CN107290639A - A kind of method for the linearity for measuring photodiode response - Google Patents
A kind of method for the linearity for measuring photodiode response Download PDFInfo
- Publication number
- CN107290639A CN107290639A CN201710451586.7A CN201710451586A CN107290639A CN 107290639 A CN107290639 A CN 107290639A CN 201710451586 A CN201710451586 A CN 201710451586A CN 107290639 A CN107290639 A CN 107290639A
- Authority
- CN
- China
- Prior art keywords
- light source
- power supply
- photodiode
- linearity
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The present invention relates to field of optical measurements, a kind of method of the linearity of measurement photodiode response, light source power supply is set：Photodiode photo stream to be measured in each step is twice in previous step, since reduced-current, in the n-th step, light source power supply electric current IA (n)=IB (n)=IAB (n‑1)；Record photodiode photo stream I to be measuredAAnd IBThe relation of light source I and light source II supply currents is respectively relative to, from small to large each light source power supply current value of scanning regulation；The linearity measured in the n-th step is defined asBy light source I and location swaps of the light source II on camera bellows, the duplicate measurements linearity WithBetween difference for light source I and light source II radiant power produced in measurement process drift change, pass through equationAcquired results eliminate light source power drift to be influenceed on linearity measure；Obtain one group of average linearity r(1)、r(2)、…、r(n)。
Description
Technical field
It is particularly a kind of without implementing temperature stabilization operation to light source, can reduce the present invention relates to field of optical measurements
A kind of method of the linearity of the low measurement photodiode response of experiment condition, cost.
Background technology
The responsiveness of one photodiode refers to the current signal and the ratio of the amount of radiation of input of its output, responsiveness
The typically function of input radiation wavelength；If the responsiveness of a photodiode does not change with the amount of input radiation,
It is called linear, the linearity is one of primary demand of optical radiation accurate measurement, especially in light measurement and actinometry
Field, in linearity measuring method, the addition method is a kind of basic method, by document【Sanders, C.L.J.Res.Natl
Bur.Stand.A 1972,76,437】And document【Sanders, C.L.Appl.Opt.1962,1,207】Understand, measure non-thread
Property degree the principle of the addition method be that the photoresponse that the light that two light sources are sent is produced in photodiode to be measured respectively is N1With
N2, the photoresponse that the summation of the light of two light sources is produced in photodiode to be measured is N12If, N1+N2=N12, then can be with
It is linear to think photodiode to be measured, if N1+N2≠N12, then nonlinearity can be by N12/(N1+N2) provide.With top
Two different light sources or a light source and two different diaphragms can be used in method.
Prior art uses the laser of power stability as light source, but it needs laser to have very high temperature stabilization
Property, it is described it is a kind of measure photodiode response the linearity method without to light source implement temperature stabilization operation, so as to
Enough reduce experiment condition.
The content of the invention
In order to solve the above problems, the present invention can be accurately determined the illumination configuration of photodiode to be measured, and cause
The influence of veiling glare is minimized, and without implementing temperature stabilization operation to light source, can reduce experiment condition.
The technical solution adopted in the present invention is：
A kind of method of linearity for measuring photodiode response, device mainly includes camera bellows, light source I, power supply
I, computer, ammeter, power supply II, light source II, photodiode to be measured, the power supply I, computer, ammeter, power supply II are equal
Outside the camera bellows, the light source I, light source II, power supply I, power supply II, photodiode to be measured and ammeter are and computer
Connect and by computer control, the camera bellows is the square cavity of 500 millimeters of the length of side, and the camera bellows inner surface is evenly coated with
Diffuse-reflective material and with an opening, the photodiode to be measured is installed at the opening of the camera bellows and connects the electric current
Table, the light source I, light source II are located at the camera bellows inner surface and powered respectively by the power supply I and power supply II, described
When light source I works independently, the photodiode to be measured produces photoelectric current IA, it is described to be measured when the light source II works independently
Photodiode produces photoelectric current IB。
It is described it is a kind of measure photodiode response the method and step of the linearity be：
Light source I, light source II supply current are according to following condition setting described in one,：So that described to be measured in each step
Photodiode photo stream is twice in previous step, from the initial value I of reduced-currentA (0)And IB (0)Start, in the n-th step, set
The supply current I of light sourceA (n)=IB (n)=IAB (n-1), wherein photoelectric current IAB (n-1)Represent that two light sources are adjusted to (n-1) simultaneously
The response of the photodiode to be measured during step；
Two, record the photodiode photo stream I to be measuredAAnd IBIt is respectively relative to the light source I and light source II power supply
The relation of electric current, the power supply current value of each light source of scanning regulation from minimum value to maximum；
Three, are in the n-th step, and the linearity of measurement is defined asMeasurementThe step of according to
It is secondary to be：Moment tAOpen the light source I, moment t1=tA+ t reads IA, moment tB=t1+ t opens the light source II, moment t2=
tB+ t reads IAB, close the power supply I, moment t3=t2+ t reads IB, the power supply II is closed, back end electric current is read, when wherein
Between interval t representative values be 0.5 second；
The light source I and location swaps of the light source II on the camera bellows are repeated above step to measure this by four,
When device the linearity
Five,WithBetween difference produced for the light source I and light source II radiant power in measurement process
Drift change, and pass through equationAcquired results eliminate light source power drift to the shadow of linearity measure
Ring, so as to obtain one group of average linearity r(1)、r(2)、…、r(n)。
The beneficial effects of the invention are as follows：
The present invention can be accurately determined the illumination configuration of photodiode to be measured, and make it that the influence of veiling glare is minimum
Change, without implementing temperature stabilization operation to light source, experiment condition can be reduced.
Brief description of the drawings
Further illustrated with reference to the figure of the present invention：
Fig. 1 is schematic diagram of the present invention.
In figure, 1. camera bellows, 2. light source I, 3. power supply I, 4. computers, 5. ammeters, 6. power supply II, 7. light source II, 8. treat
Light-metering electric diode.
Embodiment
If Fig. 1 is schematic diagram of the present invention, device mainly includes camera bellows 1, light source I 2, power supply I 3, computer 4, ammeter
5th, power supply II 6, light source II 7, photodiode to be measured 8, the power supply I 3, computer 4, ammeter 5, the equal positions of power supply II 6
In outside the camera bellows 1, the light source I 2, light source II 7, power supply I 3, power supply II 6, photodiode to be measured 8 and ammeter 5
It is connected and is controlled by computer 4 with computer 4, the camera bellows 1 is in the square cavity of 500 millimeters of the length of side, the camera bellows 1
Side surface is evenly coated with diffuse-reflective material and with an opening, and the photodiode 8 to be measured is installed on the opening of the camera bellows 1
Place and the connection ammeter 5, the light source I 2, light source II 7 are located at the inner surface of camera bellows 1 and respectively by described
Power supply I 3 and power supply II 6 power, when the light source I 2 works independently, and the photodiode 8 to be measured produces photoelectric current IA,
When the light source II 7 works independently, the photodiode 8 to be measured produces photoelectric current IB。
It is described it is a kind of measure photodiode response the method and step of the linearity be：
Light source I 2, light source II 7 supply current are according to following condition setting described in one,：So that described in each step
The photoelectric current of photodiode 8 to be measured is twice in previous step, from the initial value I of reduced-currentA (0)And IB (0)Start, the n-th step
In, the supply current I of light source is setA (n)=IB (n)=IAB (n-1), wherein photoelectric current IAB (n-1)Represent that two light sources are adjusted simultaneously to arrive
The response of the photodiode 8 to be measured during (n-1) step；
Two, record the photoelectric current I of photodiode to be measured 8AAnd IBIt is respectively relative to the light source I 2 and light source II 7
Supply current relation, the power supply current value of each light source of scanning regulation from minimum value to maximum；
Three, are in the n-th step, and the linearity of measurement is defined asMeasurementThe step of according to
It is secondary to be：Moment tAOpen the light source I 2, moment t1=tA+ t reads IA, moment tB=t1+ t opens the light source II 7, moment
t2=tB+ t reads IAB, close the power supply I 3, moment t3=t2+ t reads IB, the power supply II 6 is closed, back end electricity is read
Stream, wherein time interval t representative values are 0.5 second；
The light source I 2 and location swaps of the light source II 7 on the camera bellows (1) are repeated above step by four,
To measure the linearity of now device
Five,WithBetween difference produced for the light source I 2 and light source II 7 radiant power in measurement process
Raw drift change, and pass through equationAcquired results drift about to linearity measure to eliminate light source power
Influence, so as to obtain one group of average linearity r(1)、r(2)、…、r(n)。
The present invention can be accurately determined the illumination configuration of photodiode to be measured, and make it that the influence of veiling glare is minimum
Change, without implementing temperature stabilization operation to light source, experiment condition can be reduced.
Claims (1)
1. a kind of method for the linearity for measuring photodiode response, device mainly includes camera bellows (1), light source I (2), power supply I
(3), computer (4), ammeter (5), power supply II (6), light source II (7), photodiode to be measured (8), the power supply I (3), meter
Calculation machine (4), ammeter (5), power supply II (6) are respectively positioned on the camera bellows (1) outside, the light source I (2), light source II (7), power supply I
(3), power supply II (6), photodiode to be measured (8) and ammeter (5) are connected with computer (4) and controlled by computer (4),
The camera bellows (1) be 500 millimeters of the length of side square cavity, camera bellows (1) inner surface be evenly coated with diffuse-reflective material and
With an opening, the photodiode (8) to be measured is installed at the opening of the camera bellows (1) and connects the ammeter (5),
The light source I (2), light source II (7) are located at the camera bellows (1) inner surface and respectively by the power supply I (3) and power supply II
(6) power, when the light source I (2) works independently, the photodiode (8) to be measured produces photoelectric current IA；The light source II
(7) when working independently, the photodiode (8) to be measured produces photoelectric current IB,
It is characterized in that：It is described it is a kind of measure photodiode response the method and step of the linearity be：
Light source I (2), light source II (7) supply current are according to following condition setting described in one,：So that described in each step is treated
Light-metering electric diode (8) photoelectric current is twice in previous step, from the initial value I of reduced-currentA (0)And IB (0)Start, the n-th step
In, the supply current I of light source is setA (n)=IB (n)=IAB (n-1), wherein photoelectric current IAB (n-1)Represent that two light sources are adjusted simultaneously to arrive
The response of the photodiode (8) to be measured during (n-1) step；
Two, record photodiode to be measured (8) the photoelectric current IAAnd IBIt is respectively relative to the light source I (2) and light source II (7)
Supply current relation, the power supply current value of each light source of scanning regulation from minimum value to maximum；
Three, are in the n-th step, and the linearity of measurement is defined asMeasurementThe step of be successively：
Moment tAOpen the light source I (2), moment t1=tA+ t reads IA, moment tB=t1+ t opens the light source II (7), moment t2
=tB+ t reads IAB, close the power supply I (3), moment t3=t2+ t reads IB, the power supply II (6) is closed, back end electricity is read
Stream, wherein time interval t representative values are 0.5 second；
The light source I (2) and location swap of the light source II (7) on the camera bellows (1) are repeated above step and come by four,
Measure the linearity of now device
Five,WithBetween difference produced in measurement process for the light source I (2) and light source II (7) radiant power
Drift change, and pass through equationAcquired results eliminate light source power drift to the shadow of linearity measure
Ring, so as to obtain one group of average linearity r(1)、r(2)、…、r(n)。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710451586.7A CN107290639A (en) | 2017-06-08 | 2017-06-08 | A kind of method for the linearity for measuring photodiode response |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710451586.7A CN107290639A (en) | 2017-06-08 | 2017-06-08 | A kind of method for the linearity for measuring photodiode response |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107290639A true CN107290639A (en) | 2017-10-24 |
Family
ID=60097189
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710451586.7A Pending CN107290639A (en) | 2017-06-08 | 2017-06-08 | A kind of method for the linearity for measuring photodiode response |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107290639A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114323567A (en) * | 2021-12-31 | 2022-04-12 | 深圳市聚飞光电股份有限公司 | Photoelectric detector testing device and testing method |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61139766A (en) * | 1984-12-12 | 1986-06-27 | Nec Corp | Apparatus for measuring multiplication dark current of avalanche photodiode |
| JPH05282697A (en) * | 1992-03-31 | 1993-10-29 | Omron Corp | Optical information reproducing device and its operating method |
| EP1179857A2 (en) * | 2000-07-05 | 2002-02-13 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion characteristics |
