CN106201431B - 半导体装置 - Google Patents
半导体装置 Download PDFInfo
- Publication number
- CN106201431B CN106201431B CN201510553438.7A CN201510553438A CN106201431B CN 106201431 B CN106201431 B CN 106201431B CN 201510553438 A CN201510553438 A CN 201510553438A CN 106201431 B CN106201431 B CN 106201431B
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- fifo
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/32—Timing circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1668—Details of memory controller
- G06F13/1673—Details of memory controller using buffers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F5/00—Methods or arrangements for data conversion without changing the order or content of the data handled
- G06F5/06—Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/02—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding parasitic signals
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
- G11C7/1012—Data reordering during input/output, e.g. crossbars, layers of multiplexers, shifting or rotating
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1039—Read-write modes for single port memories, i.e. having either a random port or a serial port using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/106—Data output latches
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1066—Output synchronization
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2205/00—Indexing scheme relating to group G06F5/00; Methods or arrangements for data conversion without changing the order or content of the data handled
- G06F2205/06—Indexing scheme relating to groups G06F5/06 - G06F5/16
- G06F2205/067—Bidirectional FIFO, i.e. system allowing data transfer in two directions
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/10—Aspects relating to interfaces of memory device to external buses
- G11C2207/108—Wide data ports
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2281—Timing of a read operation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/1302—Disposition
- H01L2224/13025—Disposition the bump connector being disposed on a via connection of the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
- H01L2224/16146—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked the bump connector connecting to a via connection in the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/17—Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
- H01L2224/171—Disposition
- H01L2224/1718—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/17181—On opposite sides of the body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dram (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
Description
Claims (20)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010124505.4A CN111309284B (zh) | 2015-05-28 | 2015-09-02 | 半导体装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562167703P | 2015-05-28 | 2015-05-28 | |
US62/167,703 | 2015-05-28 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010124505.4A Division CN111309284B (zh) | 2015-05-28 | 2015-09-02 | 半导体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106201431A CN106201431A (zh) | 2016-12-07 |
CN106201431B true CN106201431B (zh) | 2020-03-24 |
Family
ID=57398788
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510553438.7A Active CN106201431B (zh) | 2015-05-28 | 2015-09-02 | 半导体装置 |
CN202010124505.4A Active CN111309284B (zh) | 2015-05-28 | 2015-09-02 | 半导体装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010124505.4A Active CN111309284B (zh) | 2015-05-28 | 2015-09-02 | 半导体装置 |
Country Status (3)
Country | Link |
---|---|
US (9) | US9558840B2 (zh) |
CN (2) | CN106201431B (zh) |
TW (5) | TWI680466B (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI680466B (zh) * | 2015-05-28 | 2019-12-21 | 日商東芝記憶體股份有限公司 | 半導體裝置 |
KR102624808B1 (ko) * | 2016-07-13 | 2024-01-17 | 삼성전자주식회사 | 멀티 랭크로 구성된 메모리와 인터페이싱을 수행하는 인터페이스 회로 |
JP6721696B2 (ja) | 2016-09-23 | 2020-07-15 | キオクシア株式会社 | メモリデバイス |
US10163469B2 (en) | 2016-11-30 | 2018-12-25 | Micron Technology, Inc. | System and method for write data bus control in a stacked memory device |
JP6679528B2 (ja) * | 2017-03-22 | 2020-04-15 | キオクシア株式会社 | 半導体装置 |
KR102512754B1 (ko) * | 2018-03-30 | 2023-03-23 | 삼성전자주식회사 | 관통 전극을 통해 전송되는 제어 신호를 이용하여 데이터를 샘플링하는 메모리 장치 |
US11545987B1 (en) | 2018-12-12 | 2023-01-03 | Marvell Asia Pte, Ltd. | Traversing a variable delay line in a deterministic number of clock cycles |
US11402413B1 (en) * | 2018-12-12 | 2022-08-02 | Marvell Asia Pte, Ltd. | Droop detection and mitigation |
US11545981B1 (en) | 2018-12-31 | 2023-01-03 | Marvell Asia Pte, Ltd. | DLL-based clocking architecture with programmable delay at phase detector inputs |
US20230299050A1 (en) * | 2022-03-21 | 2023-09-21 | Qualcomm Incorporated | Test architecture for 3d stacked circuits |
US11927612B1 (en) | 2022-04-07 | 2024-03-12 | Marvell Asia Pte Ltd | Digital droop detector |
CN116580743B (zh) * | 2023-04-26 | 2024-01-23 | 珠海妙存科技有限公司 | 一种内存读采样电路及其延时调节方法及读采样装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20050066207A (ko) * | 2003-12-26 | 2005-06-30 | 매그나칩 반도체 유한회사 | 파이프라인 구조를 갖는 선입선출 메모리 장치 |
CN1828511A (zh) * | 2005-01-11 | 2006-09-06 | 三星电子株式会社 | 固态盘控制器装置 |
CN101573903A (zh) * | 2006-11-08 | 2009-11-04 | 菲尼萨公司 | 用于在光电设备中使用的串化器/解串器 |
JP2012108590A (ja) * | 2010-11-15 | 2012-06-07 | Elpida Memory Inc | 半導体装置 |
Family Cites Families (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS46825Y1 (zh) | 1966-02-10 | 1971-01-13 | ||
JPH04370507A (ja) | 1991-06-20 | 1992-12-22 | Alps Electric Co Ltd | 磁気ヘッドおよびその製造方法 |
DE19704322A1 (de) * | 1997-02-05 | 1998-08-13 | Siemens Nixdorf Inf Syst | Speichereinrichtung und Verfahren zum Speichern von Daten nach dem FIFO-Prinzip |
US6622224B1 (en) * | 1997-12-29 | 2003-09-16 | Micron Technology, Inc. | Internal buffered bus for a drum |
US6662224B1 (en) | 1999-09-24 | 2003-12-09 | International Business Machines Corporation | Methods, systems and computer program products for providing alternative displays for networked devices |
US6144604A (en) * | 1999-11-12 | 2000-11-07 | Haller; Haggai Haim | Simultaneous addressing using single-port RAMs |
US7051264B2 (en) | 2001-11-14 | 2006-05-23 | Monolithic System Technology, Inc. | Error correcting memory and method of operating same |
US6678201B2 (en) * | 2002-04-08 | 2004-01-13 | Micron Technology, Inc. | Distributed FIFO in synchronous memory |
US7571287B2 (en) | 2003-03-13 | 2009-08-04 | Marvell World Trade Ltd. | Multiport memory architecture, devices and systems including the same, and methods of using the same |
TW200500857A (en) * | 2003-04-09 | 2005-01-01 | Netcell Corp | Method and apparatus for synchronizing data from asynchronous disk drive data transfers |
JP4370507B2 (ja) | 2003-11-27 | 2009-11-25 | エルピーダメモリ株式会社 | 半導体集積回路装置 |
US7106098B1 (en) * | 2004-05-04 | 2006-09-12 | Xilinx, Inc. | Split FIFO configuration of block RAM |
US7454538B2 (en) | 2005-05-11 | 2008-11-18 | Qualcomm Incorporated | Latency insensitive FIFO signaling protocol |
US7406566B2 (en) * | 2005-06-03 | 2008-07-29 | Intel Corporation | Ring interconnect with multiple coherence networks |
JP4600825B2 (ja) | 2005-09-16 | 2010-12-22 | エルピーダメモリ株式会社 | 半導体記憶装置 |
US7440351B2 (en) * | 2005-10-25 | 2008-10-21 | Promos Technologies Pte. Ltd. | Wide window clock scheme for loading output FIFO registers |
US8207976B2 (en) * | 2007-03-15 | 2012-06-26 | Qimonda Ag | Circuit |
KR101430166B1 (ko) | 2007-08-06 | 2014-08-13 | 삼성전자주식회사 | 멀티 스택 메모리 장치 |
KR101393311B1 (ko) * | 2008-03-19 | 2014-05-12 | 삼성전자주식회사 | 프로세스 변화량을 보상하는 멀티 칩 패키지 메모리 |
US7979607B2 (en) | 2009-02-27 | 2011-07-12 | Honeywell International Inc. | Cascadable high-performance instant-fall-through synchronous first-in-first-out (FIFO) buffer |
US8243737B2 (en) | 2009-03-23 | 2012-08-14 | Lsi Corporation | High speed packet FIFO input buffers for switch fabric with speedup and retransmit |
JP2010272168A (ja) | 2009-05-21 | 2010-12-02 | Elpida Memory Inc | 半導体装置 |
US8339891B2 (en) * | 2010-05-25 | 2012-12-25 | Lsi Corporation | Power savings and/or dynamic power management in a memory |
JP5649888B2 (ja) * | 2010-09-17 | 2015-01-07 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置 |
WO2012053015A2 (en) * | 2010-10-22 | 2012-04-26 | Jana, Tejaswini, Ramesh | Compression and decompression of data at high speed in solid state storage |
JP5632269B2 (ja) * | 2010-11-26 | 2014-11-26 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置 |
EP2466479B1 (en) * | 2010-12-20 | 2013-11-27 | STMicroelectronics (Grenoble 2) SAS | Interface system, and corresponding integrated circuit and method |
TWI437411B (zh) | 2011-03-14 | 2014-05-11 | Realtek Semiconductor Corp | 用於時脈樹轉換處的先入先出(fifo)裝置與方法 |
JP2012216652A (ja) * | 2011-03-31 | 2012-11-08 | Elpida Memory Inc | 半導体装置 |
KR20130011138A (ko) * | 2011-07-20 | 2013-01-30 | 삼성전자주식회사 | 모노 랭크와 멀티 랭크로 호환 가능한 메모리 장치 |
US9285826B2 (en) * | 2011-12-22 | 2016-03-15 | Intel Corporation | Deterministic clock crossing |
US9411722B2 (en) * | 2013-03-04 | 2016-08-09 | Sandisk Technologies Llc | Asynchronous FIFO buffer for memory access |
JP2015141725A (ja) * | 2014-01-28 | 2015-08-03 | マイクロン テクノロジー, インク. | 半導体装置及びこれを備える情報処理システム |
KR102179297B1 (ko) * | 2014-07-09 | 2020-11-18 | 삼성전자주식회사 | 모노 패키지 내에서 인터커넥션을 가지는 반도체 장치 및 그에 따른 제조 방법 |
US9916873B2 (en) * | 2015-02-12 | 2018-03-13 | Rambus Inc. | Extended capacity memory module with dynamic data buffers |
TWI680466B (zh) * | 2015-05-28 | 2019-12-21 | 日商東芝記憶體股份有限公司 | 半導體裝置 |
KR102585218B1 (ko) * | 2017-09-28 | 2023-10-05 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 그것을 포함하는 저장 장치 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20050066207A (ko) * | 2003-12-26 | 2005-06-30 | 매그나칩 반도체 유한회사 | 파이프라인 구조를 갖는 선입선출 메모리 장치 |
CN1828511A (zh) * | 2005-01-11 | 2006-09-06 | 三星电子株式会社 | 固态盘控制器装置 |
CN101573903A (zh) * | 2006-11-08 | 2009-11-04 | 菲尼萨公司 | 用于在光电设备中使用的串化器/解串器 |
JP2012108590A (ja) * | 2010-11-15 | 2012-06-07 | Elpida Memory Inc | 半導体装置 |
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US11715529B2 (en) | 2023-08-01 |
US10026485B2 (en) | 2018-07-17 |
US20180294038A1 (en) | 2018-10-11 |
TW201642137A (zh) | 2016-12-01 |
TW202236267A (zh) | 2022-09-16 |
US20170103816A1 (en) | 2017-04-13 |
TW202034315A (zh) | 2020-09-16 |
TW202111702A (zh) | 2021-03-16 |
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TW201805934A (zh) | 2018-02-16 |
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US10438670B2 (en) | 2019-10-08 |
TWI680466B (zh) | 2019-12-21 |
US11295821B2 (en) | 2022-04-05 |
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