CN105897219A - Wafer level surface acoustic filter chip packaging structure and manufacturing method thereof - Google Patents

Wafer level surface acoustic filter chip packaging structure and manufacturing method thereof Download PDF

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Publication number
CN105897219A
CN105897219A CN201610204644.1A CN201610204644A CN105897219A CN 105897219 A CN105897219 A CN 105897219A CN 201610204644 A CN201610204644 A CN 201610204644A CN 105897219 A CN105897219 A CN 105897219A
Authority
CN
China
Prior art keywords
wafer
sound filtering
filtering chip
laminating
insulating barrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610204644.1A
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Chinese (zh)
Inventor
张江华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JCET Group Co Ltd
Original Assignee
Jiangsu Changjiang Electronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangsu Changjiang Electronics Technology Co Ltd filed Critical Jiangsu Changjiang Electronics Technology Co Ltd
Priority to CN201610204644.1A priority Critical patent/CN105897219A/en
Publication of CN105897219A publication Critical patent/CN105897219A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/64Filters using surface acoustic waves
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/08Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves

Abstract

The invention relates to a wafer level surface acoustic filter chip packaging structure and a manufacturing method thereof. The structure comprises a surface acoustic filter chip wafer (1), and the surface of the surface acoustic filter chip wafer (1) includes electrode areas (1.1) and an induction area (1.2). A first metal layer (2) is arranged on the surface of each electrode area (1.1). An insulating layer (3) is arranged on the surface of the surface acoustic filter chip wafer (1). A laminated wafer (4) is arranged above the insulating layer (3). A cavity (7) is formed between the laminated wafer (4) and the induction area (1.2). The laminated wafer (4) is provided with holes (8) at the positions of the electrode areas (1.1), and a metal ball (6) is arranged in each hole (8). According to the wafer level surface acoustic filter chip packaging structure and the manufacturing method thereof of the invention, a surface acoustic filter of smaller area and size and lower manufacturing cost can be provided.

