CN105810253B - Socket device for memory test - Google Patents
Socket device for memory test Download PDFInfo
- Publication number
- CN105810253B CN105810253B CN201410853000.6A CN201410853000A CN105810253B CN 105810253 B CN105810253 B CN 105810253B CN 201410853000 A CN201410853000 A CN 201410853000A CN 105810253 B CN105810253 B CN 105810253B
- Authority
- CN
- China
- Prior art keywords
- memory
- socket
- lock piece
- pressurization
- rotation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
- H01R33/7607—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket the parallel terminal pins having a circular disposition
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
The present invention relates to a kind of socket devices for memory test, its object is to, the structure of lock piece is configured to dual rotational structure, so as to accommodate and all left and right length of pressurizeing are identical and various memories that lower-upper length is different, therefore the different various memories of lower-upper length can be tested by a memory test socket.The socket device for memory test of the present invention includes bottom plate, a pair of of Support bracket, ejector and socket, a pair of of lifting lock piece, a pair of of pressurization lock piece, more than one memory pressing member, rotation guide and pivot link.
Description
Technical field
The present invention relates to a kind of socket devices for memory test, are arranged common more particularly, to a kind of
It can be installed on the memory test socket of the bad problem for testing memory on the upside of the memory plug of socket substrate
The socket device for memory test of the different memory of upper and lower size.
Background technology
Usually, with the development of central processing unit (CPU), the performance also raising by leaps and bounds of personal computer, it is intended to open
Hair is faster, the competition of the computer of more excellent performance constantly continues, and supercomputer occur, parallel processing computer, simplify
Instruction set computer (RISC：Reduced Instruction Set Computer) exploitation etc..Moreover, improving computer performance
Effort will also continue.
As previously described, it is intended to exploitation faster, the core of the competition of the computer of more excellent performance be to develop to locate at a high speed
The memory chip of reason more multidata CPU and highly integrated, high power capacity, high speed, to accelerate its exploitation competition.Especially,
It is synchronous with the development rate of such CPU, highly integrated, high power capacity, high speed memory exploitation competition also accelerating.
In addition, the existing skill as the fraction defective for testing foregoing highly integrated, high power capacity, high speed memory
Art, provide it is a kind of on the socket substrate for be packaged with memory plug after fixed memory test device, it is slotting by being encapsulated in
The memory plug of seat substrate is confirmed whether to be electrically connected with the electrical contact of memory, thus tests depositing as test object object
The method of the fraction defective of reservoir.
The type of memory above-mentioned is roughly divided into DDR1, DDR2, DDR3.At this point, DDR is Double Data Rate's
Abbreviation, original name are DDR SDRAM (Double Data Rate Synchronous Dynamic Random Acess
Memory).As the name indicates, data can be transmitted and received in the clock (1Hz), therefore add in title double
(double) name.In the SDR (Single Data Rate) used before, can only be transmitted in a clock signal or
Receive signal.DDR memory can be divided into as shown in table 1 below according to clock.
Table 1
Various memories as shown in Table 1 can be left and right length or the identical shape of lower-upper length, but various storages
Device is formed approximately in the different shape of left and right length and lower-upper length.
In addition, in order to test the bad problem of foregoing memory module by memorizer test device, utilize
Set memory test socket carrys out sealed storage device on common socket substrate, so as to by whether turn-on power comes really
Recognize the bad problem of memory.The prior art of bad problem as such test memory, has been disclosed for following skill
Art.
The memorizer test device of the prior art includes：Memory test socket is arranged on being packaged in socket substrate
Memory plug upside, and on the medial surface of its both sides formed bootstrap memory side slot；A pair of of locking
Part is arranged in the both sides of memory test socket, and can inwardly turn so far in outside；Memory pressing member,
Respectively constituted on a pair of of lock piece, the memory that will be inserted on memory test socket, by the pressurization of both sides upper end come
It is encapsulated in the memory plug of socket substrate；And connecting rod, it connects a pair of of lock piece and is allowed to act simultaneously.
The memorizer test device of the prior art with foregoing structure is inserted to the memory of common socket substrate
Seat upside, socket substrate is fixed on the state that it is aligned with memory test socket.In fixed memory test as above
In the state that the lock piece constituted on the both sides of socket rotates in outward direction, inserted by the slot of memory test socket
Enter memory.
Also, it as previously mentioned, after being inserted into memory by the slot of memory test socket, will rotate in outward direction
Lock piece be changed to inward side to rotation, and by the pressurization of memory pressing member, make memory be connected to be encapsulated in it is slotting
Memory plug on seat substrate.At this point, contact of the contact jaw of the memory to pressurize to memory plug with memory plug
Needle interconnects.
As previously mentioned, the contact pin phase mutual connection of the contact jaw and memory plug in the memory to pressurize to memory plug
In the state of touching, by whether turn-on power confirms the bad problem of memory.That is, when turn-on power, if electrically conducting
Judge memory for normal product；It is judged as bad products if not electrically conducting.
But as previously described according to prior art memorizer test device as shown in Figure 1, due to its structure cannot will
Left and right length is identical and various memories that lower-upper length is different are inserted into and encapsulate, thus in order to test that left and right length is identical and on
The memory of the lower different type of length, memory test socket should have the structure being consistent with the lower-upper length of the memory.
Existing technical literature
Patent document
1. South Korea discloses utility model patent the 2010-0008201st (disclosure on the 18th of August in 2010)
2. Korean Patent Laid the 2008-0081385th (disclosure on the 10th of September in 2008)
3. Korean Patent Publication No. 10-0704002 (bulletin on April 9th, 2007)
4. Korean granted utility model patent the 20-0373503rd (bulletin on January 15th, 2005)
Invention content
(1) technical problems to be solved
The present invention proposes that its purpose is to provide one kind for depositing in order to solve the problems, such as in the prior art various
The socket device of reservoir test, the structure of lock piece is configured to dual rotational structure by described device, so as to accommodate and add
Press all left and right length identical and various memories that lower-upper length is different, thus can by a memory test socket come
Test the different various memories of lower-upper length.
Also, the another object of the technology of the present invention is, the structure of lock piece is configured to dual rotational structure, so as to
It can accommodate and all left and right length of pressurizeing are identical and various memories that lower-upper length is different, can be reduced by this structure
Expense of the purchase for the socket device of memory test.
In addition, a further object for the technology of the present invention is, the structure of lock piece is configured to dual rotational structure, so as to
It can accommodate and left and right length of pressurizeing is identical and various memories that lower-upper length is different, therefore can more favorably accomplish and deposit
Reservoir is tested.
Also, the purpose of technology of the present invention is, by memory test jack configurations at the rotation by lock piece come
The structure of lifting more easily to realize the pop-up for the memory being encapsulated on the memory plug of socket substrate, and saves
Save the time of test memory.
In turn, the purpose of technology of the invention is, the knot that memory pressing member is configured to rotate by hinge axis
Structure, so as to prevent memory both sides upper end damage, wherein the memory pressing member pressurization in memory test socket
On the memory that is inserted into and be encapsulated on the memory plug of socket substrate.
(2) technical solution
To realize that the present invention of purpose above-mentioned is as follows.That is, the socket device packet for memory test of the present invention
It includes：Bottom plate is arranged and is fixed on the upside of common socket substrate, forms the exposed hole of multiple sockets on the bottom plate, so as to
The more than one memory plug encapsulated on common socket substrate is inserted into and exposed to upside；A pair of of Support bracket,
The both sides of the length direction in the exposed hole of socket are oppositely arranged respectively, form guiding groove on opposite sides with upper and lower directions；Ejector
And socket, it can be arranged up or down on each guiding groove of Support bracket, form more than one peace on opposite sides
The slot of device, memory；A pair of of lifting lock piece, inside and outside can be rotatably arranged on each Support bracket, and by inside
Outer rotation makes ejector and socket decline or rise；Memory device for ejecting, when lifting is revolved in outward direction with lock piece
When turning, it is moved upward to the ejector and socket that memory to be made to pop up；A pair of of pressurization lock piece is used in each lifting
It inwardly outer can rotatably be arranged on lock piece, and memory pressurizeed to the memory plug of common socket substrate；More than one
Memory pressing member, be arranged on each opposite face of pressurization lock piece, and add to the upper end of the both sides of memory
Pressure；Rotation guide guides its rotation when pressurization lock piece inwardly outer rotation；And pivot link, connection are a pair of
Lifting lock piece enables to rotate simultaneously when its inside outer rotation.
According to the structure of the present invention above-mentioned, ejector and socket are made of support socket, guide socket and connection screw,
Wherein, the support socket can be arranged up or down on each guiding groove of Support bracket, and form what support was installed
The support slot of the both sides lower end of memory；The guide socket is engaged in the upside of support socket, on the guide socket
It is formed with corresponding with support slot and bootstrap memory guiding slot；The connecting screw is used for connecting and engaging support and inserts
Seat and guide socket.
In addition, the lower end of the support slot of support socket above-mentioned is formed with the shape closed, so as to support storage
The both sides lower end of device, and the upper end of the guiding slot of guide socket also forms the fillet surface with certain inclination angle, to insert
The memory entered is directed to guiding slot.
Moreover, structure according to the present invention, memory device for ejecting is made of fastening groove and locking member, wherein described
Fastening groove is formed in the lateral surface for each guide socket for constituting ejector and socket；The locking member is locked in each lifting
The side of the opposite face of stop member is opposite to be formed, and is locked on the fastening groove of guide socket, when lifting with lock piece in outward direction
When rotation, so that ejector and socket is increased, memory is popped up from ejector and socket.
According to the structure of the foregoing present invention, rotation guide is made of guiding groove and leading axle, wherein described
Guiding groove is formed in the both sides of each lifting lock piece with the shape of elongated slot is opposite；The leading axle is in pressurization lock piece
It is oppositely arranged on each opposite face, the both ends of each leading axle are inserted into and are engaged on guiding groove, so as in the range of guiding groove
The interior rotation for realizing pressurization lock piece.At this point, constitute rotation guide guiding groove top/bottom latitude, preferably with deposit
The size of maximum length up and down and minimum length size of reservoir correspondingly form.
Also, structure according to the present invention, memory pressing member is with the structure composition of pressure roller, the pressure roller
It is rotatably arranged on each leading axle for constituting rotation guide, and the both sides upper end of rotary presser memory.
Moreover, according to the structure of the foregoing present invention, there are multiple pressure rollers for constituting memory pressing member
When, also may be integrally formed on each opposite face of pressurization lock piece for by adjacent each pressure roller separation every
Wall.At this point, the function of preventing pressure roller from moving left and right is played in next door.
In addition, structure according to the present invention, may also include torque spring, on the rotary shaft, the rotary shaft makes for setting
Pressurization lock piece inside and outside can be rotatably coupled on lifting lock piece, and the torque spring has makes pressurization locking
Part, which sets back, sets elastic force effect.
According to the structure of the foregoing present invention, pivot link is made of supporting beam and connecting rod, wherein the support
Beam is arranged and is fixed on the unidirectional side for each lifting lock piece being oppositely arranged on a pair of of Support bracket；Institute
It states connecting rod to be rotatably attached the supporting beam of both sides, when inwardly to rotate the lifting of side outside with lock piece, make another
The lifting lock piece of side rotates simultaneously.At this point, one end of connecting rod is formed as the shape being bent at a certain angle.
Moreover, structure according to the present invention, can also be arranged rotation limitation bar in each opposite face of lifting lock piece, when
Pressurization, to inward side to when rotation, makes the rotation of pressurization lock piece be limited within a certain range with lock piece.
(3) advantageous effect
The structure of lock piece is configured to dual rotational structure by the technique according to the invention, and thus, it is possible to accommodate and pressurize
All left and right length are identical and various memories that lower-upper length is different, therefore with can pass through a memory test socket
To test the effect of the different various memories of lower-upper length.
Also, the technique according to the invention can test different each of lower-upper length by a memory test socket
Kind memory, therefore not only have the effect that can reduce purchase for the expense of the socket device of memory test, but also also have
The effect of memory test can more be favorably accomplished.
Also, the technique according to the invention lifts memory test jack configurations at by the rotation of lock piece
Structure, therefore more easily realize the pop-up for being encapsulated in the memory on the memory plug of socket substrate, and save test
The time of memory.
In turn, the technique according to the invention, the structure that memory pressing member is configured to rotate by hinge axis, therefore
The damage of the upper end of memory both sides can be prevented, wherein memory pressing member pressurization institute on memory test socket
The memory of insertion is simultaneously encapsulated on the memory plug of socket substrate.
Description of the drawings
Fig. 1 is the state for indicating the socket device for memory test by the present invention and being arranged on common socket substrate
Three-dimensional structure diagram.
Fig. 2 is the three-dimensional structure diagram for indicating the socket device for memory test of the present invention.
Fig. 3 is the overlooking structure figure for indicating the socket device for memory test of the present invention.
Fig. 4 is the side block diagram for indicating the socket device for memory test of the present invention.
Fig. 5 a are the solids of the insertion of the separately shown memory in the socket device for memory test of the present invention
Structure chart.
Fig. 5 b are the solids for indicating the installation condition of memory in the socket device for memory test of the present invention
Structure chart.
Fig. 6 is the three-dimensional knot of the memory test socket of the socket device for memory test of the separately shown present invention
Composition.
Fig. 7 is the side view knot of the memory test socket of the socket device for memory test of the separately shown present invention
Composition.
Fig. 8 is to indicate the socket device for memory test through the invention to install depositing for lower length ruler modest ability
The side block diagram of the effect of lock piece when reservoir.
Fig. 9 is to indicate the socket device for memory test through the invention lower length dimension is small to be deposited to install
The side block diagram of the effect of lock piece when reservoir.
Description of the drawings label
10：Common socket substrate 20：Memory plug
30：Memory (upper and lower full-size) 32：Memory (small size up and down)
100：Socket device 110：Bottom plate
112：The exposed hole of socket 120：Support bracket
122：Guiding groove 130：Ejector and socket
132：Slot 134 is installed：Connecting screw
136：Fillet surface 140：Lifting lock piece
150：Fastening groove 152：Locking member
160：Pressurization lock piece 162：Rotating support shaft
170：Memory pressing member 180：Guiding groove
182：Leading axle 190：Pivot link
192：Supporting beam 194：Connecting rod
200：Next door 210：Torque spring
220：Rotation limitation bar
Specific implementation mode
Hereinafter, the preferred embodiment for the socket device for memory test that present invention will be described in detail with reference to the accompanying.
Fig. 1 is the state for indicating the socket device for memory test by the present invention and being arranged on common socket substrate
Three-dimensional structure diagram, Fig. 2 be indicate the present invention the socket device for memory test three-dimensional structure diagram, Fig. 3 is to indicate
The overlooking structure figure of the socket device for memory test of the present invention, Fig. 4 are to indicate that the present invention's is used for memory test
Socket device side block diagram, Fig. 5 a be it is separately shown the present invention the socket device for memory test in store
The three-dimensional structure diagram of the insertion of device, Fig. 5 b are the peaces for indicating the memory in the socket device for memory test of the present invention
The three-dimensional structure diagram of dress state, Fig. 6 are the memory tests of the socket device for memory test of the separately shown present invention
The three-dimensional structure diagram and Fig. 7 of socket are that the memory of the socket device for memory test of the separately shown present invention is surveyed
Try the side block diagram of socket.
As shown in Figures 1 to 7, the socket device 100 for memory test of the invention includes：Bottom plate 110, setting
And it is fixed on the upside of common socket substrate 10, the exposed hole 112 of multiple sockets is formed on the bottom plate 110, so as to common
The more than one memory plug 20 encapsulated on socket substrate 10 to upside be inserted into and it is exposed；A pair of of Support bracket 120,
The both sides of the length direction in the exposed hole of socket 112 are oppositely arranged respectively, and upper and lower directions forms guiding groove 122 on opposite sides；Bullet
Go out device and socket 130,122 on each guiding groove of Support bracket 120 on can be arranged up or down, shape on opposite sides
At the installation slot 132 of more than one installation memory 30；A pair of lifting lock piece 140, in each Support bracket 120
On inwardly outer can rotatably be arranged, and by keeping ejector and socket 130 down or up to inside and outside rotation；Memory pops up
Device makes ejector and socket 130 move up, thus makes memory when lifting is rotated in outward direction with lock piece 140
30 pop-ups；A pair of pressurization lock piece 160 inwardly outer can rotatably be arranged on each lifting lock piece 140, and will deposit
Reservoir 30 pressurizes to the memory plug 20 of common socket substrate 10；More than one memory pressing member 170, setting exist
On each opposite face of pressurization lock piece 160, and the upper end of the both sides of pressurized storage device 30；Rotation guide works as pressurization
Its rotation is guided when outer rotation inside with lock piece 160；And pivot link 190, a pair of of lifting lock piece 140 is connected,
Enable to rotate simultaneously when its inside outer rotation.
The socket device 100 for memory test of the present invention with above structure is arranged in common socket substrate 10
Upside, commonly use depositing for socket substrate 10 to be inserted into from the lower to upper part in the exposed hole of the socket that is formed on bottom plate 110 112
Reservoir socket 20, and keep it exposed upwards.At this point, common socket substrate 10 is equivalent to the mainboard of practical application in PC.
If in addition, as previously mentioned, being arranged and fixing bottom plate 110 in the upside of common socket substrate 10, to commonly use socket
The memory plug 20 of substrate 10 is exposed upwards, then the installation slot 132 and memory plug 20 of ejector and socket 130 is slotting
Slot is (not shown) consistent with each other up and down respectively.The installation slot 132 of each ejector and socket 130 is inserted into and is installed to as a result,
Memory 30 be only packaged on the slot of memory plug corresponding with the installation slot 132 of ejector and socket 130 20.
As previously mentioned, the socket device 100 for being used for memory test is mounted and fixed to common socket substrate 10
In the state of upside, check that the test process of memory 30 is as follows.First, it as shown in Fig. 1 to Fig. 5 a, will be mounted and fixed on
What the lifting of the socket device 100 for memory test of 10 upside of common socket substrate was rotated outward with lock piece 140
Under state, it is inserted on the installation slot 132 of ejector and socket 130 and memory 30 to be tested is installed.
Secondly, as previously mentioned, being inserted on the installation slot 132 of ejector and socket 130 and installing storage to be tested
After device 30, as shown in Fig. 1 to Fig. 5 b, by a pair of of pressurization of both sides with lock piece 160 to inward side to relative rotation, to realize
The pressurization of memory pressing member 170.If at this point, by a pair of of pressurization of both sides with lock piece 160 to inward side to relative rotation,
The lifting that pressurization lock piece 160 is then arranged is also the same to inward side to relative rotation with lock piece 140.
If as previously mentioned, a pair of of pressurization of both sides to be inserted into and be installed to inward side to relative rotation with lock piece 160
In ejector and the memory 30 of socket 130, by memory pressing member 170, realize that the slot to memory plug 20 adds
Pressure.At this point, ejector and socket 130 by can oscilaltion it is a certain range of in a manner of constituted, therefore pressurize to memory 30
When memory 30 will decline, the memory 30 thus declined can be encapsulated on the memory plug 20 of common socket substrate 10.
In addition, as previously mentioned, pressurization is made insertion and mounted on pop-up with lock piece 160 to inward side to relative rotation
The memory 30 of device and socket 130 is encapsulated by memory pressing member 170 on the slot of memory plug 20, is then connected
Power supply confirms whether memory 30 electrically conducts, to judging the bad problem of memory 30.
On the other hand, as previously mentioned, the socket device 100 for memory test through the invention, is inserted in memory
Sealed storage device 30 and after confirming the bad problem of memory 30 on the slot of seat 20, it is packaged on split memory socket 20
Memory 30, at this point, the memory 30 encapsulated on memory plug 20 detaches the only liter by that will be in relative rotation state
Drop realized with the mode that lock piece 140 rotates in outward direction, ejector when lifting is rotated in outward direction with lock piece 140
And socket 130 rises, memory 30 is popped up from memory plug 20.
In other words, as previously mentioned, by the socket device 100 for memory test, in inserting for memory plug 20
Sealed storage device 30 and in the state of confirming the bad problem of memory 30 on slot, if by pressurization 160 outside side of lock piece
It to rotation, then lifts and is also rotated in outward direction with lock piece 140, make ejector and socket from there through memory device for ejecting
130 rise, to realize that memory 30 is popped up from the memory plug 20 for being encapsulated in common socket substrate 10.
As previously mentioned, making ejector and socket 130 rise by device for ejecting, and realizes and be encapsulated in common socket substrate 10
Memory plug 20 memory 30 pop up after, will be inserted into the state popped up from memory plug 20 and be mounted on ejector
And the memory 30 of socket 130, it is detached from ejector and socket 130, is achieved in the separation of memory 30.
In addition, as previously mentioned, the present invention the socket device 100 for memory test, by the knot of lock piece 140,160
Structure is configured to dual rotational structure, so as to accommodate and all left and right length of pressurizeing are identical and lower-upper length is different various deposits
Reservoir 30, below with left and right length is identical and memory 30 that lower-upper length is different illustrates for example.
First, illustrated with reference to Fig. 8, by the socket device 100 for memory test by lower-upper length size most
When big memory 30 is encapsulated into the memory plug 20 of common socket substrate 10, in ejector and the installation slot of socket 130
In the state of being inserted on 132 and memory 30 to be tested being installed, by a pair of of lifting of both sides with lock piece 160 to inward side to
Relative rotation is achieved in the pressurization of memory pressing member 170.
As previously mentioned, for the maximum memory 30 of lower-upper length size, when by a pair of of pressurization with lock piece 160 inwardly
When the relative rotation of direction lifting with lock piece 140 to inward side to fully rotating, and pressurize with lock piece 160 without rotation or
Only slightly rotate, from there through memory device for ejecting and pressing member 170, the sealed storage device on memory plug 20
30。
On the contrary, illustrated with reference to Fig. 9, when by the socket device 100 for memory test, by lower-upper length size
When being encapsulated into the memory plug 20 of common socket substrate 10 less than maximum sized memory 30, in ejector and socket 130
Installation slot 132 on be inserted into and the small memory 30 of lower-upper length size to be tested be installed in the state of, by the one of both sides
The pressurization of memory pressing member 170 is achieved in inward side to relative rotation with lock piece 160 to lifting.
As previously mentioned, for the small memory 30 of lower-upper length size, when by a pair of of pressurization with lock piece 160 to inward side
When to relative rotation, even if in the state that lifting is fully rotating inwardly with lock piece 140, pressing member 170 and memory
It can also be at regular intervals between 30 upper surface.In such a state, if by pressurization with lock piece 160 continue to inward side to
Relative rotation, the then upper end that pressurization rotates always the both sides for touching memory 30 to pressing member 170 with lock piece 160 are
Only.
In addition, as previously mentioned, during pressurization is continued to inward side with lock piece 160 to relative rotation, from depositing
Reservoir pressing member 170 and the upper-end contact of the both sides of memory 30 start to realize the pressurization to memory 30, thus common
Sealed storage device 30 on the memory plug 20 of substrate 10.At this point, in the state that memory 30 is fully enclosed, apply if releasing
In power of the pressurization on lock piece 160, then pressurization is restored with lock piece 160 to original state.
Illustrate that each composition for constituting the socket device 100 for memory test of the present invention is wanted more detail below
Part.First, the bottom plate 110 for constituting the present invention is for being arranged the socket device 100 for being used for memory test and being fixed on often
With the device of socket substrate 10, as shown in Fig. 1 to 7, bottom plate 110 is arranged and is fixed on the upside of common socket substrate 10, so as to
Accommodate the memory plug 20 being encapsulated on common socket substrate 10.
In other words, as shown in Figures 1 to 7, foregoing bottom plate 110 is arranged and is fixed on common socket substrate 10
Upside is formed with the exposed hole 112 of multiple sockets on the bottom plate 110, so as to one encapsulated on common socket substrate 10
Above memory plug 20 to upside be inserted into and it is exposed.At this point, the memory plug 20 being encapsulated on common socket substrate 10
Lower part by the exposed hole of the socket of bottom plate 110 112 is exposed to upside.
In addition, as previously mentioned, the exposed hole of the socket of bottom plate 110 112 and memory plug 20 is accordingly formed there are one or
It is multiple, so that the memory plug 20 being encapsulated on common socket substrate 10 is exposed to upside by lower part.
Secondly, the Support bracket 120 for constituting the present invention is for ejector and socket 130 and lifting lock piece to be arranged
140 device, as shown in Fig. 1 to Fig. 2, Fig. 4, Fig. 5, Fig. 6 and Fig. 7, a pair of of Support bracket 120 is in the exposed hole of socket 112
The both sides of length direction are oppositely arranged respectively, and upper and lower directions forms guiding groove 122 on opposite sides.
Two terminal abutments of the Support bracket 120 with above structure in length direction with the exposed hole of socket 112
Each bottom plate 10 is oppositely arranged above.At this point, forming guiding groove 122, the guiding groove on the opposite face of each Support bracket 120
122 for guiding to 130 oscilaltion of aftermentioned ejector and socket.
Secondly, it is for the depositing in common socket substrate 10 by memory 30 to constitute the ejector of the present invention and socket 130
Consistent device is arranged on reservoir socket 20, as shown in Figures 1 to 7, ejector and socket 130 are in each of Support bracket 120
It can be arranged up or down on a guiding groove 122, form the installation slot of more than one installation memory 30 on opposite sides
132。
In addition, as shown in fig. 6, foregoing ejector and socket 130 by support socket 130a, guide socket 130b and
Link screw 134 to constitute, wherein the support socket 130a can be moved up and down on each guiding groove 122 of Support bracket 120
Ground is arranged, and is formed with the support slot 132a for the both sides lower end for supporting installed memory 30；The guide socket 130b,
It is engaged in the upside of support socket 130a, guiding corresponding with support slot 132a is formed on the guide socket 130b
The guiding slot 132b of memory 30；The connecting screw 134 is used for connecting and engaging support socket 130a and guide socket
130b。
As previously mentioned, the support of the ejector and socket 130 that are made of lower part and upper bond connecting screw 134 is inserted
The guiding slot 132b formed on the support slot 132a and guide socket 130b formed on seat 130a is arranged in same line up and down
On, to be inserted into installation slot 132 and will not be blocked when installing memory 30.At this point, formed on support socket 130a
The lower end of support slot 132a is the structure closed, under the both sides will pass through the memory 30 that installation slot 132 is inserted into
End is ejected device and the installation slot 132 of socket 130 supports.
Also, ejector and socket 130 with above structure are inserted in the guiding for constituting the guide socket 130b on the upside of it
The upper ends slot 132b form the fillet surface 136 with certain inclination angle, are inserted so that memory 30 can be more easily inserted into guiding
The upper end of the guiding slot 132b of seat 130b.That is, if the lower end of memory 30 touches fillet surface 136, memory 30 slides to
It guides the entrance side of slot 132b and is inserted into.
Secondly, it is to make ejector and socket 130 by inwardly outside rotation to constitute lifting of the invention with lock piece 140
It is down or up, it is achieved in the device of encapsulation or the pop-up of memory 30, as shown in Figures 1 to 7, a pair of of lifting locking
Part 140 inwardly outer can be rotatably disposed at 120 on each Support bracket by rotary shaft 142 (with reference to Fig. 8 and Fig. 9), pass through to
Inside and outside rotation makes ejector and the socket 130 decline or rise.
In other words, the lifting lock piece 140 with above structure will pass through aftermentioned memory device for ejecting and liter
The spring out type socket 130 that drop is engaged with lock piece 140, by being rotated, making ejector and being inserted inwardly with lock piece 140 by lifting
Seat 130 declines, and is achieved in the encapsulation of memory 30, alternatively, by rotating lifting outward with lock piece 140, makes pop-up
Device and socket 130 rise, and are achieved in the pop-up of memory 30.
It follows that the lifting lock piece 140 with above structure, by memory pressing member 170 to memory
30 while pressurizeed, and ejector and socket 130 is made to decline.That is, being locked when by the rotation and lifting of pressurization lock piece 160
Stop member 140 to when rotation, is completed at the same time and memory 30 is pressurizeed and passed through by memory pressing member 170 to inward side
The decline of the ejector and socket 130 of memory device for ejecting.
Secondly, the memory device for ejecting for constituting the present invention is the device for popping up memory 30, the memory
Device for ejecting makes ejector and socket 130 rise, and is achieved in packaged on the memory plug 20 of common socket substrate 10
The pop-up of memory 30, as shown in Figures 1 to 7, the structure of memory device for ejecting is, when lifting with lock piece 140 outward
When direction rotates, ejector and socket 130 is made to move up, thus makes to be sealed on the memory plug 20 of common socket substrate 10
The memory 30 of dress pops up.
Foregoing memory device for ejecting is made of fastening groove 150 and locking member 152, wherein the fastening groove
150 are formed in the lateral surface for each guide socket 130b for constituting ejector and socket 130, and the locking member 152 is each
Lifting is oppositely arranged on the side of the opposite face of lock piece 140, is blocked on the fastening groove 150 of guide socket 130b, is worked as liter
When drop is rotated in outward direction with lock piece 140, so that ejector and socket 130 is increased, thus make memory 30 from common socket
It is popped up in the memory plug 20 of substrate 10.
In addition, foregoing memory device for ejecting, as described above, being formed by opposite on the side of each opposite face
Locking member 152 be inserted into the structure on the fastening groove 150 for the guide socket 130b for constituting ejector and socket 130 and blocked
Composition, thus when lifting with lock piece 140 to inward side to when rotation, so that ejector and socket 130 is declined, thus not only realize
The sealed storage device 30 on memory plug 20, and when lifting is rotated in outward direction with lock piece 140, keep ejector simultaneous
Socket 130 rises, and thus pop-up is packaged in the memory 30 on memory plug 20.
As previously mentioned, the memory device for ejecting of the present invention is constituted, when lifting 140 inside lateral direction of lock piece rotates
When keep ejector and socket 130 down or up, thus make the memory 30 to pressurize by memory pressing member 170 more
Add and be easily encapsulated on the memory plug 20 of common socket substrate 10, and common socket substrate 10 can be favorably accomplished
Memory plug 20 on packaged memory 30 pop-up.
Secondly, the pressurization lock piece 160 for constituting the present invention is for that will be inserted into and be mounted on ejector and socket 130
The device that memory 30 pressurizes downwards, as shown in Figures 1 to 7, a pair of of pressurization is with lock piece 160 respectively in each lifting locking
Inwardly outer can rotatably it be arranged by rotating support shaft 162 on part 140, thus the depositing to common socket substrate 10 by memory 30
Reservoir socket 20 pressurizes.
Foregoing pressurization lock piece 160 forms dual rotational structure, this dual rotation with lifting lock piece 140
Rotation structure can pressurize, and left and right length is identical and various memories 30 that lower-upper length is different.At this point, for lower-upper length size
Maximum memory 30, pressurization is not rotated slightly to rotation or only to inward side with lock piece 160, for lower-upper length
The small memory 30 of size, the upper end for the memory 30 that pressurization is inserted into and is installed on ejector and socket 130 with lock piece 160
It is rotated in spacing range between memory pressing member 170.
Secondly, the memory pressing member 170 for constituting the present invention is when pressurization lock piece 160 is to inward side to rotation
When, thus memory 30 is encapsulated into common socket substrate by the upper end for the memory 30 installed on pressurize ejector and socket 130
Device on 10 memory plug 20, memory pressing member 170 are arranged on each opposite face of pressurization lock piece 160
There are one more than, and the upper end of the both sides of pressurized storage device 30.
Foregoing memory pressing member 170 is on each leading axle 182 for constituting aftermentioned rotation guide
It is rotatably arranged, and the structure composition of the pressure roller by the upper end of the both sides of rotary presser memory 30.Add when such
When 170 pressurized storage 30 upper end of device of memory pressing member of pressing roller shape, in the upper surface upward horizon side of memory 30
To being rotated while movement, thus dispersion sends the pressure of memory 30 to.
Thus, as previously mentioned, memory pressing member 170 is formed with the shape of pressure roller, and in pressurized storage device
It when 30 upper end, is rotated while the upper surface upward horizon direction of memory 30 is moved, thus dispersion sends storage to
The pressure of device 30, therefore the upper surface of memory 30 can be prevented to be stored by the damage of pressing member 170.
In addition, when with multiple pressure rollers for constituting foregoing memory pressing member 170, in pressurization locking
The next door 200 for detaching adjacent each pressure roller can also be integrally formed on each opposite face of part 160.It is such every
Wall 200 prevents pressure roller from moving left and right, and pressure roller is made only to pressurize to corresponding memory 30.
Secondly, the rotation guide for constituting the present invention is to guide its rotation when the inside and outside rotation of pressurization lock piece 160
Device, as shown in Figures 1 to 7, rotation guide is made of guiding groove 180 and leading axle 182, wherein the guiding groove
180 are formed with the both sides of lock piece 140 with the shape of elongated slot is opposite in each lifting；The leading axle 182 is in pressurization locking
Opposed on each opposite face of part 160, the both ends of each leading axle 182 are inserted into and are engaged on guiding groove 180, so as in guiding groove
The rotation of pressurization lock piece 160 is realized in the range of 180.
As shown in figure 8, the rotation guide with above structure passes through the pressurization lower-upper length of memory pressing member 170
When the maximum memory 30 of size, pressurization is slightly rotated with lock piece 160 without rotation or only, therefore leading axle 182
In the top of guiding groove 180.
On the contrary, as shown in figure 9, when pressurize lower-upper length size small or minimum memory 30 when, pressurization lock piece
160 rotate always until memory pressing member 170 is contacted with the upper surface of memory 30, therefore leading axle 182 is to guiding
It moves the downside of slot 180.Leading axle 182 can be moved to the bottom of guiding groove 180.
Therefore, it can be seen that constituting the top/bottom latitude and memory 30 of the guiding groove 180 of foregoing rotation guide
Upper and lower maximum length size is correspondingly formed with minimum length size.
Secondly, the pivot link 190 for constituting the present invention is when by the lifting of the side inwardly outside rotation of lock piece 140
Make the lifting device that also inwardly the same direction in outside rotates of lock piece 140 of the other side, as shown in Figures 1 to 7, rotation connects
Bar 190 is made of supporting beam 192 and connecting rod 194, wherein the supporting beam 192 is arranged and is fixed in a pair of of Support bracket
On the unidirectional side for each lifting lock piece 140 being arranged oppositely on 120, the connecting rod 194 is by the branch of both sides
Support beam 192 is rotatably attached, and when so as to outer rotation that the lifting of side is inside with lock piece 140, the lifting of the other side is made to use
Lock piece 140 also rotates simultaneously.
In other words, the pivot link 190 with above structure is with the coupling part of supporting beam 192 and connecting rod 194
The structure composition being rotatably attached by hinge passes through rotation when by the lifting of the side inwardly outer rotation of lock piece 140
Power is successfully passed to the lifting of the other side on lock piece 140 by connecting rod 190.
In addition, in the structure of above-mentioned pivot link 190, one end of connecting rod 194 is formed as being bent at a certain angle
Shape.Since the shape that one end of connecting rod 194 is bent at a certain angle is formed, socket device through the invention
100 to memory 30 come when carrying out bad test, can interference caused by machinery be reduced to minimum.
Also, the socket device 100 for memory test of the present invention with above structure further includes torque spring
210, pressurization lock piece 160 inwardly outer can be rotatably coupled to lifting lock piece 140 by the setting of the torque spring 210
Rotating support shaft 162 on, and to make pressurization lock piece 160 be always maintained at original position direction realize elastic force effect.
When releasing plus-pressure, foregoing torque spring 210 makes pressurization lock piece 160 set back to set, therefore,
In order to pop up common socket substrate 10 memory plug 20 on packaged memory 30 and rotation and lifting in outward direction
When with lock piece 140, the smoothly rotation in outward direction of lifting lock piece 140 can be made by pressurization lock piece 160 by having
Effect.
Also, in the structure of the present invention, on the basis of foregoing technical pattern, in lifting lock piece 140
Rotation limitation bar 220 is also set up on each opposite face, when pressurization with lock piece 160 to inward side to when rotation, the rotation limits
Bar 220 processed makes its rotation be limited within a certain range.In such a way that rotation limits the limitation pressurization lock piece 160 of bar 220
Be, when pressurization with lock piece 160 to inward side to when rotation, in leading axle 182 and the bottom of guiding groove 180 being conducted
On adjacent initial point, rotated by limiting the pressurization lock piece 160 with the contact of lock piece 160 with pressurization.
Fig. 8 is to indicate the socket device for memory test through the invention to install depositing for lower length ruler modest ability
The side block diagram of the effect of lock piece when reservoir, Fig. 9 are the socket devices for memory test indicated through the invention
Come the side block diagram of the effect of lock piece when installing lower length dimension small memory.
By the socket device 100 for memory test of the present invention with above structure, left and right length phase is installed
With and the different various memories 30 of lower-upper length, and be encapsulated the mistake of the memory plug 20 of common socket substrate 10
Journey illustrates as shown in Figure 8 and Figure 9.At this point, indicating the maximum memory 30 of lower-upper length size in fig. 8, in fig.9
Indicate the memory 30 of the size of reservoir 30 of the lower-upper length size less than Fig. 8.
As shown in (a) in Fig. 8, when by the way that the present invention in 20 upside of memory plug of common socket substrate 10 is arranged
For the socket device 100 of memory test come when testing the maximum memory 30 of lower-upper length size, first, if will pressurization
It is pulled, is then rotated outward simultaneously by this pull force lifting lock piece 140 outward with lock piece 160.
In addition, as previously mentioned, power by pulling pressurization in outward direction with lock piece 160, lifting lock piece 140
During rotating in outward direction simultaneously, ejector and socket 130 can rise.That is, working as lifting 140 outside side of lock piece
To when rotation, the locking member 152 of the composition memory device for ejecting on lifting lock piece 140 is simultaneous to be formed in ejector
The state engaged on the fastening groove 150 of the lateral surface of socket 130 makes ejector and socket 130 rise.
In the state of as previously described, the lower end of the both sides of memory 30 is inserted into and is installed to the ejector of both sides and is inserted
On opposite installation slot 132 on seat 130.At this point, being inserted into the storage on the installation slot 132 of ejector and socket 130
Device 30, since the lower end of installation slot 132 is the structure closed, memory 30 is to be inserted into and be installed to ejector and socket
The state of 130 installation slot 132 is supported.
Moreover, as previously mentioned, in the state of being inserted on ejector and socket 130 and installing memory 30, in Fig. 8
(b) shown in, by pressurization lock piece 160 to inward side to pulling, so as to realize lifting lock piece 140 to inward side to
Rotation.At this point, by pressurization with lock piece 160 to inward side to pull and realize lifting lock piece 140 to inward side
During rotation, the locking member 152 of the composition memory device for ejecting on lifting lock piece 140 makes ejector and inserts
Seat 130 declines, thus the sealed storage device 30 on the memory plug 20 of common socket substrate 10.
In addition, as previously shown, the lower-upper length size of the memory 30 of Fig. 8 is maximum, therefore constitutes memory device for ejecting
Locking member 152 so that ejector and socket 130 is declined, to make to be encapsulated on the memory plug 20 of common socket substrate 10
The initial point of memory 30 and by pressurization with the memory pressing member 170 constituted on the opposite face of lock piece 160 to storage
It contact initial point that 30 upper end of device is pressurizeed while realizing.
As previously mentioned, the maximum memory 30 of lower-upper length size is inserted into and is installed by ejector and socket 130,
During memory plug 20 to be encapsulated into common socket substrate 10, from (a) and (b) in Fig. 8 as it can be seen that pressurization is locked
Stop member 160 is not rotated completely centered on rotating support shaft 162.This can by torque spring 210 it is any compression come
Judge.
On the contrary, as shown in (a) in Fig. 9, when by being arranged in the upside of the memory plug 20 of common socket substrate 10
The present invention for the socket device 100 of memory test come test lower-upper length size be less than maximum sized memory 32
When, pressurization is pulled outward with lock piece 160, so that lifting is rotated outward with lock piece 140, thus in ejector and socket
Memory 32 is inserted on 130.
In addition, as previously mentioned, by the way that pressurization is made lifting lock piece with the power that lock piece 160 is pulled in outward direction
During 140 rotate in outward direction simultaneously, when lifting is rotated in outward direction with lock piece 140, lifting lock piece
The locking member 152 of composition memory device for ejecting on 140, is formed with being locked on the lateral surface of ejector and socket 130
Fastening groove 150 on state, so that ejector and socket 130 is increased.
In the state of by lifting being rotated in outward direction ejector and socket 130 is made to increase with lock piece 140,
The lower end of the both sides of memory 32 is inserted into and is installed on the opposed installation slot 132 on ejector and socket 130.This
When, the memory 32 being inserted on the installation slot 132 of ejector and socket 130, since the lower end of installation slot 132 is to close
Structure, therefore memory 32 is supported with the state for being inserted into and being installed to the installation slot 132 of ejector and socket 130.
Moreover, as previously mentioned, in the state of being inserted on ejector and socket 130 and installing memory 32, in Fig. 9
(b) shown in, by pressurization lock piece 160 to inward side to pulling, so as to realize lifting lock piece 140 to inward side to
Rotation.At this point, by pressurization with lock piece 160 to inward side to pull and realize lifting lock piece 140 to inward side
During rotation, the locking member 152 of the composition memory device for ejecting on lifting lock piece 140 keeps ejector simultaneous
Socket 130 declines, thus the sealed storage device 30 on the memory plug 20 of common socket substrate 10.
Shown in (b) in Fig. 9 as the aforementioned, lifting with lock piece 140 to inward side to it is fully rotating in the state of, with
Ejector and socket 130 simultaneously decline, the lower-upper length size on being encapsulated into the memory plug 20 of common socket substrate 10
It is generated between the lower end of the pressing member 170 constituted on the opposite face of small 32 upper end of memory and pressurization lock piece 160
The interval of certain distance.This is because being designed into, when lifting is rotated to maximum to inward side with lock piece 140, make to add
Splenium part 170 touches the upper end of the memory 30 of the maximum Fig. 8 of lower-upper length size.
In addition, as the aforementioned shown in (b) in Fig. 9, when by lifting with lock piece 140 to inward side to it is fully rotating when,
Even if the small memory 32 of encapsulation lower-upper length size on the memory plug 20 of common socket substrate 10, due to cannot achieve
It is pressurizeed by pressing member 170, therefore will produce problem in terms of test.
In order to improve problem as previously described, the present invention provides be oppositely arranged on lock piece 140 in opposed lifting
The pressurization structure of lock piece 160, this structure can accommodate and test that all left and right length is identical and lower-upper length is different
Various sizes memory 30,32.At this point, with lock piece 160, to pass through rotating support shaft 162, inwardly outside rotates one for pressurization
The mode for determining range is constituted, and by the way that setting is in rotating support shaft 162 and one end and the other end are by lifting lock piece 140
The torque spring 210 supported with lock piece 160 with pressurization, by the structure composition of elastic force in outward direction.
Therefore, as previously mentioned, torque spring 210 by being arranged in rotating support shaft 162 and generating outside elastic force
Effect, pressurization lock piece 160 is constantly in inclined state outward.In such a state, when user uses to pressurization
Lock piece 160 apply to inward side to plus-pressure when, lifting lock piece 140 interior direction maximum rotation initial point it
Before, pressurization lock piece 160 will not begin to inward side to rotation from the maximum rotation of the interior direction of lifting lock piece 140
Point starts, and pressurization is started with lock piece 160 to inward side to rotation.
In other words, shown in (b) in Fig. 9 as the aforementioned, in lifting with lock piece 140 to inward side to fully rotating
Under state, small 32 upper end of memory of lower-upper length size on being encapsulated into the memory plug 20 of common socket substrate 10 with
The shape at the interval of certain distance is generated between the lower end of the pressing member 170 constituted in the opposite surface of pressurization lock piece 160
Under state, as shown in (c) in Fig. 9, if to pressurization with lock piece 160 apply to inward side to power, in the model of spacing distance
Enclose interior realization pressurization lock piece 160 to inward side to rotation, be achieved in through pressing member 170 to memory 32
Pressurization.
As previously mentioned, in the interior direction rotation by lifting lock piece 140, in the memory of common socket substrate 10
On socket 20 in the state of sealed storage device 32, rotated by the interior direction of pressurization lock piece 160 to realize memory 32
Pressurization after, it is whether bad that memory 32 is tested by turn-on power.If being applied to pressurization lock piece 160 at this point, releasing
The power added then makes pressurization lock piece 160 revert to original state by the elastic force of torque spring 210.
In addition, such as (c) in Fig. 9, memory 32 small to lower-upper length size or minimum under pressure, pressurizes
It can always be rotated until the upper end for the both sides that pressing member 170 touches memory 32 with lock piece 160, therefore leading axle
182 move to the downside of guiding groove 180.At this point, leading axle 182 can be moved to the bottom of maximum guiding groove 180.
As described above, the technology of the present invention, dual rotational structure is configured to by the structure of lock piece 14,160, so as to
It accommodates and all left and right length of pressurizeing is identical and various memories 30 that lower-upper length is different, so as to more successfully carry out
The bad test of memory 30.
The present invention is not limited to embodiments above-mentioned, can be carried out in the range of the technological thought of the present invention allows more
Kind changes and implements.
Claims (13)
1. a kind of socket device for memory test comprising：
Bottom plate is arranged and is fixed on the upside of common socket substrate, forms the exposed hole of multiple sockets on the bottom plate, so as to
The more than one memory plug encapsulated on common socket substrate is inserted into and exposed to upside；
A pair of of Support bracket is oppositely arranged respectively in the both sides of the length direction in the exposed hole of the socket, on opposite sides with
Upper and lower directions forms guiding groove；
Ejector and socket can be arranged, on opposite sides shape up or down on each guiding groove of the Support bracket
At the slot of more than one installation memory；
A pair of of lifting lock piece inwardly outer can rotatably be arranged on each Support bracket, and pass through inside outward turning
Turn to keep the ejector and socket down or up；
Memory device for ejecting, it is when the lifting is rotated in outward direction with lock piece, the ejector and socket is upward
It is mobile, so that the memory is popped up；
A pair of of pressurization lock piece inwardly outer can rotatably be arranged on each lifting lock piece, and be deposited described
Reservoir pressurizes to the memory plug of the common socket substrate；
More than one memory pressing member is arranged on each opposite face of the pressurization lock piece, and institute of pressurizeing
State the upper end of the both sides of memory；
Rotation guide guides its rotation when pressurization lock piece inwardly outer rotation；And
Pivot link, a pair of lifting lock piece of connection enable to rotate simultaneously when its inside outer rotation,
Wherein, rotation limitation bar is also set up on each opposite face of lifting lock piece, when the pressurization lock piece
To inward side to when rotation, the rotation limitation bar makes the rotation of pressurization lock piece be limited within a certain range.
2. the socket device according to claim 1 for memory test, which is characterized in that the ejector and socket
It is made of support socket, guide socket and connecting screw, wherein
The support socket can be arranged up or down on each guiding groove of the Support bracket, and is formed with support and is pacified
The support slot of the both sides lower end of the memory of dress；
The guide socket is engaged in the upside of the support socket, is formed on the guide socket and the support slot
The guiding slot of the corresponding guiding memory；
The connecting screw is used for connecting and engaging the support socket and the guide socket.
3. the socket device according to claim 2 for memory test, which is characterized in that the branch of the support socket
The lower end of support slot is formed with the shape closed, so as to support the both sides lower end of the memory.
4. the socket device according to claim 2 for memory test, which is characterized in that in the guide socket
The upper end of guiding slot also forms the fillet surface with certain inclination angle, is inserted so that the memory being inserted into is directed to guiding
Slot.
5. the socket device as claimed in any of claims 2 to 4 for memory test, which is characterized in that institute
Memory device for ejecting is stated to be made of fastening groove and locking member, wherein
The fastening groove is formed in the lateral surface for each guide socket for constituting the ejector and socket；
The side of the opposite opposite face for being formed in each lifting lock piece of the locking member is locked on the guiding and inserts
On the fastening groove of seat, when the lifting is rotated in outward direction with lock piece, the ejector and socket is made to increase, it will be described
Memory is popped up from the ejector and socket.
6. the socket device according to claim 1 for memory test, which is characterized in that the rotation guide
It is made of guiding groove and leading axle, wherein
The guiding groove is formed in the both sides of each lifting lock piece with the shape of elongated slot is opposite；
The leading axle is oppositely arranged on each opposite face of pressurization lock piece, and the both ends of each leading axle are inserted into and are connect
Together on the guiding groove, to realize the rotation of the pressurization lock piece in the range of guiding groove.
7. the socket device according to claim 6 for memory test, which is characterized in that constitute the rotation guiding
The top/bottom latitude of the guiding groove of device, it is corresponding with the size of maximum length up and down of the memory and minimum length size
Ground is formed.
8. the socket device for memory test described according to claim 6 or 7, which is characterized in that the memory adds
Splenium part is with the structure composition of pressure roller, and the pressure roller is in each leading axle for constituting the rotation guide
On be rotatably arranged, and the both sides upper end of memory described in rotary presser.
9. the socket device according to claim 8 for memory test, which is characterized in that have described in multiple compositions
When the pressure roller of memory pressing member, also it is integrally formed and is used on each opposite face of pressurization lock piece
By the next door of adjacent each pressure roller separation.
10. the socket device according to claim 1 for memory test, which is characterized in that further include torque spring,
On the rotary shaft, the rotary shaft enables the pressurization lock piece is inside and outside to be rotatably coupled to institute for the torque spring setting
It states on lifting lock piece, and the torque spring has the pressurization is made to be set back with lock piece the elastic force effect set.
11. the socket device according to claim 1 for memory test, which is characterized in that the pivot link by
Supporting beam and connecting rod are constituted, wherein the supporting beam is arranged and is fixed on opposed each on the pair of Support bracket
On the unidirectional side of the lifting lock piece；
The supporting beam of both sides is rotatably attached by the connecting rod, so that the lifting lock piece of side is inside
When outer rotation, makes the lifting lock piece of the other side while rotating.
12. the socket device according to claim 11 for memory test, which is characterized in that the one of the connecting rod
Hold the shape for having and being bent at a certain angle.
13. the socket device according to claim 1 for memory test, which is characterized in that as the pressurization is used
The rotation lifting of lock piece, to inward side to when rotation, passes through the storage of the memory pressing member with lock piece
The pressurization and the decline of the ejector and socket by the memory device for ejecting of device are to realize simultaneously.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020140185773A KR101659322B1 (en) | 2014-12-22 | 2014-12-22 | Sockets for memory testing device |
| KR10-2014-0185773 | 2014-12-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105810253A CN105810253A (en) | 2016-07-27 |
| CN105810253B true CN105810253B (en) | 2018-10-16 |
Family
ID=56420890
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410853000.6A Active CN105810253B (en) | 2014-12-22 | 2014-12-31 | Socket device for memory test |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101659322B1 (en) |
| CN (1) | CN105810253B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102571578B1 (en) * | 2021-05-28 | 2023-08-28 | 주식회사 아이에스시 | Memory module jig apparatus |
| CN114204302B (en) * | 2021-11-02 | 2024-03-15 | 深圳市博德越科技有限公司 | Adapter card |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200373503Y1 (en) * | 2004-10-09 | 2005-01-15 | 주식회사 유니테스트 | Contact pin structure contacted by air pressure and module socket using thereof |
| KR200387615Y1 (en) * | 2005-04-07 | 2005-06-20 | 김태완 | Module test socket |
| CN1780056A (en) * | 2004-12-23 | 2006-05-31 | 金士顿科技公司 | Memory module testing socket and instrument |
| CN1812199A (en) * | 2005-02-14 | 2006-08-02 | 金士顿科技公司 | Memory modules and tester |
| KR100704002B1 (en) * | 2005-04-07 | 2007-04-09 | 김태완 | Module test socket |
| CN101077042A (en) * | 2004-12-14 | 2007-11-21 | 英特尔公司 | System and method for improved edge clamping connector |
| KR20080081385A (en) * | 2007-03-05 | 2008-09-10 | 주식회사 주로에이티에스 | Memory module test socket device |
| KR100902286B1 (en) * | 2007-07-13 | 2009-06-10 | 주식회사 유니세트 | Jig for memory module test |
| KR20100008201U (en) * | 2009-02-09 | 2010-08-18 | (주)마이크로컨텍솔루션 | Ejecting device of memory module test socket |
| CN101924299A (en) * | 2009-06-11 | 2010-12-22 | 微联解决方案株式会社 | One-touch popping device of memory module test socket |
| CN101989709A (en) * | 2009-08-06 | 2011-03-23 | 微联解决方案株式会社 | One-touch clamp for testing internal memory module |
| KR101029122B1 (en) * | 2009-10-08 | 2011-04-13 | (주)씨앤씨테크 | Jig for memory module test |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20100008201A (en) | 2008-07-15 | 2010-01-25 | 김석태 | Apparatus for detecting liquid level and method of detecting liquid level using the same |
-
2014
- 2014-12-22 KR KR1020140185773A patent/KR101659322B1/en active IP Right Grant
- 2014-12-31 CN CN201410853000.6A patent/CN105810253B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200373503Y1 (en) * | 2004-10-09 | 2005-01-15 | 주식회사 유니테스트 | Contact pin structure contacted by air pressure and module socket using thereof |
| CN101077042A (en) * | 2004-12-14 | 2007-11-21 | 英特尔公司 | System and method for improved edge clamping connector |
| CN1780056A (en) * | 2004-12-23 | 2006-05-31 | 金士顿科技公司 | Memory module testing socket and instrument |
| CN1812199A (en) * | 2005-02-14 | 2006-08-02 | 金士顿科技公司 | Memory modules and tester |
| KR200387615Y1 (en) * | 2005-04-07 | 2005-06-20 | 김태완 | Module test socket |
| KR100704002B1 (en) * | 2005-04-07 | 2007-04-09 | 김태완 | Module test socket |
| KR20080081385A (en) * | 2007-03-05 | 2008-09-10 | 주식회사 주로에이티에스 | Memory module test socket device |
| KR100902286B1 (en) * | 2007-07-13 | 2009-06-10 | 주식회사 유니세트 | Jig for memory module test |
| KR20100008201U (en) * | 2009-02-09 | 2010-08-18 | (주)마이크로컨텍솔루션 | Ejecting device of memory module test socket |
| CN101924299A (en) * | 2009-06-11 | 2010-12-22 | 微联解决方案株式会社 | One-touch popping device of memory module test socket |
| CN101989709A (en) * | 2009-08-06 | 2011-03-23 | 微联解决方案株式会社 | One-touch clamp for testing internal memory module |
| KR101029122B1 (en) * | 2009-10-08 | 2011-04-13 | (주)씨앤씨테크 | Jig for memory module test |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101659322B1 (en) | 2016-10-04 |
| CN105810253A (en) | 2016-07-27 |
| KR20160077248A (en) | 2016-07-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10331585B2 (en) | Read training a memory controller | |
| CN105810253B (en) | Socket device for memory test | |
| US6779075B2 (en) | DDR and QDR converter and interface card, motherboard and memory module interface using the same | |
| CN102821578B (en) | Electronic device and ejecting mechanism thereof | |
| TWI489695B (en) | Connector | |
| CN107871524A (en) | The electronic installation resetted to storage device and the method for operating the electronic installation | |
| US7264491B2 (en) | Method and apparatus for linear insertion and removal of a memory module in a computer system | |
| CN103995564B (en) | Memory bank with special contact mechanism | |
| CN102692970A (en) | Data accessor fixing device | |
| CN101924299A (en) | One-touch popping device of memory module test socket | |
| US20150372429A1 (en) | Plug connector, electronic apparatus including receptacle and connecting method of electronic apparatus | |
| CN101989709B (en) | One-touch clamp for testing internal memory module | |
| CN105811195A (en) | Three-in-one card seat connector and mobile phone | |
| KR200444336Y1 (en) | A jig for memory-module test | |
| US20130238841A1 (en) | Data processing device and method for preventing data loss thereof | |
| CN111757587A (en) | Snap-on electromagnetic interference (EMI) shielding without motherboard ground requirements | |
| KR101555263B1 (en) | Rotation OTG USB Memory Device. | |
| CN106486840A (en) | Card access device and card taking method | |
| TWI546650B (en) | Removable type computing device and insertion type connection assembly | |
| KR20080045877A (en) | A jig for memory-module test | |
| CN207318516U (en) | The solid phase carrier automatic discharging device and reaction disc system of a kind of analyzer | |
| US20140048674A1 (en) | Supporting apparatus | |
| CN209514628U (en) | A kind of card reader with active type plug connector | |
| CN202111750U (en) | Portable terminal | |
| TWM327525U (en) | Testing tool of memory module |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |