through the above technical scheme, the utility model can prevent the test probe from being easily deviated during the downward movement under pressure, so that its lower end cannot be contacted and connected with the return spring or the contact position is inaccurate, causing the test probe to bend and deform. Even the problem of damage can avoid the problem that the lower end of the test probe is stuck in the spring hole of the return spring and cannot be reset. The contact connection and separation between the lower end of the test probe and the return spring are stable and reliable, and the test results are accurate. Use The utility model has a long service life and can greatly reduce the scrap rate of the test circuit board at the same time, and the structure is very simple and practical, and is easy to process and produce.

【Description of drawings】

Fig. 1 is a schematic structural view of a novel circuit board test fixture embodiment of the utility model;

Fig. 2 is a schematic diagram of an enlarged structure of part A in Fig. 1;

Fig. 3 is a schematic structural view of a test state of a novel circuit board test fixture embodiment of the utility model;

FIG. 4 is an enlarged structural schematic diagram of part B in FIG. 3 .

【Detailed ways】

In order to make the purpose, technical solution and advantages of the utility model clearer, the utility model will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model, and are not intended to limit the utility model.

As shown in Figure 1 to Figure 4:

The embodiment of the utility model provides a new circuit board test fixture, including a needle plate 1, a wire plate 2, a test interface 3, a plurality of test probes 4 and a plurality of conductive wires 5; the plurality of test probes 4 The needle disc 1 can be vertically and vertically arranged at intervals; one end of the plurality of conductive wires 5 is connected to the test interface 3, and the other end is threaded on the wire tray 2 at intervals, and each conductive wire 5 is threaded on the wire One end on the disk 2 is provided with a return spring 6, the lower end of the return spring 6 is connected and fixed to the conductive wire 5, and the upper end is in detachable contact connection with the lower end of the test probe 4 that moves downward in a detachable manner, The specific structure is as follows: the upper end of the return spring 6 is wound with a connection integral connection insertion part 61, and the lower end of the test probe 4 is provided with an anti-jamming terminal 41, and the transverse width of the anti-jamming terminal 41 is connected to the insertion part 61. The insertion hole diameter of the part 61 is adapted (that is, the transverse width of the anti-card terminal 41 is less than the insertion hole diameter of the connection insertion part 61), and is greater than the aperture of the return spring 6; In a detachable manner, insert one-to-one into the connection insertion part 61, and the anti-card terminal 41 is pressed against the outside of the opening of the return spring 6, so as to realize the conduction connection with the conductive wire 5; wherein, the test probe 4 is Metal needle, the conductive wire 5 is an enameled wire or an OK wire; the anti-jamming terminal 41 can be a flat terminal, and the flat terminal can be a flat outer convex end formed by flattening the lower end of the test probe 4 with a tool The head is connected with the test probe 4 as a whole.

When using the jig described in the utility model for testing, the circuit board 7 to be tested is placed on the dial surface 11 of the dial 1, and the test probe 4 on the dial 11 is pressed downward by the circuit board 7 to be tested. Move, insert the lower end of the test probe 4 into the connection insertion part 61 of the return spring 6, and continue to move down under the guidance of the insertion hole of the connection insertion part 61 until the anti-jamming terminal 41 is pressed against the hole of the return spring 6 The outer side of the mouth is connected with the upper end of the return spring 6 to realize the conductive connection with the conductive wire 5. At this time, the return spring 6 is forced to shrink; 4 moves upward under the restoring force of the returning spring 6 , and the lower end of the test probe 4 is kept slightly separated from the connecting insertion portion 61 of the returning spring 6 .

In this way, by setting the connection insertion part 61 and the anti-jamming terminal 41 respectively at the upper end of the return spring 6 and the lower end of the test probe 4, it can be avoided that the test probe 4 is easily deviated during the downward movement under pressure during the test. Its lower end cannot be connected with the return spring 6 or the contact position is inaccurate, causing the test probe 4 to be bent, deformed, or even damaged, and it can also prevent the lower end of the test probe 4 from being stuck in the spring hole of the return spring 6 and cannot be reset problem, the lower end of the test probe 4 and the return spring 6 are stable and reliable in contact connection and reset separation, the test result is accurate, the service life is long, and the scrap rate of the test circuit board can be greatly reduced at the same time, and the structure is very simple, practical, and easy to use. Processing.

Certainly, the anti-seize terminal 41 may also be a sphere or a hemisphere, which is integrally connected with the test probe 4 , for example, the sphere or hemisphere and the test probe 4 are integrally formed by CNC lathe processing.

The above content is a further detailed description of the utility model in combination with specific preferred technical solutions, and it cannot be determined that the specific implementation of the utility model is only limited to these descriptions. For a person of ordinary skill in the technical field to which the utility model belongs, without departing from the concept of the utility model, some simple deduction or substitutions can also be made, which should be regarded as belonging to the protection scope of the utility model.

Claims (6)

1. A novel circuit board test fixture, comprising a dial (1), a wire reel (2), a test interface (3), a plurality of test probes (4) and a plurality of conductive wires (5); The test probes (4) are arranged at intervals and can be inserted up and down in the dial (1); one end of the plurality of conductive wires (5) is connected to the test interface (3), and the other ends are arranged at intervals and passed through the wire on the disc (2), and each conductive wire (5) is threaded on one end of the wire disc (2) to be provided with a return spring (6), and the lower end of the return spring (6) is connected to the conductive wire (5) fixed; it is characterized in that: the upper end of the return spring (6) is wound with an integrated connection insertion part (61), the lower end of the test probe (4) is provided with an anti-jamming terminal (41), and the anti-jamming The transverse width of the card terminal (41) is adapted to the aperture of the insertion hole of the connection insert (61), and is greater than the aperture of the back-moving spring (6); One-to-one insertion into the connection insertion part (61) in a one-to-one manner, and the anti-jamming terminal (41) is pressed against the outside of the hole of the return spring (6) to realize a conductive connection with the conductive wire (5). 2. The new circuit board test fixture according to claim 1, characterized in that: the anti-jamming terminal (41) is a flat terminal connected with the test probe (4). 3. The new circuit board test fixture according to claim 2, characterized in that: the flat end is a flat protruding end formed by flattening the lower end of the test probe (4) with a tool. 4. The new circuit board test fixture according to claim 1, characterized in that: the anti-jamming terminal (41) is a sphere or a hemisphere, and is integrally connected with the test probe (4). 5. The new circuit board test fixture according to claim 4, characterized in that: the sphere or hemisphere and the test probe (4) are integrally formed by CNC lathe processing. 6. The novel circuit board test fixture according to claim 1 or 2 or 3 or 4 or 5, characterized in that: the test probe (4) is a metal needle, and the conductive wire (5) is an enameled wire or OK line.