KR200444336Y1 - A jig for memory-module test - Google Patents

Abstract

The present invention relates to a test jig for a memory module, and more particularly, to allow the connection connector provided on the motherboard to smoothly perform the insertion and withdrawal of the memory module for testing without a human hand. The present invention relates to a test jig for a memory module that enables a maximizing test process with preventing damage to the module and the motherboard.

According to the present invention, a test jig for a conventional memory module for testing a memory module mounted on a connection connector provided on the motherboard, the housing for maintaining a fixed state of the memory module inserted into the connection connector; ; A plurality of drive handles and interlocking handles, one side of which is hinged rotatably at both ends of the housing; An interlocking bar coupled to one end of the driving handle and the interlocking handle to achieve the interlocking operation; And, it is characterized in that it comprises a plurality of eject pins rotatably coupled to form the insertion and removal of the memory module in close proximity to the lower surface of the drive handle and the interlock handle.

Memory Module, Motherboard, Connector, Drive Handle, Interlock Handle, Eject Pin

Description

Jig for testing memory module {A JIG FOR MEMORY-MODULE TEST}

The present invention relates to a test jig for a memory module, and more particularly, to allow the connection connector provided on the motherboard to smoothly perform the insertion and withdrawal of the memory module for testing without a human hand. The present invention relates to a test jig for a memory module that enables a maximizing test process with preventing damage to the module and the motherboard.

Mother board dictionary means board that is equipped with the basic parts of the computer, the most basic and physical hardware that contains the basic circuits and components in the computer, the mainboard or main board Also called (主 基板).

On the other hand, while being mounted on the motherboard (實 裝: state that can be immediately available with a simple operation), the memory module (Memory-module) to increase the processing speed of the resident program to increase the performance of the computer As the type of the memory module is used, it is commercially available for the manufacture and production of synchronous dynamic random access memory (SDRAM), RAMBUS DRAM, or stud random access memory (SRAM).

The various memory modules described above are fixed on one motherboard to form an independent circuit. Since the memory modules play an important role among various modules mounted on the motherboard, the manufacturing process is After completion, the characteristics or reliability of the internal circuits are checked before mounting on the motherboard.

Accordingly, the memory module has been tested using a separate specialized equipment such as the 'automatic memory test device for computers' disclosed in Korean Patent No. 10-607546, but expensive specialized equipment must be purchased for him. Due to the economic burden and the need to provide a separate installation space for equipment, the cost was higher than the cost required for the production of memory modules, which made it difficult to obtain the purpose of substantial profits.

In addition, the condition that the memory module is tested is not carried out on the actual motherboard, but because it is carried out by a separate specialized equipment, the experimental results cannot be obtained under the optimal conditions, which does not completely overcome the improvement in quality problems. This has been.

Accordingly, in recent years, a self-test method using a motherboard directly on which a memory module is mounted is mainly used, and for this purpose, in Korean Patent No. 10-483196, on the motherboard without using the expensive experimental equipment described above. A semiconductor memory tester has been disclosed that enables a test of a memory module through an installed semiconductor device slot.

1 is an exploded perspective view showing the configuration of a memory module tester according to the prior art. As shown in the drawing, a conventional semiconductor memory tester is provided on a motherboard of a computer, and an intermediate slot 510 is provided on an upper surface thereof. An installed socket 500; An intermediate board 600 having one end inserted into the intermediate slot 510 of the installation socket 500; A connection connector 700 connected to the other end of the intermediate board 600; The test socket 800 is coupled to an upper portion of the connection connector 700, and a connection slot 810 is formed on an upper surface thereof so that the semiconductor memory module M is inserted into and connected to the connection slot 810.

In addition, at both ends of the installation socket 500 and the test socket 800, a plurality of ejectors 520 and 820 for separating or combining the intermediary board 600 and the memory module M are hinged to the outside. Are combined.

Looking specifically at the coupling and the working relationship of the memory module tester according to the prior art, after the one end of the medium board 600 is inserted into the medium slot 510 of the installation socket 500 by a predetermined depth, the medium board 600 The connection connector 700 is coupled and connected to the upper end of the upper side, and the test socket 800 is inserted into the upper end of the connection connector 700 and connected to the connection slot 810 of the test socket 800. The lower end of the memory module M for testing the characteristics or reliability is inserted.

