CN107250810A - 探针销及具备该探针销的探针组件 - Google Patents

探针销及具备该探针销的探针组件 Download PDF

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Publication number
CN107250810A
CN107250810A CN201680010320.2A CN201680010320A CN107250810A CN 107250810 A CN107250810 A CN 107250810A CN 201680010320 A CN201680010320 A CN 201680010320A CN 107250810 A CN107250810 A CN 107250810A
Authority
CN
China
Prior art keywords
probe pin
plunger
contact site
helical spring
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201680010320.2A
Other languages
English (en)
Chinese (zh)
Inventor
寺西宏真
酒井贵浩
的场正人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Publication of CN107250810A publication Critical patent/CN107250810A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CN201680010320.2A 2015-03-13 2016-01-18 探针销及具备该探针销的探针组件 Pending CN107250810A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015050723A JP6531438B2 (ja) 2015-03-13 2015-03-13 プローブピン、および、これを備えたプローブユニット
JP2015-050723 2015-03-13
PCT/JP2016/051284 WO2016147691A1 (ja) 2015-03-13 2016-01-18 プローブピン、および、これを備えたプローブユニット

Publications (1)

Publication Number Publication Date
CN107250810A true CN107250810A (zh) 2017-10-13

Family

ID=56919851

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201680010320.2A Pending CN107250810A (zh) 2015-03-13 2016-01-18 探针销及具备该探针销的探针组件

Country Status (4)

Country Link
JP (1) JP6531438B2 (ja)
CN (1) CN107250810A (ja)
TW (1) TWI585414B (ja)
WO (1) WO2016147691A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111579829A (zh) * 2019-02-15 2020-08-25 万润科技股份有限公司 探针驱动方法及装置
CN111602062A (zh) * 2018-01-11 2020-08-28 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
CN112005448A (zh) * 2018-05-22 2020-11-27 欧姆龙株式会社 探针销

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6737002B2 (ja) * 2016-06-17 2020-08-05 オムロン株式会社 プローブピン
CN111579834B (zh) * 2020-05-18 2023-03-31 武汉精毅通电子技术有限公司 一种适用于大电流高速信号测试的探针及连接器
US11387587B1 (en) 2021-03-13 2022-07-12 Plastronics Socket Partners, Ltd. Self-retained slider contact pin

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101079539A (zh) * 2006-05-24 2007-11-28 东神电气株式会社 螺旋形支承器及其连接器
CN101122614A (zh) * 2006-08-10 2008-02-13 李诺工业有限公司 测试探针装置及其制造方法
CN101231306A (zh) * 2007-01-25 2008-07-30 李诺工业有限公司 测试探针装置及其测试插座
CN101740923A (zh) * 2008-11-21 2010-06-16 日立电线株式会社 阴阳连接构造
CN102082353A (zh) * 2009-11-02 2011-06-01 Smk株式会社 顶针式压接型连接器
CN102414925A (zh) * 2009-07-03 2012-04-11 矢崎总业株式会社 阴端子
CN102842794A (zh) * 2011-06-22 2012-12-26 泰科电子日本合同会社 接触件及插座
JP2015040734A (ja) * 2013-08-21 2015-03-02 オムロン株式会社 プローブピン、および、これを用いた電子デバイス

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4259405B2 (ja) * 2004-06-15 2009-04-30 住友電装株式会社 基板用コネクタ
KR100584225B1 (ko) * 2004-10-06 2006-05-29 황동원 전자장치용 콘택트
JP5067790B2 (ja) * 2007-04-27 2012-11-07 センサータ テクノロジーズ マサチューセッツ インコーポレーテッド プローブピンおよびそれを用いたソケット
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP5352525B2 (ja) * 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101079539A (zh) * 2006-05-24 2007-11-28 东神电气株式会社 螺旋形支承器及其连接器
CN101122614A (zh) * 2006-08-10 2008-02-13 李诺工业有限公司 测试探针装置及其制造方法
CN101231306A (zh) * 2007-01-25 2008-07-30 李诺工业有限公司 测试探针装置及其测试插座
CN101740923A (zh) * 2008-11-21 2010-06-16 日立电线株式会社 阴阳连接构造
CN102414925A (zh) * 2009-07-03 2012-04-11 矢崎总业株式会社 阴端子
CN102082353A (zh) * 2009-11-02 2011-06-01 Smk株式会社 顶针式压接型连接器
CN102842794A (zh) * 2011-06-22 2012-12-26 泰科电子日本合同会社 接触件及插座
JP2015040734A (ja) * 2013-08-21 2015-03-02 オムロン株式会社 プローブピン、および、これを用いた電子デバイス

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111602062A (zh) * 2018-01-11 2020-08-28 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
CN111602062B (zh) * 2018-01-11 2023-03-03 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
CN112005448A (zh) * 2018-05-22 2020-11-27 欧姆龙株式会社 探针销
CN111579829A (zh) * 2019-02-15 2020-08-25 万润科技股份有限公司 探针驱动方法及装置
CN111579829B (zh) * 2019-02-15 2022-05-24 万润科技股份有限公司 探针驱动方法及装置

Also Published As

Publication number Publication date
JP2016170096A (ja) 2016-09-23
JP6531438B2 (ja) 2019-06-19
TW201636619A (zh) 2016-10-16
TWI585414B (zh) 2017-06-01
WO2016147691A1 (ja) 2016-09-22

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Application publication date: 20171013