CN108957201A - Electronic component testing apparatus - Google Patents
Electronic component testing apparatus Download PDFInfo
- Publication number
- CN108957201A CN108957201A CN201710356017.4A CN201710356017A CN108957201A CN 108957201 A CN108957201 A CN 108957201A CN 201710356017 A CN201710356017 A CN 201710356017A CN 108957201 A CN108957201 A CN 108957201A
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- electronic component
- guidance part
- testing apparatus
- jacking
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
The present invention is a kind of electronic component testing apparatus, includes body, test module, plummer and lifting guide member.Test module is set to body.Plummer can be set on body with respect to test module along first direction with displacement, and plummer has auxiliary section.Lifting guide member can movably be set to body along the second direction perpendicular to first direction, going up and down guide member has guidance part, guidance part has first end and second end, first end and second end are located on the different location of first direction, when guidance part is when Chong Die with auxiliary section in second direction, auxiliary section cooperates guiding relative to guidance part and is displaced along first direction.
Description
Technical field
The present invention is related with electronic component testing apparatus.
Background technique
It presses, in the electronic component process of semiconductor industry, electronic component has to pass through test formality confirmation before factory
Its function is normal.General tester table has test module, takes and set module, bearing fixture and driving source.Take set module can will
Electronic component, which takes, to be placed on bearing fixture, and bearing fixture tests electronic component for putting electronic component, test module.Its
When test, driving source driving bearing fixture vertically jacks and is displaced the close calibrating terminal with test module to test module and connects
It touches and is tested.So, the bearing fixture of general test module is only capable of putting the electronic component of single, single kind, takes
It sets module and is also only capable of taking every time and set single electronic component, testing efficiency is not evident.In addition, when different electronic components need to be tested
When, it is necessary to the electronic component of different kenels could be carried by replacing different bearing fixtures, to be improved using upper convenience.
In addition, test module and electronic component must have specific contact force when contacting to ensure the stability tested.
Therefore, general tester table is mostly the vertically extending driving source of configuration, and driving source imposes the drive of vertical direction to bearing fixture
Power makes bearing fixture generate the displacement action of vertical direction.It is driven by the drive force bearing fixture edge of driving source with it
The identical direction engaged test module in amount of power direction.It can be seen that under this arrangement, driving source is driving bearing fixture lifting
It must thus extend in the vertical direction.In this way, which tester table can not reduce in the volume in vertical direction, lead to test machine
Platform is also difficult to do to be laminated in vertical direction and use, thus can not make the configuration of more test sections, and testing efficiency is caused to be difficult to effectively mention
It rises.
Summary of the invention
The embodiment of the present invention provides a kind of electronic component testing apparatus, and main purpose is to improve general test board to be difficult to
Meet the configuration of more test sections, can not effectively promote the missing of testing efficiency.
For up to foregoing purpose, the embodiment of the present invention is a kind of electronic component testing apparatus, comprising body, test module, hold
Microscope carrier and lifting guide member.Test module is set to body.Plummer can be arranged with displacement with respect to test module along first direction
In on body, and plummer has auxiliary section.Lifting guide member can be movably arranged along the second direction perpendicular to first direction
In body, going up and down guide member has guidance part, and guidance part has first end and second end, and first end and second end are located at first party
To different location on, when guidance part is when Chong Die with auxiliary section in second direction, auxiliary section cooperates relative to guidance part to be guided
And it is displaced along first direction.
The present embodiment passes through the lifting guide member being displaced in a second direction and plummer is driven to be displaced along first direction, is not necessary to increase
Add space on first direction that the component for driving plummer displacement is set, can be greatly reduced accordingly electronic component testing apparatus in
Volume on first direction occupies, and can enable electronic component testing apparatus in being overlapped use on first direction, meets more tests
The configuration in area, and testing efficiency can be greatly improved under identical space.
Detailed description of the invention
Fig. 1 is the stereo appearance figure of one embodiment of electronic component testing apparatus of the present invention.
Fig. 2 is another view stereo outside drawing of one embodiment of electronic component testing apparatus of the present invention.
Fig. 3 is the three-dimensional cutaway view of one embodiment of electronic component testing apparatus of the present invention.
The action schematic diagram that Fig. 4 is hookup 3.
Fig. 5 is that the plummer of one embodiment of electronic component testing apparatus of the present invention changes the stereo appearance figure of position.
Fig. 6 is the side view of Fig. 5 example.
Fig. 7 is the three-dimensional cutaway view of Fig. 5 example.
Fig. 8 is the action schematic diagram of hookup 7.
Fig. 9 is the stereo appearance figure of Fig. 8 embodiment state.
Figure 10 is the outside side view of Fig. 9 example.
Wherein appended drawing reference are as follows:
10 body, 11 first bolster
12 second bolsters 20 test host
21 control panel, 30 test module
31 test surfaces, 40 plummer
41 substrate, 411 guide post
42 lifter plate, 43 side plate
44 the first auxiliary sections auxiliary section 44A
The second auxiliary section 44B 50 goes up and down guide member
51 the first guidance parts of guidance part 51A
The second guidance part of 51B 511 translates section
511A first translates section 511B second and translates section
512 jacking section 512A first jack section
512B second jacks section 60 first and translates guide unit
61 first sliding rail, 62 first sliding block
63 first driving source, 631 first cylinder body
632 first telescopic rods 70 second translate guide unit
71 second sliding rail, 72 second sliding block
73 second driving source, 731 second cylinder body
732 second telescopic rod D1 first directions
D2 second direction T pallet
E1 first end E2 second end
C link plate θ jacks angle
θ 1 first jacks angle θ 2 second and jacks angle
Specific embodiment
Please cooperate with reference to Fig. 1, Fig. 1 is the stereo appearance figure of an embodiment of electronic component testing apparatus of the present invention.Yu Yi
In embodiment, electronic component testing apparatus includes body 10, test module 30, plummer 40 and lifting guide member 50.Test
Module 30, plummer 40 and lifting guide member 50 are set to body 10.Plummer 40 is to carry pallet (Tray) T and can phase
Test module 30 is displaced along first direction D1.Lifting guide member 50 is moved along the second direction D2 of vertical first direction D1, and
It drives plummer 40 to carry pallet T to be displaced along first direction D1 can test close to 30 tested person module 30 of test module.Whereby,
By the direction of displacement configuration different from plummer 40 of lifting guide member 50, single unit system is reduced in the height on first direction D1
Degree, and then occupying for overall volume is reduced simultaneously, improve the space utilization rate of configuration electronic component testing apparatus.
Refering to fig. 1, in an embodiment, body 10 has the first bolster 11 and the second bolster 12, the first bolster 11 and the
Two bolsters 12 are located on the different location on second direction D2.
Refering to fig. 1 and Fig. 2, in an embodiment, electronic component testing apparatus further includes test host 20, tests host 20
Can be set and be electrically connected on the first bolster 11 of body 10 and with test module 30, be also possible to independently of body 10 it is outer with
Test module 30 is electrically connected.Test host 20 more may include control panel 21, and control panel 21 is set to the first bolster 11
One end far from the second bolster 12 manipulates test host 20 for operator.
Again please refer to Fig. 1 and Fig. 3, test module 30 has a test surfaces 31 and is set to the second bolster of body 10
On 12, test module 30 and test host 20 are electrically connected, so that test host 20 can control test module 30 and be tested
And receive test result.The test surfaces 31 of test module 30 have multiple calibrating terminals, the multiple electronic components of accommodating in pallet T,
Test module 30 is tested with the electronic component in the calibrating terminals of test surfaces 31 contact pallet T, and can after a test will be electric
The test result of subcomponent is sent to test host 20.
Then please refer to Fig. 3, plummer 40 is to carry pallet T to be displaced along first direction D1 close to test module
The test of 30 tested person modules 30.And plummer 40 D2 can also be set on body 10 with displacement in a second direction simultaneously.By
This keep plummer 40 movable to from test module 30 in a second direction d 2 different position.In this way, plummer 40
It can be to move to the position for making the position of pallet T completely disengage test module 30, in order to which taking for pallet T is set.
And when being intended to be tested, plummer 40 is moved to test module 30 on the identical position second direction D2,
Such as Fig. 4 to 6.In this, plummer 40 has auxiliary section 44.Going up and down guide member 50 can be along the second direction D2 of vertical first direction D1
It is movably set to body 10, lifting guide member 50 has guidance part 51.When going up and down the D2 displacement in a second direction of guide member 50,
The auxiliary section 44 of plummer 40 is guided by guidance part 51 and is displaced along first direction D1.
In an embodiment, cooperate refering to fig. 4 to fig. 6, plummer 40 is set to second party identical with test module 30
To on the position D2, but not limited to this.Plummer 40 includes substrate 41, lifter plate 42, two side plates 43 and auxiliary section 44.Substrate
Guide post 411 is provided on 41, guide post 411 extends along first direction D1.Lifter plate 42 is movably set in guide post 411 and can edge
First direction D1 sliding.Two side plates 43 are fixedly installed on the two sides of lifter plate 42 respectively, with 42 synchronization lifting of lifter plate.Cooperation
Portion 44 is set on side plate 43, with 43 synchronization action of side plate.In an embodiment, auxiliary section 44 is cam.In this, plummer
40 lifter plate 42 opposite test module 30 synchronous with side plate 43 and auxiliary section 44 is displaced along first direction D1.In an embodiment
In, auxiliary section 44 is all provided on two side plates 43.
Again please refer to Fig. 6, going up and down guide member 50 movably can be set to body 10, lifting guiding by D2 in a second direction
D2 is mobile to guide plummer 40 along first direction D1 displacement close to or far from test module 30 in a second direction for part 50.Yu Yishi
It applies in example, lifting guide member 50 has guidance part 51, and guidance part 51 is the guide groove being extended continuously.Further, guidance part 51 has
There are first end E1 and second end E2, first end E1 and second end E2 to be located on the different positions first direction D1, and first end E1
It also is located at from second end E2 on the different positions second direction D2.When the D2 displacement in a second direction of lifting guide member 50, and it is displaced
To the guidance part 51 for going up and down guide member 50 when the position on second direction D2 is Chong Die with auxiliary section 44, leading for guide member 50 is gone up and down
Draw portion 51 to be taken the lead in the portion of being engaged 44, auxiliary section 44 being made to receive into guidance part 51 to be led by guidance part 51 by first end E1
Draw.
In this, cooperation is refering to Fig. 8 to Figure 10, when lifting guide member 50 continues D2 displacement in a second direction, lifting guiding
The guidance part 51 of part 50 persistently changes the position in relative engagement portion 44, and the position in 51 relative engagement portion 44 of guidance part is by first
E1 is held gradually to change to second end E2.When guidance part 51 is to be changed as by the position first end E1 relative engagement portion 44 with second end
When the relative engagement portion 44 of the position E2, auxiliary section 44 by first end E1 and second end E2 in the position change on first direction D1 and
It is corresponding to change position, and make auxiliary section 44 change the position on first direction D1 together with side plate 43 and lifter plate 42 and gradually lean on
Nearly test module 30 is tested with tested person module 30.
Refering to Fig. 6 and Figure 10, further, in an embodiment, guidance part 51 includes at least jacking section 512, jacks section
512 both ends are located on the different positions first direction D1, and jack to have between section 512 and second direction D2 and jack angle θ.It leads
Draw portion 51 also and may include multiple jacking sections 512 and sequentially connect, when guidance part 51 includes multiple jacking sections 512, respectively jacks section
512 have jacking angle θ between second direction D2 respectively, and closer to test module 30 in the jacking of position on first direction D1
The jacking angle θ of section 512 is smaller.Enable plummer 40 with the state contacts test module 30 of the high thrust of low speed whereby.
In an embodiment, refering to Fig. 6 and Figure 10, guidance part 51 can further include translation section 511, and guidance part 51 can be by
It translates section 511 and jacking 512 matched combined of section is constituted.In this, guidance part 51 includes the first translation section 511A being sequentially connected, the
One jacking section 512A, the second jacking section 512B and the second translation section 511B.D2 extends first translation section 511A in a second direction,
There is first jacking section 512A and second direction D2 the first jacking angle θ 1, the second jacking section 512B and second direction D2 to have second
Angle θ 2 is jacked, D2 extends the second translation section 511B in a second direction.First jacking angle θ 1 is greater than the second jacking angle θ 2.First translation
Section 511A, the first jacking section 512A, the second jacking section 512B and the second translation section 511B on second direction D2 in not being overlapped.
Whereby, refering to Fig. 6 and Figure 10, auxiliary section 44 is corresponding to be placed in the first translation section 511A, and to lifting guide member 50
When imposing the strength of second direction D2, due to bestowing the strength direction and the extension side of the first translation section 511A of lifting guide member 50
To coincideing, the resistance that the first translation section 511A generates lifting guide member 50 is minimum, is this means, applied to lifting guide member 50
The strength energy consumption of second direction D2 is few, therefore can quickly and surely drive the D2 displacement in a second direction of lifting guide member 50, according to
This quick correcting plummer 40 is located at correctly by guiding position.
Then, when auxiliary section 44 enters the first jacking section 512A by translation section 511, the first jacking section 512A and second party
To D2 there is the kenel of jacking angle θ auxiliary section 44 is directed to and can change in the position on first direction D1.And due to
One jacking section 512A has biggish jacking angle compared to the second jacking section 512B and the second translation section 511B and second direction D2
θ, therefore, in comparison, under the premise of going up and down the identical distance of D2 displacement in a second direction of guide member 50, auxiliary section 44 is in first
Can be directed in jacking section 512A and in generating biggish jacking distance on first direction D1.Therefore, the auxiliary section of plummer 40
Plummer 40 can be rapidly driven to jack close to test module 30 within the scope of 44 guidings for jacking section 512A in first.
Then, when auxiliary section 44 enters the second jacking section 512B by the first jacking section 512A, due to the second jacking angle θ 2
Less than the first jacking angle θ 1, therefore, the speed that the second jacking section 512B drives plummer 40 to be displaced to test module 30 is reduced.By
This reduces the pallet T on plummer 40 by speed with engaged test module 30, simultaneously, also due to the second jacking angle θ's 2 subtracts
Small, being applied to suffered resistance when the strength of lifting guide member 50 is located at the first jacking section 512A relative to auxiliary section 44 reduces,
Therefore again can be improved plummer 40 to test module 30 contact when thrust, make plummer 40 at a slow speed, the state of high thrust
Engaged test module 30 certainly can contact survey with the calibrating terminal of test module 30 with the electronic component ensured in pallet T
Examination, improves the stability of test.
Then, refering to Fig. 8 to Figure 10, auxiliary section 44 enters the second translation section 511B by the second jacking section 512B, works as cooperation
When portion 44 enters the second translation section 511B, the second translation section 511B structure that D1 extends in a second direction keeps plummer 40
In identical height, and auxiliary section 44 then can be far from the second jacking section 51B, it is ensured that auxiliary section 44 does not return to the second jacking section easily
51B, and plummer 40 can be made more stably to be in tested position.
As shown in the above description, it in an embodiment of electronic component testing apparatus of the present invention, drives and carries holding for pallet T
Microscope carrier 40 is not necessary to along the mechanism that first direction D1 is displaced in extension configuration on first direction D1, and can be along vertical first direction D1
Second direction D2 configuration.In this way, which the overall mechanism of the present embodiment is not only restricted to the displacement action of plummer 40 and increases
Overall mechanism is in the height on first direction D1.The present embodiment electronic component testing apparatus is improved whereby to use in spatially configuration
Freedom degree.
Further, it is flat to further include first please refer to Fig. 3 and Fig. 4 to be easily carried the pick-and-place of 40 top tray T of platform
Move guide unit 60.First translation guide unit 60 is set to body 10, and plummer 40 is connected to the first translation guide unit 60
And it D2 can be displaced in a second direction.In an embodiment, the first translation guide unit 60 includes the first sliding rail 61 and the first sliding block
62, the first sliding rail 61 is fixedly installed on plummer 40 and D2 extends in a second direction, and the first sliding rail 61 is movably set in
First sliding block 62, and the first sliding block 62 is fixed on body 10.
Whereby, plummer 40 can be guided D2 in a second direction by the cooperation of the first sliding rail 61 and the first sliding block 62 and is displaced
To with the nonoverlapping position in a second direction d 2 of test module 30.In this way, plummer 40 on first direction D1 not yet
It is Chong Die with test module 30, then become open state on the first direction D1 of plummer 40, pallet T just can be by first direction D1
It is placed on plummer 40, improves take tray T in the convenience on plummer 40 accordingly.
Further, please refer to Fig. 3 and Fig. 4, for the displacement precision and efficiency for improving plummer 40, to meet
Efficient test, the first translation guide unit 60 more may include the first driving source 63, and the first driving source 63 can be cylinder pressure,
But not limited to this.When the first driving source 63 is cylinder pressure, the first driving source 63 includes the first cylinder body 631 and the first telescopic rod
632.First cylinder body 631 is fixedly installed on body 10, and the first telescopic rod 632 can be set to D2 telescopic displacement in a second direction
In one cylinder body 631, one end of the first telescopic rod 632 stretches out the first cylinder body 631 and is fixed on substrate 41.Whereby, when the first cylinder body
When 631 running, D2 displacement is flexible in a second direction for the first telescopic rod 632 of the first cylinder body 631, and in this, the first telescopic rod 632 is just
Substrate 41 and lifter plate 42 thereon, side plate 43, the D2 movement in a second direction of auxiliary section 44 can be driven.In addition, the first driving source
63 can connect with the test control of host 20, in this way, test host 20 just and can control the first driving source 63 reach precisely and from
The running of dynamicization.
First driving source 63 can be set on body 10 with being extended with D2 in a second direction, and whereby, the first translation of driving is led
The first driving source 63 for drawing unit 60 is not more than the space that plummer 40 occupies in itself in the space occupied on first direction D1.
This means, first translation guide unit 60 because be arranged first driving source 63 due to be not added on first direction D1 occupied by space.
In addition, more being wrapped to improve the running convenience of lifting guide member 50 and smoothness please refer to Fig. 7 and Fig. 8
Containing the second translation guide unit 70.Second translation guide unit 70 is set to body 10, and it is flat that lifting guide member 50 is connected to second
It moves guide unit 70 and D2 can be displaced in a second direction.In an embodiment, the second translation guide unit 70 includes the second sliding rail
71 and second sliding block 72, D2 extends the second sliding rail 71 in a second direction, and the second sliding block 72, which movably covers, is overlying on the second sliding rail 71,
And lifting guide member 50 is connected to the second sliding block 72.
Whereby, lifting guide member 50 can pass through the cooperation D2 displacement in a second direction of the second sliding block 72 and the second sliding rail 71,
Improve the displacement smooth degree and efficiency of lifting guide member 50.Further, the second translation guide unit 70 more may include the
Two driving sources 73, the second driving source 73 can be cylinder pressure, and but not limited to this.
Cooperation is refering to Fig. 7 and Fig. 8, and when the second driving source 73 is cylinder pressure, the second driving source 73 can be controlled with test host 20
System connection reaches the running precisely and automated in this way, test host 20 just and can control the second driving source 73.It is driven second
When dynamic source 73 is cylinder pressure, the second driving source 73 includes the second cylinder body 731 and the second telescopic rod 732.It and is cooperation plummer 40
The auxiliary section 44 of two side plates 43, the two sides of plummer 40 be respectively set lifting guide member 50, and two lifting guide members 50 between with
One link plate C connection.In this, the second cylinder body 731 is fixedly installed on body 10, and the second telescopic rod 732 can be stretched D2 in a second direction
Contracting is set to displacement in the second cylinder body 731, and one end of the second telescopic rod 732 stretches out the second cylinder body 731 and is fixed on link plate
C.Whereby, when the second cylinder body 731 operates, D2 displacement is flexible in a second direction for the second telescopic rod 732 of the second cylinder body 731, in
This, the second telescopic rod 732 just can drive link plate C and two to go up and down the D2 movement in a second direction of guide member 50.
Similarly, refering to Fig. 7 and Fig. 8, D2 is set on body 10 73 system of the second driving source with extending in a second direction.By
This, the second driving source 73 of driving the second translation guide unit 70 is not more than plummer in the space occupied on first direction D1
40 spaces occupied in itself.This means, the second translation guide unit 70 is not added on first direction D1 because driving source 73 are arranged
Occupied space.In this way, which the present embodiment electronic component testing apparatus can reduce as much as possible in institute on first direction D1
The space occupied, whereby, in multiple electronic component testing apparatus simultaneously in use, just can be by electronic component testing apparatus in first
It overlaps on the D1 of direction, and more electronic component testing apparatus can be provided under the premise of the smallest space requirement, improve and survey
Try efficiency.
Further, aforementioned first driving source 63 and the second driving source 73 are neither limited with cylinder pressure.Pass through gear, rack gear
Cooperation drives, and is driven by the cooperation of screw rod, nut, or is driven by the cooperation of belt and motor, is all that this field has
Other state sample implementations that usual skill is expected.
Please refer to Fig. 6 and Figure 10, in an embodiment, the first cooperation is respectively set on each side plate 43 of plummer 40
Portion 44A and the second auxiliary section 44B, the first auxiliary section 44A and the second auxiliary section 44B on first direction D1 and second direction D2 all
It is not overlapped.In this, going up and down guide member 50 has the first guidance part 51A and the second guidance part 51B, the translation of the second guidance part 51B
The range of section 511 is in Chong Die with the whole of the first guidance part 51A on second direction D2.In this way, which the first auxiliary section 44A enters
The time point of first guidance part 51A and the time point of the second auxiliary section 44B into the second guidance part 51B have the time difference.In this
In example, before the first auxiliary section 44A not yet enters the first guidance part 51A, the second auxiliary section 44B is just introduced into the second guidance part
The translation section 511 of 51B.In this way, which the translation section 511 that the second auxiliary section 44B is able to cooperate the second guidance part 51B makes plummer
40 are located at correctly by guiding position, and can be under the situation that lifting guide member 50 is persistently displaced, it is ensured that the first auxiliary section 44A energy
It is smooth and properly enter the first guidance part 51A, finally, being respectively contained in by the first auxiliary section 44A and the second auxiliary section 44B
First guidance part 51A and the second guidance part 51B, and plummer 40 can certainly be driven to be displaced.
In summary, in the embodiment of above-mentioned electronic component testing apparatus, 40 system of plummer carries pallet T to drive pallet
T is moved to tested position and is tested, and each displacement of plummer 40 is the multiple electronic components carried in pallet T, electronics member
Part test device can once test multiple electronic components in each test job, and testing efficiency can be substantially improved.
In addition, replacement plummer 40 is not necessary to when the kenel difference of electronic building brick, as long as and selecting has identical external form
Pallet T carries electronic building brick, and plummer 40 can carry pallet T smoothly just to drive pallet T to complete test, and raising uses whereby
Convenience.
Furthermore drive plummer 40 along the drive displacement direction system edge that first direction D1 is displaced in electronic component testing apparatus
The second direction D2 of vertical first direction D1, enables electronic component testing apparatus reduce in the volume on first direction D1 whereby,
And electronic component testing apparatus is made to be able to improve the electricity that can be configured in identical space in stack arrangement on first direction D1
Subcomponent test device quantity, and the test volume of unit space is improved in turn.
In addition to this, in terms of the stability of running, since 40 system of plummer contacts with displacement along first direction D1
Test module 30 must endure as on first direction D1 with the test of tested person module 30 when plummer 40 and test module 30 contact
Strength, and not along first direction D1 extend guidance part 51 then can be in plummer 40 by the strength on first direction D1
When provide support and buffering strength, it is ensured that plummer 40 can test when keep stablize.
Although the present invention is disclosed as above with embodiment, however, it is not to limit the invention, any technical field
Middle tool usually intellectual, without departing from the spirit and scope of the present invention, when can make a little modification and variation.Therefore, only
Wanting these modifications and variation is in appended claims and the range same with it, and the present invention will also cover these and repair
Change and changes.
Claims (11)
1. a kind of electronic component testing apparatus, characterized by comprising:
One body；
One test module is set to the body；
One plummer can be set to displacement on the body with respect to the test module along a first direction, and the plummer has
One auxiliary section；And
One lifting guide member, can movably be set to the body along the second direction perpendicular to the first direction, which leads
Draw part with a guidance part, which has a first end and a second end, the first end and the second end be located at this first
On the different location in direction, when the guidance part is when Chong Die with the auxiliary section in the second direction, which leads relative to this
Draw portion's cooperation guiding and is displaced along the first direction.
2. electronic component testing apparatus as described in claim 1, which is characterized in that further include a test host, be set to this
Body, the test host and the test module are electrically connected.
3. electronic component testing apparatus as described in claim 1, which is characterized in that one first translation guide unit is further included,
It is set to the body, which is connected to the first translation guide unit and can be displaced along the second direction.
4. electronic component testing apparatus as described in claim 1, which is characterized in that one second translation guide unit is further included,
It is set to the body, which is connected to the second translation guide unit and can be displaced along the second direction.
5. electronic component testing apparatus as claimed in claim 4, which is characterized in that further include one second driving source, be set to
On the body, which connects the second translation guide unit to drive the second translation guide unit to drive the lifting
Guide member is displaced along the second direction.
6. electronic component testing apparatus as described in claim 1, which is characterized in that the auxiliary section is cam, which is
Slot is led.
7. electronic component testing apparatus as described in claim 1, which is characterized in that the guidance part includes a jacking section, the top
Section inclination is risen to extend and there is a jacking angle with the second direction.
8. electronic component testing apparatus as claimed in claim 7, which is characterized in that the guidance part includes multiple jacking sections, should
Multiple jacking sections are located on different first direction positions, and multiple jacking section has a jacking with the second direction respectively
Angle, it is smaller in the jacking angle of the jacking section of position on first direction closer to test module.
9. electronic component testing apparatus as claimed in claim 7, which is characterized in that the guidance part further includes a translation section, should
Translation section connects the jacking section, which extends along the second direction, and the translation section and the jacking section are positioned at different the
On two directions position, which is located at the translation section, which is located at the jacking section.
10. electronic component testing apparatus as claimed in claim 9, which is characterized in that the auxiliary section includes one first auxiliary section
And one second auxiliary section, which includes one first guidance part and one second guidance part, when the lifting guide member is in this
When Chong Die with the plummer in second direction, which is placed in first guidance part, second auxiliary section accommodating
In in second guidance part.
11. electronic component testing apparatus as claimed in claim 10, wherein the range of the translation section of second guidance part is in this
It is Chong Die with the whole of first guidance part in second direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710356017.4A CN108957201A (en) | 2017-05-19 | 2017-05-19 | Electronic component testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710356017.4A CN108957201A (en) | 2017-05-19 | 2017-05-19 | Electronic component testing apparatus |
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|---|---|
| CN108957201A true CN108957201A (en) | 2018-12-07 |
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| CN201710356017.4A Withdrawn CN108957201A (en) | 2017-05-19 | 2017-05-19 | Electronic component testing apparatus |
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| US6307388B1 (en) * | 2000-02-23 | 2001-10-23 | Unisys Corporation | Electromechanical apparatus for testing IC chips using first and second sets of substrates which are pressed together |
| TW200632346A (en) * | 2005-02-15 | 2006-09-16 | Advantest Corp | Burn-in apparatus |
| CN201096808Y (en) * | 2007-11-16 | 2008-08-06 | 深圳华为通信技术有限公司 | Sliding slot clamp |
| CN106290993A (en) * | 2015-06-10 | 2017-01-04 | 鸿劲科技股份有限公司 | The test cell detent mechanism of test device and the test equipment of application thereof |
-
2017
- 2017-05-19 CN CN201710356017.4A patent/CN108957201A/en not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6307388B1 (en) * | 2000-02-23 | 2001-10-23 | Unisys Corporation | Electromechanical apparatus for testing IC chips using first and second sets of substrates which are pressed together |
| JP2001264386A (en) * | 2000-03-16 | 2001-09-26 | Nippon Eng Kk | Loader/unloader device for burn-in board |
| TW200632346A (en) * | 2005-02-15 | 2006-09-16 | Advantest Corp | Burn-in apparatus |
| CN201096808Y (en) * | 2007-11-16 | 2008-08-06 | 深圳华为通信技术有限公司 | Sliding slot clamp |
| CN106290993A (en) * | 2015-06-10 | 2017-01-04 | 鸿劲科技股份有限公司 | The test cell detent mechanism of test device and the test equipment of application thereof |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
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| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20181207 |