CN106290993B - Test unit positioning mechanism of test device and test equipment applied by same - Google Patents
Test unit positioning mechanism of test device and test equipment applied by same Download PDFInfo
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- CN106290993B CN106290993B CN201510315726.9A CN201510315726A CN106290993B CN 106290993 B CN106290993 B CN 106290993B CN 201510315726 A CN201510315726 A CN 201510315726A CN 106290993 B CN106290993 B CN 106290993B
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Abstract
The invention provides a test unit positioning mechanism of a test device and test equipment applied by the test unit positioning mechanism, wherein the test device is provided with the positioning mechanism on the bottom surface of a machine table, the positioning mechanism is provided with a fixing plate with a containing space, the fixing plate is provided with at least one power source, the power source drives at least one abutting part to move in at least one direction, the test unit is provided with a loader for assembling a test seat, the test mechanism of the test device drives the abutting part to move to the containing space of the fixing plate, the positioning mechanism drives the abutting part to move by the power source and clamps the abutting part to be really attached to the machine table so as to position the test unit with the test seat, when the test seat is replaced, the positioning mechanism drives the abutting part to be separated from the loader by the power source, and the test unit with the test seat is detached so that the test mechanism drives the test unit; therefore, the positioning mechanism can be used for automatically positioning or removing the test unit with the test seat, so that the replacement operation time is saved, and the practical benefits of improving the use convenience and the production efficiency are achieved.
Description
Technical Field
The invention relates to a positioning mechanism which can automatically position or remove a test unit with a test seat, thereby saving the operation time of replacing the test seat and improving the use convenience and the production efficiency.
Background
At present, after the electronic device is manufactured, the electronic device is transported to a testing apparatus for testing operation to eliminate the defective products, please refer to fig. 1, 2 and 3, the testing apparatus is provided with a machine platform 11 having an opening 111, a housing 12 having an entrance 121 is disposed above the machine platform 11, a testing device 13 for testing the electronic device is disposed below the machine platform 11, the testing device 13 is provided with a tester 131 connected to a central control device (not shown), the tester 131 is driven by a transfer structure (not shown) to move in a first direction and a second direction (such as X, Y direction) and is driven by two transfer arms 132 to move in a third direction (such as Z direction), the tester 131 is provided with a testing circuit board 133 and a testing unit, the testing circuit board 133 is electrically connected to the tester 131, the testing unit is provided with a plurality of testing seats 135 having probes on a substrate 134, the probe of the test seat 135 is electrically connected to the test circuit board 133, the test device 13 drives the tester 131 to move in the first and second directions by the transfer structure, the test seat 135 of the test unit corresponds to the opening 111 of the machine 11, and then the transfer arm 132 drives the tester 131 and the test circuit board 133 thereon and the test unit to move in the third direction, the substrate 134 of the test unit is placed on the bottom surface of the machine 11, and the plurality of test seats 135 are inserted into the opening 111 of the machine 11, because of the press mechanism 14 for transferring the electronic component 15 to be tested, in order to make the electrical contact of the electronic component 15 to be tested and the probe of the test seat 135 really contact, when the electronic component 15 to be tested is placed in the test seat 135, a lower pressure is applied to the electronic component 15 to be tested, so as to press the electronic component 15 to perform the test operation, the worker is to avoid the test seat 135 of the test unit from moving downwards to affect the test quality due to the lower pressure, the worker uses the plurality of pins 136 to lock the substrate 134 of the testing unit to the bottom surface of the machine 11, so that the testing seat 135 will not move in the third direction, and therefore, when the pressing mechanism 14 presses the electronic device 15 to perform the testing operation in the testing seat 135, the substrate 134 of the testing unit is already fixed on the bottom surface of the machine 11, so that the testing seat 135 can stably perform the testing operation; referring to fig. 4, when replacing the test socket 135, the worker must detach the plurality of pins 136 to separate the substrate 134 of the test unit from the machine 11, so that the tester 131 can drive the test unit with the test socket 135 and the substrate 134 to move downward in the third direction away from the machine 11 for the worker to replace the test unit with the test socket 135; however, the positioning of such a test cell has the following disadvantages in use:
1. because the substrate 134 of the testing unit is locked on the tester 131 and the tester 131 is installed under the machine 11, there is no space under the machine 11 for the worker to lock the substrate 134, so that the worker must lock the substrate 134 through the entrance 121 of the housing 12, but the space inside the housing 12 is limited due to the arrangement of other devices, which makes it inconvenient for the worker to lock the substrate 134 in a narrow space.
