CN107290639A - A kind of method for the linearity for measuring photodiode response - Google Patents

A kind of method for the linearity for measuring photodiode response Download PDF

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CN107290639A
CN107290639A CN201710451586.7A CN201710451586A CN107290639A CN 107290639 A CN107290639 A CN 107290639A CN 201710451586 A CN201710451586 A CN 201710451586A CN 107290639 A CN107290639 A CN 107290639A
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light source
photodiode
power supply
linearity
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赵永建
张向平
方晓华
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Jinhua Polytechnic
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
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    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

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Abstract

本发明涉及光学测量领域，一种测量光电二极管响应的线性度的方法，光源供电设置：每一步中的待测光电二极管光电流是上一步中的两倍，从较低电流开始，第n步中，光源供电电流IA (n)＝IB (n)＝IAB (n‑1)；记录待测光电二极管光电流IA和IB分别相对于光源I和光源II供电电流的关系，从小到大扫描调节每个光源供电电流值；在第n步中测量的线性度定义为将光源I与光源II在暗箱上的位置互换，重复测量线性度 和之间差异为光源I和光源II的辐射功率在测量过程中产生的漂移变化，通过等式所得结果消除光源功率漂移对线性度测量影响；得到一组平均线性度r(1)、r(2)、…、r(n)。

The invention relates to the field of optical measurement, a method for measuring the linearity of photodiode response, light source power supply setting: the photocurrent of the photodiode to be tested in each step is twice that of the previous step, starting from a lower current, the nth step Among them, the light source supply current I A (n) = I B (n) = I AB (n-1) ; record the relationship between the photodiode photocurrent I A and I B to be measured relative to the light source I and light source II power supply current respectively, Adjust the power supply current value of each light source by scanning from small to large; the linearity measured in the nth step is defined as Exchange the position of light source I and light source II on the dark box, and repeat the measurement of linearity with The difference between is the drift change of the radiant power of light source I and light source II during the measurement process, through the equation The obtained result eliminates the influence of light source power drift on the linearity measurement; a set of average linearity r (1) , r (2) , ..., r (n) is obtained.

Description

一种测量光电二极管响应的线性度的方法A Method of Measuring the Linearity of Photodiode Response

技术领域technical field

本发明涉及光学测量领域，特别是一种无需对光源实施温度稳定操作、能够降低实验条件、成本低的一种测量光电二极管响应的线性度的方法。The invention relates to the field of optical measurement, in particular to a method for measuring the linearity of photodiode response that does not require temperature-stabilized operation of a light source, can reduce experimental conditions, and has low cost.

背景技术Background technique

一个光电二极管的响应率是指其输出的电流信号与输入的辐射量的比值，响应率通常是输入辐射波长的函数；如果一个光电二极管的响应率不随输入辐射的量而变化，则称其为线性的，线性度是光学辐射精密测量的基本需求之一，尤其在光度学和辐射测量学领域，在线性度测量方法中，叠加法是一种基本的方法，由文献【Sanders，C.L.J.Res.NatlBur.Stand.A 1972，76，437】和文献【Sanders，C.L.Appl.Opt.1962，1，207】可知，测量非线性度的叠加法的原理是，两个光源发出的光分别在待测光电二极管中产生的光响应为N1和N2，两个光源的光的总和在待测光电二极管中产生的光响应为N12，如果N1+N2＝N12，则可以认为待测光电二极管是线性的，如果N1+N2≠N12，则非线性度可以由N12/(N1+N2)给出。以上方法中可以使用两个不同的光源或者一个光源和两个不同光阑。The responsivity of a photodiode refers to the ratio of its output current signal to the amount of input radiation, and the responsivity is usually a function of the wavelength of the input radiation; if the responsivity of a photodiode does not change with the amount of input radiation, it is called Linearity, linearity is one of the basic requirements for precision measurement of optical radiation, especially in the field of photometry and radiometry, in the linearity measurement method, the superposition method is a basic method, by the literature [Sanders, CLJRes.NatlBur .Stand.A 1972,76,437] and [Sanders, CLAppl.Opt.1962, 1, 207], it can be known that the principle of the superposition method for measuring nonlinearity is that the light emitted by two light sources is respectively in the photodiode to be tested. The photoresponses generated in N 1 and N 2 are N 1 and N 2 , and the photodiode generated by the sum of the light of the two light sources is N 12 in the photodiode to be tested. If N 1 +N 2 =N 12 , the photodiode to be tested can be considered is linear, and if N 1 +N 2 ≠N 12 , the non-linearity can be given by N 12 /(N 1 +N 2 ). Two different light sources or one light source and two different apertures can be used in the above method.

现有技术使用功率稳定的激光器作为光源，但是其需要激光器有很高的温度稳定性，所述一种测量光电二极管响应的线性度的方法无需对光源实施温度稳定操作，从而能够降低实验条件。The prior art uses a laser with stable power as a light source, but it requires the laser to have high temperature stability. The method for measuring the linearity of the photodiode response does not require temperature-stabilized operation of the light source, thereby reducing experimental conditions.

发明内容Contents of the invention

为了解决上述问题，本发明能够精确地确定待测光电二极管的照明构型，并使得杂散光的影响最小化，无需对光源实施温度稳定操作，能够降低实验条件。In order to solve the above problems, the present invention can accurately determine the illumination configuration of the photodiode to be tested, and minimize the influence of stray light, without implementing a temperature-stabilized operation on the light source, and can reduce experimental conditions.

本发明所采用的技术方案是：The technical scheme adopted in the present invention is:

所述一种测量光电二极管响应的线性度的方法，装置主要包括暗箱、光源I、电源I、计算机、电流表、电源II、光源II、待测光电二极管，所述电源I、计算机、电流表、电源II均位于所述暗箱外，所述光源I、光源II、电源I、电源II、待测光电二极管和电流表均与计算机连接并由计算机控制，所述暗箱为边长500毫米的正方体腔体，所述暗箱内侧表面均匀涂有漫反射材料且具有一开口，所述待测光电二极管安装于所述暗箱的开口处且连接所述电流表，所述光源I、光源II位于所述暗箱内侧表面处、且分别由所述电源I和电源II供电，所述光源I单独工作时，所述待测光电二极管产生光电流IA，所述光源II单独工作时，所述待测光电二极管产生光电流IB。Described a kind of method for measuring the linearity of photodiode response, device mainly comprises dark box, light source I, power supply I, computer, ammeter, power supply II, light source II, photodiode to be tested, described power supply I, computer, ammeter, power supply II are all located outside the dark box, and the light source I, light source II, power supply I, power supply II, photodiode to be tested and ammeter are all connected to the computer and controlled by the computer. The dark box is a cube cavity with a side length of 500 mm. The inner surface of the dark box is evenly coated with diffuse reflection material and has an opening, the photodiode to be measured is installed at the opening of the dark box and connected to the ammeter, the light source I and light source II are located at the inner surface of the dark box, and Powered by the power supply I and the power supply II respectively, when the light source I works alone, the photodiode to be tested produces a photocurrent I A , and when the light source II works alone, the photodiode to be tested produces a photocurrent I B .

所述一种测量光电二极管响应的线性度的方法步骤为：Described a kind of method step of measuring the linearity of photodiode response is:

一.所述光源I、光源II的供电电流按照以下条件设置：使得每一步中的所述待测光电二极管光电流是上一步中的两倍，从较低电流的初始值IA (0)和IB (0)开始，第n步中，设置光源的供电电流IA (n)＝IB (n)＝IAB (n-1)，其中光电流IAB (n-1)表示两个光源同时调节到第(n-1)步时所述待测光电二极管的响应；1. The supply current of the light source I, the light source II is set according to the following conditions: the photodiode photocurrent to be measured in each step is twice that of the previous step, from the initial value I A (0) of the lower current and I B (0) , in the nth step, set the supply current I A (n) of the light source = I B (n) = I AB (n-1) , where the photocurrent I AB (n-1) represents two The response of the photodiode to be tested when a light source is adjusted to (n-1) step simultaneously;

二.记录所述待测光电二极管光电流IA和IB分别相对于所述光源I和光源II的供电电流的关系，从最小值到最大值扫描调节每个光源的供电电流值；2. Record the relationship between the photodiode photocurrent IA and IB to be measured with respect to the power supply current of the light source I and light source II respectively, and scan and adjust the power supply current value of each light source from the minimum value to the maximum value;

三.在第n步中，测量的线性度定义为测量的步骤依次是：时刻tA开启所述光源I，时刻t1＝tA+t读取IA，时刻tB＝t1+t开启所述光源II，时刻t2＝tB+t读取IAB，关闭所述电源I，时刻t3＝t2+t读取IB，关闭所述电源II，读取背底电流，其中时间间隔t典型值为0.5秒；3. In step n, the measured linearity is defined as Measurement The steps are: turn on the light source I at time t A , read I A at time t 1 =t A +t, turn on the light source II at time t B =t 1 +t, and read at time t 2 =t B +t Take I AB , turn off the power supply I, read I B at time t 3 =t 2 +t, turn off the power supply II, and read the background current, where the typical value of the time interval t is 0.5 seconds;

四.将所述光源I与所述光源II在所述暗箱上的位置互换，重复以上步骤来测量此时装置的线性度 4. Exchange the positions of the light source I and the light source II on the dark box, repeat the above steps to measure the linearity of the device at this time

五.和之间的差异为所述光源I和光源II的辐射功率在测量过程中产生的漂移变化，并通过等式所得结果来消除光源功率漂移对线性度测量的影响，从而得到一组平均线性度r(1)、r(2)、…、r(n)。Fives. with The difference between the radiant power of the light source I and light source II is the drift change produced during the measurement, and is given by the equation The obtained results are used to eliminate the influence of light source power drift on the linearity measurement, thereby obtaining a set of average linearity r (1) , r (2) , ..., r (n) .

本发明的有益效果是：The beneficial effects of the present invention are:

本发明能够精确地确定待测光电二极管的照明构型，并使得杂散光的影响最小化，无需对光源实施温度稳定操作，能够降低实验条件。The invention can accurately determine the illumination configuration of the photodiode to be tested, minimize the influence of stray light, and can reduce the experimental conditions without performing temperature stable operation on the light source.

附图说明Description of drawings

下面结合本发明的图形进一步说明：Below in conjunction with figure of the present invention further illustrate:

图1是本发明示意图。Figure 1 is a schematic diagram of the present invention.

图中，1.暗箱，2.光源I，3.电源I，4.计算机，5.电流表，6.电源II，7.光源II，8.待测光电二极管。In the figure, 1. dark box, 2. light source I, 3. power supply I, 4. computer, 5. ammeter, 6. power supply II, 7. light source II, 8. photodiode to be tested.

具体实施方式detailed description

如图1是本发明示意图，装置主要包括暗箱1、光源I 2、电源I 3、计算机4、电流表5、电源II 6、光源II 7、待测光电二极管8，所述电源I 3、计算机4、电流表5、电源II 6均位于所述暗箱1外，所述光源I 2、光源II 7、电源I 3、电源II 6、待测光电二极管8和电流表5均与计算机4连接并由计算机4控制，所述暗箱1为边长500毫米的正方体腔体，所述暗箱1内侧表面均匀涂有漫反射材料且具有一开口，所述待测光电二极管8安装于所述暗箱1的开口处且连接所述电流表5，所述光源I 2、光源II 7位于所述暗箱1内侧表面处、且分别由所述电源I 3和电源II 6供电，所述光源I 2单独工作时，所述待测光电二极管8产生光电流IA，所述光源II 7单独工作时，所述待测光电二极管8产生光电流IB。Fig. 1 is a schematic diagram of the present invention, and device mainly comprises dark box 1, light source I 2, power supply I 3, computer 4, ammeter 5, power supply II 6, light source II 7, photodiode 8 to be measured, described power supply I 3, computer 4 , ammeter 5, power supply II 6 are all located outside the dark box 1, and described light source I 2, light source II 7, power supply I 3, power supply II 6, photodiode 8 to be measured and ammeter 5 are all connected with computer 4 and controlled by computer 4 Control, the dark box 1 is a cube cavity with a side length of 500 millimeters, the inner surface of the dark box 1 is uniformly coated with a diffuse reflection material and has an opening, and the photodiode 8 to be tested is installed at the opening of the dark box 1 and connected to the The ammeter 5, the light source I 2 and the light source II 7 are located at the inner surface of the dark box 1, and are powered by the power supply I 3 and the power supply II 6 respectively. When the light source I 2 works alone, the photoelectric to be tested The diode 8 generates a photocurrent I A , and when the light source II 7 works alone, the photodiode 8 to be tested generates a photocurrent I B .

所述一种测量光电二极管响应的线性度的方法步骤为：Described a kind of method step of measuring the linearity of photodiode response is:

一.所述光源I 2、光源II 7的供电电流按照以下条件设置：使得每一步中的所述待测光电二极管8光电流是上一步中的两倍，从较低电流的初始值IA (0)和IB (0)开始，第n步中，设置光源的供电电流IA (n)＝IB (n)＝IAB (n-1)，其中光电流IAB (n-1)表示两个光源同时调节到第(n-1)步时所述待测光电二极管8的响应；1. The supply current of the light source I 2 and the light source II 7 is set according to the following conditions: the photoelectric current of the photodiode 8 to be tested in each step is twice that of the previous step, from the initial value I A of the lower current (0) and I B (0) , in the nth step, set the supply current I A (n) of the light source = I B (n) = I AB (n-1) , where the photocurrent I AB (n-1 ) represents the response of the photodiode 8 to be tested when the two light sources are adjusted to the (n-1) step simultaneously;

二.记录所述待测光电二极管8光电流IA和IB分别相对于所述光源I 2和光源II 7的供电电流的关系，从最小值到最大值扫描调节每个光源的供电电流值；Two. Record the relationship between the photodiode 8 photocurrent I A and I B relative to the supply current of the light source I 2 and the light source II 7 respectively, and scan and adjust the supply current value of each light source from the minimum value to the maximum value ;

三.在第n步中，测量的线性度定义为测量的步骤依次是：时刻tA开启所述光源I 2，时刻t1＝tA+t读取IA，时刻tB＝t1+t开启所述光源II 7，时刻t2＝tB+t读取IAB，关闭所述电源I 3，时刻t3＝t2+t读取IB，关闭所述电源II 6，读取背底电流，其中时间间隔t典型值为0.5秒；3. In step n, the measured linearity is defined as Measurement The steps are as follows: turn on the light source I 2 at time t A , read I A at time t 1 =t A +t, turn on the light source II 7 at time t B =t 1 +t, and turn on the light source II 7 at time t 2 =t B + Read I AB at t, turn off the power supply I 3 , read I B at time t 3 =t 2 +t, turn off the power supply II 6, and read the background current, wherein the typical value of the time interval t is 0.5 seconds;

四.将所述光源I 2与所述光源II 7在所述暗箱(1)上的位置互换，重复以上步骤来测量此时装置的线性度 4. Exchange the positions of the light source I 2 and the light source II 7 on the dark box (1), repeat the above steps to measure the linearity of the device at this time

五.和之间的差异为所述光源I 2和光源II 7的辐射功率在测量过程中产生的漂移变化，并通过等式所得结果来消除光源功率漂移对线性度测量的影响，从而得到一组平均线性度r(1)、r(2)、…、r(n)。Fives. with The difference between the radiant power of the light source I 2 and the light source II 7 is the drift change produced during the measurement, and by the equation The obtained results are used to eliminate the influence of light source power drift on the linearity measurement, thereby obtaining a set of average linearity r (1) , r (2) , ..., r (n) .

本发明能够精确地确定待测光电二极管的照明构型，并使得杂散光的影响最小化，无需对光源实施温度稳定操作，能够降低实验条件。The invention can accurately determine the illumination configuration of the photodiode to be tested, minimize the influence of stray light, and can reduce the experimental conditions without performing temperature stable operation on the light source.

Claims (1)

