CN107525585B - 光谱分析设备、光谱分析方法以及光谱图显示的方法 - Google Patents

光谱分析设备、光谱分析方法以及光谱图显示的方法 Download PDF

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CN107525585B
CN107525585B CN201710684666.7A CN201710684666A CN107525585B CN 107525585 B CN107525585 B CN 107525585B CN 201710684666 A CN201710684666 A CN 201710684666A CN 107525585 B CN107525585 B CN 107525585B
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wavelength
light
detection
spectrogram
particle analysis
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CN107525585A (zh
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新田尚
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Sony Corp
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Sony Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0264—Electrical interface; User interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1006—Investigating individual particles for cytology

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Dispersion Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Signal Processing (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201710684666.7A 2011-09-13 2012-09-12 光谱分析设备、光谱分析方法以及光谱图显示的方法 Active CN107525585B (zh)

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JP2011199901A JP5817369B2 (ja) 2011-09-13 2011-09-13 スペクトル解析装置及び微小粒子測定装置、並びにスペクトル解析あるいはスペクトルチャート表示のための方法及びプログラム
JP2011-199901 2011-09-13
CN201280043375.5A CN103797356B (zh) 2011-09-13 2012-09-12 光谱分析设备、细颗粒测量设备以及用于光谱分析或光谱图显示的方法和程序

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CN107525585A CN107525585A (zh) 2017-12-29
CN107525585B true CN107525585B (zh) 2020-09-18

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CN201710684666.7A Active CN107525585B (zh) 2011-09-13 2012-09-12 光谱分析设备、光谱分析方法以及光谱图显示的方法
CN201280043375.5A Active CN103797356B (zh) 2011-09-13 2012-09-12 光谱分析设备、细颗粒测量设备以及用于光谱分析或光谱图显示的方法和程序
CN201710684600.8A Active CN107525759B (zh) 2011-09-13 2012-09-12 光谱分析设备、光谱分析方法以及光谱图显示的方法
CN201710684328.3A Active CN107462327B (zh) 2011-09-13 2012-09-12 光谱分析设备、光谱分析方法以及光谱图显示的方法

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CN201710684600.8A Active CN107525759B (zh) 2011-09-13 2012-09-12 光谱分析设备、光谱分析方法以及光谱图显示的方法
CN201710684328.3A Active CN107462327B (zh) 2011-09-13 2012-09-12 光谱分析设备、光谱分析方法以及光谱图显示的方法

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US (3) US10782224B2 (https=)
EP (2) EP3454046B1 (https=)
JP (1) JP5817369B2 (https=)
CN (4) CN107525585B (https=)
WO (1) WO2013038660A1 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5817369B2 (ja) * 2011-09-13 2015-11-18 ソニー株式会社 スペクトル解析装置及び微小粒子測定装置、並びにスペクトル解析あるいはスペクトルチャート表示のための方法及びプログラム
JP6623551B2 (ja) * 2015-05-15 2019-12-25 ソニー株式会社 情報処理装置、情報処理システム及び情報処理方法
JP6699102B2 (ja) * 2015-07-27 2020-05-27 ソニー株式会社 微小粒子測定装置及び情報処理方法
CN106153592A (zh) * 2016-08-18 2016-11-23 刘华英 用于光谱仪的背景扣除方法和装置
WO2019209977A1 (en) 2018-04-26 2019-10-31 Becton, Dickinson And Company Biexponential transformation for particle sorters
CN109580495B (zh) * 2018-11-28 2021-08-24 重庆工商大学 一种基于高光谱图像的解混装置及方法
US12461012B2 (en) 2019-06-24 2025-11-04 Sony Group Corporation Particle analysis system having autofluorescence spectrum correction
TWI726446B (zh) * 2019-08-11 2021-05-01 新加坡商克雷多生物醫學私人有限公司 分析系統及其分析方法
JP7451926B2 (ja) * 2019-10-10 2024-03-19 ソニーグループ株式会社 情報処理装置、粒子測定装置、情報処理方法、粒子測定方法、及びコンピュータプログラム
JP2021103139A (ja) * 2019-12-25 2021-07-15 ソニーグループ株式会社 情報処理装置、粒子測定装置、粒子測定システム、粒子分取装置、粒子分取システム、情報処理方法、及び情報処理プログラム
US12429479B2 (en) * 2022-02-18 2025-09-30 Idexx Laboratories Inc. Flow cytometry systems and methods for presenting two-dimensional dot plot
JP7739535B1 (ja) * 2024-06-19 2025-09-16 浜松ホトニクス株式会社 信号処理方法、信号処理装置、及び信号処理システム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0564157A1 (en) * 1992-04-01 1993-10-06 Toa Medical Electronics Co., Ltd. Apparatus for analyzing particles
CN1494655A (zh) * 2001-01-26 2004-05-05 ¿ 多通道生物分离系统中的光学检测
CN101074915A (zh) * 2006-05-15 2007-11-21 欧姆龙株式会社 异物检测装置及异物检测方法
CN101726461A (zh) * 2008-10-16 2010-06-09 索尼株式会社 光学测量设备

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2096367B (en) * 1981-04-02 1984-09-12 Solartron Electronic Group The Digital signal processing apparatus
US4573796A (en) * 1984-01-06 1986-03-04 The United States Of America As Represented By The United States Department Of Energy Apparatus for eliminating background interference in fluorescence measurements
US5123731A (en) * 1988-02-01 1992-06-23 Canon Kabushiki Kaisha Particle measuring device
EP0884583A1 (en) 1997-06-10 1998-12-16 Evotec BioSystems GmbH A method for characterizing samples in at least two dimensional space of specific physical properties
US6461813B2 (en) * 1998-09-21 2002-10-08 Rigel Pharmaceuticals, Inc. Multiparameter FACS assays to detect alterations in cell cycle regulation
US7257518B2 (en) * 2001-02-28 2007-08-14 Felix Alba Consultants, Inc. Fundamental method and its hardware implementation for the generic prediction and analysis of multiple scattering of waves in particulate composites
JP2003083894A (ja) 2001-09-14 2003-03-19 Sumitomo Electric Ind Ltd 蛍光値補正方法、蛍光値補正装置、蛍光値補正プログラム及び前記蛍光値補正プログラムを記録した記録媒体
US20060015291A1 (en) * 2002-10-18 2006-01-19 Leland Stanford Junior University Methods and systems for data analysis
US6807010B2 (en) * 2002-11-13 2004-10-19 Eastman Kodak Company Projection display apparatus having both incoherent and laser light sources
US6897954B2 (en) 2002-12-20 2005-05-24 Becton, Dickinson And Company Instrument setup system for a fluorescence analyzer
ATE550099T1 (de) * 2003-04-04 2012-04-15 Hoffmann La Roche Verbessertes system für mehrfarbige echtzeit-pcr
US6983213B2 (en) 2003-10-20 2006-01-03 Cerno Bioscience Llc Methods for operating mass spectrometry (MS) instrument systems
US7268881B2 (en) * 2004-02-17 2007-09-11 The Curators Of The University Of Missouri Light scattering detector
JP2006047069A (ja) * 2004-08-03 2006-02-16 Funai Electric Co Ltd 照明装置
JP4529587B2 (ja) * 2004-08-23 2010-08-25 株式会社ニコン 分光装置及びスペクトルレーザ顕微鏡
WO2006086579A2 (en) 2005-02-09 2006-08-17 Inlight Solutions, Inc. Methods and apparatus for noninvasive determinations of analytes
CN101501464A (zh) * 2005-02-09 2009-08-05 音莱特解决方案有限公司 用于分析物的无创伤性确定的方法及设备
JP4678218B2 (ja) * 2005-03-24 2011-04-27 コニカミノルタホールディングス株式会社 撮像装置及び画像処理方法
WO2006130728A2 (en) * 2005-05-31 2006-12-07 The Regents Of The University Of California Single-cell raman spectroscopy for the non-destructive, non-invasive analysis of cells and cellular components
JP2007298278A (ja) * 2006-04-27 2007-11-15 Sony Corp 表示装置用検査装置
US7676330B1 (en) * 2006-05-16 2010-03-09 Unisys Corporation Method for processing a particle using a sensor structure
US8255267B2 (en) * 2007-07-13 2012-08-28 Wahrheit, Llc System and method for determining relative preferences
JP4389991B2 (ja) * 2007-10-26 2009-12-24 ソニー株式会社 微小粒子の光学的測定方法及び光学的測定装置
US8229678B2 (en) * 2008-07-25 2012-07-24 Beckman Coulter, Inc. Methods and systems for transforming particle data
US8187885B2 (en) 2009-05-07 2012-05-29 Nodality, Inc. Microbead kit and method for quantitative calibration and performance monitoring of a fluorescence instrument
JP5985140B2 (ja) 2010-04-28 2016-09-06 ソニー株式会社 蛍光強度補正方法、蛍光強度算出方法及び蛍光強度算出装置
JP5540952B2 (ja) 2010-07-09 2014-07-02 ソニー株式会社 蛍光強度補正方法及び蛍光強度算出装置
US20130229412A1 (en) * 2010-12-03 2013-09-05 Sony Corporation 3d data analysis apparatus, 3d data analysis method, and 3d data analysis program
CN202027563U (zh) * 2011-01-28 2011-11-09 浙江大学 一种基于干涉光谱相位信息的光谱标定系统
JP5817369B2 (ja) * 2011-09-13 2015-11-18 ソニー株式会社 スペクトル解析装置及び微小粒子測定装置、並びにスペクトル解析あるいはスペクトルチャート表示のための方法及びプログラム
US11640361B2 (en) 2019-03-08 2023-05-02 International Business Machines Corporation Sharing secure memory across multiple security domains

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0564157A1 (en) * 1992-04-01 1993-10-06 Toa Medical Electronics Co., Ltd. Apparatus for analyzing particles
CN1494655A (zh) * 2001-01-26 2004-05-05 ¿ 多通道生物分离系统中的光学检测
CN101074915A (zh) * 2006-05-15 2007-11-21 欧姆龙株式会社 异物检测装置及异物检测方法
CN101726461A (zh) * 2008-10-16 2010-06-09 索尼株式会社 光学测量设备

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Publication number Publication date
EP2756286A4 (en) 2015-04-29
EP3454046B1 (en) 2023-07-05
WO2013038660A1 (en) 2013-03-21
US20210080375A1 (en) 2021-03-18
US20250164375A1 (en) 2025-05-22
US10782224B2 (en) 2020-09-22
EP3454046A1 (en) 2019-03-13
CN107462327A (zh) 2017-12-12
US20140222381A1 (en) 2014-08-07
JP2013061246A (ja) 2013-04-04
US12276591B2 (en) 2025-04-15
EP2756286B1 (en) 2018-11-07
EP2756286A1 (en) 2014-07-23
JP5817369B2 (ja) 2015-11-18
CN107462327B (zh) 2020-06-09
CN107525759B (zh) 2020-09-11
CN103797356A (zh) 2014-05-14
CN103797356B (zh) 2017-09-05
CN107525759A (zh) 2017-12-29
CN107525585A (zh) 2017-12-29

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