2. When the test seat 135 of the test unit is replaced, the worker has to stop the test equipment, detach the plurality of bolts 136 on the machine 11 one by one to detach the substrate 134 of the test unit, and when the substrate of the new test unit is fixed, the plurality of bolts 134 are used to fix the new substrate on the machine 11, so that the whole test equipment can be started to perform the test operation after the operation of repeatedly assembling and disassembling the plurality of bolts 136, which not only consumes the operation time, but also fails to improve the production efficiency.
Disclosure of Invention
Aiming at the defects of the prior art, the invention aims to: the test unit positioning mechanism of the test device and the test equipment applied by the test unit positioning mechanism can automatically position or remove the test unit with the test seat, thereby saving the operation time of replacing the test seat.
In order to achieve the purpose, the invention adopts the technical scheme that:
a test cell positioning mechanism for a test apparatus, comprising:
a machine station: has at least one opening;
a test unit: a loader with at least one substrate is arranged, at least one test seat with a probe is assembled on the at least one substrate, and the test seat tests the electronic element;
a positioning mechanism: the testing unit is assembled on the machine table and is provided with at least one power source, the power source drives at least one abutting piece to move in at least one direction, and at least one end of the abutting piece is provided with a jacking part used for positioning or dismounting the loader of the testing unit.
The test unit positioning mechanism of the test device is provided with a fixing plate with an accommodating space, the fixing plate is fixedly arranged on the bottom surface of the machine table, and the power source is assembled.
The positioning mechanism of the testing unit of the testing device is provided with a sliding groove on the fixing plate for placing the abutting piece.
The fixed plate of the positioning mechanism is provided with a supporting part in the moving path of the abutting part so as to support the abutting part.
The testing unit positioning mechanism of the testing device is provided with at least one on-off switch for turning on and off the power source.
The test unit positioning mechanism of the test device is characterized in that a loader of the test unit is provided with a first substrate and a second substrate, the first substrate is provided with at least one bearing part for assembling the test seat, the second substrate is provided with a through hole and is assembled above the first substrate, and the test seat is arranged in the through hole.
The test unit positioning mechanism of the test device is characterized in that the second substrate is provided with at least one bearing part on the bearing device of the test unit, so that the bearing part of the positioning mechanism can be clamped or separated.
The test unit positioning mechanism of the test device is provided with a test mechanism, a test circuit board and a guide structure, wherein the test mechanism is provided with a tester with a pedestal, the test circuit board is assembled on the pedestal of the tester and is electrically connected with the tester and the test seat of the test unit, and the guide structure is provided with a guide connecting piece and a connecting piece which are matched with each other between a fixing plate of the positioning mechanism and the tester of the test mechanism.
The test unit positioning mechanism of the test device is characterized in that the guide structure is provided with an embedded part and an inserting part which are matched with each other between the machine platform and the loader of the test unit.
In order to achieve the above object, the technical solution adopted by the present invention further comprises:
a test apparatus employing a test device, comprising:
a machine platform;
a feeding device: the feeding mechanism is assembled on the machine table and is used for accommodating the electronic element to be tested;
the material receiving device comprises: the receiving mechanism is assembled on the machine table and is used for accommodating the tested electronic element;
at least one test unit positioning mechanism of the test device: the testing unit is used for testing the electronic element, and the positioning mechanism is used for positioning or detaching the testing unit;
a conveying device: is assembled on the machine table and is provided with at least one material moving mechanism for moving and carrying the electronic elements;
the central control device: used to control and integrate the actions of each device to execute the automation operation.
One of the advantages of the present invention is to provide a positioning mechanism for a testing unit of a testing device, wherein the testing device is provided with a positioning mechanism on the bottom surface of a machine platform, the positioning mechanism is provided with a fixing plate having an accommodating space, the fixing plate is provided with at least one power source, the power source drives at least one abutting piece to move in at least one direction, the testing unit is provided with a carrier for assembling a testing seat, the testing mechanism of the testing device drives the abutting piece to move to the accommodating space of the fixing plate, the positioning mechanism drives the abutting piece to move by the power source and clamps the abutting piece to be really attached to the machine platform so as to position the testing unit with the testing seat, when the testing seat is replaced, the positioning mechanism drives the abutting piece to be detached from the carrier by the power source, and the testing unit with the testing seat is detached so that the testing mechanism drives the testing unit to leave the machine platform; therefore, the positioning mechanism can be used for automatically positioning or removing the test unit with the test seat, so that the replacement operation time is saved, and the practical benefits of improving the use convenience and the production efficiency are achieved.
The second advantage of the present invention is to provide a positioning mechanism for testing unit of testing device, wherein the positioning mechanism automatically controls the power source to drive the abutting member to move for positioning or detaching the testing unit, so that the worker does not need to assemble or disassemble the bolt in a narrow space, thereby achieving the practical benefit of improving the convenience of operation.
The third advantage of the present invention is to provide a positioning mechanism for a testing unit of a testing device, wherein a guiding structure is disposed between the positioning mechanism and the testing mechanism, and the guiding structure is a guiding member and a connecting member disposed between a fixing plate of the positioning mechanism and a tester of the testing mechanism, which are engaged with each other, so that the tester can drive the testing unit with a testing seat to be accurately assembled on the positioning mechanism, thereby facilitating the abutting member of the positioning mechanism to clamp and position the carrier of the testing unit, and achieving practical benefits of improving operation convenience.
The present invention provides a positioning mechanism for a testing unit of a testing device, wherein the positioning mechanism is provided with a supporting member in a moving path of the abutting member to support the abutting member to firmly clamp the carrier of the testing unit, so that the carrier is firmly attached to the bottom surface of the machine, thereby achieving a practical benefit of improving the positioning efficiency.
The fifth advantage of the present invention is to provide a testing apparatus using a testing device, which comprises a feeding device, a receiving device, a testing device, a conveying device and a central control device, wherein the feeding device is used for accommodating at least one electronic component to be tested, the receiving device is used for accommodating at least one tested electronic component, the testing device is provided with a positioning mechanism for positioning or detaching a testing unit having a testing seat and a carrier, the testing seat is used for testing the electronic component, the conveying device is provided with at least one material transferring mechanism having a taking and placing device for transferring an object, the central control device is used for controlling and integrating the actions of the devices to execute automatic operation, thereby achieving the practical benefit of improving the production efficiency of the operation.
Drawings
FIG. 1 is a schematic diagram (I) illustrating the assembly of a test unit and a machine of a conventional testing apparatus;
FIG. 2 is a schematic diagram of the assembly and use of a test unit and a machine of a conventional testing apparatus;
FIG. 3 is a schematic diagram of a prior art testing apparatus and a pressing mechanism;
FIG. 4 is a schematic view of a prior art test apparatus used to remove a test unit;
FIG. 5 is an external view of a positioning mechanism of the testing device of the present invention;
FIG. 6 is a cross-sectional view of the positioning mechanism of the test device of the present invention;
FIG. 7 is an assembled cross-sectional view of a positioning mechanism and a machine table of the testing device of the present invention;
FIG. 8 is a schematic diagram of a testing mechanism, a testing circuit board and a testing unit of the testing device of the present invention;
FIG. 9 is a schematic view (one) of the positioning mechanism of the present invention;
FIG. 10 is a schematic view of the positioning mechanism of the present invention positioning the test unit;
FIG. 11 is a schematic view of the test socket for holding electronic components for testing in accordance with the present invention;
FIG. 12 is a schematic view (one) of the positioning mechanism of the present invention in use with a detachment test unit;
FIG. 13 is a schematic view of the positioning mechanism of the present invention in use with a detachment test unit (two);
FIG. 14 is a schematic view of the testing device of the present invention applied to a testing apparatus.
Description of reference numerals: [ Prior Art ] A machine table 11; an opening 111; a housing 12; an inlet and an outlet 121; a testing device 13; a testing mechanism 131; a transfer arm 132; a test circuit board 133; a substrate 134; a test seat 135; a pin 136; a press-taking mechanism 14; an electronic component 15; [ invention ] positioning mechanism 20; a fixed plate 21; the accommodating space 211; a chute 212; a slide 213; a support member 214; a press cylinder 22; a butting piece 23; a top-catch member 231; a roller 232; an on-off switch 24; a first lead 25; a second lead 26; a card slot 261; a machine table 30; an opening 301; the insertion member 302; (ii) a A testing mechanism 40; a tester 41; a pedestal 411; a transfer arm 42; (ii) a The first engaging piece 43; a second engaging member 44; (ii) a A fastener 441; a test circuit board 50; a test unit 60; a first substrate 61; a bearing portion 611; a second substrate 62; port 621; a top piece 622; an embedment member 623; a test seat 63; a press-taking mechanism 70; an electronic component 80; a supply device 90; a material receiving device 100; a conveying device 110; an input end material moving mechanism 1101; a first feed stage 1102; a second feed stage 1103; a first press-taking mechanism 1104; a second press mechanism 1105; a first material receiving platform 1106; a second receiving platform 1107; an output material moving mechanism 1108.
Detailed Description
To further understand the present invention, a preferred embodiment is illustrated in the accompanying drawings, which are detailed below:
referring to fig. 5 and 6, a positioning mechanism 20 of a testing device of the present invention includes at least one power source and at least one abutting member, the at least one power source is used to drive the at least one abutting member to move in at least one direction, the power source can be mounted on a bottom surface of a machine or an independent board, in this embodiment, the positioning mechanism 20 has a fixing plate 21 with a receiving space 211, the fixing plate 21 is mounted with a plurality of power sources which can be hydraulic cylinders 22, and the plurality of hydraulic cylinders 22 are respectively disposed in a first direction and a second direction; at least one top support 23 is provided with at least one top support part 231, the top support part 231 can be a wedge-shaped block or a roller for supporting and positioning or separating from the test unit with the test seat and the loader, the top support 23 is connected with at least one power source, the power source drives the test unit to move in at least one direction, in this embodiment, a plurality of sliding grooves 212 are arranged on the fixing plate 21 for placing a plurality of top support parts 23, one end of the top support part 23 is connected with a piston rod of a pressure cylinder 22 and driven by the pressure cylinder 22 to move in a stretching way, the other end of the top support part 23 is provided with a top support part 231 of a wedge-shaped block, two sides of the top support part 231 are provided with rollers 232 to roll on a sliding seat 213 concavely arranged on the fixing plate 21, a support part 214 is arranged on the moving path of the top support part 23 for supporting the top support part 23, the positioning mechanism 20 further comprises at least one open-close switch 24 electrically connected with the power source, for turning on and off the power source, in the present embodiment, the on-off switch 24 is mounted on the outer peripheral surface of the fixed plate 21 to control the on-off of each cylinder 22.
Referring to fig. 7 and 8, the testing apparatus of the present invention further includes a machine 30, a testing mechanism 40, a testing circuit board 50, a testing unit 60 and a guiding structure, wherein the machine 30 is provided with at least one opening 301, and a positioning mechanism 20 is assembled on a bottom surface of the machine 30, a fixing plate 21 of the positioning mechanism 20 is fixedly secured to the bottom surface of the machine 30, and the accommodating space 211 is aligned to the opening 301 of the machine 30; the testing mechanism 40 is provided with a tester 41 having a pedestal 411, the tester 41 is electrically connected to a central control device (not shown), and the testing mechanism 40 is moved by a transfer mechanism (not shown) in a first direction and a second direction (for example, X, Y direction) and moved by a transfer arm 42 in a third direction (for example, Z direction), which is not described again since the testing mechanism 40 is a prior art; the test circuit board 50 is electrically connected to the tester 41 and mounted on the base 411 of the tester 41; the testing unit 60 is provided with a carrier having at least one substrate, and at least one substrate is provided with a bearing part, the bearing part is a testing seat equipped with probes, the probes of the testing seat are electrically connected with the testing circuit board 50 for testing electronic components, in the embodiment, the carrier of the testing unit 60 is provided with a first substrate 61 and a second substrate 62, the first substrate 61 is provided with a plurality of bearing parts 611 and locked under the second substrate 62, the second substrate 62 is provided with a through hole 621, further, the