1.一种测量光电二极管响应的线性度的方法，装置主要包括暗箱(1)、光源I(2)、电源I(3)、计算机(4)、电流表(5)、电源II(6)、光源II(7)、待测光电二极管(8)，所述电源I(3)、计算机(4)、电流表(5)、电源II(6)均位于所述暗箱(1)外，所述光源I(2)、光源II(7)、电源I(3)、电源II(6)、待测光电二极管(8)和电流表(5)均与计算机(4)连接并由计算机(4)控制，所述暗箱(1)为边长500毫米的正方体腔体，所述暗箱(1)内侧表面均匀涂有漫反射材料且具有一开口，所述待测光电二极管(8)安装于所述暗箱(1)的开口处且连接所述电流表(5)，所述光源I(2)、光源II(7)位于所述暗箱(1)内侧表面处、且分别由所述电源I(3)和电源II(6)供电，所述光源I(2)单独工作时，所述待测光电二极管(8)产生光电流IA；所述光源II(7)单独工作时，所述待测光电二极管(8)产生光电流IB，1. A method for measuring the linearity of photodiode response, the device mainly includes dark box (1), light source I (2), power supply I (3), computer (4), ammeter (5), power supply II (6), Light source II (7), photodiode to be tested (8), described power supply I (3), computer (4), ammeter (5), power supply II (6) are all positioned outside described dark box (1), and described light source I (2), light source II (7), power supply I (3), power supply II (6), photodiode to be tested (8) and ammeter (5) are all connected with computer (4) and controlled by computer (4), The dark box (1) is a cube cavity with a side length of 500 mm. The inside surface of the dark box (1) is evenly coated with a diffuse reflection material and has an opening. The photodiode (8) to be tested is installed in the dark box (1) and connected to the ammeter (5), the light source I (2), light source II (7) are located at the inner surface of the dark box (1), and are respectively controlled by the power source I (3) and power source II ( 6) power supply, when the light source I (2) works alone, the photodiode to be tested (8) produces a photocurrent I A ; when the light source II (7) works alone, the photodiode to be tested (8) produces a photocurrent I B , 其特征是：所述一种测量光电二极管响应的线性度的方法步骤为：It is characterized in that: the steps of a method for measuring the linearity of photodiode response are: 一.所述光源I(2)、光源II(7)的供电电流按照以下条件设置：使得每一步中的所述待测光电二极管(8)光电流是上一步中的两倍，从较低电流的初始值IA (0)和IB (0)开始，第n步中，设置光源的供电电流IA (n)＝IB (n)＝IAB (n-1)，其中光电流IAB (n-1)表示两个光源同时调节到第(n-1)步时所述待测光电二极管(8)的响应；One. The supply current of described light source I (2), light source II (7) is set according to the following conditions: make the photoelectric current of described photodiode (8) to be measured in each step be double in the previous step, from lower Starting from the initial values of current I A (0) and I B (0) , in the nth step, set the supply current of the light source I A (n) = I B (n) = I AB (n-1) , where the photocurrent IAB (n-1) represents the response of the photodiode to be tested (8) when two light sources are adjusted to (n-1) step simultaneously; 二.记录所述待测光电二极管(8)光电流IA和IB分别相对于所述光源I(2)和光源II(7)的供电电流的关系，从最小值到最大值扫描调节每个光源的供电电流值；Two. Record the relation of the photoelectric current I A and I B of the photodiode to be measured (8) with respect to the power supply current of the light source I (2) and the light source II (7) respectively, scan and adjust each time from the minimum value to the maximum value The supply current value of a light source; 三.在第n步中，测量的线性度定义为测量的步骤依次是：时刻tA开启所述光源I(2)，时刻t1＝tA+t读取IA，时刻tB＝t1+t开启所述光源II(7)，时刻t2＝tB+t读取IAB，关闭所述电源I(3)，时刻t3＝t2+t读取IB，关闭所述电源II(6)，读取背底电流，其中时间间隔t典型值为0.5秒；3. In step n, the measured linearity is defined as Measurement The steps are: turn on the light source I(2) at time t A , read I A at time t 1 =t A +t, turn on the light source II(7) at time t B =t 1 +t, and turn on the light source II(7) at time t 2 =t B +t read I AB , turn off the power supply I(3), time t 3 =t 2 +t read I B , turn off the power supply II(6), read the background current, wherein the time interval The typical value of t is 0.5 seconds; 四.将所述光源I(2)与所述光源II(7)在所述暗箱(1)上的位置互换，重复以上步骤来测量此时装置的线性度 4. Exchange the positions of the light source I (2) and the light source II (7) on the dark box (1), repeat the above steps to measure the linearity of the device at this time 五.和之间的差异为所述光源I(2)和光源II(7)的辐射功率在测量过程中产生的漂移变化，并通过等式所得结果来消除光源功率漂移对线性度测量的影响，从而得到一组平均线性度r(1)、r(2)、…、r(n)。Fives. with The difference between is the drift change of the radiant power of the light source I(2) and light source II(7) produced during the measurement, and is passed by the equation The obtained results are used to eliminate the influence of light source power drift on the linearity measurement, thereby obtaining a set of average linearity r (1) , r (2) , ..., r (n) .
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