CN107451989A - 输入装置、输入装置的检查装置、检查方法及检查程序 - Google Patents

输入装置、输入装置的检查装置、检查方法及检查程序 Download PDF

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Publication number
CN107451989A
CN107451989A CN201710208942.2A CN201710208942A CN107451989A CN 107451989 A CN107451989 A CN 107451989A CN 201710208942 A CN201710208942 A CN 201710208942A CN 107451989 A CN107451989 A CN 107451989A
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CN
China
Prior art keywords
input unit
contact
radiography
thing
rubber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710208942.2A
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English (en)
Chinese (zh)
Inventor
松矢隆史
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Fujitsu Ltd
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Fujitsu Ltd
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Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of CN107451989A publication Critical patent/CN107451989A/zh
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • G06T7/73Determining position or orientation of objects or cameras using feature-based methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10116X-ray image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Push-Button Switches (AREA)
  • Input From Keyboards Or The Like (AREA)
  • Manufacture Of Switches (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201710208942.2A 2016-05-13 2017-03-31 输入装置、输入装置的检查装置、检查方法及检查程序 Pending CN107451989A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016097064A JP2017204229A (ja) 2016-05-13 2016-05-13 入力装置、入力装置の検査装置、検査方法および検査プログラム
JP2016-097064 2016-05-13

Publications (1)

Publication Number Publication Date
CN107451989A true CN107451989A (zh) 2017-12-08

Family

ID=60322348

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710208942.2A Pending CN107451989A (zh) 2016-05-13 2017-03-31 输入装置、输入装置的检查装置、检查方法及检查程序

Country Status (2)

Country Link
JP (1) JP2017204229A (ja)
CN (1) CN107451989A (ja)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001126587A (ja) * 1999-10-26 2001-05-11 Shin Etsu Polymer Co Ltd 押釦スイッチ用部材及びその製造方法
TW200524384A (en) * 2004-01-12 2005-07-16 Asustek Comp Inc Translucent key structure and its manufacturing method
CN101809403A (zh) * 2007-09-28 2010-08-18 松下电器产业株式会社 检查装置以及检查方法
CN102944567A (zh) * 2012-11-29 2013-02-27 中国航空综合技术研究所 塑封电子元器件x射线造影检测方法
CN103930772A (zh) * 2011-11-08 2014-07-16 浜松光子学株式会社 非破坏检查装置及非破坏检查装置用的亮度数据的补正方法
CN105258834A (zh) * 2015-10-30 2016-01-20 昆山鸿志犀自动化机电设备有限公司 键帽拉拔力测试用按压模组及键帽拉拔力测试机
CN105551864A (zh) * 2015-12-28 2016-05-04 合肥联宝信息技术有限公司 一种键盘和电子设备

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001126587A (ja) * 1999-10-26 2001-05-11 Shin Etsu Polymer Co Ltd 押釦スイッチ用部材及びその製造方法
TW200524384A (en) * 2004-01-12 2005-07-16 Asustek Comp Inc Translucent key structure and its manufacturing method
CN101809403A (zh) * 2007-09-28 2010-08-18 松下电器产业株式会社 检查装置以及检查方法
CN103930772A (zh) * 2011-11-08 2014-07-16 浜松光子学株式会社 非破坏检查装置及非破坏检查装置用的亮度数据的补正方法
CN102944567A (zh) * 2012-11-29 2013-02-27 中国航空综合技术研究所 塑封电子元器件x射线造影检测方法
CN105258834A (zh) * 2015-10-30 2016-01-20 昆山鸿志犀自动化机电设备有限公司 键帽拉拔力测试用按压模组及键帽拉拔力测试机
CN105551864A (zh) * 2015-12-28 2016-05-04 合肥联宝信息技术有限公司 一种键盘和电子设备

Also Published As

Publication number Publication date
JP2017204229A (ja) 2017-11-16

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Application publication date: 20171208

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