outer dimension of the second substrate 62 is matched with the dimension of the accommodating space 211 of the fixing plate 21 of the positioning mechanism 20, and the second substrate 62 can be used with first substrates 61 with different dimensions, and the plurality of bearing parts 611 of the first substrate 61 are equipped with testing seats 63 equipped with probes, the testing seat 63 is used for bearing electronic components to be tested, and the carrier is provided with at least one bearing part on at least one substrate, in the present embodiment, a plurality of top-bearing parts 622 are disposed around the second substrate 62, the top-bearing parts 622 can be wedge-shaped blocks or rollers, in the present embodiment, the top-bearing parts 622 are rollers, the carrier is locked on the test circuit board 50 by the first substrate 61, so that the probes of the test socket 63 are electrically connected to the test circuit board 50; the guiding structure is to set the guiding component and the joint component which are mutually matched between the fixing plate 21 of the positioning mechanism 20 and the tester 41 of the testing mechanism 40, so as to primarily position the positioning mechanism 20 and the tester 41, in this embodiment, the bottom surface of the fixing plate 21 of the positioning mechanism 20 is set with the first guiding component 25 and the second guiding component 26, the first guiding component 25 is a guide rod, the second guiding component 26 is set with a slot 261, and the tester 41 is set with the first joint component 43 and the second joint component 44 which are corresponding to the first guiding component 25 and the second guiding component 26, the first joint component 43 is a hollow conduit, the second joint component 44 is set with at least one buckle component 441, the buckle component 441 is a steel ball which can be extended and retracted, furthermore, the guiding structure is to set the embedding component and the joint component which are mutually matched between the machine table 30 and the loader of the testing unit 60, so as to finely position the testing unit 60 and the machine table 30, in the embodiment, the bottom surface of the platform 30 is provided with an insertion component 302 as a sleeve hole, and the second substrate 62 of the testing unit 60 is provided with an insertion member 623 at a position corresponding to the insertion component 302.
Referring to fig. 8 and 9, the tester 41 of the testing mechanism 40 of the present invention is moved by a transfer structure (not shown) to move in a first direction and a second direction, so that the tester 41 drives the testing unit 60 to be located below the positioning mechanism 20, the testing mechanism 40 drives the tester 41 to move in the third direction by the transfer arm 42, the tester 41 uses the first engaging member 43 and the second engaging member 44 to respectively align with the first guiding member 25 and the second guiding member 26 of the positioning mechanism 20, the first engaging member 43 is sleeved outside the first guiding member 25, so that the tester 41 and the positioning mechanism 20 are initially positioned, the transfer arm 42 continues to drive the tester 41 and the testing unit 60 to move in the third direction, the tester 41 uses the locking member 441 of the second engaging member 44 to be locked with the locking slot 261 of the second guiding member 26 of the positioning mechanism 20, and the testing unit 60 uses the locking member 623 of the second substrate 62 to be inserted into the insertion member 302 of the machine 30, the test unit 60 and the machine 30 are finely positioned, so that the test unit 60 is placed in the accommodating space 211 of the fixing plate 21 of the positioning mechanism 20, the second substrate 62 of the carrier is attached to the bottom surface of the machine 30, the top part 622 of the second substrate 62 corresponds to the top part 23 of the positioning mechanism 20, and the test seat 63 of the test unit 60 is located below the opening 301 of the machine 30.
Referring to fig. 5 and 10, in order to prevent the testing unit 60 from moving downward in the third direction during the testing operation and affecting the testing quality, the worker does not need to assemble the bolt in a narrow space, the open/close switch 24 of the positioning mechanism 20 can be used to electrically control the start of the press cylinder 22, because the top member 622 of the second substrate 62 corresponds to the top member 23 of the positioning mechanism 20, the press cylinder 22 drives the top member 23 to move in an outward protruding manner, the top member 23 moves along the sliding slot 212 of the fixed plate 21 and is supported by the supporting member 214 to move stably, the top member 231 of the top member 23 can slide stably along the sliding seat 213 of the fixed plate 21 by using the rollers 232 at both sides, so that the top member 231 of the top member 23 is clamped under the top member 622 of the second substrate 62, and the wedge-shaped surface of the top member 231 supports the second substrate 62 to move in the third direction and is indeed attached to the bottom surface of the machine 30, so as to quickly position the test unit 60 having the test socket 63, thereby shortening the operation time and improving the production efficiency.
Referring to fig. 11, the testing base 63 of the testing unit 60 is located at the opening 301 of the machine 30, the pressing mechanism 70 is used to place the electronic component 80 to be tested in the testing base 63 and press the electronic component 80 to be tested to perform the testing operation, because the abutting member 23 of the positioning mechanism 20 is used to position and support the second substrate 62 of the testing unit 60 to be stably assembled on the bottom surface of the machine 30, the second substrate 62 is used to fixedly mount the first substrate 61 having the testing base 63, and the testing base 63 can be stably positioned by using the first and second substrates 61, 62, when the testing base 63 bears the downward pressure of the pressing mechanism 70, the third directional displacement is not performed, so that the electrical contact of the electronic component 80 to be tested is actually contacted with the probe of the testing base 63 to perform the testing operation.
Referring to fig. 5, 8, 12, and 13, when replacing different types of test sockets, a worker does not need to mount or dismount the bolt in a narrow space, the open/close switch 24 of the positioning mechanism 20 can be used to electrically control the start of the press cylinder 22, so that the press cylinder 22 drives the abutting member 23 to move inward and contract, the abutting member 23 moves reversely along the sliding slot 212 of the fixing plate 21, the abutting member 231 of the abutting member 23 disengages from the supporting member 622 of the second substrate 62, and the test unit 60 with the test socket 63 is rapidly dismounted, then the test mechanism 40 drives the tester 41 to move downward in the third direction by using the transfer arm 42, the tester 41 drives the test circuit board 50 and the test unit 60 to move downward in the third direction, the scarf 623 of the test unit 60 disengages from the insertion member 302 of the machine 30, and the transfer arm 42 continues to drive the tester 41 and the test unit 60 to move downward in the third direction, the first engaging member 43 and the second engaging member 44 on the tester 41 are separated from the first guiding member 25 and the second guiding member 26 of the positioning mechanism 20, respectively, so that the tester 41 drives the testing unit 60 with the testing seat 63 to leave the machine 30, thereby facilitating the operation of replacing the testing seat, further shortening the operation time and improving the production efficiency.
Referring to fig. 14, the testing apparatus of the present invention can be applied to a testing apparatus, the testing apparatus is configured with a feeding device 90, a receiving device 100, a testing device, a conveying device 110 and a central control device (not shown) on a machine platform 30, the feeding device 90 is assembled on the machine platform 30 and is provided with at least one feeding mechanism for accommodating at least one electronic component to be tested; the material receiving device 100 is mounted on the machine 30 and has at least one material receiving mechanism for receiving at least one tested electronic component; the testing device is assembled on the machine table 30, and is provided with a testing mechanism 40, a testing circuit board 50, a testing unit 60 and a positioning mechanism 20 for testing electronic components; the conveying device 110 is provided with an input end material moving mechanism 1101 for conveying the electronic components to be tested at the feeding device 90 to the first feeding carrier 1102 and the second feeding carrier 1103 respectively, the first feeding carrier 1102 and the second feeding carrier 1103 carry the electronic components to be tested to the testing device respectively, so that the first pressing mechanism 1104 and the second pressing mechanism 1105 take out the electronic components to be tested and carry the electronic components to the testing device for testing, the conveying device 110 is provided with a first material receiving carrier 1106 and a second material receiving carrier 1107 capable of moving to the testing device to respectively carry the tested electronic components placed in the first pressing mechanism 1104 and the second pressing mechanism 1105 and carry out the testing device, the conveying device 110 is provided with an output end material moving mechanism 1108 for taking out the tested electronic components on the first material receiving carrier 1106 or the second material receiving carrier 1107 and conveying the tested electronic components to the material receiving device 100 for classified placement according to the testing result, the central control device is used to control and integrate the operation of each device to execute the automatic operation, thereby achieving the practical benefit of improving the operation efficiency.
Claims (10)
1. A test unit positioning mechanism of a testing device, comprising:
a machine station: has at least one opening;
a test unit: the test device comprises a loader with at least one substrate, a test seat with at least one probe and arranged on the at least one substrate, and at least one bearing part arranged on the loader;
a positioning mechanism: the test unit is assembled on the machine table and provided with at least one power source, the power source drives at least one abutting piece to move in at least one direction, at least one end of the abutting piece is provided with a jacking part used for positioning or detaching the loader of the test unit, and the at least one abutting piece can move to enable the jacking part to extend to the lower part of the at least one bearing part, so that the jacking part abuts against the at least one bearing part upwards to position the loader of the test unit.
2. The positioning mechanism of testing unit of testing device as claimed in claim 1, wherein the positioning mechanism has a fixing plate with a receiving space, the fixing plate is fixed on the bottom surface of the machine platform and is equipped with the power source.
3. The positioning mechanism of testing unit of claim 2, wherein the fixing plate is provided with a sliding slot for placing the abutting member.
4. The test unit positioning mechanism of claim 2, wherein the fixing plate of the positioning mechanism is provided with a supporting member in a moving path of the abutting member for supporting the abutting member.
5. The test unit positioning mechanism of claim 1, wherein the positioning mechanism comprises at least one switch for turning on and off the power source.
6. The apparatus as claimed in claim 1, wherein the carrier of the test unit has a first substrate and a second substrate, the first substrate has at least one receiving portion for receiving the test socket, the second substrate has a through hole, and the through hole is disposed above the first substrate for receiving the test socket.
7. The test element positioning mechanism of claim 6, wherein the at least one pedestal member is disposed on the second base plate.
8. The positioning mechanism of testing unit of testing device as claimed in claim 1, wherein the testing device comprises a testing mechanism, a testing circuit board and a guiding structure, the testing mechanism comprises a tester having a base, the testing circuit board is mounted on the base of the tester and electrically connects the tester and the testing base of the testing unit, and the guiding structure comprises a guiding member and a connecting member which are engaged with each other between the fixing plate of the positioning mechanism and the tester of the testing mechanism.
9. The test unit positioning mechanism of claim 8, wherein the guiding structure comprises a fitting member and an insertion member disposed between the machine platform and the carrier of the test unit.
10. A test apparatus using a test device, comprising:
a machine platform;
a feeding device: the feeding mechanism is assembled on the machine table and is used for accommodating the electronic element to be tested;
the material receiving device comprises: the receiving mechanism is assembled on the machine table and is used for accommodating the tested electronic element;
at least one test unit positioning mechanism of the test apparatus of claim 1: the testing unit is used for testing the electronic element, and the positioning mechanism is used for positioning or detaching the testing unit;
a conveying device: is assembled on the machine table and is provided with at least one material moving mechanism for moving and carrying the electronic elements;
the central control device: used to control and integrate the actions of each device to execute the automation operation.
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| CN201510315726.9A CN106290993B (en) | 2015-06-10 | 2015-06-10 | Test unit positioning mechanism of test device and test equipment applied by same |
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| CN201510315726.9A CN106290993B (en) | 2015-06-10 | 2015-06-10 | Test unit positioning mechanism of test device and test equipment applied by same |
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| CN106290993B true CN106290993B (en) | 2021-01-29 |
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| CN108957201A (en) * | 2017-05-19 | 2018-12-07 | 亚克先进科技股份有限公司 | Electronic component testing apparatus |
| CN108802439B (en) * | 2018-06-22 | 2020-07-10 | 湖北泰和电气有限公司 | Power generation control box tester convenient to operate |
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| JP2002164136A (en) * | 2000-11-28 | 2002-06-07 | Nec Ibaraki Ltd | Ic socket for bga |
| CN101078737A (en) * | 2006-05-24 | 2007-11-28 | 捷智科技股份有限公司 | Testing fixture and machine station combination device |
| JP4275163B2 (en) * | 2006-09-22 | 2009-06-10 | 株式会社アドバンテスト | Connector assembly, receptacle-type connector and interface device |
| KR101093646B1 (en) * | 2009-05-01 | 2011-12-15 | 가부시키가이샤 니혼 마이크로닉스 | A testing apparatus for a plate-shaped object |
| CN101901634B (en) * | 2009-05-26 | 2013-01-02 | 鸿劲科技股份有限公司 | USB memory testing sorter |
| JP5789206B2 (en) * | 2011-12-08 | 2015-10-07 | 東京エレクトロン株式会社 | Wafer inspection interface and wafer inspection apparatus |
| CN202916302U (en) * | 2012-11-30 | 2013-05-01 | 无锡日联科技有限公司 | A circuit board detecting and positioning mechanism |
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Effective date of registration: 20211008 Address after: Taichung City, Taiwan, China Patentee after: HONGJIN PRECISION Co.,Ltd. Address before: Taichung City Patentee before: HON TECHNOLOGIES, Inc. |