CN105699315B - 太赫兹波测量装置、测量方法以及测量仪器 - Google Patents
太赫兹波测量装置、测量方法以及测量仪器 Download PDFInfo
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- CN105699315B CN105699315B CN201510930890.0A CN201510930890A CN105699315B CN 105699315 B CN105699315 B CN 105699315B CN 201510930890 A CN201510930890 A CN 201510930890A CN 105699315 B CN105699315 B CN 105699315B
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0223—Sample holders for photometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3577—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
- G01N2021/058—Flat flow cell
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014254392A JP2016114523A (ja) | 2014-12-16 | 2014-12-16 | テラヘルツ波測定装置、測定方法、及び測定用具 |
| JP2014-254392 | 2014-12-16 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105699315A CN105699315A (zh) | 2016-06-22 |
| CN105699315B true CN105699315B (zh) | 2019-12-03 |
Family
ID=54936809
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510930890.0A Active CN105699315B (zh) | 2014-12-16 | 2015-12-15 | 太赫兹波测量装置、测量方法以及测量仪器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9784610B2 (enExample) |
| EP (1) | EP3035033B1 (enExample) |
| JP (1) | JP2016114523A (enExample) |
| CN (1) | CN105699315B (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105928624B (zh) * | 2016-04-18 | 2018-10-12 | 上海理工大学 | 基于空心金属波导光纤增强太赫兹波信号的装置及方法 |
| CN108731824B (zh) * | 2017-04-20 | 2020-02-07 | 清华大学 | 一种太赫兹波波长检测装置 |
| WO2019049250A1 (ja) * | 2017-09-07 | 2019-03-14 | 株式会社日立ハイテクノロジーズ | 分光測定装置 |
| JP2019060829A (ja) * | 2017-09-28 | 2019-04-18 | 株式会社Ｓｃｒｅｅｎホールディングス | テラヘルツ波透過測定システムおよびテラヘルツ波透過測定方法 |
| CN108226099B (zh) * | 2017-12-29 | 2024-05-03 | 北京工业大学 | 一种太赫兹无损检测硅片电阻率的装置及其使用方法 |
| CN110108662B (zh) * | 2019-05-16 | 2021-07-13 | 上海理工大学 | 集成化太赫兹产生聚焦滤波元件及太赫兹检测系统 |
| CN110743104B (zh) * | 2019-10-28 | 2023-03-17 | 鲍玉珍 | 太赫兹波理疗终端、用于宫颈癌的太赫兹波理疗系统 |
| CN111896787A (zh) * | 2020-06-05 | 2020-11-06 | 北京无线电计量测试研究所 | 一种用于太赫兹脉冲辐射器辐射波形的测量系统及测量方法 |
| CN113804288B (zh) * | 2021-09-07 | 2023-09-15 | 首都师范大学 | 利用液态水中等离子体声波增强原理探测太赫兹波的系统和方法 |
| CN113625059B (zh) * | 2021-09-16 | 2024-07-19 | 首都师范大学 | 太赫兹波段流体复介电常数的测量装置及测量方法 |
| CN115173192B (zh) * | 2022-06-30 | 2023-06-09 | 首都师范大学 | 利用液体柱作为探针表征太赫兹波束空间分布的系统及方法 |
| CN115072847B (zh) * | 2022-07-28 | 2023-03-28 | 中山市美力新电子科技有限公司 | 太赫兹水分子重排智能制作系统及制作方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104006888A (zh) * | 2013-02-21 | 2014-08-27 | 精工爱普生株式会社 | 太赫兹波检测装置、拍摄装置、成像装置以及计测装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5894125A (en) * | 1997-08-18 | 1999-04-13 | Lucent Technologies Inc. | Near field terahertz imaging |
| AU776886B2 (en) * | 1999-06-04 | 2004-09-23 | Teraview Limited | Three dimensional imaging |
| GB2399626B (en) | 2003-03-21 | 2006-04-05 | Teraview Ltd | Spectroscopy apparatus and associated technique |
| JP2007178414A (ja) * | 2005-12-28 | 2007-07-12 | Semiconductor Res Found | 糖度検査方法および検査システム |
| JP4646838B2 (ja) | 2006-03-17 | 2011-03-09 | キヤノン株式会社 | プローブ及び近接場顕微鏡 |
| JP5067754B2 (ja) | 2007-08-03 | 2012-11-07 | 独立行政法人理化学研究所 | 近接場顕微装置とその分光・画像取得方法 |
| JP5086787B2 (ja) * | 2007-12-11 | 2012-11-28 | 独立行政法人理化学研究所 | エタノール混合ガソリンの成分分析装置および方法 |
| US20110285985A1 (en) * | 2009-02-12 | 2011-11-24 | Mika Honda | Method for Analyzing Sample and Microanalysis Chip to be used Therefore |
| JP2012185151A (ja) | 2011-02-17 | 2012-09-27 | Arkray Inc | テラヘルツ波の特性測定方法、物質検出方法、測定用具、テラヘルツ波の特性測定装置、及び物質検出装置 |
-
2014
- 2014-12-16 JP JP2014254392A patent/JP2016114523A/ja active Pending
-
2015
- 2015-12-11 US US14/965,972 patent/US9784610B2/en active Active
- 2015-12-15 EP EP15200071.7A patent/EP3035033B1/en active Active
- 2015-12-15 CN CN201510930890.0A patent/CN105699315B/zh active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104006888A (zh) * | 2013-02-21 | 2014-08-27 | 精工爱普生株式会社 | 太赫兹波检测装置、拍摄装置、成像装置以及计测装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3035033B1 (en) | 2018-06-13 |
| US9784610B2 (en) | 2017-10-10 |
| JP2016114523A (ja) | 2016-06-23 |
| CN105699315A (zh) | 2016-06-22 |
| US20160169735A1 (en) | 2016-06-16 |
| EP3035033A1 (en) | 2016-06-22 |
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