That is, when the intermediate board 600 and the memory module M are pressed down to be mounted using a human hand, the ejector 520 and 820 may be installed in the installation socket 500 and the test socket 800. Forcibly rotated inward to achieve a fixed coupling of the intermediary board 600 and the memory module M, or rotate the ejectors 520 and 820 in both directions to release the fixed state and then again It can be separated and detached by hand.

However, while the advantage of being able to test the memory module by directly coupling on the motherboard without using expensive experimental equipment, the intermediate board 600 in the intermediate slot 510 of the installation socket 500 The intermediary board 600 by directly carrying out all work processes of inserting or pressing the memory module M in the connection slot 810 of the test socket 800 or forcibly pulling them out and removing them by hand. ) And the memory module (M) inevitably apply a load and damage (damage), and also interferes with various modules, such as active and passive devices including them increases the damage rate of the product, Adsorption has been a problem that causes poor electrical properties.

In addition, in order to test the memory module (M), it is further provided with a plurality of sockets and connectors and a separate intermediary board 600, etc., and assembling them to be stacked on each other, the connection state between each component Not only are they unable to obtain a complete inspection result due to the problem of being poor, but there have been closures that require additional manufacturing processes and additional manufacturing costs required for the construction of such stacked assemblies.

An object of the present invention is to solve the above problems, the drive handle and the interlocking handle and their operation to enable the indirect drawing / withdrawal of the memory module in the connection connector without a person forcibly inserted or pulled out by hand The present invention provides a jig for testing a memory module having a plurality of eject pins interlocked with each other, so that mounting or detaching of the memory module can be easily performed.

In order to achieve the above object, the test jig for a memory module according to the present invention is a test jig for a normal memory module for testing a memory module mounted on a connection connector provided on a motherboard. A housing for maintaining a fixed state of the inserted memory module; A plurality of drive handles and interlocking handles, one side of which is hinged rotatably at both ends of the housing; An interlocking bar coupled to one end of the driving handle and the interlocking handle to achieve the interlocking operation; And, it is characterized in that it comprises a plurality of eject pins rotatably coupled to form the insertion and removal of the memory module in close proximity to the lower surface of the drive handle and the interlock handle.

As is apparent from the above description, the test jig for the memory module of the present invention has a drive handle and an interlocking handle without a person pressing or mounting the memory module directly by hand into a connection connector provided on the motherboard. And by using a plurality of eject pins can be indirectly pulled in and out of the memory module, the load and impact that may occur when mounting or detaching the memory module does not affect the peripheral module including the motherboard damage of the product It has the effect of resolving concerns.

In addition, the memory module can be indirectly attached to or detached from the connection connector through the driving handle, the interlocking handle, and the plurality of eject pins, so that the closed end of the foreign matter adsorbed to the memory module can be blocked in advance. It's a useful design that allows you to perform a more maximal test process.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings such that those skilled in the art may easily implement the present invention.

2 is an exploded perspective view showing a coupling relationship of the test jig of the memory module according to the present invention, Figure 3 is an exploded perspective view showing the configuration of the test jig of the memory module according to the present invention, Figure 4a and Figure 4b is an operating state diagram showing the operating relationship of the test jig of the memory module according to the present invention, Figure 5 is an operating state diagram showing the driving relationship of the test jig and the interlocking bar of the memory module according to the present invention, Figure 6 A usage example showing a state in which a test jig for a memory module according to the present invention is mounted on a motherboard.

As shown in Figure 2 and 3 and 6, the test jig (A) of the memory module according to the present invention, the memory module (inserted in the connection connector (C) seated on the motherboard (B) ( A housing 1 for maintaining the fixed state of M), a plurality of drive handles 2 and an interlocking handle 3, one side of which is hinged rotatably at both ends of the housing 1, and the drive; It is composed of a plurality of eject pins (4) rotatably coupled to achieve the insertion and removal of the memory module (M) in close contact with the lower surface of the handle (2) and the interlocking handle (3).

In addition, as shown in FIG. 5, when the driving handle 2 is operated, the interlocking handle 3 automatically rotates in one direction so as to press the upper end of the memory module M together in a downward direction. The interlocking bar 5 is connected to one end of the driving handle 2 and the interlocking handle 3.

The housing (1) is for maintaining the connection state of the memory module (M) fitted to the connection connector (B) provided on the motherboard (B), it is possible to accommodate the connection connector (B) inside. The lower end is open and the fitting hole 11 penetrated in the longitudinally long hole shape to the finished upper surface, the plurality of driving handles 2, the interlocking handles 3, and the plurality of eject pins 4 rotate. Drive spaces 12 and 12 'coupled to each other are formed at both ends.

Meanwhile, hinge holes 121 and 121 'for hinge coupling of the driving handle 2 and the interlocking handle 3 are formed at both ends of the housing 1 constituting the driving spaces 12 and 12'. ) Is further formed.

The driving handle 2 and the interlocking handle 3 have a connection hole B of the connection connector B accommodated in the lower side after the memory module M passes through the fitting hole 11 of the housing 1. -1) as a means for forcing (separating) into or detaching them into

First, the driving handle 2 is a gripping portion 21 for holding a person by hand and rotationally driving it, a rotating portion 22 for referencing the rotation center point of the driving handle 2, and the rotation It consists of a pressing unit 23 for pressing one upper end of the memory module (M) downward in accordance with the rotation of the eastern portion (22).

The interlocking handle 3 is coupled to the other end of the housing 1 to rotate in the opposite direction of the driving handle 2 to press the other upper end of the memory module M, and when the driving handle 2 is operated. The interlocking portion 31 rotates together by the interlocking bar 5 interlocked with each other, and the pressing portion 32 presses one upper end portion of the memory module M when the interlocking portion 31 rotates.

On the other hand, the first push roller (23a) and the second push roller (32a) is provided in the pressing portion (23) (32) in order not to damage or damage when the memory module (M) is pressed as described above However, roller accommodating parts 231 and 321 for their accommodation coupling are further provided inside the pressing parts 23 and 32.

In addition, hinge shafts 221 fitted to the respective hinge holes 121 and 121 ′ at both ends of the pivoting part 22 of the driving handle 2 and the ends of the linking part 31 of the linking handle 3. ) 311 is protruded. Therefore, the driving handle 2 and the interlocking handle 3 may be rotatably coupled in the driving spaces 12 and 12 'of the housing 1.

Eject pin (4), as shown in Figures 3 to 4b, to support the lower end so that the memory module (M) can be easily inserted into the connection connector (B), and simply to separate it, A bent end 41 having a predetermined length and close to the bottom surface of the “a” shaped so as to be rotated equally at the time of rotation of the driving handle 2 and the interlocking handle 3; Lifting protrusions 42 for supporting the insertion and removal of the lower edge of the M) to enable insertion and separation, and a rotating shaft rotatably hinged to the lower inner side of the drive spaces 12 and 12 'of the housing 1 ( 43).

Reference numeral (B) is a motherboard that is coupled within the computer, (C) is a connector for connecting the memory module to the motherboard and electrically connected, (C-1) is a memory module can be connected. It is a connection hole formed in the longitudinal direction on the top of the connector.

Referring to the operation of the test jig of the memory module according to the present invention having the above configuration in detail as follows.

First, as shown in FIGS. 2 and 6, a connection connector C for allowing the memory module M to be electrically connected to the motherboard B is first coupled, and the memory module M (1) is fitted to maintain the fixed state or on the contrary the housing (1) to be detached and detached from the connecting connector (C) is coupled, and the drive space (12) on both sides of the housing (1) again ( 12 '), the driving handle 2 and the interlocking handle 3 are integrally coupled to each other to rotate.

In addition, as shown in Figures 3 and 5, during the rotation operation of the drive handle (2), the interlocking handle (3) rotates together so that they can constantly press the upper end of both sides of the memory module (M) Interlocking bar 5 is coupled to one outside is coupled.

In addition, as shown in Figure 4a, the rotational operation of the drive handle 2 and the interlocking handle 3 while being hinged to the lower side of the drive space (12, 12 ') of each of the housing (1) A plurality of eject pins 4 pivoting together are more closely coupled to the lower end of the driving handle 2 and the interlocking handle 3.

As such, when the test jig A of the memory module including the connection connector C is coupled to the motherboard B, the memory module M is formed on the upper surface of the housing 1. It penetrates through the several fitting hole 11, and it is located so that it may contact the connection hole (C-1) part of the said connection connector (C).

Next, the holding unit 21 of the driving handle 2 by the side of the memory module (M) by hand to rotate. At this time, the first push roller 23a accommodated in the pressing unit 23 of the driving handle 2 presses one upper end of the memory module M downward, and the driving handle 2 and the interlocking handle. By interlocking operation of the interlocking bar 5 coupled to the outer end of (3), the interlocking handles 3 rotate together in the reverse direction of the driving handles 2 so that the second push roller 32a is different from the memory module M. Press the upper end.

Therefore, the memory module M is easily inserted into and connected through the connection hole C-1 of the connection connector C.

On the other hand, during the process of the memory module (M) is fitted into the connection hole (C-1) of the connection connector (C) in the above process, the plurality of eject pins 4 and the drive handle (2) and the interlocking handle ( 3) is rotated by, and the lower end of the memory module (M) is supported on the upper surface of the lifting projections 42 of each of the plurality of eject pins (4) to be securely inserted into the connection hole (C-1). do.

As illustrated in FIG. 6, a test process of the memory module M connected to the motherboard B may be performed through the configuration and driving process as described above.

On the other hand, as shown in Figure 4b, the memory module (M) after the test is separated from the connection connector (C) of the motherboard (B), by rotating the drive handle (2) to the outside The interlocking bar (5) associated therewith operates to rotate the interlocking handle (3), and the plurality of eject pins (4) close to the lower end of the driving handle (2) and the interlocking handle (3) rotate together. The lifting projections 42 which support both lower end portions of M are lifted upwards to easily separate the memory module M from the connection hole C-1.

Although the present invention has been described in detail using the preferred embodiments as described above, the scope of the present invention is not limited to the specific embodiments, it should be interpreted by the appended utility model registration claims. In addition, those of ordinary skill in the art, of course, various modifications are possible without departing from the scope and spirit of the present invention.

1 is an exploded perspective view showing the configuration of the memory module tester according to the prior art.

Figure 2 is an exploded perspective view showing a coupling relationship of the test jig of the memory module according to the present invention.

Figure 3 is an exploded perspective view showing the configuration of the test jig of the memory module according to the present invention.

4a and 4b is an operating state diagram showing the operation relationship of the test jig of the memory module according to the present invention.

5 is an operational state diagram showing the driving relationship between the test jig and the interlock bar of the memory module according to the present invention.

6 is an exemplary view showing a state in which a test jig of the memory module according to the present invention is mounted on the motherboard.

*** Explanation of symbols for the main parts of the drawings ***

A: Jig, B: Motherboard, C: Connector

C-1: connection hole, 1: housing, 2: driving handle

3: linkage handle, 4: eject pin, 5: linkage bar

11: fitting hole, 12, 12 ': drive space portion, 21: gripping portion

22: rotating part, 23, 32: pressing part, 23a: first push roller

31: linkage, 32a: second push roller, 41: bend end

42: lifting up, 43: rotating shaft, 121, 121 ': hinge hole

221, 311: hinge shaft, 231, 321: roller accommodating part

Claims (3)

In the test jig of a conventional memory module for testing a memory module mounted on a connection connector provided on the motherboard, A housing for maintaining a fixed state of the memory module inserted into the connection connector; A plurality of drive handles and interlocking handles rotatably coupled to one side of the housing and extending vertically; An interlocking bar coupled to one end of the driving handle and the interlocking handle to achieve the interlocking operation; And, A plurality of eject pins rotatably coupled to form an insertion and a separation of a memory module while being in close contact with lower surfaces of the driving handle and the interlock handle; The housing has a lower end that is open to accommodate the connection connector therein, a fitting hole penetrated in a longitudinal hole in a longitudinal direction to a closed upper end surface, the plurality of driving handles and interlocking handles, and a plurality of ejections. A drive space portion to which the pin is rotatably coupled, and a hinge hole for hinge coupling of the drive handle and the interlock handle are formed. The eject pin has a pin shape having a predetermined length, and includes a pivot shaft pivotally coupled to an inner lower end of the driving space portion of the housing, and a portion extending vertically from the pivot shaft and extending horizontally. It is composed of a bent end of the "b" shaped to be in close contact with the lower surface of the drive handle or the interlocking handle, and lifting projections to guide the insertion or separation removal of the lower end of the memory module, and within the drive space Jig for testing of the memory module, characterized in that accommodated. The method of claim 1, The driving handle may include: a gripping portion for driving the rotation thereof, a rotating portion for referring to the rotation center point of the driving handle, a pressing portion for pressing down one upper end of the memory module according to the rotation of the rotating portion, and Jig for testing the memory module, characterized in that consisting of the first push roller accommodated in the pressing portion. The method of claim 1, The interlocking handle may include an interlocking portion pivoted together by the interlocking bar interlocked when the driving handle is operated, a pressurizing portion pressurizing an upper end portion of the memory module when the interlocking portion rotates, and a second pusher accommodated in the pressing portion. Jig for testing the memory module, characterized in that consisting of a roller.

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