| CN201016842Y (en) * | 2007-04-02 | 2008-02-06 | 湖北众友科技实业股份有限公司 | Photoelectric detection principle test instrument |
| CN102385039A (en) * | 2011-08-15 | 2012-03-21 | 北京东方计量测试研究所 | Test method and device for high-light intensity and large-scale solar cell illumination linearity |
| CN103389451A (en) * | 2013-07-24 | 2013-11-13 | 广东瑞谷光纤通信有限公司 | Testing method and testing device of avalanche photodiode |
| CN103983431A (en) * | 2014-04-25 | 2014-08-13 | 中国科学院长春光学精密机械与物理研究所 | Device and method for testing out-band relative spectral responsivity of solar blind ultraviolet image intensifier |
-
2017
- 2017-06-08 CN CN201710451586.7A patent/CN107290639A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61139766A (en) * | 1984-12-12 | 1986-06-27 | Nec Corp | Apparatus for measuring multiplication dark current of avalanche photodiode |
| JPH05282697A (en) * | 1992-03-31 | 1993-10-29 | Omron Corp | Optical information reproducing device and its operating method |
| EP1179857A2 (en) * | 2000-07-05 | 2002-02-13 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion characteristics |
| CN201016842Y (en) * | 2007-04-02 | 2008-02-06 | 湖北众友科技实业股份有限公司 | Photoelectric detection principle test instrument |
| CN102385039A (en) * | 2011-08-15 | 2012-03-21 | 北京东方计量测试研究所 | Test method and device for high-light intensity and large-scale solar cell illumination linearity |
| CN103389451A (en) * | 2013-07-24 | 2013-11-13 | 广东瑞谷光纤通信有限公司 | Testing method and testing device of avalanche photodiode |
| CN103983431A (en) * | 2014-04-25 | 2014-08-13 | 中国科学院长春光学精密机械与物理研究所 | Device and method for testing out-band relative spectral responsivity of solar blind ultraviolet image intensifier |
Non-Patent Citations (3)
| Title |
|---|
| 董伟, 光学学报，基于发光二极管光源的光电高温计非线性研究, vol. 28, no. 5, pages 1 - 7 * |
| 谢印忠, 传感器与微系统，智能光电探测器线性测量系统的研究, vol. 29, no. 2, pages 1 - 4 * |
| 陈风等, 光学学报，高精度光电探测器的线性测量, vol. 28, no. 5, pages 4 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114323567A (en) * | 2021-12-31 | 2022-04-12 | 深圳市聚飞光电股份有限公司 | Photoelectric detector testing device and testing method |
| CN114323567B (en) * | 2021-12-31 | 2024-07-09 | 深圳市聚飞光电股份有限公司 | Photoelectric detector testing device and method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Sarwar et al. | Description and characterization of an adjustable flux solar simulator for solar thermal, thermochemical and photovoltaic applications | |
| Bliss et al. | An LED-based photovoltaic measurement system with variable spectrum and flash speed | |
| CN102914323B (en) | Method and device for calibrating absolute spectral response of photoelectric detector | |
| Zaid et al. | Differential spectral responsivity measurement of photovoltaic detectors with a light-emitting-diode-based integrating sphere source | |
| US2302049A (en) | Measuring and control method and apparatus | |
| CN206906531U (en) | A kind of device for the linearity for measuring photodiode response | |
| CN205245084U (en) | Light intensity automatically regulated ware | |
| CN107290639A (en) | A kind of method for the linearity for measuring photodiode response | |
| US2420058A (en) | Compensated photoelectric photometer circuits | |
| CN107132467A (en) | A kind of device for the linearity for measuring photodiode response | |
| CN201069388Y (en) | A spectrum instrument | |
| US2244732A (en) | Measuring apparatus | |
| US2219775A (en) | Measuring apparatus | |
| WO2016065729A1 (en) | Absolute-type linear encoder absolute signal consistency correction method | |
| KR100664363B1 (en) | Filament lamp light quantity control method and filament lamp light quantity control unit and filament lamp light source unit | |
| CN104199502A (en) | Bias voltage method of Si-APD | |
| US2649834A (en) | Optical feed-back densitometer | |
| CN107314887A (en) | The method for estimating absolute light responsiveness of the photomultiplier under low light-intensity conditions | |
| CN103500915B (en) | Piezoelectric tunable laser real-time calibration system and method | |
| Parsons et al. | Performance measurements for indoor photovoltaic devices: Classification of a novel light source | |
| CN102607615A (en) | Gain self-compensating method for linear array CCD (Charge-coupled Device) pixel level signal and compensating circuit | |
| CN107402365A (en) | A kind of calibration method of LED photovoltaic comprehensive tester | |
| US2043589A (en) | Photoelectric colorimeter | |
| Gomes et al. | A Low-Cost Flexible-Platform (LCFP) for characterization of photodetectors | |
| SU1369469A1 (en) | Luxmeter Calibration Device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |