CN202599998U - Low-resistance spring-free tool - Google Patents

Low-resistance spring-free tool Download PDF

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Publication number
CN202599998U
CN202599998U CN 201120562523 CN201120562523U CN202599998U CN 202599998 U CN202599998 U CN 202599998U CN 201120562523 CN201120562523 CN 201120562523 CN 201120562523 U CN201120562523 U CN 201120562523U CN 202599998 U CN202599998 U CN 202599998U
Authority
CN
China
Prior art keywords
low
probe
resistance
test
drum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
CN 201120562523
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Chinese (zh)
Inventor
郭红建
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZHUHAI TOYON ELECTRONIC Co Ltd
Original Assignee
ZHUHAI TOYON ELECTRONIC Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZHUHAI TOYON ELECTRONIC Co Ltd filed Critical ZHUHAI TOYON ELECTRONIC Co Ltd
Priority to CN 201120562523 priority Critical patent/CN202599998U/en
Application granted granted Critical
Publication of CN202599998U publication Critical patent/CN202599998U/en
Anticipated expiration legal-status Critical
Withdrawn - After Issue legal-status Critical Current

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Abstract

The utility model relates to a low-resistance spring-free tool. And the existing tool can not meet requirements of high density and low resistance of testing of a printed circuit board. The low-resistance spring-free tool comprises a dial, a wire coil and a test interface. The dial is formed by one or more insulating boards and through holes corresponding to test points of a to-be-tested board are also arranged; and probes are arranged inside the through holes. The wire coil is formed by one or more insulating boards and holes corresponding to the through holes arranged on the lower surface of the dial are also arranged; and leads are arranged inside the holes and one ends of the leads are connected to the test interfaces. The diameter of each of the probes is arranged between 0.015 to 0.15 mm and the probes are made of piano wires or rhenium tungsten wires; and the dial is pressed on the wire coil and the probes are pressed at the upper ends of the corresponding leads. According to the utility model, the low-resistance spring-free tool with advantages of simple structure, low resistance, and high density can be widely applied to detection processes of various printed circuit boards.

