CN105683805B - 图像取得装置以及图像取得装置的图像取得方法 - Google Patents

图像取得装置以及图像取得装置的图像取得方法 Download PDF

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Publication number
CN105683805B
CN105683805B CN201480058554.5A CN201480058554A CN105683805B CN 105683805 B CN105683805 B CN 105683805B CN 201480058554 A CN201480058554 A CN 201480058554A CN 105683805 B CN105683805 B CN 105683805B
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imaging element
speed
sample
image acquisition
imaging
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CN201480058554.5A
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Chinese (zh)
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CN105683805A (zh
Inventor
岩瀬富美雄
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/69—Microscopic objects, e.g. biological cells or cellular parts
    • G06V20/693—Acquisition
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/086—Condensers for transillumination only
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/698—Control of cameras or camera modules for achieving an enlarged field of view, e.g. panoramic image capture

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Theoretical Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Studio Devices (AREA)
  • Image Input (AREA)
CN201480058554.5A 2013-11-01 2014-01-28 图像取得装置以及图像取得装置的图像取得方法 Active CN105683805B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013-228560 2013-11-01
JP2013228560A JP6154291B2 (ja) 2013-11-01 2013-11-01 画像取得装置及び画像取得装置の画像取得方法
PCT/JP2014/051804 WO2015064116A1 (ja) 2013-11-01 2014-01-28 画像取得装置及び画像取得装置の画像取得方法

Publications (2)

Publication Number Publication Date
CN105683805A CN105683805A (zh) 2016-06-15
CN105683805B true CN105683805B (zh) 2018-09-28

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CN201480058554.5A Active CN105683805B (zh) 2013-11-01 2014-01-28 图像取得装置以及图像取得装置的图像取得方法

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US (1) US9911028B2 (enExample)
EP (1) EP3064981B1 (enExample)
JP (1) JP6154291B2 (enExample)
CN (1) CN105683805B (enExample)
DK (1) DK3064981T3 (enExample)
HU (1) HUE059480T2 (enExample)
WO (1) WO2015064116A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6698451B2 (ja) * 2016-07-11 2020-05-27 オリンパス株式会社 観察装置
CN107782738A (zh) * 2016-08-31 2018-03-09 上海微电子装备（集团）股份有限公司 一种自动光学检测装置及其检测方法
JP6865010B2 (ja) * 2016-10-19 2021-04-28 オリンパス株式会社 顕微鏡システムおよび標本観察方法
JP6842387B2 (ja) * 2017-08-31 2021-03-17 浜松ホトニクス株式会社 画像取得装置及び画像取得方法
JP7023659B2 (ja) * 2017-09-29 2022-02-22 キヤノン株式会社 撮像装置、撮像システム、移動体
JP6920978B2 (ja) * 2017-12-18 2021-08-18 浜松ホトニクス株式会社 画像取得装置及び画像取得方法
FR3081552B1 (fr) * 2018-05-23 2020-05-29 Commissariat A L'energie Atomique Et Aux Energies Alternatives Dispositif et procede d'observation d'un echantillon fluorescent par imagerie defocalisee
CN109752916A (zh) * 2018-12-26 2019-05-14 江苏大学 一种平面激光拍摄装置及其方法
TW202336423A (zh) 2021-10-01 2023-09-16 美商伊路米納有限公司 用於傳輸光之設備及方法
KR102596730B1 (ko) * 2022-02-16 2023-11-02 주식회사 팍스웰 렌즈없는 광학 시스템

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997004347A1 (en) * 1995-07-19 1997-02-06 Morphometrix Technologies Inc. Automated scanning of microscope slides
EP1324097A2 (en) * 2001-12-18 2003-07-02 Fairfield Imaging Ltd. Method and apparatus for acquiring digital microscope images
EP1439385A1 (en) * 2003-01-15 2004-07-21 Negevtech Ltd. Method and system for fast on-line electro-optical detection of wafer defects
JP2009128648A (ja) * 2007-11-26 2009-06-11 Olympus Corp 顕微鏡観察システム
JP2010271550A (ja) * 2009-05-21 2010-12-02 Olympus Corp 顕微鏡システム
CN101995652A (zh) * 2009-08-17 2011-03-30 索尼公司 图像获取装置和图像获取方法
CN102854615A (zh) * 2012-04-27 2013-01-02 麦克奥迪实业集团有限公司 一种对显微切片的全自动扫描系统及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63191063A (ja) 1987-02-03 1988-08-08 Sumitomo Electric Ind Ltd 顕微鏡画像の処理方式
JPH09281405A (ja) * 1996-04-17 1997-10-31 Olympus Optical Co Ltd 顕微鏡システム
JPH11326233A (ja) * 1998-05-12 1999-11-26 Mitsui Mining & Smelting Co Ltd 材料表面検査装置
JP2003222801A (ja) * 2002-01-29 2003-08-08 Olympus Optical Co Ltd 顕微鏡画像撮影装置
JP4102842B1 (ja) * 2006-12-04 2008-06-18 東京エレクトロン株式会社 欠陥検出装置、欠陥検出方法、情報処理装置、情報処理方法及びそのプログラム
JP2010002534A (ja) * 2008-06-19 2010-01-07 Nikon Corp 顕微鏡装置
JP2014026233A (ja) * 2012-07-30 2014-02-06 Olympus Corp 撮像システム
WO2014127468A1 (en) * 2013-02-25 2014-08-28 Huron Technologies International Inc. Microscopy slide scanner with variable magnification

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997004347A1 (en) * 1995-07-19 1997-02-06 Morphometrix Technologies Inc. Automated scanning of microscope slides
EP1324097A2 (en) * 2001-12-18 2003-07-02 Fairfield Imaging Ltd. Method and apparatus for acquiring digital microscope images
EP1439385A1 (en) * 2003-01-15 2004-07-21 Negevtech Ltd. Method and system for fast on-line electro-optical detection of wafer defects
JP2009128648A (ja) * 2007-11-26 2009-06-11 Olympus Corp 顕微鏡観察システム
JP2010271550A (ja) * 2009-05-21 2010-12-02 Olympus Corp 顕微鏡システム
CN101995652A (zh) * 2009-08-17 2011-03-30 索尼公司 图像获取装置和图像获取方法
CN102854615A (zh) * 2012-04-27 2013-01-02 麦克奥迪实业集团有限公司 一种对显微切片的全自动扫描系统及方法

Also Published As

Publication number Publication date
HUE059480T2 (hu) 2022-11-28
US20160267317A1 (en) 2016-09-15
JP6154291B2 (ja) 2017-06-28
CN105683805A (zh) 2016-06-15
JP2015087719A (ja) 2015-05-07
EP3064981A1 (en) 2016-09-07
EP3064981A4 (en) 2017-04-05
US9911028B2 (en) 2018-03-06
EP3064981B1 (en) 2022-04-20
WO2015064116A1 (ja) 2015-05-07
DK3064981T3 (da) 2022-06-13

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