CN103529247B - A kind of tool for measuring surface mounting crystal electrical quantity - Google Patents

A kind of tool for measuring surface mounting crystal electrical quantity Download PDF

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Publication number
CN103529247B
CN103529247B CN201310502441.7A CN201310502441A CN103529247B CN 103529247 B CN103529247 B CN 103529247B CN 201310502441 A CN201310502441 A CN 201310502441A CN 103529247 B CN103529247 B CN 103529247B
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China
Prior art keywords
test
guide
handle
tool
surface mounting
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CN201310502441.7A
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Chinese (zh)
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CN103529247A (en
Inventor
王金涛
魏福全
黄祥妙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taijing Technology Co., Ltd
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HUBEI TKD ELECTRONIC TECHNOLOGY Co Ltd
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Priority to CN201310502441.7A priority Critical patent/CN103529247B/en
Publication of CN103529247A publication Critical patent/CN103529247A/en
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Abstract

The present invention relates to tool field, is a kind of tool for measuring surface mounting crystal electrical quantity.It is characterized in that, on measurement jig base, limited block is housed; Have the axis of guide in the hole of test handle, have test holddown spring under the axis of guide, the base of test handle is installed on guide holder, and there is testing needle the lower end of test handle.Owing to have employed the technical program, measure surface mounting crystal electrical quantity method simple, saved manpower, improve production efficiency, reduced production cost.

Description

A kind of tool for measuring surface mounting crystal electrical quantity
Technical field
The present invention relates to tool field, is a kind of tool for measuring surface mounting crystal electrical quantity.
Background technology
At surface mounting crystal production field, production run needs to carry out selective examination test electrical quantity to the product encapsulated, and does not have a kind of test fixture to be applicable to this small surface mounting crystal in the market.
Summary of the invention
The object of the invention is to provide a kind of tool for measuring surface mounting crystal electrical quantity.
Technical scheme of the present invention is: a kind of tool for measuring surface mounting crystal electrical quantity, it is characterized in that, on measurement jig base, limited block is housed; Have the axis of guide in the hole of test handle, have test holddown spring under the axis of guide, the base of test handle is installed on guide holder, and there is testing needle the lower end of test handle.
Owing to have employed technique scheme, measure surface mounting crystal electrical quantity method simple, saved manpower, improve production efficiency, reduced production cost.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
In the drawings: 1, measurement jig base; 2, limited block; 3, handle is tested; 4, guide holder; 5, holddown spring is tested; 6, the axis of guide; 7, testing needle.
Embodiment
Below in conjunction with embodiment, the present invention is further illustrated.
In FIG, limited block 2 is equipped with measurement jig base 1; Have the axis of guide 6 in the hole of test handle 3, the axis of guide has test holddown spring 5 for 6 times, and the base of test handle 3 is installed on guide holder 4, and there is testing needle 7 lower end of test handle 3.
Embodiment, first test handle 3 is upwards carried, dextrorotation turn 90 degrees the top of putting to guide holder 4, with tweezers, product test electrode to be tested is put into tool groove upward again, located by limited block 2, then test handle 3 is rotated counterclockwise 90 degree and puts to guide holder 4 entrance, owing to testing the acting force of holddown spring 5, imported by guide holder 4, just in time testing needle 7 is pressed in edge on the yellow electrode of product to be tested, product takes out by be measured completing.

Claims (1)

1., for measuring a tool for surface mounting crystal electrical quantity, its principal character is, on measurement jig base (1), limited block (2) is housed, the axis of guide (6) is had in the hole of test handle (3), test holddown spring (5) is had under the axis of guide (6), the base of test handle (3) is installed on guide holder (4), there is testing needle (7) lower end of test handle (3), first will test handle (3) upwards to carry, dextrorotation turn 90 degrees the top of putting to guide holder (4), with tweezers, product test electrode to be tested is put into tool groove upward again, located by limited block (2), handle (3) will be tested again be rotated counterclockwise 90 degree and put to guide holder (4) entrance, due to the acting force of test holddown spring (5), imported by guide holder (4), just in time testing needle (7) is pressed in edge on the yellow electrode of product to be tested.
CN201310502441.7A 2013-10-23 2013-10-23 A kind of tool for measuring surface mounting crystal electrical quantity Active CN103529247B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310502441.7A CN103529247B (en) 2013-10-23 2013-10-23 A kind of tool for measuring surface mounting crystal electrical quantity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310502441.7A CN103529247B (en) 2013-10-23 2013-10-23 A kind of tool for measuring surface mounting crystal electrical quantity

Publications (2)

Publication Number Publication Date
CN103529247A CN103529247A (en) 2014-01-22
CN103529247B true CN103529247B (en) 2016-01-20

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106996990B (en) * 2016-01-25 2023-05-12 东莞市杰普特光电技术有限公司 Test fixture for simultaneously testing multiple multi-needle laser devices
CN108169618B (en) * 2018-01-08 2021-02-09 四川九洲电器集团有限责任公司 Testing device and testing method
CN110231498A (en) * 2019-07-17 2019-09-13 安徽三优光电科技有限公司 A kind of SMD encapsulation semiconductor devices thermo-resistance measurement fixture

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03215754A (en) * 1990-01-19 1991-09-20 Futsusa Denshi Kogyo:Kk Inspection device for packaged printed board
JPH08288616A (en) * 1995-04-14 1996-11-01 Advantest Corp Pin-socket connector for mounting on substrate
CN2512113Y (en) * 2001-11-08 2002-09-18 致茂电子股份有限公司 Test device for electronic component
CN1740797A (en) * 2004-08-27 2006-03-01 京元电子股份有限公司 Method and apparatus for taking and putting electronic elements waiting for measurement
CN201413341Y (en) * 2009-06-08 2010-02-24 北京耐尔仪器设备有限公司 Fixture for measuring electric parameters of concrete
CN102937658A (en) * 2012-11-15 2013-02-20 昆山迈致治具科技有限公司 Downward-needling test jig
CN203535072U (en) * 2013-10-23 2014-04-09 湖北泰晶电子科技股份有限公司 A jig for measuring patch crystal electrical parameters

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03215754A (en) * 1990-01-19 1991-09-20 Futsusa Denshi Kogyo:Kk Inspection device for packaged printed board
JPH08288616A (en) * 1995-04-14 1996-11-01 Advantest Corp Pin-socket connector for mounting on substrate
CN2512113Y (en) * 2001-11-08 2002-09-18 致茂电子股份有限公司 Test device for electronic component
CN1740797A (en) * 2004-08-27 2006-03-01 京元电子股份有限公司 Method and apparatus for taking and putting electronic elements waiting for measurement
CN201413341Y (en) * 2009-06-08 2010-02-24 北京耐尔仪器设备有限公司 Fixture for measuring electric parameters of concrete
CN102937658A (en) * 2012-11-15 2013-02-20 昆山迈致治具科技有限公司 Downward-needling test jig
CN203535072U (en) * 2013-10-23 2014-04-09 湖北泰晶电子科技股份有限公司 A jig for measuring patch crystal electrical parameters

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Address after: 441300 Zengdou Economic Development Zone, Suizhou District, Hubei Province, Hubei (Polytron Technologies Inc)

Patentee after: Taijing Technology Co., Ltd

Address before: 441300 Zengdou Economic Development Zone, Suizhou District, Hubei Province, Hubei (Polytron Technologies Inc)

Patentee before: HUBEI TKD ELECTRONIC TECHNOLOGY Co.,Ltd.