CN105739236B - 与经外涂布的光致抗蚀剂一起使用的涂层组合物 - Google Patents

与经外涂布的光致抗蚀剂一起使用的涂层组合物 Download PDF

Info

Publication number
CN105739236B
CN105739236B CN201510980497.2A CN201510980497A CN105739236B CN 105739236 B CN105739236 B CN 105739236B CN 201510980497 A CN201510980497 A CN 201510980497A CN 105739236 B CN105739236 B CN 105739236B
Authority
CN
China
Prior art keywords
polymer
photoresist
coating composition
coating
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510980497.2A
Other languages
English (en)
Chinese (zh)
Other versions
CN105739236A (zh
Inventor
S-J·李
J·姜
D-J·洪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DuPont Specialty Materials Korea Ltd
Original Assignee
Rohm and Haas Electronic Materials Korea Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm and Haas Electronic Materials Korea Ltd filed Critical Rohm and Haas Electronic Materials Korea Ltd
Publication of CN105739236A publication Critical patent/CN105739236A/zh
Application granted granted Critical
Publication of CN105739236B publication Critical patent/CN105739236B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G03F7/0397Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
    • AHUMAN NECESSITIES
    • A41WEARING APPAREL
    • A41DOUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
    • A41D15/00Convertible garments
    • A41D15/04Garments convertible into other articles
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/002Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor using materials containing microcapsules; Preparing or processing such materials, e.g. by pressure; Devices or apparatus specially designed therefor
    • AHUMAN NECESSITIES
    • A41WEARING APPAREL
    • A41DOUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
    • A41D27/00Details of garments or of their making
    • A41D27/22Loops or hooks for hanging-up
    • AHUMAN NECESSITIES
    • A41WEARING APPAREL
    • A41DOUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
    • A41D3/00Overgarments
    • A41D3/02Overcoats
    • A41D3/04Raincoats
    • AHUMAN NECESSITIES
    • A45HAND OR TRAVELLING ARTICLES
    • A45FTRAVELLING OR CAMP EQUIPMENT: SACKS OR PACKS CARRIED ON THE BODY
    • A45F4/00Travelling or camp articles which may be converted into other articles or into objects for other use; Sacks or packs carried on the body and convertible into other articles or into objects for other use
    • AHUMAN NECESSITIES
    • A45HAND OR TRAVELLING ARTICLES
    • A45FTRAVELLING OR CAMP EQUIPMENT: SACKS OR PACKS CARRIED ON THE BODY
    • A45F4/00Travelling or camp articles which may be converted into other articles or into objects for other use; Sacks or packs carried on the body and convertible into other articles or into objects for other use
    • A45F4/14Coats or capes convertible into tent coverings
    • AHUMAN NECESSITIES
    • A47FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47GHOUSEHOLD OR TABLE EQUIPMENT
    • A47G9/00Bed-covers; Counterpanes; Travelling rugs; Sleeping rugs; Sleeping bags; Pillows
    • A47G9/06Travelling rugs; Sleeping rugs
    • A47G9/062Travelling rugs; Sleeping rugs for covering the ground, e.g. picnic or beach blankets
    • AHUMAN NECESSITIES
    • A47FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47GHOUSEHOLD OR TABLE EQUIPMENT
    • A47G9/00Bed-covers; Counterpanes; Travelling rugs; Sleeping rugs; Sleeping bags; Pillows
    • A47G9/08Sleeping bags
    • A47G9/086Sleeping bags for outdoor sleeping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/11Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • G03F7/325Non-aqueous compositions
    • AHUMAN NECESSITIES
    • A41WEARING APPAREL
    • A41DOUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
    • A41D2300/00Details of garments
    • A41D2300/30Closures
    • A41D2300/324Closures using snap fasteners
    • AHUMAN NECESSITIES
    • A41WEARING APPAREL
    • A41DOUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
    • A41D2300/00Details of garments
    • A41D2300/30Closures
    • A41D2300/33Closures using straps or ties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Materials For Photolithography (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Materials Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Laminated Bodies (AREA)
  • Paints Or Removers (AREA)
CN201510980497.2A 2014-12-30 2015-12-23 与经外涂布的光致抗蚀剂一起使用的涂层组合物 Active CN105739236B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462097667P 2014-12-30 2014-12-30
US62/097667 2014-12-30

Publications (2)

Publication Number Publication Date
CN105739236A CN105739236A (zh) 2016-07-06
CN105739236B true CN105739236B (zh) 2022-07-19

Family

ID=56163995

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510980497.2A Active CN105739236B (zh) 2014-12-30 2015-12-23 与经外涂布的光致抗蚀剂一起使用的涂层组合物

Country Status (5)

Country Link
US (1) US11762292B2 (https=)
JP (2) JP2016139123A (https=)
KR (2) KR102110178B1 (https=)
CN (1) CN105739236B (https=)
TW (1) TWI592760B (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10203602B2 (en) * 2016-09-30 2019-02-12 Rohm And Haas Electronic Materials Korea Ltd. Coating compositions for use with an overcoated photoresist
US20180364575A1 (en) * 2017-06-15 2018-12-20 Rohm And Haas Electronic Materials Korea Ltd. Coating compositions for use with an overcoated photoresist
JPWO2020066477A1 (ja) * 2018-09-27 2021-05-20 富士フイルム株式会社 パターン形成方法、及び、有機溶剤現像用レジスト積層体
US12393118B2 (en) * 2021-05-28 2025-08-19 Dupont Electronic Materials International, Llc Composition for photoresist underlayer

Family Cites Families (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2123702C3 (de) * 1971-05-13 1988-05-26 Hoechst Ag, 6230 Frankfurt Verfahren zur Herstellung eines Reliefbildes
DE3209327A1 (de) * 1982-03-15 1983-09-15 Cassella Ag, 6000 Frankfurt Verfahren zur herstellung von aetzreservedrucken auf hydrophoben textilmaterialien
DE3236560A1 (de) * 1982-10-02 1984-04-05 Hoechst Ag, 6230 Frankfurt Lichtempfindliches schichtuebertragungsmaterial und verfahren zur herstellung einer photoresistschablone
US5232813A (en) * 1990-01-31 1993-08-03 Fuji Photo Film Co., Ltd. Ps plate for use in making lithographic printing plate requiring no dampening water utilizing irradiation cured primer layer containing polyurethane resin and diazonium salt polycondensate photopolymerizable light-sensitive layer and silicone rubber layer
US5994031A (en) * 1996-09-09 1999-11-30 Konica Corporation Method of processing presensitized planographic printing plate
CA2302249C (en) * 1998-09-21 2003-03-18 Presstek, Inc. Lithographic printing plates for use with laser imaging apparatus
US20020015917A1 (en) * 1998-12-31 2002-02-07 Lee Geun Su Multi-oxygen containing compound for preventing acid diffusion, and photoresist composition containing the same
KR100498440B1 (ko) * 1999-11-23 2005-07-01 삼성전자주식회사 백본이 환상 구조를 가지는 감광성 폴리머와 이를포함하는 레지스트 조성물
US7258956B2 (en) * 2000-07-06 2007-08-21 Cabot Corporation Printing plates comprising modified pigment products
JP4654544B2 (ja) * 2000-07-12 2011-03-23 日産化学工業株式会社 リソグラフィー用ギャップフィル材形成組成物
WO2002025374A2 (en) * 2000-09-19 2002-03-28 Shipley Company, L.L.C. Antireflective composition
US6787286B2 (en) * 2001-03-08 2004-09-07 Shipley Company, L.L.C. Solvents and photoresist compositions for short wavelength imaging
WO2002086624A1 (fr) * 2001-04-10 2002-10-31 Nissan Chemical Industries, Ltd. Composition servant a former un film antireflet pour procede lithographique
JP4401600B2 (ja) * 2001-06-29 2010-01-20 富士フイルム株式会社 感光性平版印刷版
TW591341B (en) * 2001-09-26 2004-06-11 Shipley Co Llc Coating compositions for use with an overcoated photoresist
JP4373082B2 (ja) * 2001-12-28 2009-11-25 富士通株式会社 アルカリ可溶性シロキサン重合体、ポジ型レジスト組成物、レジストパターン及びその製造方法、並びに、電子回路装置及びその製造方法
US7078157B2 (en) * 2003-02-27 2006-07-18 Az Electronic Materials Usa Corp. Photosensitive composition and use thereof
US6811964B2 (en) * 2003-03-26 2004-11-02 Fuji Photo Film Co., Ltd. Method and apparatus for producing coating liquid for photothermographic material
JP4152810B2 (ja) * 2003-06-13 2008-09-17 東京応化工業株式会社 ポジ型レジスト組成物およびレジストパターン形成方法
US20060108710A1 (en) * 2004-11-24 2006-05-25 Molecular Imprints, Inc. Method to reduce adhesion between a conformable region and a mold
US7462436B2 (en) * 2003-07-16 2008-12-09 Tokyo Ohka Kogyo Co., Ltd. Positive photoresist composition and method of forming resist pattern
TWI360726B (en) * 2003-10-30 2012-03-21 Nissan Chemical Ind Ltd Sublayer coating-forming composition containing de
JP4485241B2 (ja) * 2004-04-09 2010-06-16 Azエレクトロニックマテリアルズ株式会社 水溶性樹脂組成物およびそれを用いたパターン形成方法
JP2005326491A (ja) * 2004-05-12 2005-11-24 Tokyo Ohka Kogyo Co Ltd ポジ型レジスト組成物及びレジストパターン形成方法
CN100503756C (zh) * 2004-05-18 2009-06-24 罗姆及海斯电子材料有限公司 与上涂光致抗蚀剂一起使用的涂料组合物
CN100541327C (zh) * 2004-05-21 2009-09-16 明德国际仓储贸易(上海)有限公司 液晶显示元件散乱层光阻组成物
EP2618215B1 (en) * 2004-05-31 2017-07-05 Fujifilm Corporation Method for producing a lithographic printing plate
JP4379596B2 (ja) * 2004-06-10 2009-12-09 信越化学工業株式会社 犠牲膜形成用組成物、パターン形成方法、犠牲膜及びその除去方法
US7691556B2 (en) * 2004-09-15 2010-04-06 Az Electronic Materials Usa Corp. Antireflective compositions for photoresists
EP1742108B1 (en) * 2005-07-05 2015-10-28 Rohm and Haas Electronic Materials, L.L.C. Coating compositions for use with an overcoated photoresist
JP4654993B2 (ja) * 2005-08-19 2011-03-23 Jsr株式会社 樹脂組成物、それを用いた二層積層膜、およびバンプ形成方法
JP4553835B2 (ja) * 2005-12-14 2010-09-29 信越化学工業株式会社 反射防止膜材料、及びこれを用いたパターン形成方法、基板
CN101371196B (zh) * 2006-02-13 2012-07-04 陶氏康宁公司 抗反射涂料
JP4409524B2 (ja) * 2006-03-28 2010-02-03 富士通株式会社 レジストパターン厚肉化材料、レジストパターンの製造方法、及び半導体装置の製造方法
WO2008026468A1 (fr) * 2006-08-28 2008-03-06 Nissan Chemical Industries, Ltd. Composition servant à créer une sous-couche de réserve et contenant un additif liquide
KR100852706B1 (ko) * 2007-03-02 2008-08-19 삼성에스디아이 주식회사 격벽 형성용 조성물, 및 이를 이용하여 제조된 플라즈마디스플레이 패널
US20080286689A1 (en) * 2007-05-14 2008-11-20 Hong Zhuang Antireflective Coating Compositions
CN101802712B (zh) * 2007-09-11 2013-03-20 日产化学工业株式会社 含有具有带氮的甲硅烷基的聚合物的、抗蚀剂下层膜形成用组合物
JP5337983B2 (ja) * 2007-09-19 2013-11-06 日産化学工業株式会社 多環式脂肪族環を有するポリマーを含むリソグラフィー用レジスト下層膜形成組成物
JP5077026B2 (ja) * 2008-04-02 2012-11-21 Jsr株式会社 レジスト下層膜形成用組成物及びそれを用いたデュアルダマシン構造の形成方法
US8173346B2 (en) * 2008-05-28 2012-05-08 Presstek, Inc. Printing members having permeability-transition layers and related methods
US20100092894A1 (en) * 2008-10-14 2010-04-15 Weihong Liu Bottom Antireflective Coating Compositions
US8501383B2 (en) * 2009-05-20 2013-08-06 Rohm And Haas Electronic Materials Llc Coating compositions for use with an overcoated photoresist
US9244352B2 (en) 2009-05-20 2016-01-26 Rohm And Haas Electronic Materials, Llc Coating compositions for use with an overcoated photoresist
CN102460301B (zh) * 2009-06-02 2014-08-06 日产化学工业株式会社 含有带硫醚键的硅的抗蚀剂下层膜形成用组合物
US8507192B2 (en) * 2010-02-18 2013-08-13 Az Electronic Materials Usa Corp. Antireflective compositions and methods of using same
JP2012022191A (ja) * 2010-07-15 2012-02-02 Nissan Chem Ind Ltd イオン性重合体を含むレジスト下層膜形成組成物及びそれを用いたレジストパターンの形成方法
JP5890990B2 (ja) * 2010-11-01 2016-03-22 株式会社キーエンス インクジェット光造形法における、光造形品形成用モデル材、光造形品の光造形時の形状支持用サポート材および光造形品の製造方法
JP5518772B2 (ja) * 2011-03-15 2014-06-11 信越化学工業株式会社 パターン形成方法
WO2012147700A1 (ja) * 2011-04-25 2012-11-01 旭硝子株式会社 撥水撥油剤組成物、その製造方法および物品
KR101808893B1 (ko) * 2011-04-28 2017-12-13 제이에스알 가부시끼가이샤 레지스트 하층막 형성용 조성물 및 패턴 형성 방법
KR20140050046A (ko) * 2011-08-04 2014-04-28 닛산 가가쿠 고교 가부시키 가이샤 축합계 폴리머를 가지는 euv 리소그래피용 레지스트 하층막 형성조성물
JP5882776B2 (ja) * 2012-02-14 2016-03-09 信越化学工業株式会社 レジスト下層膜形成用組成物、及びパターン形成方法
JP5894106B2 (ja) * 2012-06-18 2016-03-23 信越化学工業株式会社 レジスト下層膜形成用化合物、これを用いたレジスト下層膜材料、レジスト下層膜形成方法、パターン形成方法
KR102307208B1 (ko) * 2012-10-31 2021-10-01 닛산 가가쿠 가부시키가이샤 에스테르기를 갖는 실리콘함유 레지스트 하층막 형성조성물
WO2014097993A1 (ja) * 2012-12-18 2014-06-26 日産化学工業株式会社 多環芳香族ビニル化合物を含む自己組織化膜の下層膜形成組成物
JPWO2014167671A1 (ja) * 2013-04-10 2017-02-16 千代田ケミカル株式会社 感光性樹脂組成物
KR101674989B1 (ko) * 2013-05-21 2016-11-22 제일모직 주식회사 레지스트 하층막용 조성물, 이를 사용한 패턴 형성 방법 및 상기 패턴을 포함하는 반도체 집적회로 디바이스
KR102255221B1 (ko) * 2013-12-27 2021-05-24 롬엔드하스전자재료코리아유한회사 나노리소그래피용 유기 바닥 반사방지 코팅 조성물
JP6569204B2 (ja) * 2014-10-08 2019-09-04 大日本印刷株式会社 積層体の製造方法および積層体
US11092894B2 (en) * 2014-12-31 2021-08-17 Rohm And Haas Electronic Materials Korea Ltd. Method for forming pattern using anti-reflective coating composition comprising photoacid generator
US9499698B2 (en) * 2015-02-11 2016-11-22 Az Electronic Materials (Luxembourg)S.A.R.L. Metal hardmask composition and processes for forming fine patterns on semiconductor substrates
TWI646397B (zh) * 2015-10-31 2019-01-01 南韓商羅門哈斯電子材料韓國公司 與外塗佈光致抗蝕劑一起使用的塗料組合物
US10203602B2 (en) * 2016-09-30 2019-02-12 Rohm And Haas Electronic Materials Korea Ltd. Coating compositions for use with an overcoated photoresist

Also Published As

Publication number Publication date
JP2019003200A (ja) 2019-01-10
CN105739236A (zh) 2016-07-06
US20160187778A1 (en) 2016-06-30
US11762292B2 (en) 2023-09-19
JP6788639B2 (ja) 2020-11-25
KR102110178B1 (ko) 2020-05-13
JP2016139123A (ja) 2016-08-04
TW201626109A (zh) 2016-07-16
TWI592760B (zh) 2017-07-21
KR20180006474A (ko) 2018-01-17
KR20160082470A (ko) 2016-07-08

Similar Documents

Publication Publication Date Title
JP6751454B2 (ja) オーバーコートされたフォトレジストと共に使用するためのコーティング組成物
TWI745613B (zh) 具有熱酸產生劑的抗反射組合物
TWI709587B (zh) 塗佈之基板及形成光阻劑浮雕圖像之方法
JP6788639B2 (ja) オーバーコートされたフォトレジストと共に使用するためのコーティング組成物
TWI794186B (zh) 用於與上塗光阻使用之塗佈組成物
JP6453378B2 (ja) オーバーコートされたフォトレジストと共に用いるためのコーティング組成物
CN109143783B (zh) 与外涂布光致抗蚀剂一起使用的涂料组合物
CN111033381B (zh) 与外涂覆的光致抗蚀剂一起使用的涂料组合物
TWI721304B (zh) 與外塗佈光致抗蝕劑一起使用的塗料組合物

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CP03 Change of name, title or address

Address after: Han Guozhongqingnandao

Patentee after: DuPont Special Materials Korea Co.,Ltd.

Country or region after: Republic of Korea

Address before: Han Guozhongqingnandao

Patentee before: ROHM AND HAAS ELECTRONIC MATERIALS KOREA Ltd.

Country or region before: Republic of Korea

CP03 Change of name, title or address