CN2658473Y - Spring special for electronic and test industry - Google Patents
Spring special for electronic and test industry Download PDFInfo
- Publication number
- CN2658473Y CN2658473Y CN 200320117477 CN200320117477U CN2658473Y CN 2658473 Y CN2658473 Y CN 2658473Y CN 200320117477 CN200320117477 CN 200320117477 CN 200320117477 U CN200320117477 U CN 200320117477U CN 2658473 Y CN2658473 Y CN 2658473Y
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- CN
- China
- Prior art keywords
- spring
- special purpose
- purpose spring
- test industry
- shape
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to a special-purpose spring used for electronic test industries and consists of a connecting portion on the top, an extensible portion at the middle and a rear portion which are successively wounded through a spring wire in a clockwise or a counter-clockwise direction. The connecting portion is composed of an under pin section and a top pin-clamped section inserted by an underside of a probe. The minimum internal diameter of the under pin section is smaller than the external diameter of the underside of the probe to be combined. The rear portion is wound together by the spring wire. The utility model integrates with the probe when in use without any mutual escapement because the connecting portion is arranged; has a reliable electric connection, thereby ensuring the further improvement of the accuracy and efficiency; also is convenient for the repeated use of the special-purpose spring and the utilization rate of the special-purpose spring is enhanced because the probe or special-purpose spring is convenient to maintain and exchange.
Description
Technical field
The utility model relates to a kind of electronics and test industry special purpose spring.
Background technique
All need to be used for the quality status of testing circuit plate and electronic product in electronics and test industry with special purpose spring and probe combinations together.Existing special purpose spring is the holder portion that supports that is provided with one section weak point at the top of common spring, this special purpose spring and probe are after two separate components place testing apparatuss such as tool, the holder portion that supports of special purpose spring is used to hold the bottom of probe and location contact with it, it is unreliable that the said structure of this special purpose spring makes it and contacting of probe conduct electricity, and influences the accuracy and the efficient of probe test.In addition, the afterbody of this special purpose spring is connected with lead, is not easy to maintenance and changes spring, and spring also is not easy to reuse, and its utilization ratio is not high.
Summary of the invention
The purpose of this utility model is the problems referred to above at existing special purpose spring existence, can further improve with good test accuracy and the efficient of guaranteeing of probe conduction thereby provide a kind of, and convenient maintenance and replacement, the reusable electronics of energy and test industry special purpose spring.
The purpose of this utility model is achieved in that the utility model is made up of the belled part at top, middle pars contractilis, afterbody, they by a spring wire with coiled continuously clockwise or counterclockwise, described belled part by top for the probe bottom tightly insert in wherein card pin section and following thimble section form, the minimum place internal diameter of thimble section is less than the external diameter for the treatment of the combination probe bottom.
Technique effect of the present utility model is: the utility model is owing to be provided with the belled part at the top, connect into an integral body with probe in use, can not break away from mutually,, thereby can guarantee the accuracy of testing and the further raising of efficient so conduction is very reliable between this special purpose spring and the probe.In addition because the utility model is connected as a whole in use with probe, when being taken out from testing apparatus, can together take out special purpose spring by probe, conveniently probe and spring are keeped in repair and change, and special purpose spring is reusable, has improved its utilization ratio.
The utility model is described in further detail below in conjunction with drawings and Examples.
Description of drawings
Fig. 1 is the utility model embodiment one a plan view.
Fig. 2 is embodiment one the special purpose spring and the combination assumption diagram of probe.
Fig. 3 is the utility model embodiment two a plan view.
Fig. 4 is the utility model embodiment three a plan view.
Fig. 5 is the utility model embodiment four a plan view.
Fig. 6 is the plan view of card pin section among Fig. 5.
Fig. 7 to Fig. 9 is respectively three kinds of structural drawing of afterbody in the utility model special purpose spring.
Embodiment
As Fig. 1, shown in Figure 2, embodiment one special purpose spring is with counterclockwise continuous coiled by a spring wire, the belled part 1 that is divided into the top, middle pars contractilis 2 and 3 three parts of afterbody, belled part 1 is made up of top card pin section 11 and following thimble section 12, card pin section 11 is crooked shape, after the bottom of probe 4 inserts in wherein as shown in Figure 2, card pin section 11 becomes straight shape by crooked deformation, its spring-back force makes probe 4 tightly insert in it and is difficult for deviating from, thimble section 12 is inverted funnel shape, close up coiled by spring wire, its minimum place internal diameter is less than the external diameter for the treatment of combination probe 4 bottoms, to withstand probe 4, pars contractilis 2 plays a part flexible, be provided with a place at pars contractilis 2 and close up the section of closing up 21 that forms around 3 circles by spring wire, the design of the section of closing up 21 can increase the intensity of pars contractilis 2, the external diameter of the section of closing up 21 is consistent with the maximum outside diameter of belled part 1 in the pars contractilis 2, and the external diameter of the other parts of pars contractilis 2 is less than the maximum outside diameter of belled part 1, its external diameter difference is less than the twice of spring wire diameter, the external diameter of pars contractilis also can equal the maximum outside diameter of belled part in the utility model, and the maximum outside diameter of pars contractilis is not more than the maximum outside diameter of belled part in a word.Aforementioned afterbody 3 is the funnel shapes of being closed up coiled by spring wire, afterbody 3 be used for lead by contacting or fixedly connected mode conducting, its biggest place external diameter is consistent with the maximum outside diameter of belled part 1.