Description

Wafer level surface sound filtering chip encapsulating structure and manufacture method thereof
Technical field
The present invention relates to a kind of wafer level surface sound filtering chip encapsulating structure and manufacture method thereof, belong to technical field of semiconductor encapsulation.
Background technology
Surface sound filter apparatus is widely used in RF and IF application, including pocket telephone, radiophone and various radio device.By using surface sound to filter, these electronic equipments are carried out the filtering of the signal of telecommunication, time delay etc. and processes.Because of surface acoustical filter properties of product and design function demand, need to ensure that filtering chip functional area can not contact any material, i.e. cavity structure design.
Existing surface acoustic filter part encapsulating structure is filtering chip to be passed through conductive projection flip chip bonding be connected with ceramic substrate and be embedded in completely in substrate cavity body, and substrate surface adds crown cap protection.But this kind of structural metal lid is relatively costly, and ceramic substrate compares high with the flatness requirement of crown cap, easily has the situation of close bad.Additionally the manufacture method of other surface acoustic filter parts is to use top sealing or coating process to be sealed module, forms cavity structure.
The method for packing of existing surface acoustic filter part, flow process is longer, relatively costly, and physical dimension is the biggest, under the trend trend that current electronic equipment does less and less, need constantly to reduce electronic installation and used in the weight of surface acoustic filter part and size.
Summary of the invention
The technical problem to be solved is to provide a kind of wafer level surface sound filtering chip encapsulating structure and manufacture method thereof for above-mentioned prior art, and it is provided that the surface acoustic filter part of a kind of less area and volume, and has lower manufacturing cost.
The present invention solves the technical scheme that the problems referred to above are used: a kind of wafer level surface sound filtering chip encapsulating structure, it includes surface sound filtering chip wafer, described surface sound filtering chip crystal column surface includes electrode zone and induction region, described electrode area surfaces is provided with the first metal layer, sound filtering chip wafer region in addition to electrode zone and induction region in described surface is provided with insulating barrier, described insulating barrier is provided above wafer of fitting, cavity is formed between described laminating wafer and induction region, described laminating wafer is provided with perforate in electrode zone position, it is provided with metal ball in described perforate, described metal ball contacts with the first metal layer.
Described laminating wafer is arranged on insulating barrier by adhesive glue.
A kind of manufacture method of wafer level surface sound filtering chip encapsulating structure, described method comprises the following steps that:
Step one, take a piece of surface sound filtering chip wafer;
Step 2, prepare the first metal layer at the electrode zone of surface sound filtering chip wafer;
Step 3, prepare insulating barrier
Being coated with one layer of insulating cement on the sound filtering chip wafer of surface with coating technique, with photoetching, the insulating cement of electrode zone and chip induction region position is removed by the method for development;
Step 4, laminating wafer
Taking a piece of laminating wafer, be coated with last layer adhesive glue on laminating wafer, the surface sound filtering chip wafer preparing insulating barrier with step 3 fits together, thus forms cavity above chip induction region;
Step 5, etching
At laminating crystal column surface resist coating, and it is exposed, development, etching, needs the surface sound filtering wafer the first metal layer planting ball to come out follow-up, form perforate;
Step 6, plant ball
Carry out planting ball in the first metal layer position come out;
Step 7, cutting
Cutting is divided into single product.
Between described step 4 and step 5 to laminating wafer be ground, thinning.
Described insulating barrier uses B-stage glue, it may be unnecessary to is coated with adhesive glue on laminating wafer, directly fits.
Described laminating wafer uses glass material, insulant.
Compared with prior art, it is an advantage of the current invention that:
1, compared with traditional technique, integral production flow process is wafer scale, can form undersized encapsulating structure, and technique is simple, can guarantee that the cavity structure of chip induction zone, can form the wafer level surface sound filtering chip encapsulating structure that reliability is higher;
2, the wafer level surface sound filtering chip encapsulating structure of the present invention can directly use, it is also possible to total and other encapsulating structures are formed on substrate secondary encapsulation, forms system in package.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of a kind of wafer level of present invention surface sound filtering chip encapsulating structure.
Fig. 2 ~ Fig. 9 is the process chart of the manufacture method of a kind of wafer level of present invention surface sound filtering chip encapsulating structure.
Wherein:
Surface sound filtering chip wafer 1
Electrode zone 1.1
Induction region 1.2
The first metal layer 2
Insulating barrier 3
Laminating wafer 4
Adhesive glue 5
Metal ball 6
Cavity 7
Perforate 8.
Detailed description of the invention
Below in conjunction with accompanying drawing embodiment, the present invention is described in further detail.
As shown in Figure 1, a kind of wafer level surface sound filtering chip encapsulating structure in the present embodiment, it includes surface sound filtering chip wafer 1, sound filtering chip wafer 1 surface, described surface includes electrode zone 1.1 and induction region 1.2, described electrode zone 1.1 surface configuration has the first metal layer 2, the sound filtering chip wafer 1 region in addition to electrode zone 1.1 and induction region 1.2 in described surface is provided with insulating barrier 3, described the first metal layer 2 flushes with insulating barrier 3, above described insulating barrier 3, adhesive glue 5 is provided with laminating wafer 4, cavity 7 is formed between described laminating wafer 4 and induction region 1.2, described laminating wafer 4 is provided with perforate 8 in electrode zone 1.1 position, it is provided with metal ball 6 in described perforate 8, described metal ball 6 contacts with the first metal layer 2.
Its manufacture method comprises the following steps that:
Step one, see Fig. 2, take a piece of surface sound filtering chip wafer;
Step 2, seeing Fig. 3, the electrode zone at surface sound filtering chip wafer prepares the first metal layer;
Surface sound filtering chip wafer, by cleaning, toasts, sputtering, resist coating, photoetching, development, and copper electroplating layer removes photoresist, and the method for etching prepares the first metal layer at electrode zone;
Step 3, prepare insulating barrier
See Fig. 4, on the sound filtering chip wafer of surface, be coated with one layer of certain thickness insulating cement with coating technique, such as PI(polyimides), PA (nylon, polyamide), with photoetching, the insulating cement of electrode zone and chip induction region position is removed by the method for development;
Step 4, laminating wafer laminating
Seeing Fig. 5, take a piece of laminating wafer, be coated with last layer adhesive glue on laminating wafer, the surface sound filtering chip wafer preparing insulating barrier with step 3 fits together, thus forms cavity above chip induction region;
Step 5, thinning
See Fig. 6, laminating wafer is ground, thinning;
Step 6, etching
See Fig. 7, at laminating crystal column surface resist coating, and be exposed, development, etching, need the surface sound filtering wafer the first metal layer planting ball to come out follow-up, form perforate;
Step 7, plant ball
See Fig. 8, carry out planting ball in the first metal layer position come out;
Step 8, cutting
Seeing Fig. 9, cutting is divided into single product.
In above-mentioned steps, described step 5 can be omitted;
Described insulating barrier can be B-stage glue, melted after colloid heating, now can need not be coated with adhesive glue on laminating wafer, directly fit;
Described laminating wafer is glass material or other insulant.
In addition to the implementation, present invention additionally comprises the technical scheme that other embodiments, all employing equivalents or equivalence substitute mode are formed, all should fall within the scope of the hereto appended claims.

Claims (6)

  1. null1. a wafer level surface sound filtering chip encapsulating structure,It is characterized in that: it includes surface sound filtering chip wafer (1),Sound filtering chip wafer (1) surface, described surface includes electrode zone (1.1) and induction region (1.2),Described electrode zone (1.1) surface configuration has the first metal layer (2),Described surface sound filtering chip wafer (1) region in addition to electrode zone (1.1) and induction region (1.2) is provided with insulating barrier (3),Described insulating barrier (3) is provided above wafer (4) of fitting,Cavity (7) is formed between described laminating wafer (4) and induction region (1.2),Described laminating wafer (4) is provided with perforate (8) in electrode zone (1.1) position,Metal ball (6) it is provided with in described perforate (8),Described metal ball (6) contacts with the first metal layer (2).
  2. A kind of wafer level surface the most according to claim 1 sound filtering chip encapsulating structure, it is characterised in that: described laminating wafer (4) is arranged on insulating barrier (3) by adhesive glue (5).
  3. 3. the manufacture method of a wafer level surface sound filtering chip encapsulating structure, it is characterised in that described method comprises the following steps that:
    Step one, take a piece of surface sound filtering chip wafer;
    Step 2, prepare the first metal layer at the electrode zone of surface sound filtering chip wafer;
    Step 3, prepare insulating barrier
    Being coated with one layer of insulating cement on the sound filtering chip wafer of surface with coating technique, with photoetching, the insulating cement of electrode zone and chip induction region position is removed by the method for development;
    Step 4, laminating wafer
    Taking a piece of laminating wafer, be coated with last layer adhesive glue on laminating wafer, the surface sound filtering chip wafer preparing insulating barrier with step 3 fits together, thus forms cavity above chip induction region;
    Step 5, etching
    At laminating crystal column surface resist coating, and it is exposed, development, etching, needs the surface sound filtering wafer the first metal layer planting ball to come out follow-up, form perforate;
    Step 6, plant ball
    Carry out planting ball in the first metal layer position come out;
    Step 7, cutting
    Cutting is divided into single product.
  4. The manufacture method of a kind of wafer level surface the most according to claim 3 sound filtering chip encapsulating structure, it is characterised in that: between described step 4 and step 5 to laminating wafer be ground, thinning.
  5. The manufacture method of a kind of wafer level surface the most according to claim 3 sound filtering chip encapsulating structure, it is characterised in that: described insulating barrier uses B-stage glue, it may be unnecessary to is coated with adhesive glue on laminating wafer, directly fits.
  6. The manufacture method of a kind of wafer level surface the most according to claim 3 sound filtering chip encapsulating structure, it is characterised in that: described laminating wafer uses glass material, insulant.
CN201610204644.1A 2016-04-01 2016-04-01 Wafer level surface acoustic filter chip packaging structure and manufacturing method thereof Pending CN105897219A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610204644.1A CN105897219A (en) 2016-04-01 2016-04-01 Wafer level surface acoustic filter chip packaging structure and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610204644.1A CN105897219A (en) 2016-04-01 2016-04-01 Wafer level surface acoustic filter chip packaging structure and manufacturing method thereof

Publications (1)

Publication Number Publication Date
CN105897219A true CN105897219A (en) 2016-08-24

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106301283A (en) * 2016-11-07 2017-01-04 无锡吉迈微电子有限公司 The encapsulating structure of SAW filter and manufacture method
CN106505967A (en) * 2016-11-07 2017-03-15 无锡吉迈微电子有限公司 Encapsulating structure of SAW filter and preparation method thereof
CN109037428A (en) * 2018-08-10 2018-12-18 付伟 Chip-packaging structure and preparation method thereof with double cofferdam
CN113054938A (en) * 2019-12-27 2021-06-29 中芯集成电路(宁波)有限公司 Package structure and method for manufacturing the same

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040029356A1 (en) * 2001-01-18 2004-02-12 Hans-Jorg Timme Filter device and method for fabricating filter devices
CN1565078A (en) * 2002-07-31 2005-01-12 株式会社村田制作所 Piezoelectric component and production method therefor
US20060290238A1 (en) * 2005-06-22 2006-12-28 Alps Electric Co., Ltd. Electronic part having high sealing performance and method of manufacturing the same
JP2008047855A (en) * 2006-07-19 2008-02-28 Toray Ind Inc Field-effect transistor
US7596849B1 (en) * 2003-06-11 2009-10-06 Triquint Semiconductor, Inc. Method of assembling a wafer-level package filter
CN205609499U (en) * 2016-04-01 2016-09-28 江苏长电科技股份有限公司 Wafer level surface sound filtering chip package structure

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040029356A1 (en) * 2001-01-18 2004-02-12 Hans-Jorg Timme Filter device and method for fabricating filter devices
CN1565078A (en) * 2002-07-31 2005-01-12 株式会社村田制作所 Piezoelectric component and production method therefor
US7596849B1 (en) * 2003-06-11 2009-10-06 Triquint Semiconductor, Inc. Method of assembling a wafer-level package filter
US20060290238A1 (en) * 2005-06-22 2006-12-28 Alps Electric Co., Ltd. Electronic part having high sealing performance and method of manufacturing the same
JP2008047855A (en) * 2006-07-19 2008-02-28 Toray Ind Inc Field-effect transistor
CN205609499U (en) * 2016-04-01 2016-09-28 江苏长电科技股份有限公司 Wafer level surface sound filtering chip package structure

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106301283A (en) * 2016-11-07 2017-01-04 无锡吉迈微电子有限公司 The encapsulating structure of SAW filter and manufacture method
CN106505967A (en) * 2016-11-07 2017-03-15 无锡吉迈微电子有限公司 Encapsulating structure of SAW filter and preparation method thereof
CN109037428A (en) * 2018-08-10 2018-12-18 付伟 Chip-packaging structure and preparation method thereof with double cofferdam
CN113054938A (en) * 2019-12-27 2021-06-29 中芯集成电路(宁波)有限公司 Package structure and method for manufacturing the same

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Application publication date: 20160824

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