CN103529247A - Jig for measuring electrical parameters of surface-mounted crystals - Google Patents
Jig for measuring electrical parameters of surface-mounted crystals Download PDFInfo
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- CN103529247A CN103529247A CN201310502441.7A CN201310502441A CN103529247A CN 103529247 A CN103529247 A CN 103529247A CN 201310502441 A CN201310502441 A CN 201310502441A CN 103529247 A CN103529247 A CN 103529247A
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- test
- jig
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- handle
- electrical parameters
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Abstract
The invention relates to the field of jigs, particularly to a jig for measuring electrical parameters of surface-mounted crystals. The jig is characterized in that a limiting block is mounted on a test jig base; a guide shaft is mounted inside a hole of a test handle; a test press spring is arranged below the guide shaft; a base of the test handle is clamped on a guide base; and test pins are installed at the lower end of the test handle. With the adoption of the technical scheme, a method for measuring the electrical parameters of the surface-mounted crystals is simple, the manpower is saved, the production efficiency is improved, and the production cost is reduced.
Description
Technical field
The present invention relates to tool field, is a kind of for measuring the tool of surface mounting crystal electrical quantity.
Background technology
At surface mounting crystal production field, production run need to be spot-check test electrical quantity to the product having encapsulated, and does not have in the market a kind of test fixture to be applicable to this small surface mounting crystal.
Summary of the invention
The object of the invention is to provide a kind of for measuring the tool of surface mounting crystal electrical quantity.
Technical scheme of the present invention is: a kind of for measuring the tool of surface mounting crystal electrical quantity, it is characterized in that, on measurement jig base, limited block is housed; On in the hole of test handle, have the axis of guide, have test holddown spring under the axis of guide, the base of test handle is installed on guide holder, and there is testing needle the lower end of test handle.
Owing to having adopted technique scheme, measure surface mounting crystal electrical quantity method simple, saved manpower, improved production efficiency, reduced production cost.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
In the drawings: 1, measurement jig base; 2, limited block; 3, test handle; 4, guide holder; 5, test holddown spring; 6, the axis of guide; 7, testing needle.
Embodiment
Below in conjunction with embodiment, the present invention is further illustrated.
In Fig. 1, limited block 2 is housed on measurement jig base 1; On in the hole of test handle 3, have the axis of guide 6, the axis of guide has test holddown spring 5 for 6 times, and the base of test handle 3 is installed on guide holder 4, and there is testing needle 7 lower end of test handle 3.
Embodiment, first test handle 3 is upwards carried, dextrorotation turn 90 degrees the top of putting to guide holder 4, with tweezers, product test electrode to be tested is put into tool groove upward again, by limited block 2, locate, then test handle 3 is rotated counterclockwise to 90 degree puts to guide holder 4 entrances, acting force due to test holddown spring 5, by guide holder 4, import, just in time testing needle 7 is pressed in to edge on the yellow electrode of product to be tested, to be measured completing taken out product.
Claims (1)
1. for measuring a tool for surface mounting crystal electrical quantity, it is characterized in that being equipped with limited block (2) on measurement jig base (1); On in the hole of test handle (3), there is the axis of guide (6), under the axis of guide (6), there is test holddown spring (5), it is upper that the base of test handle (3) is installed on guide holder (4), and there is testing needle (7) lower end of test handle (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310502441.7A CN103529247B (en) | 2013-10-23 | 2013-10-23 | A kind of tool for measuring surface mounting crystal electrical quantity |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310502441.7A CN103529247B (en) | 2013-10-23 | 2013-10-23 | A kind of tool for measuring surface mounting crystal electrical quantity |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103529247A true CN103529247A (en) | 2014-01-22 |
| CN103529247B CN103529247B (en) | 2016-01-20 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310502441.7A Active CN103529247B (en) | 2013-10-23 | 2013-10-23 | A kind of tool for measuring surface mounting crystal electrical quantity |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103529247B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106996990A (en) * | 2016-01-25 | 2017-08-01 | 东莞市杰普特光电技术有限公司 | It is a kind of while testing the test fixture of multiple spininess laser devices |
| CN108169618A (en) * | 2018-01-08 | 2018-06-15 | 四川九洲电器集团有限责任公司 | A kind of test device and test method |
| CN110231498A (en) * | 2019-07-17 | 2019-09-13 | 安徽三优光电科技有限公司 | A kind of SMD encapsulation semiconductor devices thermo-resistance measurement fixture |
Citations (7)
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|---|---|---|---|---|
| JPH03215754A (en) * | 1990-01-19 | 1991-09-20 | Futsusa Denshi Kogyo:Kk | Inspection device for packaged printed board |
| JPH08288616A (en) * | 1995-04-14 | 1996-11-01 | Advantest Corp | Pin-socket connector for mounting on substrate |
| CN2512113Y (en) * | 2001-11-08 | 2002-09-18 | 致茂电子股份有限公司 | Test device for electronic component |
| CN1740797A (en) * | 2004-08-27 | 2006-03-01 | 京元电子股份有限公司 | Method and apparatus for taking and putting electronic elements waiting for measurement |
| CN201413341Y (en) * | 2009-06-08 | 2010-02-24 | 北京耐尔仪器设备有限公司 | Fixture for measuring electric parameters of concrete |
| CN102937658A (en) * | 2012-11-15 | 2013-02-20 | 昆山迈致治具科技有限公司 | Downward-needling test jig |
| CN203535072U (en) * | 2013-10-23 | 2014-04-09 | 湖北泰晶电子科技股份有限公司 | A jig for measuring patch crystal electrical parameters |
-
2013
- 2013-10-23 CN CN201310502441.7A patent/CN103529247B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03215754A (en) * | 1990-01-19 | 1991-09-20 | Futsusa Denshi Kogyo:Kk | Inspection device for packaged printed board |
| JPH08288616A (en) * | 1995-04-14 | 1996-11-01 | Advantest Corp | Pin-socket connector for mounting on substrate |
| CN2512113Y (en) * | 2001-11-08 | 2002-09-18 | 致茂电子股份有限公司 | Test device for electronic component |
| CN1740797A (en) * | 2004-08-27 | 2006-03-01 | 京元电子股份有限公司 | Method and apparatus for taking and putting electronic elements waiting for measurement |
| CN201413341Y (en) * | 2009-06-08 | 2010-02-24 | 北京耐尔仪器设备有限公司 | Fixture for measuring electric parameters of concrete |
| CN102937658A (en) * | 2012-11-15 | 2013-02-20 | 昆山迈致治具科技有限公司 | Downward-needling test jig |
| CN203535072U (en) * | 2013-10-23 | 2014-04-09 | 湖北泰晶电子科技股份有限公司 | A jig for measuring patch crystal electrical parameters |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106996990A (en) * | 2016-01-25 | 2017-08-01 | 东莞市杰普特光电技术有限公司 | It is a kind of while testing the test fixture of multiple spininess laser devices |
| CN106996990B (en) * | 2016-01-25 | 2023-05-12 | 东莞市杰普特光电技术有限公司 | Test fixture for simultaneously testing multiple multi-needle laser devices |
| CN108169618A (en) * | 2018-01-08 | 2018-06-15 | 四川九洲电器集团有限责任公司 | A kind of test device and test method |
| CN110231498A (en) * | 2019-07-17 | 2019-09-13 | 安徽三优光电科技有限公司 | A kind of SMD encapsulation semiconductor devices thermo-resistance measurement fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103529247B (en) | 2016-01-20 |
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| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
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Address after: 441300 Zengdou Economic Development Zone, Suizhou District, Hubei Province, Hubei (Polytron Technologies Inc) Patentee after: Taijing Technology Co., Ltd Address before: 441300 Zengdou Economic Development Zone, Suizhou District, Hubei Province, Hubei (Polytron Technologies Inc) Patentee before: HUBEI TKD ELECTRONIC TECHNOLOGY Co.,Ltd. |
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| CP01 | Change in the name or title of a patent holder |