Description

Low-resistance does not have the spring tool
Technical field
The utility model relates to a kind of low-resistance does not have the spring tool.
Background technology
Electronic component on the circuit board should be with suitable circuit serial or parallel connection, to reach a certain specific effect.As be short-circuited or open circuit, circuit board can't use.Therefore, must be before circuit board dispatches from the factory through test, complicated circuit and number of electronic components on the circuit board are too many, in the test process of electronic component, need rely on measurement jig again, cooperate Test Host to accomplish the test job of electronic component.
Existing measurement jig is a probe press formula tool, and it is made up of dials, drum, probe, spring line, test interface; Dials is made up of one or more insulcrete, has the hole corresponding with printed board to be measured on the dials, places probe in the hole; Drum is made up of one or more insulcrete, have on the drum with the corresponding hole, hole of last piece plate of dials in place the spring line, a section of spring line is connected with test interface, test interface is connected with test machine.
Dials and drum are grouped together, and one section contact measured plate of probe other end passes through the spring line, spring line test interface, and test interface is accomplished test through test machine.
Along with the printed circuit board test point is more and more closeer, solder joint is more and more meticulousr, and low-resistance requires increasingly high, and existing tool can't satisfy high density, the low resistance requirement of printed circuit board test.
The utility model content
The technical matters that the utility model will solve is the above-mentioned defective that how to overcome prior art, provides a kind of low-resistance that can solve high density, low resistance, slight open circuit, slight short circuit simple in structure not have the spring tool.
For solving the problems of the technologies described above, this low-resistance does not have the spring tool and comprises dials, drum and test interface, and dials is made up of one or more insulcrete, and has the through hole corresponding with the test point of test plate (panel) to be measured, places probe in the through hole; Drum is made up of one or more insulcrete; And have with the dials lower surface on the corresponding hole of through hole, place lead in the hole, the lead other end is connected on the test interface; It is characterized in that: said probe diameter is between 0.05~0.15mm; Processed by piano wire or rhenium tungsten filament, dials is pressed on the drum, and probe is pressed in the upper end of respective wire.Lead can be selected enameled wire or ok line for use.
So design, the probe of employing particular design has saved spring, and probe aperture can be thinner on the one hand, adapts to the high density requirement of tool, and probe directly is connected with lead on the other hand, and contact resistance is little, adapts to the low-resistance requirement of tool.
As optimization, said probe scribbles insullac or is wrapped with insulation course except that two ends are exposed on the needle body.So design, can prevent the probe bend by pressure after, be in contact with one another short circuit.
As optimization, the two ends exposed part of said probe is electroplated one deck nickel, and nickel is electroplated one deck gold outward again.So design can prevent the probe oxidation, get rusty, and causes the tool resistance to raise.
As optimization, said probe two ends point, length is 30mm.So design facts have proved that above-mentioned length effect is best.
As optimization, one deck nickel is electroplated in the lead upper end of exposing on the said drum, and nickel is electroplated one deck gold outward again.So design, in the use, can oxidation, get rusty, cause the tool resistance to raise.
As optimization, adopt between said lead and the test interface to be welded to connect.So design, in the use, can oxidation, get rusty, cause the tool resistance to raise.
The advantage of the utility model patent:
1, an end of ok line or enameled wire and probe contact directly and the probe contact has been saved and probe between spring, reduced contact resistance and improved measuring accuracy.
2, an end of ok line or enameled wire test interface connection adopts the manufacture craft of welding, has reduced contact resistance and has improved the stability of test.
3, ok line or enameled wire after inserting drum and the corresponding part of probe to electroplate (first nickel plating is gold-plated again) and prevent that oxidation in use from reducing resistance;
4, ok line or enameled wire prevent in the conductor wire use loosening after inserting drum with glue fixing;
5, change test interface can with the supporting use of various test machines;
After adopting such scheme; It is simple in structure that this low-resistance does not have spring tool manufacture craft; Can solve the technical matters of tool low-resistance test, the resistance of common tool is approximately 50-150 Ω, and the utility model low-resistance can reach 1-10 Ω; And the advantage of certain compatibility is arranged, in the testing process of various printed circuit board (PCB)s.
Description of drawings
Below in conjunction with accompanying drawing the utility model low-resistance not being had the spring tool is described further:
Fig. 1 is the structural representation that this low-resistance does not have the spring tool;
Fig. 2 is the process schematic representation that this low-resistance does not have spring tool manufacturing approach.
Among the figure: 1 is that dials, 2 is that drum, 3 is that test interface, 4 is that test plate (panel) to be measured, 5 is that probe, 6 is that lead, 7 is that Lycra cloth, 8 is dials height control plate.
Embodiment
Embodiment one: as shown in Figure 1, this low-resistance does not have the spring tool and comprises dials 1, drum 2 and test interface 3, and dials 1 is made up of three insulcretes, and has the through hole corresponding with the test point of test plate (panel) 4 to be measured, places probe 5 in the through hole; Drum 2 is made up of an insulcrete, and have with the dials lower surface on the corresponding hole of through hole, place lead 6 in the hole, lead 6 other ends are connected on the test interface 3 through welding manner.Said probe 5 diameters are processed by piano wire or rhenium tungsten filament between 0.05~0.15mm, and dials 1 is pressed on the drum 2, and probe 5 is pressed in the upper end of respective wire 7.
Said probe 5 scribbles insullac or is wrapped with insulation course except that two ends are exposed on the needle body.The two ends exposed part of said probe 5 is electroplated one deck nickel, and nickel is electroplated one deck gold outward again.Said probe 5 two ends point, length is 30mm.One deck nickel is electroplated in lead 7 upper ends of exposing on the said drum 2, and nickel is electroplated one deck gold outward again, and figure slightly.
This low-resistance does not have the manufacturing approach of spring tool, and is as shown in Figure 2, comprises the steps:
A. make dials 1: according to the distribution situation of the test point of test plate (panel) 4 to be measured, on insulcrete, punch, above-mentioned insulcrete and Lycra cloth 7 (or sponge) are superimposed, form dials 1;
B. make or buying probe 5: probe 5 is processed by piano wire or rhenium tungsten filament, except that two ends are exposed, scribble insullac on the needle body or is wrapped with insulation course, and its diameter is between 0.05~0.15mm;
C. probe 5 is inserted in the dials 1;
D. make drum 2: according to the distribution situation of the test point of test plate (panel) 4 to be measured, on insulcrete, punch, above-mentioned insulcrete is superimposed, form drum 2;
E. connect drum 2 and test interface 3 with lead 6: the lead 6 of getting respective numbers; The insullac or the insulation course of lead 7 one ends are removed; And according to electroplating one deck nickel, re-plating one deck is golden, and will hold in the respective aperture of inserting drum 2; And gluing is fixed the respective terminal of the other end connection test interface 3 of lead 6;
F. assembled formation: dials 1 is pressed on the drum 2, and makes probe 5 be pressed in the upper end of respective wire 6, get final product.

Claims (6)

1. a low-resistance does not have the spring tool, comprises dials, drum and test interface, and dials is made up of one or more insulcrete, and has the through hole corresponding with the test point of test plate (panel) to be measured, places probe in the through hole; Drum is made up of one or more insulcrete; And have with the dials lower surface on the corresponding hole of through hole, place lead in the hole, the lead other end is connected on the test interface; It is characterized in that: said probe diameter is between 0.05~0.15mm; Processed by piano wire or rhenium tungsten filament, dials is pressed on the drum, and probe is pressed in the upper end of respective wire.
2. low-resistance according to claim 1 does not have the spring tool, it is characterized in that: said probe scribbles insullac or is wrapped with insulation course except that two ends are exposed on the needle body.
3. low-resistance according to claim 2 does not have the spring tool, it is characterized in that: the two ends exposed part of said probe is electroplated one deck nickel, and nickel is electroplated one deck gold outward again.
4. do not have the spring tool according to claim 1 or 2 or 3 described low-resistances, it is characterized in that: said probe two ends point, length is 30mm.
5. low-resistance according to claim 4 does not have the spring tool, it is characterized in that: one deck nickel is electroplated in the lead upper end of exposing on the said drum, and nickel is electroplated one deck gold outward again.
6. low-resistance according to claim 4 does not have the spring tool, it is characterized in that: adopt between said lead and the test interface to be welded to connect.
CN 201120562523 2011-12-29 2011-12-29 Low-resistance spring-free tool Withdrawn - After Issue CN202599998U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201120562523 CN202599998U (en) 2011-12-29 2011-12-29 Low-resistance spring-free tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201120562523 CN202599998U (en) 2011-12-29 2011-12-29 Low-resistance spring-free tool

Publications (1)

Publication Number Publication Date
CN202599998U true CN202599998U (en) 2012-12-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201120562523 Withdrawn - After Issue CN202599998U (en) 2011-12-29 2011-12-29 Low-resistance spring-free tool

Country Status (1)

Country Link
CN (1) CN202599998U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102419383A (en) * 2011-12-29 2012-04-18 珠海拓优电子有限公司 Low-resistivity spring-free jig and manufacturing method thereof
CN110865295A (en) * 2019-10-30 2020-03-06 武汉光庭信息技术股份有限公司 Onboard IC pin signal test fixture

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102419383A (en) * 2011-12-29 2012-04-18 珠海拓优电子有限公司 Low-resistivity spring-free jig and manufacturing method thereof
CN110865295A (en) * 2019-10-30 2020-03-06 武汉光庭信息技术股份有限公司 Onboard IC pin signal test fixture

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C14 Grant of patent or utility model
GR01 Patent grant
AV01 Patent right actively abandoned

Granted publication date: 20121212

Effective date of abandoning: 20141001

RGAV Abandon patent right to avoid regrant