CN107367490B - 一种x射线荧光光谱法分析制样用助研磨添加剂及使用方法 - Google Patents
一种x射线荧光光谱法分析制样用助研磨添加剂及使用方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 11
- 238000004846 x-ray emission Methods 0.000 title claims abstract description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims abstract description 30
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 claims abstract description 15
- RYYKJJJTJZKILX-UHFFFAOYSA-M sodium octadecanoate Chemical compound [Na+].CCCCCCCCCCCCCCCCCC([O-])=O RYYKJJJTJZKILX-UHFFFAOYSA-M 0.000 claims abstract description 13
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Abstract
本发明涉及一种X射线荧光光谱法分析制样用助研磨添加剂及使用方法，添加剂包括乙醇(95％分析纯)、三乙醇胺(分析纯>95％)、硬酯酸钠(分析纯)，乙醇与三乙醇胺按体积比为(1～2)：1；每50毫升乙醇和三乙醇胺混合物中加入3～5克硬酯酸钠。在样品制备的过程中添加本添加剂，使样品在研磨过程中，细小颗粒之间不能产生粒度效应。消除样品粒度之间的吸附力，增加样品颗粒之间的张力，使样品在研磨过程中不能粘附成球状或饼状，阻碍样品粒度的进一步破碎。使样品的破碎粒度最终达到小于0.050mm。
Description
技术领域
本发明涉及一种X射线荧光光谱法分析制样用助研磨添加剂及使用方法。
背景技术
随着X射线荧光光谱仪在无机化学分析领域的越来越多地应用，对样品分析前制样技术的要求越来越高，为了保证分析结果的准确性，要求制样粒度非常苛刻，但是某些熔剂类、球团类样品本身的物理性质使得它们不能达到要求的粒度。
发明内容
本发明所要解决的技术问题是提供一种X射线荧光光谱法分析制样用助研磨添加剂，使得样品粒度可以克服本身的物理性质的缺点，达到X射线荧光光谱仪分析要求的粒度。
为实现上述目的，本发明采用以下技术方案实现：
一种X射线荧光光谱法分析制样用助研磨添加剂，包括：
乙醇(95％分析纯)
三乙醇胺(分析纯>95％)
硬酯酸钠(分析纯)
乙醇与三乙醇胺按体积比为(1～2)：1；
每50毫升乙醇和三乙醇胺混合物中加入3～5克硬酯酸钠。
所述添加剂的使用方法：每20克研磨样品添加1～1.5毫升添加剂。
一种X射线荧光光谱法分析制样用助研磨添加剂的配制方法：按上述比例将乙醇和三乙醇胺制成混合溶液，混合均匀后加入硬酯酸钠充分混合待用。
与现有的技术相比，本发明的有益效果是：
1、在样品制备的过程中添加本添加剂，使样品在研磨过程中，细小颗粒之间不能产生粒度效应。消除样品粒度之间的吸附力，增加样品颗粒之间的张力，使样品在研磨过程中不能粘附成球状或饼状，阻碍样品粒度的进一步破碎。使样品的破碎粒度最终达到小于0.050mm。
2、消除了由于样品的粒度效应、矿物效应而对X射线荧光光谱仪分析结果带来的波动。
3、推动更多的受粒度效应和矿物效应影响的矿物原料使用X射线荧光光谱仪分析。
具体实施方式
下面结合实施例对本发明进一步说明：
以下实施例对本发明进行详细描述。这些实施例仅是对本发明的最佳实施方案进行描述，并不对本发明的范围进行限制。
实施例1
制备球团矿样品40g。
助研磨添加剂制备：乙醇(95％分析纯) 30ml
三乙醇胺(分析纯>95％) 20ml
硬酯酸钠(分析纯) 4g
助研磨添加剂的配制方法：按上述比例将乙醇和三乙醇胺制成混合溶液，混合均匀后加入硬酯酸钠充分混合待用。
在40g样品中加入2ml上述添加剂。破碎粒度最终达到小于0.050mm。
实施例2
制备白云石样品20g。
助研磨添加剂制备：乙醇(95％分析纯) 30ml
三乙醇胺(分析纯>95％) 30ml
硬酯酸钠(分析纯) 5g
助研磨添加剂的配制方法：按上述比例将乙醇和三乙醇胺制成混合溶液，混合均匀后加入硬酯酸钠充分混合待用。
在20g样品中加入1ml上述添加剂。破碎粒度最终达到小于0.050mm。
实施例3
制备石灰石样品40g。
助研磨添加剂制备：乙醇(95％分析纯) 40ml
三乙醇胺(分析纯>95％) 30ml
硬酯酸钠(分析纯) 7g
助研磨添加剂的配制方法：按上述比例将乙醇和三乙醇胺制成混合溶液，混合均匀后加入硬酯酸钠充分混合待用。
在40g样品中加入2ml上述添加剂。破碎粒度最终达到小于0.050mm。
上面所述仅是本发明的基本原理，并非对本发明作任何限制，凡是依据本发明对其进行等同变化和修饰，均在本专利技术保护方案的范畴之内。
Claims (1)
1.一种X射线荧光光谱法分析制样用助研磨添加剂，其特征在于，制备球团矿样品40g,助研磨添加剂的配制方法：按比例将乙醇和三乙醇胺制成混合溶液，混合均匀后加入硬酯酸钠充分混合待用,助研磨添加剂：
乙醇(95％分析纯) 30ml
三乙醇胺(分析纯>95％) 20ml
硬酯酸钠(分析纯) 4g
在40g样品中加入2ml上述添加剂，破碎粒度最终达到小于0.050mm，使样品在研磨过程中，细小颗粒之间不能产生粒度效应，样品在研磨过程中不能粘附成球状或饼状。
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