CN105699292B - The single abrasive particle scratching that a kind of spherical mounted point repairs hard crisp test specimen in advance stops test method fastly - Google Patents
The single abrasive particle scratching that a kind of spherical mounted point repairs hard crisp test specimen in advance stops test method fastly Download PDFInfo
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- CN105699292B CN105699292B CN201610078090.5A CN201610078090A CN105699292B CN 105699292 B CN105699292 B CN 105699292B CN 201610078090 A CN201610078090 A CN 201610078090A CN 105699292 B CN105699292 B CN 105699292B
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Abstract
The single abrasive particle scratching for repairing hard crisp test specimen in advance the invention discloses a kind of spherical mounted point stops test method fastly; belong to the material properties test in machining and precise and ultraprecise machining field; hard crisp test specimen is fixed and carries out on-line dynamic balancing; it carries out repairing disk using spherical mounted point, reaches required end face run-out and roughness requirements；Test specimen is with specified revolving speed rotation; top is connected with the tool heads of single abrasive particle with specified cutting-in radial feed scratching; spiral scratch is formed in test specimen end face; tool heads and test specimen moment are detached from during scratching; realize " the freezing " of abrasive grain and test specimen contact condition during single abrasive scratches; pass through measuring three-dimensional morphology and microexamination; the Related Mechanisms such as material deformation, machined surface formation, the interface friction in abrasive grain removal materials process can be better understood by, and then the further investigation for abrasive machinings process material cutting mechanisms such as grindings provides means.
Description
Technical field
The invention belongs in being machined material properties test and precise and ultraprecise machining field, and in particular to it is a kind of
The single abrasive particle scratching that spherical mounted point repairs hard crisp test specimen in advance stops test method fastly.
Background technique
Stop test method fastly and be also quick roll setting test method, refer to makes cutter or abrasive grain speed away cutting using external force
Or grinding area keeps material for test to deform wink so that " freezing " exits the instantaneously contact condition with test specimen in cutter or abrasive grain
Between state be recorded, and do not destroyed by subsequent process.This deformation moment can pass through subsequent metallographic
Sample preparation and microexamination carry out deeper into analysis.This method can further investigate the removal of the material in cutting or grinding process
Mechanism has been developed there are many quick-stop device in metal cutting field, and corresponding test result also has in correlative theses
Report, but in grinding field, the test method of stopping fastly for single abrasive particle scratching is had not been reported.
Summary of the invention
It is an object of the invention in place of overcome the deficiencies in the prior art, provide a kind of spherical mounted point to repair hard crisp test specimen in advance
Single abrasive particle scratching stop test method fastly, by making the tool heads for installing abrasive grain be detached from the contact zone of abrasive grain and test specimen rapidly
Domain realizes that " freezing " of abrasive grain and test specimen contact condition during single abrasive scratches can be better understood by by microexamination
Abrasive grain removes the Related Mechanisms such as material deformation, machined surface formation, interface friction in materials process, and then is the mill such as grinding
The further investigation of grain process Material Removal Mechanism provides means.
The technical solution adopted by the present invention to solve the technical problems is:
The single abrasive particle scratching that a kind of spherical mounted point repairs hard crisp test specimen in advance stops test method fastly, comprising:
1) hard crisp test specimen is fixed on electro spindle, test specimen can be rotated by electro spindle；The test specimen is carried out online dynamic flat
Weighing apparatus；
2) test specimen is carried out to repair disk using spherical mounted point, is better than IT1 grades to form end face run-out amount in surface of test piece, table
Face average roughness Ra repairs disk area better than 10nm's, the specific steps are as follows:
Disk is repaired in 2-1) spherical mounted point roughing: being cooled down while repairing disk to spherical mounted point and test specimen, test specimen when repairing disk
The range of speeds be 3000~10000rpm, spherical mounted point is with the revolving speed rotation of 8000~20000rpm, while on the outside of the test specimen
With 10~50 μm of cutting-in along test specimen radial feed, feed speed range is 0.4~1.2mm/s, and feeding distance is test specimen diameter
1/4~1/2；
Disk is repaired in 2-2) spherical mounted point finishing: being cooled down while repairing disk to spherical mounted point and test specimen, test specimen when repairing disk
The range of speeds be 3000~10000rpm, spherical mounted point is with the revolving speed rotation of 8000~20000rpm, while on the outside of the test specimen
With 2~10 μm of cutting-in along test specimen radial feed, feed speed range is 0.1~0.3mm/s, and feeding distance is test specimen diameter
1/4~1/2；
3) spherical mounted point touches tool setting gauge, and determination repairs disk area and tool setting gauge to the difference in height h of knife plane0；By pot mill
Head is changed to the tool heads that top is connected with single abrasive particle, and the abrasive grain on tool heads top touches tool setting gauge, then by tool heads along examination
The axial direction of part rotation moves up h0+ δ, so that the abrasive grain on tool heads top is located at test specimen and repairs completion pair above disk area at δ
Knife；
4) tool heads level is moved to and is repaired right above the scratching point of disk area, and move down δ+apSo that scratching depth is ap；Root
According to the scratching radius R where scratching speed v and the scratching point that need to be tested, pass throughThe setting speed n of calculation testing piece；
Test specimen is rotated according to setting speed n, and tool heads are radially fed, so that abrasive grain to form spiral shape and draw repairing disk area and scratch
Trace, tool heads moment and test specimen are detached from during scratching, and the instantaneous linear velocity for being detached from moment tool heads top is higher than test specimen rotation
Linear velocity is detached from the contact condition of moment abrasive grain and test specimen with " freezing "；Measurement system during this by being connected with tool heads
Data during system acquisition scratching.
In one embodiment: the abrasive grain is diamond, CBN, oxide ceramics or nitride ceramics, and abrasive grain shape is ball
Shape, cone or polygonal pyramid shape；The abrasive grain is fixed in tool heads top by mechanical grip, plating or soldering；The tool heads
For pressure head.
In one embodiment: the test specimen is disc；End face radius smaller portions linear velocity is smaller when due to test, cannot
Realize higher scratching speed, in order to improve efficiency, spherical mounted point feeding distance is less than test specimen radius when repairing disk, so that described repair
Disk area is circular ring shape.
In one embodiment: the measuring system is dynamometry and acoustic emission system, dynamometer, sound including the connection of mutual signal
Emission system, data collecting card and signal amplifier；The tool heads are connected with dynamometer and acoustic emission system.
In one embodiment: the intrinsic frequency of the dynamometer is higher than 4KHz, and dynamometry precision is better than 0.01N；The data are adopted
The sample rate of truck is higher than 2M/s.
In one embodiment: in the step 2), the direction of rotation of test specimen and the direction of rotation of spherical mounted point are opposite when repairing disk.
In one embodiment: the tool heads are superior in the positioning accuracy of the axial direction and radial direction that rotate along test specimen
0.1μm。
In one embodiment: the positioning accuracy of the tool setting gauge is better than 0.1 μm.
In one embodiment: in the step 4), tool heads are detached from by high rigidity spring or pneumatic impact wrench moment and test specimen.
In one embodiment: the tool heads axis is parallel to test specimen rotation axis；The spherical mounted point axis is parallel to examination
Part rotation axis.
In addition to being described, the connection type between the single treatment process and each device of each device according to the present invention is equal
For this field routine techniques, it is not described in detail herein.
The technical program compared with the background art, it has the following advantages:
1. single abrasive particle scratching of the invention stops test method fastly, during scratching, keep the tool heads for installing abrasive grain fast
Speed is detached from the contact area of abrasive grain and test specimen, realizes and is detached from moment abrasive grain and test specimen contact condition during single abrasive scratching
" freezing " can be better understood by material deformation in abrasive grain removal materials process, machined surface shape by microexamination
At Related Mechanisms such as, interface frictions, and then the further investigation for abrasive machinings process material cutting mechanisms such as grindings provides means.
2. the present invention carries out on-line dynamic balancing to main shaft-sample system, the substantially end face in high-speed rotation is avoided
Bounce or circular runout, to keep the steady contact state between abrasive grain and test specimen；Meanwhile test specimen is carried out using spherical mounted point
On-line machining, while the form accuracy and surface smoothness of test specimen are improved, improve test specimen rotating accuracy and grain motion essence
Degree cooperates dynamic balancing, further ensures between abrasive grain and test specimen to ensure that the relative motion precision between abrasive grain and test specimen
It above can continually and steadily be contacted in longer scratching distance, to realize the high-speed, high precision scratching of abrasive grain, and then guarantee to stop to survey fastly
The accuracy of examination.
3. the machined surface quality of test specimen must be better than the surface that correlation grinding process obtain according to the common sense of this field
Quality is preferably higher by an order of magnitude, and obtained scratch test result could be used for the analysis of grinding process cutting mechanisms；Due to
The present invention greatly improves the quality of surface of test piece, therefore can satisfy wanting for the high accuracy analysis such as grinding process cutting mechanisms
It asks, can be used for the research of Material Removal Mechanism in process of friction and wear and grinding.
4. abrasive grain scratching depth is greater than 5 times or more of the surface of test piece fluctuating quantity stability that just can guarantee scratching, due to
The present invention greatly improves the quality of surface of test piece, and surface of test piece precision and finish are good, even the abrasive grain of small grain size also can
It realizes that stablizing high-precision scratches, therefore can be used for the single abrasive particle scratching test of small grain size abrasive grain, further expanded this hair
Bright application range, and industry single abrasive particle scratching experimental technique is greatly facilitated.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples.
Fig. 1 is test method schematic illustration of the invention.
Fig. 2 repairs disk Principle of Process schematic diagram for of the invention.
Fig. 3 stops schematic illustration for of the invention fastly, and it is also " freezing " that wherein Fig. 3 b, which is enlarged diagram at A in Fig. 3 a,
Abrasive grain and test specimen are detached from moment schematic diagram.
Fig. 4 is the comparison of surface of test piece three-dimensional appearance before and after repairing disk in the embodiment of the present invention, and wherein Fig. 4 a is (warp before repairing disk
The processing of conventional plane fine grinding technology), Fig. 4 b is after repairing disk.
Fig. 5 is the comparison of surface of test piece end face run-out amount before and after repairing disk in the embodiment of the present invention, and wherein Fig. 5 a is before repairing disk
(processing through conventional planar accurate grinding technique), end face run-out amount maximum value is up to 29.1 μm；Fig. 5 b is end face run-out after repairing disk
Measuring maximum value is 9.1 μm.
Fig. 6 is the SEM photograph and three-dimensional appearance schematic diagram of scratch in the embodiment of the present invention.
Fig. 7 is that abrasive grain and test specimen are detached from the three-dimensional shaped that moment, that is, scratch front end is " frozen " region in the embodiment of the present invention
Looks schematic diagram.
Fig. 8 is that abrasive grain and test specimen are detached from the two dimension section that moment, that is, scratch front end is " frozen " region in the embodiment of the present invention
Face pattern schematic diagram.
Appended drawing reference: test specimen 1, vacuum chuck 2, tool heads 3 repair disk area 4, tool setting gauge 5, spherical mounted point 6.
Specific embodiment
The contents of the present invention are illustrated below by embodiment:
The single abrasive particle that a kind of spherical mounted point repairs hard crisp test specimen in advance continuously scratches test method, and used device includes:
Lathe, the firmly crisp test specimen 1 of disc is installed on the electro spindle of lathe by vacuum chuck 2, and test specimen 1 can pass through electricity
Main shaft rotation；
Dynamic balance instrument, for carrying out on-line dynamic balancing to test specimen 1；
Spherical mounted point 6, for carrying out repairing disk to 1 end face of test specimen；The spherical mounted point 6 is dismantledly installed in bracket, and leads to
It crosses bracket and is movably installed in lathe；6 axis of spherical mounted point is parallel to 1 rotation axis of test specimen；
Tool heads 3, for carrying out scratching test；3 top of tool heads is connected with single abrasive grain；The tool heads 3 can be with
Spherical mounted point is installed in bracket with mutually replacing assembly and disassembly, and is movably installed in lathe by bracket；Tool heads 3 and high rigidity bullet
Spring or pneumatic impact wrench are connected, and are detached from by the moment of high rigidity spring or pneumatic impact wrench implementation tool head 3 and test specimen 1；Tool heads 3
Axis is parallel to 1 rotation axis of test specimen, the axial direction and move in the radial direction that tool heads 3 can be rotated in test specimen 1, and
The positioning accuracy of both direction is superior to 0.1 μm；
Tool setting gauge 5, for carrying out spherical mounted point 6 and tool heads 3 to knife, positioning accuracy is better than 0.1 μm；It is installed in machine
Bed, and the relative position between test specimen 1 is kept fixed；
Measuring system is dynamometry and acoustic emission system, dynamometer, acoustic emission system, data including the connection of mutual signal
Capture card and signal amplifier；The tool heads 3 are connected with dynamometer and acoustic emission system；The connection of data collecting card signal calculates
Machine.
Air-cooler: for the tool heads and test specimen during the spherical mounted point and test specimen repaired during disk, and scratching
Cooling is blowed.
The specific test method is as follows:
1) sapphire wafer, that is, test specimen 1 of 6 inches (diameter about 150mm) is fixed on lathe with 2 clamping of vacuum chuck
On electro spindle, test specimen 1 can be rotated by electro spindle；On-line dynamic balancing is carried out to the test specimen 1 with dynamic balance instrument, to reduce test specimen 1
Vibration when rotating at high speed, to guarantee that abrasive grain and test specimen 1 can be contacted steadily during scratching；
2) test specimen 1 is carried out repairing disk using spherical mounted point 6, roughing is first carried out, then finished, in test specimen 1
Surface forms 3 μm of end face run-out amount, and the circular ring shape of surface average roughness Ra 10nm repairs disk area 4, to reduce by 1 end face of test specimen
Jerk value improves surface quality, is further ensured that during scratching that abrasive grain and test specimen 1 can be contacted steadily；Specific step is as follows:
Disk is repaired in 2-1) spherical mounted point roughing: being opened air-cooler while repairing disk, is made cold wind alignment spherical mounted point 6 and test specimen
1 is cooled down, and the revolving speed of test specimen 1 is 3000rpm when repairing disk, and spherical mounted point 6 is with the revolving speed rotation of 10000rpm, while from test specimen
1 outside with 10 μm of cutting-in along test specimen radial feed carry out single-point grinding, feed speed range be 0.4~1.2mm/s, feeding away from
From for 50mm；
Disk is repaired in 2-2) spherical mounted point finishing: being opened air-cooler while repairing disk, is made cold wind alignment spherical mounted point 6 and test specimen
1 is cooled down, and the revolving speed of test specimen 1 is 3000rpm when repairing disk, and spherical mounted point 6 is with the revolving speed rotation of 10000rpm, while from test specimen
Outside carries out single-point grinding along test specimen radial feed with 2 μm of cutting-in, and feed speed range is 0.1~0.3mm/s, feeding distance
For 50mm；
Fig. 4 and Fig. 5 are shown in the comparison for repairing disk front and back 1 three-dimensional surface shape of test specimen and end face run-out amount respectively；
3) spherical mounted point 6 touches tool setting gauge 5, determines and repairs disk area 4 and tool setting gauge 5 to the difference in height h of knife plane0；By ball
Shape bistrique 6 is removed from bracket, is changed to the tool heads 3 that top plating is connected with the spherical wear particles of single radius 0.1mm, tool
First 3 top moves closer to tool setting gauge 5, and when measuring system data generate mutation, the abrasive grain on 3 top of representational tool head is just touched
Tool setting gauge 5 moves up h along the axial direction that test specimen rotates to knife plane, then by tool heads 30+ δ, so that the abrasive grain on 3 top of tool heads
It repairs above disk area 4 at δ, is completed to knife, so that scratching depth can be accurately controlled when guaranteeing follow-up test positioned at test specimen 1；
4) 3 level of tool heads is moved to and is repaired right above the scratching point of disk area 4, and move down δ+apSo that scratching depth is ap；
According to the scratching radius R where scratching speed v and the scratching point that need to be tested, pass throughThe setting of calculation testing piece 1 turns
Fast n；Among the present embodiment, n=10000rpm, scratching speed v be 52m/s~78m/s (scratching speed with scratching radius change and
Variation), scratch depth apIt is set as 6 μm；Test specimen 1 is rotated according to above-mentioned setting speed n, and tool heads 3 are radially with 1m/s's
Speed feeding, so that abrasive grain is repairing the continuous helical shape scratch that the formation spacing of disk area 4 is 100 μm, scratch circle number is greater than 3；
Data during being scratched during this by dynamometer and the acoustic emission system acquisition being connected with tool heads 3, and pass through signal
Amplifier transfer is to data collecting card, then is transmitted to computer and is calculated, and can obtain the physics such as scratching power, acoustic emission signal
Amount；During scratching, when the single abrasive particle on 3 top of tool heads is scratched to the circumference that diameter is 100mm, (scratching speed is 52m/
When s), tool heads 3 are detached from by high rigidity spring or pneumatic impact wrench moment and test specimen 1, and are detached from the wink on 3 top of moment tool heads
When linear velocity be higher than test specimen 1 rotate linear velocity, with " freezing " abrasive grain scratching during be detached from moment abrasive grain and test specimen 1 contact shape
State；
It should be noted that commonly used in the art make tool heads be detached from test specimen by high rigidity spring or pneumatic impact wrench
In mode, tool heads are fixed on high rigidity spring or pneumatic impact wrench, in the drive of high rigidity spring or pneumatic impact wrench when disengaging
It is lower to be detached from along circular arc, therefore the instantaneous linear velocity on above-mentioned disengaging moment tool heads top refers to being detached from moment tool heads along circular arc
The tangential velocity of movement, the direction of motion at this time are parallel to test specimen rotation axis and far from test specimens.
5) microexamination and measuring three-dimensional morphology are carried out to scratch, as shown in Figure 6；Scratch front end is " frozen " region
Three-dimensional appearance and its two-dimensional section pattern are as shown in Figure 7 and Figure 8.
Among the present embodiment, the intrinsic frequency of the dynamometer is higher than 4KHz, and dynamometry precision is better than 0.01N；The data
The sample rate of capture card is higher than 2M/s.
As needed, the hard brittle material can also be ceramics, silicon wafer；The abrasive grain can for diamond, CBN (cube
Boron nitride), oxide ceramics or nitride ceramics；Abrasive grain shape can also be cone or polygonal pyramid shape；The abrasive grain passes through machine
Tool clamping, plating or soldering are fixed in tool heads top；The tool heads can be pressure head or other fixed grain forms.
As needed, the parameter for repairing disk adjust in the following range and carry out it is one or many repair disk, can be in surface of test piece
It forms end face run-out amount and is better than IT1 grades, surface average roughness Ra repairs disk area better than 10nm's:
Disk is repaired in 2-1) spherical mounted point roughing: being cooled down while repairing disk to spherical mounted point and test specimen, test specimen when repairing disk
The range of speeds be 3000~10000rpm, spherical mounted point is with the revolving speed rotation of 8000~20000rpm, while on the outside of the test specimen
With 10~50 μm of cutting-in along test specimen radial feed, feed speed range is 0.4~1.2mm/s, and feeding distance is test specimen diameter
1/4~1/2；The direction of rotation of test specimen identical can may be reversed with the direction of rotation of spherical mounted point when repairing disk, on the contrary may be used
To increase speed of related movement, processing quality is improved；
Disk is repaired in 2-2) spherical mounted point finishing: being cooled down while repairing disk to spherical mounted point and test specimen, test specimen when repairing disk
The range of speeds be 3000~10000rpm, spherical mounted point is with the revolving speed rotation of 8000~20000rpm, while on the outside of the test specimen
With 2~10 μm of cutting-in along test specimen radial feed, feed speed range is 0.1~0.3mm/s, and feeding distance is test specimen diameter
1/4~1/2；The direction of rotation of test specimen identical can may be reversed with the direction of rotation of spherical mounted point when repairing disk, on the contrary can be with
Increase speed of related movement, improves processing quality.
Comparative example
Hard crisp test specimen is taken, after the processing of conventional planar accurate grinding technique, surface of test piece is divided into two regions, one of area
Domain disk step according to the invention of repairing carries out repairing disk, so that its surface quality is reached end face run-out amount better than IT1 grades, surface is average thick
Rugosity Ra is better than 10nm, is denoted as and repairs disk area；Another region is denoted as without repairing disk and does not repair disk area.
Above-mentioned test specimen is continuously scratched using test method progress single abrasive particle of the invention and stops to test fastly, in same test
Scratch is formed in disk area repairing disk area and do not repair under parameter, scratch depth very little can reach micron order, the results show that
In the case where scratch depth very little, the scratch for repairing disk area forms coherent spiral shape, in being evenly spaced on, detects its depth
Deflection error shows that abrasive grain and test specimen can continually and steadily connect in the longer scratching repaired in disk area apart from upper less than 1 μm/1mm
Touching, so as to realize that the high-speed, high precision scratching of abrasive grain stops to test fastly；And the scratch for not repairing disk area cannot form coherent spiral shell
Shape is revolved, scratch interval is different, and the scratch depth, scratch width all have macroscopic otherness, shows between abrasive grain and test specimen
It can not continually and steadily contact, it is even more impossible to the high-speed, high precision scratchings for abrasive grain to stop to test fastly.
The above is only the preferred embodiment of the present invention, the range implemented of the present invention that therefore, it cannot be limited according to, i.e., according to
Equivalent changes and modifications made by the invention patent range and description, should still be within the scope of the present invention.
Claims (9)
1. the single abrasive particle scratching that a kind of spherical mounted point repairs hard crisp test specimen in advance stops test method fastly, it is characterised in that: include:
1) hard crisp test specimen is fixed on electro spindle, test specimen can be rotated by electro spindle；On-line dynamic balancing is carried out to the test specimen；
2) test specimen is carried out to repair disk using spherical mounted point, is better than IT1 grades to form end face run-out amount in surface of test piece, surface is flat
Equal roughness Ra repairs disk area better than 10nm, and the direction of rotation of test specimen and the direction of rotation of spherical mounted point when repairing disk are on the contrary, tool
Steps are as follows for body:
Disk is repaired in 2-1) spherical mounted point roughing: being cooled down while repairing disk to spherical mounted point and test specimen, test specimen turns when repairing disk
Fast range is 3000~10000rpm, and spherical mounted point is with the revolving speed rotation of 8000~20000rpm, while with 10 on the outside of the test specimen
For~50 μm of cutting-in along test specimen radial feed, feed speed range is 0.4~1.2mm/s, and feeding distance is the 1/4 of test specimen diameter
~1/2；
Disk is repaired in 2-2) spherical mounted point finishing: being cooled down while repairing disk to spherical mounted point and test specimen, test specimen turns when repairing disk
Fast range is 3000~10000rpm, spherical mounted point with the revolving speed rotation of 8000~20000rpm, while on the outside of the test specimen with 2~
For 10 μm of cutting-in along test specimen radial feed, feed speed range is 0.1~0.3mm/s, feeding distance be test specimen diameter 1/4~
1/2；
3) spherical mounted point touches tool setting gauge, and determination repairs disk area and tool setting gauge to the difference in height h of knife plane0；Spherical mounted point is replaced
The tool heads of single abrasive particle are connected with for top, the abrasive grain on tool heads top touches tool setting gauge, then tool heads are rotated along test specimen
Axial direction move up h0+ δ is completed so that the abrasive grain on tool heads top is located at test specimen and repairs above disk area at δ to knife；
4) tool heads level is moved to and is repaired right above the scratching point of disk area, and move down δ+apSo that scratching depth is ap；According to need
Scratching radius R where scratching speed v and the scratching point of test, passes throughThe setting speed n of calculation testing piece；Test specimen
It is rotated according to setting speed n, and tool heads are radially fed, so that abrasive grain scratches to form spiral scratch repairing disk area, are drawn
Tool heads moment and test specimen are detached from during wiping, and the instantaneous linear velocity for being detached from moment tool heads top is higher than test specimen and rotates linear speed
Degree is detached from the contact condition of moment abrasive grain and test specimen with " freezing "；It is adopted during this by the measuring system being connected with tool heads
Data during collection scratching.
2. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the abrasive grain is diamond, CBN, oxide ceramics or nitride ceramics, abrasive grain shape is spherical, cone
Or polygonal pyramid shape；The abrasive grain is fixed in tool heads top by mechanical grip, plating or soldering；The tool heads are pressure head.
3. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the test specimen is disc；Spherical mounted point feeding distance is less than test specimen radius when repairing disk, and repairing disk area is annulus
Shape.
4. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the measuring system is dynamometry and acoustic emission system, dynamometer, sound emission system including the connection of mutual signal
System, data collecting card and signal amplifier；The tool heads are connected with dynamometer and acoustic emission system.
5. the single abrasive particle scratching that a kind of spherical mounted point according to claim 4 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the intrinsic frequency of the dynamometer is higher than 4KHz, dynamometry precision is better than 0.01N；The data collecting card is adopted
Sample speed is higher than 2M/s.
6. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the tool heads are superior to 0.1 μm in the positioning accuracy of the axial direction and radial direction that rotate along test specimen.
7. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the positioning accuracy of the tool setting gauge is better than 0.1 μm.
8. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: tool heads are detached from by high rigidity spring or pneumatic impact wrench moment and test specimen in the step 4).
9. the single abrasive particle scratching that a kind of spherical mounted point according to claim 1 repairs hard crisp test specimen in advance stops test method fastly,
It is characterized by: the tool heads axis is parallel to test specimen rotation axis；The spherical mounted point axis is parallel to test specimen rotary shaft
Line.
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