CN105810253A - Socket device for memory test - Google Patents
Socket device for memory test Download PDFInfo
- Publication number
- CN105810253A CN105810253A CN201410853000.6A CN201410853000A CN105810253A CN 105810253 A CN105810253 A CN 105810253A CN 201410853000 A CN201410853000 A CN 201410853000A CN 105810253 A CN105810253 A CN 105810253A
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- CN
- China
- Prior art keywords
- socket
- locking piece
- memorizer
- memory test
- pressurization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
- H01R33/7607—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket the parallel terminal pins having a circular disposition
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- Testing Of Individual Semiconductor Devices (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
The invention relates to a socket device for a memory test, the purpose is that: the structure of a locking piece can be configured as a double rotary structure, so as to contain and pressurize various memories with same length of left and right and different length of upper and lower, therefore a memory test socket can test various memories with different length of upper and lower. The socket device for memory test comprises a baseplate, a pair of support brackets, a ejector and socket, a pair of locking pieces for lifting, a pair of locking pieces for pressurizing, more than one memory pressurizing pieces, a rotary guiding device and a rotary connecting rod.
Description
Technical field
The present invention relates to a kind of socket device for memory test, more particularly, to the socket device for memory test that can install the different memorizer of lower size on the memory test socket of the bad problem for testing memorizer on the upside of a kind of memory plug being arranged on conventional socket substrate.
Background technology
Usually, development along with central processing unit (CPU), the performance of personal computer is improve by leaps and bounds also, be intended to develop faster, the competition of the computer of more excellent performance constantly continues, and supercomputer, parallel processing computer, Reduced Instruction Set Computer (RISC:ReducedInstructionSetComputer) exploitation etc. occurs.And, the effort improving computing power also will continue.
As previously mentioned, it is intended to exploitation faster, the core of the competition of the computer of more excellent performance be develop can the CPU of high speed processing more data and memory chip highly integrated, high power capacity, high speed, thus accelerating its exploitation competition.Especially, Tong Bu with the development rate of such CPU, the exploitation competition of the internal memory of highly integrated, high power capacity, high speed is also being accelerated.
Additionally, as being used for testing the prior art of the fraction defective of highly integrated, high power capacity, high speed memorizer foregoing, provide a kind of on the socket substrate be packaged with memory plug read-only storage test device after, the electrical contact of memory plug with memorizer by being encapsulated in socket substrate is confirmed whether to electrically connect, and thus test is as the method for the fraction defective of the memorizer of test object.
The kind of aforesaid memorizer is roughly divided into DDR1, DDR2, DDR3.Now, DDR is the abbreviation of DoubleDataRate, and its original name is DDRSDRAM (DoubleDataRateSynchronousDynamicRandomAcessMemory).As the name indicates, can transmit in a clock (1Hz) and receive data, in title, therefore adding the name of double (double).In the SDR (SingleDataRate) before used, signal can only be transmitted in a clock or receive signal.DDR memory can be divided into as shown in table 1 below according to clock.
Table 1
Various memorizeies as shown in table 1 can be left and right length or the identical shape of lower-upper length, but various memorizer is formed approximately in left and right length and all different shape of lower-upper length.
Additionally, in order to be tested the bad problem of foregoing memory module by memorizer test device, memory test socket set on conventional socket substrate is utilized to carry out sealed storage device, in order to by whether turn-on power confirms the bad problem of memorizer.As the prior art of the bad problem of such test memorizer, have been disclosed for following technology.
The memorizer test device of prior art includes: memory test socket, and it is arranged on the upside of the memory plug being packaged on socket substrate, and forms the slot of the side of bootstrap memory on the medial surface of its both sides；A pair locking piece, it is arranged on the both sides of memory test socket, it is possible to inwardly outside turns so far；Memorizer pressure-producing part, it respectively constitutes on a pair locking piece, the memorizer that will insert on memory test socket, is encapsulated in the memory plug of socket substrate by the pressurization of upper end, both sides；And connecting rod, it connects a pair locking piece so as to action simultaneously.
There is the memorizer test device of the prior art of foregoing structure, on the upside of the memory plug of conventional socket substrate, be fixed on socket substrate with the state that it aligns with memory test socket.The locking piece constituted on the both sides of the memory test socket as above fixed rotates in outward direction, insert memorizer by the slot of memory test socket.
And, as it was previously stated, after inserting memorizer by the slot of memory test socket, the locking piece rotated in outward direction is changed into inward side to rotation, and by the pressurization of memorizer pressure-producing part, make memorizer be connected to the memory plug being encapsulated on socket substrate.Now, interconnect to the contact jaw of memorizer of memory plug pressurization with the contact pin of memory plug.
As it was previously stated, when the contact jaw of the memorizer pressurizeed to memory plug contacts with each other with the contact pin of memory plug, by whether turn-on power confirms the bad problem of memorizer.That is, during turn-on power, if electrically conducting, judge that memorizer is normal product；If not electrically conducting, it is judged as bad product.
But, the foregoing memorizer test device according to prior art is as shown in Figure 1, owing to identical for left and right length and that lower-upper length is different various memorizeies can not be inserted and encapsulate by its structure, therefore to test left and right length is identical and the memorizer of kind that lower-upper length is different, memory test socket should possess the structure that the lower-upper length with this memorizer is consistent.
Prior art literature
Patent documentation
1. the open utility model patent the 2010-0008201st of Korea S (on August 18th, 2010 is open)
2. Korean Patent Laid the 2008-0081385th (JIUYUE disclosed on the 10th in 2008)
3. Korean granted patent publication the 10-0704002nd (bulletin on April 9th, 2007)
4. Korean granted utility model patent the 20-0373503rd (bulletin on January 15th, 2005)
Summary of the invention
(1) to solve the technical problem that
The present invention proposes to solve various problem of the prior art, its object is to provide a kind of socket device for memory test, the structure of locking piece is configured to dual rotational structure by described device, so as to hold and all left and right length of pressurizeing is identical and various memorizeies that lower-upper length is different, therefore, it is possible to test, by a memory test socket, the various memorizeies that lower-upper length is different.
And, the another object of the technology of the present invention is in that, the structure of locking piece is configured to dual rotational structure, so as to hold and all left and right length of pressurizeing is identical and various memorizeies that lower-upper length is different, the expense buying the socket device for memory test can be reduced by this structure.
It addition, the another purpose of the technology of the present invention is in that, the structure of locking piece is configured to dual rotational structure, so as to hold and left and right length of pressurizeing is identical and various memorizeies that lower-upper length is different, therefore, it is possible to more favorably accomplish memory test.
And, the purpose of the technology of the present invention is in that, memory test jack configurations is become the structure lifted by the rotation of locking piece, in order to realize the ejection of the memorizer being encapsulated on the memory plug of socket substrate more easily, and save the time of test memorizer.
And then, the purpose of the technology of the present invention is in that, memorizer pressure-producing part is configured through the structure that hinge axis rotates, to prevent the damage of the upper end of memorizer both sides, wherein said memorizer pressure-producing part adds and is pressed on memory test socket the memorizer inserted and is encapsulated on the memory plug of socket substrate.
(2) technical scheme
It is as follows for realizing the present invention of aforesaid purpose.Namely, the socket device for memory test of the present invention includes: base plate, it arranges and is fixed on the upside of conventional socket substrate, forms multiple socket and expose hole on described base plate, in order on conventional socket substrate, the more than one memory plug of encapsulation inserts to upside and exposes；A pair Support bracket, it is oppositely arranged respectively in the both sides of the length direction that socket exposes hole, forms guiding groove with above-below direction on opposite sides；Ejector is held concurrently socket, and it can be arranged up or down on each guiding groove of Support bracket, forms the slot of more than one installation memorizer on opposite sides；A pair lifting locking piece, its on each Support bracket can inside and outside arrange rotatably, and by inside and outside rotation make ejector hold concurrently socket decline or rise；Memorizer device for ejecting, when lifting locking piece rotates in outward direction, socket of being held concurrently by described ejector is moved upward to make memorizer eject；A pair pressurization locking piece, it can inwardly be arranged to external rotation on each lifting locking piece, and is pressurizeed to the memory plug of conventional socket substrate by memorizer；More than one memorizer pressure-producing part, it is arranged on each opposite face of pressurization locking piece, and pressurizes to the upper end of the both sides of memorizer；Rotation guide, guides it to rotate when the inside external rotation of pressurization locking piece；And pivot link, it connects a pair lifting locking piece so that it is inwardly can rotate during external rotation simultaneously.
Structure according to the aforesaid present invention, ejector socket of holding concurrently is constituted by supporting socket, guide socket and link screw, wherein, described support socket can be arranged up or down on each guiding groove of Support bracket, and forms the support slot of the lower end, both sides of the memorizer that support is installed；Described guide socket is engaged in the upside supporting socket, is formed with corresponding with supporting slot and bootstrap memory guiding slot on described guide socket；Described connecting screw is used for connecting and engage support socket and guide socket.
Additionally, the lower end supporting slot of the aforesaid support socket shape composition to close, so as to support the lower end, both sides of memorizer, and the upper end guiding slot of guide socket also forms the fillet surface with certain inclination angle, in order to the memorizer of insertion is directed to guiding slot.
And, the structure according to the present invention, memorizer device for ejecting is made up of fastening groove and locking member, and wherein, described fastening groove is formed and holds concurrently the lateral surface of each guide socket of socket constituting ejector；Described locking member is formed relatively in the side of the opposite face of each lifting locking piece, is locked on the fastening groove of guide socket, when lifting locking piece rotates in outward direction, make ejector hold concurrently socket rise, memorizer is held concurrently socket from ejector eject.
Structure according to the foregoing present invention, rotation guide is made up of guiding groove and leading axle, and wherein, described guiding groove is formed with the shape of elongated slot relatively in the both sides of each lifting locking piece；Described leading axle is oppositely arranged on each opposite face of pressurization locking piece, and the two ends of each leading axle are inserted and are engaged on guiding groove, in order to realize the rotation of pressurization locking piece in the scope of guiding groove.Now, the top/bottom latitude of the guiding groove of rotation guide is constituted, it is preferred that formed accordingly with the greatest length size up and down of memorizer and minimum length size.
Further, the structure according to the present invention, memorizer pressure-producing part forms with the structure of pressure roller, and described pressure roller is rotatably arranged on each leading axle constituting rotation guide, and the upper end, both sides of rotary presser memorizer.
And, the structure according to the foregoing present invention, when there is the pressure roller of multiple composition memorizer pressure-producing part, each opposite face of pressurization locking piece also may be integrally formed the next door for each adjacent pressure roller being separated.Now, the function preventing pressure roller from moving left and right is played in next door.
Additionally, structure according to the present invention, may also include torque spring, and it is arranged on the rotary shaft, described rotating shaft enables to be rotatably coupled on lifting locking piece inside and outside pressurization locking piece, and described torque spring has and makes pressurization locking piece set back to put elastic force effect.
Structure according to the foregoing present invention, pivot link is by supporting beam and connecting rod is constituted, and wherein, described support beam arranges and is fixed on the unidirectional side of each lifting locking piece being oppositely arranged on a pair Support bracket；The support beam of both sides is rotatably attached by described connecting rod, in order to during by inside for the lifting locking piece of side external rotation, makes the lifting locking piece of opposite side rotate simultaneously.Now, one end of connecting rod is formed as the shape that bends at a certain angle.
And, the structure according to the present invention, each opposite face at lifting locking piece also can arrange rotationally constrained bar, when pressurization with locking piece to inward side to rotate time, make pressurization locking piece rotationally constrained within certain limit.
(3) beneficial effect
Technology according to the present invention, the structure of locking piece is configured to dual rotational structure, it is possible to hold and all left and right length of pressurizeing is identical and various memorizeies that lower-upper length is different, therefore be there is the effect that can be tested the different various memorizeies of lower-upper length by a memory test socket.
And, technology according to the present invention, can test, by a memory test socket, the various memorizeies that lower-upper length is different, therefore only can not reduce the effect of the expense buying the socket device for memory test, and also can more favorably accomplish the effect of memory test.
Further, the technology according to the present invention, memory test jack configurations is become the structure lifted by the rotation of locking piece, therefore realizes the ejection of the memorizer being encapsulated on the memory plug of socket substrate more easily, and save the time of test memorizer.
And then, technology according to the present invention, memorizer pressure-producing part is configured through the structure that hinge axis rotates, therefore, it is possible to prevent the damage of the upper end of memorizer both sides, wherein said memorizer pressure-producing part adds and is pressed on memory test socket the memorizer inserted and is encapsulated on the memory plug of socket substrate.
Accompanying drawing explanation
Fig. 1 indicates that the three-dimensional structure diagram of the state being arranged on conventional socket substrate by the socket device for memory test of the present invention.
Fig. 2 indicates that the three-dimensional structure diagram of the socket device for memory test of the present invention.
Fig. 3 indicates that the plan structure figure of the socket device for memory test of the present invention.
Fig. 4 indicates that the side block diagram of the socket device for memory test of the present invention.
Fig. 5 a be separately shown the present invention for the socket device of memory test in the three-dimensional structure diagram of insertion of memorizer.
Fig. 5 b indicate that the present invention for the socket device of memory test in the three-dimensional structure diagram of installment state of memorizer.
Fig. 6 is the three-dimensional structure diagram of the memory test socket of the socket device for memory test of the separately shown present invention.
Fig. 7 is the side block diagram of the memory test socket of the socket device for memory test of the separately shown present invention.
Fig. 8 indicates that the socket device for memory test by the present invention installs the side block diagram of the effect of locking piece during the memorizer of lower length ruler modest ability.
Fig. 9 indicates that the socket device for memory test by the present invention installs the side block diagram of the effect of locking piece during lower length dimension little memorizer.
Accompanying drawing illustrates labelling
10: conventional socket substrate 20: memory plug
30: memorizer (upper and lower full-size) 32: memorizer (size little up and down)
100: socket device 110: base plate
112: socket exposes hole 120: Support bracket
122: guiding groove 130: ejector is held concurrently socket
132: slot 134 is installed: connecting screw
136: fillet surface 140: lifting locking piece
150: fastening groove 152: locking member
160: pressurization locking piece 162: rotating support shaft
170: memorizer pressure-producing part 180: guiding groove
182: leading axle 190: pivot link
192: support beam 194: connecting rod
200: next door 210: torque spring
220: rotationally constrained bar
Detailed description of the invention
Hereinafter, the preferred embodiment of the socket device for memory test that present invention will be described in detail with reference to the accompanying.
nullFig. 1 indicates that the three-dimensional structure diagram of the state being arranged on conventional socket substrate by the socket device for memory test of the present invention，Fig. 2 indicates that the three-dimensional structure diagram of the socket device for memory test of the present invention，Fig. 3 indicates that the plan structure figure of the socket device for memory test of the present invention，Fig. 4 indicates that the side block diagram of the socket device for memory test of the present invention，Fig. 5 a be separately shown the present invention for the socket device of memory test in the three-dimensional structure diagram of insertion of memorizer，Fig. 5 b indicate that the present invention for the socket device of memory test in the three-dimensional structure diagram of installment state of memorizer，Fig. 6 is the three-dimensional structure diagram of the memory test socket of the socket device for memory test of the separately shown present invention，And Fig. 7 is the side block diagram of memory test socket of the socket device for memory test of the separately shown present invention.
As shown in Figures 1 to 7, the socket device 100 for memory test of the present invention includes: base plate 110, it arranges and is fixed on the upside of conventional socket substrate 10, described base plate 110 forms multiple socket and exposes hole 112, in order to the more than one memory plug 20 of encapsulation inserts to upside and exposes on conventional socket substrate 10；A pair Support bracket 120, it is oppositely arranged respectively in the both sides of the length direction that socket exposes hole 112, and above-below direction forms guiding groove 122 on opposite sides；Ejector is held concurrently socket 130, and it can be arranged up or down on 122 on each guiding groove of Support bracket 120, forms the installation slot 132 of more than one installation memorizer 30 on opposite sides；A pair lifting locking piece 140, it can inwardly be arranged to external rotation on each Support bracket 120, and by making ejector socket 130 of holding concurrently down or up to inside and outside rotation；Memorizer device for ejecting, when lifting locking piece 140 rotates in outward direction, makes ejector socket 130 of holding concurrently move up, thus makes memorizer 30 eject；A pair pressurization locking piece 160, it can inwardly be arranged to external rotation on each lifting locking piece 140, and is pressurizeed to the memory plug 20 of conventional socket substrate 10 by memorizer 30；More than one memorizer pressure-producing part 170, it is arranged on each opposite face of pressurization locking piece 160, and the upper end of the both sides of pressurized storage device 30；Rotation guide, guides it to rotate when pressurization locking piece 160 inside external rotation；And pivot link 190, it connects a pair lifting locking piece 140 so that it is inwardly can rotate during external rotation simultaneously.
The socket device 100 for memory test with the present invention of said structure is arranged on the upside of conventional socket substrate 10, so that the lower to upper part exposing hole 112 from the socket formed on base plate 110 inserts the memory plug 20 commonly using socket substrate 10, and makes it upwards expose.Now, conventional socket substrate 10 is equivalent to the mainboard of practical application in PC.
Additionally, as previously mentioned, if arranging in the upside of conventional socket substrate 10 and fixing base plate 110, so that the memory plug 20 commonly using socket substrate 10 upwards exposes, then ejector hold concurrently socket 130 to install slot 132 consistent with each other up and down respectively with the slot (not shown) of memory plug 20.Thus, insert and be installed to the hold concurrently memorizer 30 installing slot 132 of socket 130 of each ejector and be only packaged on the slot installing the corresponding memory plug 20 of slot 132 of socket 130 of holding concurrently with ejector.
As it was previously stated, when the socket device 100 being used for memory test being mounted and fixed to the upside of conventional socket substrate 10, check that the test process of memorizer 30 is as follows.First, as shown in Fig. 1 to Fig. 5 a, when the lifting locking piece 140 of the socket device 100 being used for memory test being mounted and fixed on the upside of conventional socket substrate 10 is rotated laterally, slot 132 inserts ejector installing of socket 130 of holding concurrently and the memorizer 30 to test is installed.
Secondly, as it was previously stated, after ejector holds concurrently the installing and insert on slot 132 and install the memorizer 30 to test of socket 130, as shown in Fig. 1 to Fig. 5 b, by a pair pressurization locking piece 160 of both sides to inward side to rotating against, in order to realize the pressurization of memorizer pressure-producing part 170.Now, if by a pair pressurization locking piece 160 of both sides to inward side to rotating against, then the lifting locking piece 140 of pressurization locking piece 160 is set too to inward side to rotating against.
If as it was previously stated, by a pair pressurization locking piece 160 of both sides to inward side to rotating against, then insert and be arranged on ejector and hold concurrently the memorizer 30 of socket 130, by memorizer pressure-producing part 170, it is achieved pressurize to the slot of memory plug 20.Now, ejector holds concurrently socket 130 can a range of mode of oscilaltion be constituted, and when therefore memorizer 30 being pressurizeed, memorizer 30 will decline, and the memorizer 30 thus declined can be encapsulated on the memory plug 20 of conventional socket substrate 10.
Additionally, as previously mentioned, by pressurization locking piece 160 to inward side to rotating against, make insertion and be arranged on the hold concurrently memorizer 30 of socket 130 of ejector and be encapsulated on the slot of memory plug 20 by memorizer pressure-producing part 170, then turn-on power confirms whether memorizer 30 electrically conducts, thus judging the bad problem of memorizer 30.
On the other hand, as previously mentioned, by the socket device 100 for memory test of the present invention, sealed storage device 30 after confirming the bad problem of memorizer 30 on the slot of memory plug 20, memorizer 30 packaged on split memory socket 20, now, on memory plug 20, the memorizer 30 of encapsulation separates only by the mode that the lifting locking piece 140 being in the state of rotating against rotates in outward direction being realized, when being rotated in outward direction by lifting locking piece 140, ejector socket 130 of holding concurrently rises, and memorizer 30 ejects from memory plug 20.
In other words, as previously mentioned, by the socket device 100 for memory test, sealed storage device 30 when confirming the bad problem of memorizer 30 on the slot of memory plug 20, if pressurization locking piece 160 is rotated in outward direction, then lifting locking piece 140 also rotates in outward direction, making ejector socket 130 of holding concurrently increase from there through memorizer device for ejecting, ejecting from the memory plug 20 being encapsulated in conventional socket substrate 10 thus realizing memorizer 30.
As previously mentioned, ejector socket 130 of holding concurrently is made to increase by device for ejecting, and realize be encapsulated in conventional socket substrate 10 memory plug 20 memorizer 30 eject after, state to eject is inserted and is arranged on ejector from memory plug 20 to hold concurrently the memorizer 30 of socket 130, separate from ejector socket 130 of holding concurrently, be achieved in the separation of memorizer 30.
Additionally, as previously mentioned, the socket device 100 for memory test of the present invention, by locking piece 140, the structure of 160 is configured to dual rotational structure, so as to hold and all left and right length of pressurizeing is identical and various memorizeies 30 that lower-upper length is different, below with left and right length is identical and that lower-upper length is different memorizer 30 illustrates for example.
First, illustrate with reference to Fig. 8, during by for the socket device 100 of memory test memorizer 30 maximum for lower-upper length size is encapsulated into conventional socket substrate 10 memory plug 20, when ejector hold concurrently socket 130 install slot 132 inserts and memorizer 30 to test is installed, by a pair lifting locking piece 160 of both sides to inward side to rotating against, it is achieved in the pressurization of memorizer pressure-producing part 170.
As previously mentioned, for the memorizer 30 that lower-upper length size is maximum, when by a pair pressurization locking piece 160 to inward side to lifting locking piece 140 when rotating against to inward side to fully rotating, and pressurize and do not rotate with locking piece 160 or simply somewhat rotate, from there through memorizer device for ejecting and pressure-producing part 170, sealed storage device 30 on memory plug 20.
On the contrary, illustrate with reference to Fig. 9, when passing through the socket device 100 for memory test, when lower-upper length is smaller in size than the memory plug 20 that maximum sized memorizer 30 is encapsulated into conventional socket substrate 10, when ejector hold concurrently socket 130 install slot 132 inserts and installs the lower-upper length size to test little memorizer 30, by a pair lifting locking piece 160 of both sides to inward side to rotating against, it is achieved in the pressurization of memorizer pressure-producing part 170.
As previously mentioned, for the memorizer 30 that lower-upper length size is little, when by a pair pressurization locking piece 160 to inward side to when rotating against, even if when lifting locking piece 140 is fully rotating to the inside, also can be at regular intervals between the upper surface of pressure-producing part 170 and memorizer 30.In such a state, if pressurization locking piece 160 is continued to inward side to rotating against, then pressurization locking piece 160 rotates the upper end of the both sides touching memorizer 30 to pressure-producing part 170 always.
Additionally, as previously mentioned, pressurization locking piece 160 is being continued to inward side in the process rotated against, starting to realize the pressurization to memorizer 30, thus sealed storage device 30 on the memory plug 20 of conventional substrate 10 from the upper-end contact of memorizer pressure-producing part 170 with the both sides of memorizer 30.Now, when memorizer 30 is fully enclosed, if releasing the power being applied on pressurization locking piece 160, then pressurization locking piece 160 recovers to original state.
Illustrate to constitute each composition important document of the socket device 100 for memory test of the present invention more detail below.First, the base plate 110 constituting the present invention is the device for the socket device 100 being used for memory test being arranged and is fixed on conventional socket substrate 10, if Fig. 1 is to shown in 7, base plate 110 arranges and is fixed on the upside of conventional socket substrate 10, in order to hold the memory plug 20 being encapsulated on conventional socket substrate 10.
In other words, as shown in Figures 1 to 7, foregoing base plate 110 arranges and is fixed on the upside of conventional socket substrate 10, is formed with multiple socket and exposes hole 112 on described base plate 110, in order on conventional socket substrate 10, the more than one memory plug 20 of encapsulation inserts to upside and exposes.Now, the bottom that the memory plug 20 being encapsulated on conventional socket substrate 10 exposes hole 112 by the socket of base plate 110 is exposed to upside.
It addition, as it was previously stated, the socket of base plate 110 exposes hole 112 and memory plug 20 has been correspondingly formed one or more, in order to the memory plug 20 being encapsulated on conventional socket substrate 10 is exposed to upside by bottom.
Secondly, constituting the Support bracket 120 of the present invention is hold concurrently the device of socket 130 and lifting locking piece 140 for arranging ejector, as shown in Fig. 1 to Fig. 2, Fig. 4, Fig. 5, Fig. 6 and Fig. 7, a pair Support bracket 120 is oppositely arranged respectively in the both sides of the length direction that socket exposes hole 112, and above-below direction forms guiding groove 122 on opposite sides.
The Support bracket 120 with said structure is oppositely arranged on each base plate 10 of two terminal abutment of the length direction exposing hole 112 with socket.Now, forming guiding groove 122 on the opposite face of each Support bracket 120, described guiding groove 122 is used for guiding to ejector described later holds concurrently socket 130 oscilaltion.
Secondly, the ejector socket 130 of holding concurrently constituting the present invention is for memorizer 30 is arranged in consistent device on the memory plug 20 of conventional socket substrate 10, as shown in Figures 1 to 7, ejector socket 130 of holding concurrently can be arranged up or down on each guiding groove 122 of Support bracket 120, forms the installation slot 132 of more than one installation memorizer 30 on opposite sides.
Additionally, as shown in Figure 6, foregoing ejector hold concurrently socket 130 by support socket 130a, guide socket 130b and link screw 134 constitute, wherein, described support socket 130a can be arranged up or down on each guiding groove 122 of Support bracket 120, and is formed with the support slot 132a of the lower end, both sides of the memorizer 30 that support is installed；Described guide socket 130b, is engaged in the upside supporting socket 130a, is formed with the guiding slot 132b of the bootstrap memory 30 corresponding with supporting slot 132a on described guide socket 130b；Described connecting screw 134 is used for connecting and engage support socket 130a and guide socket 130b.
As previously mentioned, the hold concurrently guiding slot 132b formed on the upper support slot 132a and guide socket 130b formed of socket 130a that supports of socket 130 of the ejector being made up of bottom and upper bond connecting screw 134 is arranged on upper and lower same line, thus will not block when inserting and install memorizer 30 to installation slot 132.Now, it is the structure closed supporting the lower end supporting slot 132a formed on socket 130a, in order to be ejected the hold concurrently installation slot 132 of socket 130 of device support by installing the lower end of the both sides of the memorizer 30 that slot 132 inserts.
And, there is the ejector of said structure hold concurrently socket 130, the fillet surface 136 with certain inclination angle is formed, in order to memorizer 30 can be more easily inserted into the upper end guiding slot 132b of guide socket 130b in the slot 132b upper end that guides constituting the guide socket 130b on the upside of it.That is, if the lower end of memorizer 30 touches fillet surface 136, then memorizer 30 slides to the entrance side guiding slot 132b and inserts.
Secondly, constituting the lifting locking piece 140 of the present invention is rotated by inwardly outside to make ejector socket 130 of holding concurrently down or up, the encapsulation being achieved in memorizer 30 or the device ejected, as shown in Figures 1 to 7, a pair lifting locking piece 140 can inwardly be arranged on to external rotation on each Support bracket 120 by rotating shaft 142 (with reference to Fig. 8 and Fig. 9), by making ejector socket 130 of holding concurrently decline or rise to inside and outside rotation.
In other words, there is the lifting locking piece 140 of said structure, the spring out type socket 130 that will be engaged with lifting locking piece 140 by memorizer device for ejecting described later, by lifting locking piece 140 is rotated to the inside, make ejector socket 130 of holding concurrently decline, be achieved in the encapsulation of memorizer 30, or, by lifting locking piece 140 is rotated laterally, make ejector socket 130 of holding concurrently increase, be achieved in the ejection of memorizer 30.
It follows that have the lifting locking piece 140 of said structure, while memorizer 30 being pressurizeed by memorizer pressure-producing part 170, ejector socket 130 of holding concurrently is made to decline.That is, when by pressurization with the rotation and lifting locking piece 140 of locking piece 160 to inward side to rotate time, simultaneously complete the decline of the socket 130 that by memorizer pressure-producing part 170, memorizer 30 pressurizeed and held concurrently by the ejector of memorizer device for ejecting.
Secondly, the memorizer device for ejecting constituting the present invention is the device for being ejected by memorizer 30, described memorizer device for ejecting makes ejector socket 130 of holding concurrently rise, it is achieved in the ejection of memorizer 30 packaged on the memory plug 20 of conventional socket substrate 10, as shown in Figures 1 to 7, the structure of memorizer device for ejecting is, when lifting locking piece 140 rotates in outward direction, make ejector socket 130 of holding concurrently move up, thus make packaged memorizer 30 on the memory plug 20 of conventional socket substrate 10 eject.
Foregoing memorizer device for ejecting is made up of fastening groove 150 and locking member 152, wherein, described fastening groove 150 is formed and holds concurrently the lateral surface of each guide socket 130b of socket 130 constituting ejector, described locking member 152 is oppositely arranged on the side of the opposite face of each lifting locking piece 140, the fastening groove 150 of guide socket 130b blocks, when lifting locking piece 140 rotates in outward direction, make ejector socket 130 of holding concurrently increase, thus make memorizer 30 eject from the memory plug 20 of conventional socket substrate 10.
Additionally, foregoing memorizer device for ejecting, as mentioned above, be inserted into by the locking member 152 relatively formed on the side of each opposite face constitute ejector hold concurrently socket 130 guide socket 130b fastening groove 150 on and the structure blocked form, therefore when lifting with locking piece 140 to inward side to rotate time, ejector socket 130 of holding concurrently is made to decline, thus it is not implemented only in sealed storage device 30 on memory plug 20, and when lifting locking piece 140 rotates in outward direction, ejector socket 130 of holding concurrently is made to increase, thus eject the memorizer 30 being packaged on memory plug 20.
As previously mentioned, constitute the memorizer device for ejecting of the present invention, make ejector socket 130 of holding concurrently down or up when the inside lateral direction of lifting locking piece 140 rotates, thus make the memorizer 30 being undertaken pressurizeing by memorizer pressure-producing part 170 be encapsulated into more easily on the memory plug 20 of conventional socket substrate 10, and the ejection of memorizer 30 packaged on the memory plug 20 of conventional socket substrate 10 can be favorably accomplished.
Secondly, constituting the pressurization locking piece 160 of the present invention is for holding concurrently inserting and be arranged on ejector the device that the memorizer 30 of socket 130 pressurizes downwards, as shown in Figures 1 to 7, a pair pressurization locking piece 160 can inwardly be arranged to external rotation by rotating support shaft 162 respectively on each lifting locking piece 140, is thus pressurizeed to the memory plug 20 of conventional socket substrate 10 by memorizer 30.
Foregoing pressurization locking piece 160 and lifting locking piece 140 form dual rotational structure, and this dual rotational structure can pressurize that left and right length is identical and various memorizeies 30 that lower-upper length is different.Now, for the memorizer 30 that lower-upper length size is maximum, pressurization locking piece 160 is to inward side to rotating or simply somewhat rotating, for the memorizer 30 that lower-upper length size is little, rotate in the spacing range between upper end and the memorizer pressure-producing part 170 of the memorizer 30 that pressurization locking piece 160 inserts on ejector holds concurrently socket 130 and installs.
Secondly, the memorizer pressure-producing part 170 constituting the present invention is when pressurization locking piece 160 is to inward side to when rotating, pressurization ejector is held concurrently the upper end of the memorizer 30 installed on socket 130, thus memorizer 30 is encapsulated into the device on the memory plug 20 of conventional socket substrate 10, memorizer pressure-producing part 170 is provided with more than one on each opposite face of pressurization locking piece 160, and the upper end of the both sides of pressurized storage device 30.
Foregoing memorizer pressure-producing part 170 is rotatably arranged on each leading axle 182 constituting rotation guide described later, and is made up of the structure of the pressure roller of the upper end of the both sides of rotary presser memorizer 30.When memorizer pressure-producing part 170 pressurized storage device 30 upper end of such pressure roller shape, rotating while the upward horizon direction, upper surface of memorizer 30 is moved, thus dispersion sends the pressure of memorizer 30 to.
Thus, as previously mentioned, memorizer pressure-producing part 170 forms with the shape of pressure roller, and when pressurized storage device 30 upper end, rotate while the upward horizon direction, upper surface of memorizer 30 is moved, thus dispersion sends the pressure of memorizer 30 to, damages therefore, it is possible to prevent the upper surface of memorizer 30 to be stored by pressure-producing part 170.
It addition, when there is the pressure roller of multiple composition foregoing memorizer pressure-producing part 170, each opposite face of pressurization locking piece 160 can also be integrally formed the next door 200 for separating each adjacent pressure roller.Such next door 200 prevents pressure roller from moving left and right, and makes pressure roller only corresponding memorizer 30 be pressurizeed.
Secondly, the rotation guide constituting the present invention is the device guiding its rotation when external rotation in pressurization locking piece 160, as shown in Figures 1 to 7, rotation guide is made up of guiding groove 180 and leading axle 182, wherein, described guiding groove 180 is formed with the shape of elongated slot relatively in the both sides of each lifting locking piece 140；Described leading axle 182 is opposed on each opposite face of pressurization locking piece 160, and the two ends of each leading axle 182 insert and be engaged on guiding groove 180, in order to realize the rotation of pressurization locking piece 160 in the scope of guiding groove 180.
As shown in Figure 8, have the rotation guide of said structure by memorizer pressure-producing part 170 pressurize lower-upper length size maximum memorizer 30 time, pressurization locking piece 160 does not rotate or simply somewhat rotates, and therefore leading axle 182 is positioned at the top of guiding groove 180.
On the contrary, as it is shown in figure 9, when pressurize lower-upper length size little or minimum memorizer 30 time, the upper surface that pressurization locking piece 160 rotates to memorizer pressure-producing part 170 with memorizer 30 always contacts, therefore leading axle 182 is to the lower side shifting of guiding groove 180.Leading axle 182 can move to the bottom of guiding groove 180.
It will be appreciated that, the top/bottom latitude of guiding groove 180 constituting foregoing rotation guide is formed accordingly with the greatest length size up and down of memorizer 30 and minimum length size.
Secondly, the pivot link 190 constituting the present invention is when lifting locking piece 140 device that also inwardly the same direction in outside rotates that the lifting locking piece 140 inwardly outside of side makes when rotating opposite side, as shown in Figures 1 to 7, pivot link 190 is made up of support beam 192 and connecting rod 194, wherein, described support beam 192 arranges and is fixed on the unidirectional side of each lifting locking piece 140 being arranged oppositely on a pair Support bracket 120, the support beam 192 of both sides is rotatably attached by described connecting rod 194, so that during by the lifting of side by locking piece 140 inside external rotation, the lifting locking piece 140 making opposite side also rotates simultaneously.
In other words, the pivot link 190 with said structure is the structure composition that the coupling part supporting beam 192 and connecting rod 194 is rotatably attached by hinge, when by the lifting of side by locking piece 140 inside external rotation, by pivot link 190 power successfully passed on the lifting locking piece 140 of opposite side.
It addition, in the structure of above-mentioned pivot link 190, one end of connecting rod 194 is formed as the shape bent at a certain angle.The shape bent at a certain angle due to one end of connecting rod 194 is formed, when therefore memorizer 30 being carried out bad test by the socket device 100 of the present invention, it is possible to the interference caused by machinery is reduced to minimum.
And, the socket device 100 for memory test of the present invention with said structure also includes torque spring 210, described torque spring 210 is arranged on and can be inwardly joined to external rotation in the rotating support shaft 162 of lifting locking piece 140 by pressurization locking piece 160, and realizes the effect of elastic force to the direction making pressurization locking piece 160 be always maintained at original position.
When releasing plus-pressure, foregoing torque spring 210 makes pressurization locking piece 160 set back to put, therefore, during rotation and lifting locking piece 140 in outward direction in order to eject on the memory plug 20 of conventional socket substrate 10 packaged memorizer 30, having and can pass through the effect that pressurization locking piece 160 make lifting locking piece 140 rotate smoothly in outward direction.
And, in the structure of the present invention, on the basis of foregoing technical pattern, each opposite face of lifting locking piece 140 also sets up rotationally constrained bar 220, when pressurization with locking piece 160 to inward side to rotate time, described rotationally constrained bar 220 makes it rotationally constrained within certain limit.The mode limiting pressurization locking piece 160 by rotationally constrained bar 220 is, when pressurization with locking piece 160 to inward side to rotate time, on the initial point that the bottom of leading axle 182 and the guiding groove 180 being conducted is adjacent, by limiting described pressurization locking piece 160 rotate with contacting of pressurization locking piece 160.
Fig. 8 indicates that the socket device for memory test by the present invention installs the side block diagram of the effect of locking piece during the memorizer of lower length ruler modest ability, and Fig. 9 indicates that the socket device for memory test by the present invention installs the side block diagram of the effect of locking piece during lower length dimension little memorizer.
By having the socket device 100 for memory test of the present invention of said structure, install that left and right length is identical and various memorizeies 30 that lower-upper length is different, and it is encapsulated the process of the memory plug 20 of conventional socket substrate 10, illustrate as shown in Figure 8 and Figure 9.Now, represent the memorizer 30 that lower-upper length size is maximum in fig. 8, represent that lower-upper length is smaller in size than the memorizer 30 of the size of the bin 30 of Fig. 8 in fig .9.
Shown in (a) in Fig. 8, when by being arranged on the socket device 100 for memory test of the present invention on the upside of the memory plug 20 of conventional socket substrate 10 and testing lower-upper length size maximum memorizer 30, first, if pressurization locking piece 160 is pulled laterally, then rotated laterally by this pull force lifting locking piece 140 simultaneously.
It addition, as it was previously stated, by the power pulled in outward direction by pressurization locking piece 160, in the process that lifting locking piece 140 rotates simultaneously in outward direction, ejector socket 130 of holding concurrently can rise.Namely, when lifting locking piece 140 rotates in outward direction, the lifting locking member 152 constituting memorizer device for ejecting on locking piece 140, with formed ejector hold concurrently socket 130 lateral surface fastening groove 150 on the state of locking, make ejector socket 130 of holding concurrently increase.
Under foregoing state, on the relative installation slot 132 that the ejector lower end of the both sides of memorizer 30 being inserted and being installed to both sides is held concurrently on socket 130.Now, being inserted into ejector and hold concurrently the memorizer 30 installed on slot 132 of socket 130, be the structure closed owing to installing the lower end of slot 132, therefore memorizer 30 is supported to insert and to be installed to the hold concurrently state installing slot 132 of socket 130 of ejector.
And, as it was previously stated, when inserting and install memorizer 30 on ejector holding concurrently socket 130, shown in (b) in Fig. 8, by pressurization locking piece 160 to inward side to pulling, so as to realize lifting locking piece 140 to inward side to rotation.Now, by pressurization locking piece 160 to inward side to pull realize lifting locking piece 140 to inward side to rotate process in, the locking member 152 constituting memorizer device for ejecting on lifting locking piece 140 makes ejector socket 130 of holding concurrently decline, thus sealed storage device 30 on the memory plug 20 of conventional socket substrate 10.
Additionally, as previously shown, the lower-upper length size of the memorizer 30 of Fig. 8 is maximum, therefore the locking member 152 constituting memorizer device for ejecting makes ejector socket 130 of holding concurrently decline, so that the initial point of sealed storage device 30 and the contact initial point pressurizeed in memorizer 30 upper end by the memorizer pressure-producing part 170 of composition on the opposite face of pressurization locking piece 160 are realized on the memory plug 20 of conventional socket substrate 10 simultaneously.
As previously mentioned, by ejector socket 130 of holding concurrently, memorizer 30 maximum for lower-upper length size is being inserted and installing, to be encapsulated in the process of the memory plug 20 of conventional socket substrate 10, (a) and (b) from Fig. 8, pressurization locking piece 160 does not rotate completely centered by rotating support shaft 162.This can not have any compression to judge by torque spring 210.
On the contrary, shown in (a) in Fig. 9, when the socket device 100 for memory test of the present invention of the upside of the memory plug 20 by being arranged on conventional socket substrate 10 test lower-upper length be smaller in size than maximum sized memorizer 32 time, pressurization locking piece 160 is pulled laterally, make lifting locking piece 140 rotate laterally, thus on ejector holds concurrently socket 130, be inserted into memorizer 32.
Additionally, as previously mentioned, in the process rotated in outward direction passing through to make the power that pressurization locking piece 160 is pulled in outward direction lifting locking piece 140 while, when lifting locking piece 140 rotates in outward direction, the lifting locking member 152 constituting memorizer device for ejecting on locking piece 140, with be locked on ejector hold concurrently socket 130 lateral surface on state on the fastening groove 150 that formed, make ejector socket 130 of holding concurrently increase.
When by lifting locking piece 140 is rotated in outward direction make ejector hold concurrently socket 130 rise, the lower end of the both sides of memorizer 32 is inserted and is installed on the opposed installation slot 132 that ejector is held concurrently on socket 130.Now, being inserted into ejector and hold concurrently the memorizer 32 installed on slot 132 of socket 130, be the structure closed owing to installing the lower end of slot 132, therefore memorizer 32 is supported to insert and to be installed to the hold concurrently state installing slot 132 of socket 130 of ejector.
And, as it was previously stated, when inserting and install memorizer 32 on ejector holding concurrently socket 130, shown in (b) in Fig. 9, by pressurization locking piece 160 to inward side to pulling, so as to realize lifting locking piece 140 to inward side to rotation.Now, by pressurization locking piece 160 to inward side to pull realize lifting locking piece 140 to inward side to rotate process in, the lifting locking member 152 constituting memorizer device for ejecting on locking piece 140, ejector socket 130 of holding concurrently is made to decline, thus sealed storage device 30 on the memory plug 20 of conventional socket substrate 10.
Shown in (b) in Fig. 9 as the aforementioned, at lifting locking piece 140 to inward side to fully rotating, decline with ejector socket 130 of holding concurrently simultaneously, between the lower end of the pressure-producing part 170 that memorizer 32 upper end that lower-upper length size on the memory plug 20 being encapsulated into conventional socket substrate 10 is little and the opposite face of pressurization locking piece 160 are constituted, produce the interval of certain distance.This is owing to being designed into, and when lifting locking piece 140 is to inward side to maximum rotation, makes pressure-producing part 170 touch the upper end of memorizer 30 of the maximum Fig. 8 of lower-upper length size.
Additionally, shown in (b) in Fig. 9 as the aforementioned, when by lifting locking piece 140 to inward side to time fully rotating, even if encapsulating the memorizer 32 that lower-upper length size is little on the memory plug 20 of conventional socket substrate 10, owing to cannot realize being pressurizeed by pressure-producing part 170, therefore can come into question in test.
In order to improve foregoing problem, the invention provides the structure being oppositely arranged pressurization locking piece 160 on opposed lifting locking piece 140, this structure can hold and test all of left and right length is identical and the memorizer 30,32 of various sizes that lower-upper length is different.Now, pressurization locking piece 160 is to be consisted of in the way of turning so far rotating support shaft 162 inwardly outside, and by being arranged in rotating support shaft 162 and one end and the other end are lifted the torque spring 210 supported with locking piece 140 and pressurization locking piece 160, it is subject to the structure composition of elastic force in outward direction.
Therefore, as it was previously stated, the effect of the torque spring 210 by being arranged in rotating support shaft 162 and produce outside elastic force, pressurization locking piece 160 is constantly in the state tilted laterally.In such a state, when user to pressurization locking piece 160 apply to inward side to plus-pressure time, before the maximum rotation initial point in the direction, inner side of lifting locking piece 140, pressurization locking piece 160 will not to inward side to rotation, from the maximum rotation initial point in the direction, inner side of lifting locking piece 140, pressurization locking piece 160 starts to inward side to rotation.
In other words, shown in (b) in Fig. 9 as the aforementioned, at lifting locking piece 140 to inward side to fully rotating, memorizer 32 upper end that lower-upper length size on the memory plug 20 being encapsulated into conventional socket substrate 10 is little and pressurization locking piece 160 to when producing the interval of certain distance between the lower end of the pressure-producing part 170 constituted on face, shown in (c) in Fig. 9, if pressurization locking piece 160 is applied to inward side to power, then realize in the scope of spacing distance pressurization locking piece 160 to inward side to rotation, it is achieved in pressurizeing to memorizer 32 by pressure-producing part 170.
As previously mentioned, rotated by the direction, inner side of lifting locking piece 140, on the memory plug 20 of conventional socket substrate 10 when sealed storage device 32, after rotating, by the direction, inner side of pressurization locking piece 160, the pressurization realizing memorizer 32, whether bad test memorizer 32 by turn-on power.Now, if releasing the power that pressurization is applied with locking piece 160, then pressurization locking piece 160 is made to revert to original state by the elastic force of torque spring 210.
Additionally, (c) in Fig. 9, when the memorizer 32 that lower-upper length size is little or minimum is pressurizeed, pressurization locking piece 160 can rotate the upper end of the both sides touching memorizer 32 to pressure-producing part 170 always, therefore leading axle 182 is to the lower side shifting of guiding groove 180.Now, leading axle 182 can move to the bottom of maximum guiding groove 180.
As mentioned above, the technology of the present invention, the structure of locking piece 14,160 is configured to dual rotational structure, so as to hold and all left and right length of pressurizeing is identical and various memorizeies 30 that lower-upper length is different such that it is able to more successfully carry out the bad test of memorizer 30.
The present invention is not limited to aforesaid embodiment, can carry out numerous variations and implement in the scope that the technological thought of the present invention allows.
Claims (14)
1. for a socket device for memory test, comprising:
Base plate, it arranges and is fixed on the upside of conventional socket substrate, forms multiple socket and expose hole on described base plate, in order on conventional socket substrate, the more than one memory plug of encapsulation inserts to upside and exposes；
A pair Support bracket, it is oppositely arranged respectively in the both sides of the length direction that described socket exposes hole, forms guiding groove with above-below direction on opposite sides；
Ejector is held concurrently socket, and it can be arranged up or down on each guiding groove of described Support bracket, forms the slot of more than one installation memorizer on opposite sides；
A pair lifting locking piece, it can inwardly be arranged to external rotation on Support bracket at each described, and makes described ejector socket of holding concurrently down or up by inside external rotation；
Memorizer device for ejecting, when described lifting locking piece rotates in outward direction, socket of being held concurrently by described ejector moves up, and makes described memorizer eject；
A pair pressurization locking piece, it can inwardly be arranged to external rotation on lifting locking piece at each described, and is pressurizeed to the described memory plug of described conventional socket substrate by described memorizer；
More than one memorizer pressure-producing part, it is arranged on each opposite face of described pressurization locking piece, and the upper end of the both sides of the described memorizer that pressurizes；
Rotation guide, guides it to rotate when the inside external rotation of described pressurization locking piece；And
Pivot link, it connects lifting locking piece described in a pair so that it is inwardly can rotate during external rotation simultaneously.
2. the socket device for memory test according to claim 1, it is characterised in that described ejector socket of holding concurrently is constituted by supporting socket, guide socket and connecting screw, wherein,
Described support socket can be arranged up or down on each guiding groove of described Support bracket, and is formed with the support slot of the lower end, both sides of the described memorizer that support is installed；
Described guide socket is engaged in the upside of described support socket, is formed with the guiding slot that guide described memorizer corresponding with described support slot on described guide socket；
Described connecting screw is used for connecting and engage described support socket and described guide socket.
3. the socket device for memory test according to claim 2, it is characterised in that the lower end supporting slot of the described support socket shape composition to close, so as to support the lower end, both sides of described memorizer.
4. the socket device for memory test according to claim 2, it is characterised in that also form the fillet surface with certain inclination angle in the upper end guiding slot of described guide socket, in order to the described memorizer inserted is directed to guiding slot.
5. the socket device for memory test as claimed in any of claims 2 to 4, it is characterised in that described slot lowering or hoisting gear is made up of fastening groove and locking member, wherein,
Described fastening groove is formed and holds concurrently the lateral surface of each described guide socket of socket constituting described ejector；
Described locking member forms side of the opposite face of lifting locking piece at each described relatively, it is locked on the fastening groove of described guide socket, when described lifting locking piece rotates in outward direction, make described ejector hold concurrently socket rise, described memorizer is held concurrently socket from described ejector eject.
6. the socket device for memory test according to claim 1, it is characterised in that described rotation guide is made up of guiding groove and leading axle, wherein,
Described guiding groove both sides of lifting locking piece at each described are formed relatively with the shape of elongated slot；
Described leading axle is oppositely arranged on each opposite face of described pressurization locking piece, and the two ends of each leading axle insert and be engaged on described guiding groove, in order to realize the rotation of described pressurization locking piece in the scope of described guiding groove.
7. the socket device for memory test according to claim 6, it is characterised in that constitute the top/bottom latitude of the described guiding groove of described rotation guide, is formed accordingly with the greatest length size up and down of described memorizer and minimum length size.
8. the socket device for memory test according to claim 6 or 7, it is characterized in that, described memorizer pressure-producing part forms with the structure of pressure roller, described pressure roller is rotatably arranged on each the described leading axle constituting described rotation guide, and the upper end, both sides of memorizer described in rotary presser.
9. the socket device for memory test according to claim 8, it is characterized in that, when there is the described pressure roller of multiple composition described memorizer pressure-producing part, each opposite face of described pressurization locking piece is also integrally formed the next door for each adjacent described pressure roller being separated.
10. the socket device for memory test according to claim 1, it is characterized in that, also include torque spring, described torque spring is arranged on the rotary shaft, described rotating shaft enables to be rotatably coupled on described lifting locking piece inside and outside described pressurization locking piece, and described torque spring has and makes described pressurization locking piece set back the elastic force effect put.
11. the socket device for memory test according to claim 1, it is characterized in that, described pivot link is by supporting beam and connecting rod is constituted, wherein, on the unidirectional side of each described lifting locking piece that described support beam is arranged and to be fixed on the pair of Support bracket opposed；
The described support beam of both sides is rotatably attached by described connecting rod, in order to during by inside for the described lifting locking piece of side external rotation, makes the described lifting locking piece of opposite side rotate simultaneously.
12. the socket device for memory test according to claim 11, it is characterised in that one end of described connecting rod has the shape bent at a certain angle.
13. the socket device for memory test according to claim 1, it is characterized in that, along with the described lifting locking piece of the rotation of described pressurization locking piece to inward side to when rotating, by the pressurization of the described memorizer of described memorizer pressure-producing part be realize by the hold concurrently decline of socket of the described ejector of described memorizer device for ejecting simultaneously.
14. the socket device for memory test according to claim 1, it is characterized in that, each opposite face of described lifting locking piece also sets up rotationally constrained bar, when described pressurization locking piece is to inward side to when rotating, described rotationally constrained bar makes the rotationally constrained within certain limit of described pressurization locking piece.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2014-0185773 | 2014-12-22 | ||
| KR1020140185773A KR101659322B1 (en) | 2014-12-22 | 2014-12-22 | Sockets for memory testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105810253A true CN105810253A (en) | 2016-07-27 |
| CN105810253B CN105810253B (en) | 2018-10-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410853000.6A Active CN105810253B (en) | 2014-12-22 | 2014-12-31 | Socket device for memory test |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101659322B1 (en) |
| CN (1) | CN105810253B (en) |
Cited By (1)
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| CN114204302A (en) * | 2021-11-02 | 2022-03-18 | 深圳市博德越科技有限公司 | Switching card |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102571578B1 (en) * | 2021-05-28 | 2023-08-28 | 주식회사 아이에스시 | Memory module jig apparatus |
| CN117935899A (en) * | 2023-02-10 | 2024-04-26 | 广东三木森智能装备有限公司 | DDR5 memory test fixture |
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Also Published As
| Publication number | Publication date |
|---|---|
| KR101659322B1 (en) | 2016-10-04 |
| CN105810253B (en) | 2018-10-16 |
| KR20160077248A (en) | 2016-07-04 |
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