As shown in Figure 3, embodiment two is with embodiment one difference: its card pin section 5 is dislocation shape, in this section stagger in the position of each coil spring line, after the bottom for the treatment of combination probe inserts in wherein, block pin section 5 and become straight shape, make probe under the effect of all directions spring-back force, tightly insert in it and be difficult for deviating from by dislocation deformation.The card pin section of dislocation shape can adopt various dislocation modes in the utility model, as symmetry dislocation mode, asymmetric dislocation mode, irregular dislocation mode, etc.
As shown in Figure 4, embodiment three is with embodiment one difference: its card pin section 6 is for cylindrical, and its internal diameter is designed to match with the external diameter for the treatment of the combination probe bottom, makes them be combined into an integral body.
As Fig. 5, shown in Figure 6, embodiment four is identical with embodiment three main structure, and difference is: be provided with the salient point 8 of the inside coiled of spring wire on every circle in columniform card pin section 7 of the embodiment four, be used to block and treat that combination probe tightly inserts in this card pin section 7 probe.Salient point can not be provided with on every circle of card pin section yet, can be provided in a side of on a circle or the multi-turn.
The card pin section of the utility model special purpose spring can also adopt other shape except adopting above-mentioned different shape, as one of crooked shape, dislocation shape, cylindrical shape that combines mutually.
The section of closing up can be provided with at the 1-4 place in the pars contractilis of the utility model special purpose spring, and the spring wire number of turns of the section of closing up can be the 2-8 circle;
The afterbody of the utility model special purpose spring can also adopt other shape except the funnel shape in the foregoing description, T shape y-shaped, shown in Figure 9 tubaeform, shown in Figure 8 as shown in Figure 7, or their shapes of combining.
Claims (11)
1. electronics and test industry special purpose spring, it is characterized in that: form by the belled part at top, middle pars contractilis, afterbody, they by a spring wire with coiled continuously clockwise or counterclockwise, described belled part by top for the probe bottom tightly insert in wherein card pin section and following thimble section form, the minimum place internal diameter of thimble section is less than the external diameter for the treatment of the combination probe bottom.
2. electronics according to claim 1 and test industry special purpose spring is characterized in that: described thimble section is for falling funnel shape.
3. electronics according to claim 1 and 2 and test industry special purpose spring, it is characterized in that: described card pin section is crooked shape.
4. electronics according to claim 1 and 2 and test industry special purpose spring is characterized in that: described card pin section is dislocation shape.
5. electronics according to claim 1 and 2 and test industry special purpose spring, it is characterized in that: described card pin section is cylindrical, its internal diameter matches with the external diameter for the treatment of the combination probe bottom.
6. electronics according to claim 5 and test industry special purpose spring, it is characterized in that: be provided with the salient point that the inside coiled of spring wire is used to block probe in described columniform card pin section, described salient point is located on a circle, multi-turn or the every circle of card pin section.
7. electronics according to claim 1 and 2 and test industry special purpose spring is characterized in that: described card pin section is one of crooked shape, dislocation shape, cylindrical shape that combines mutually.
8. electronics according to claim 1 and test industry special purpose spring is characterized in that: described pars contractilis be shaped as the cylindrical of common spring.
9. electronics according to claim 1 and test industry special purpose spring is characterized in that: described pars contractilis is provided with the 1-4 place and is closed up the section of closing up that forms around the 2-8 circle by spring wire.
10. electronics according to claim 8 and test industry special purpose spring, it is characterized in that: the maximum outside diameter of described pars contractilis is not more than the maximum outside diameter of belled part.
11. electronics according to claim 1 and test industry special purpose spring is characterized in that: described afterbody is the shape that one of funnel shape, tubaeform, y-shaped, T shape or they combine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200320117477 CN2658473Y (en) | 2003-10-23 | 2003-10-23 | Spring special for electronic and test industry |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200320117477 CN2658473Y (en) | 2003-10-23 | 2003-10-23 | Spring special for electronic and test industry |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2658473Y true CN2658473Y (en) | 2004-11-24 |
Family
ID=34346773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200320117477 Expired - Fee Related CN2658473Y (en) | 2003-10-23 | 2003-10-23 | Spring special for electronic and test industry |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2658473Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103133582A (en) * | 2013-01-29 | 2013-06-05 | 广州奥图弹簧有限公司 | Double-wire parallel winding close-wound spring, manufacturing method and manufacturing device thereof |
| CN107607753A (en) * | 2017-09-20 | 2018-01-19 | 上达电子（深圳）股份有限公司 | A kind of measurement jig novel probe |
-
2003
- 2003-10-23 CN CN 200320117477 patent/CN2658473Y/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103133582A (en) * | 2013-01-29 | 2013-06-05 | 广州奥图弹簧有限公司 | Double-wire parallel winding close-wound spring, manufacturing method and manufacturing device thereof |
| CN107607753A (en) * | 2017-09-20 | 2018-01-19 | 上达电子（深圳）股份有限公司 | A kind of measurement jig novel probe |
| CN107607753B (en) * | 2017-09-20 | 2021-08-17 | 上达电子（深圳）股份有限公司 | Novel probe of test fixture |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |