CN105466463B - 传感器芯片 - Google Patents

传感器芯片 Download PDF

Info

Publication number
CN105466463B
CN105466463B CN201510621626.9A CN201510621626A CN105466463B CN 105466463 B CN105466463 B CN 105466463B CN 201510621626 A CN201510621626 A CN 201510621626A CN 105466463 B CN105466463 B CN 105466463B
Authority
CN
China
Prior art keywords
lamination
opening
substrate
sensing element
sensor chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510621626.9A
Other languages
English (en)
Chinese (zh)
Other versions
CN105466463A (zh
Inventor
F·梅耶
U·巴特世
M·维因格
M·格拉夫
P·格尔纳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sheng Sirui Co Ltd
Original Assignee
Sheng Sirui Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sheng Sirui Co Ltd filed Critical Sheng Sirui Co Ltd
Publication of CN105466463A publication Critical patent/CN105466463A/zh
Application granted granted Critical
Publication of CN105466463B publication Critical patent/CN105466463B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/048Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance for determining moisture content of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/12Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
    • G01N27/128Microapparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/14Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/223Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity
    • G01N27/225Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity by using hygroscopic materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004Gaseous mixtures, e.g. polluted air
    • G01N33/0009General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Combustion & Propulsion (AREA)
  • Medicinal Chemistry (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Measuring Fluid Pressure (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
CN201510621626.9A 2014-09-26 2015-09-25 传感器芯片 Active CN105466463B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP14186534.5 2014-09-26
EP14186534.5A EP3001186B1 (de) 2014-09-26 2014-09-26 Sensorchip

Publications (2)

Publication Number Publication Date
CN105466463A CN105466463A (zh) 2016-04-06
CN105466463B true CN105466463B (zh) 2019-11-15

Family

ID=51625878

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510621626.9A Active CN105466463B (zh) 2014-09-26 2015-09-25 传感器芯片

Country Status (5)

Country Link
US (1) US9506885B2 (de)
EP (1) EP3001186B1 (de)
JP (1) JP6713259B2 (de)
KR (1) KR102361998B1 (de)
CN (1) CN105466463B (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102609714B1 (ko) * 2016-04-27 2023-12-05 엘지전자 주식회사 센서
JP6803579B2 (ja) * 2016-06-08 2020-12-23 Nissha株式会社 Memsガスセンサ、memsガスセンサ実装体、memsガスセンサ・パッケージ、memsガスセンサ組立体、及びmemsガスセンサの製造方法
EP3139159A1 (de) * 2016-08-23 2017-03-08 Sensirion AG Sensoranordnung
JP7081354B2 (ja) * 2017-07-19 2022-06-07 地方独立行政法人東京都立産業技術研究センター センサ保持基板及びセンサモジュール
KR102520038B1 (ko) 2018-01-10 2023-04-12 삼성전자주식회사 가스 센서 패키지 및 이를 포함하는 센싱 장치
US20200150069A1 (en) 2018-11-12 2020-05-14 Ams Sensors Uk Limited Gas sensor
US11674916B2 (en) 2018-11-12 2023-06-13 Sciosense B.V. Gas sensor
JP7445920B2 (ja) 2020-07-02 2024-03-08 パナソニックIpマネジメント株式会社 ガスセンサ装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1533741A (zh) * 2003-03-31 2004-10-06 ��ʿͨ��ʽ���� 用于指纹识别的半导体装置
CN1193227C (zh) * 2000-07-19 2005-03-16 Lg电子株式会社 绝对湿度传感器
CN1279348C (zh) * 2002-03-20 2006-10-11 株式会社电装 电容型湿度传感器
EP2481703A1 (de) * 2011-01-27 2012-08-01 Sensirion AG Sensorschutz
EP2620768A1 (de) * 2012-01-25 2013-07-31 Sensirion AG Tragbare Detektionsvorrichtung
DE202013102632U1 (de) * 2013-06-19 2013-12-20 Sensirion Ag Sensorbaustein
CN103969311A (zh) * 2013-01-31 2014-08-06 盛思锐股份公司 化学传感器及用于制造该化学传感器的方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2880651B2 (ja) 1994-08-12 1999-04-12 東京瓦斯株式会社 熱式マイクロフローセンサ及びその製造方法
DE19928297A1 (de) 1999-06-22 2000-12-28 Bosch Gmbh Robert Verfahren zur Herstellung eines Sensors mit einer Membran
US6384353B1 (en) 2000-02-01 2002-05-07 Motorola, Inc. Micro-electromechanical system device
EP1350078B1 (de) 2001-01-10 2018-02-14 Sensirion Holding AG Mikromechanischer flusssensor mit tensiler beschichtung
US6528875B1 (en) 2001-04-20 2003-03-04 Amkor Technology, Inc. Vacuum sealed package for semiconductor chip
US20030037590A1 (en) 2001-08-27 2003-02-27 Stark Kevin C. Method of self-testing a semiconductor chemical gas sensor including an embedded temperature sensor
US6841883B1 (en) 2003-03-31 2005-01-11 Micron Technology, Inc. Multi-dice chip scale semiconductor components and wafer level methods of fabrication
JP2005109221A (ja) 2003-09-30 2005-04-21 Toshiba Corp ウェーハレベルパッケージ及びその製造方法
US6936918B2 (en) 2003-12-15 2005-08-30 Analog Devices, Inc. MEMS device with conductive path through substrate
JP2006226743A (ja) 2005-02-16 2006-08-31 Mitsubishi Electric Corp 加速度センサ
DE102008025599B4 (de) 2007-05-14 2013-02-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Gehäuste aktive Mikrostrukturen mit Direktkontaktierung zu einem Substrat
JP5137059B2 (ja) 2007-06-20 2013-02-06 新光電気工業株式会社 電子部品用パッケージ及びその製造方法と電子部品装置
JP5031492B2 (ja) 2007-09-06 2012-09-19 キヤノン株式会社 インクジェットヘッド基板の製造方法
JP5237607B2 (ja) 2007-10-25 2013-07-17 新光電気工業株式会社 基板の製造方法
KR100942439B1 (ko) 2007-12-28 2010-02-17 전자부품연구원 마이크로 가스센서 및 제조방법
US20090212397A1 (en) 2008-02-22 2009-08-27 Mark Ewing Tuttle Ultrathin integrated circuit and method of manufacturing an ultrathin integrated circuit
EP2154713B1 (de) 2008-08-11 2013-01-02 Sensirion AG Verfahren zur Herstellung einer Messvorrichtung mit einer Spannungsverminderungsschicht
JP2010212297A (ja) 2009-03-06 2010-09-24 Toshiba Corp 半導体装置および半導体装置の製造方法
US8736002B2 (en) 2009-11-18 2014-05-27 Sensirion Ag Sensor mounted in flip-chip technology at a substrate edge
EP2502066B1 (de) 2009-11-18 2017-09-27 Sensirion AG In flip-chip-technologie auf einem substrat montierter sensor und dessen herstellung
US20110138882A1 (en) 2009-12-11 2011-06-16 Electronics And Telecommunications Research Institute Semiconductor gas sensor having low power consumption
EP2348292A1 (de) 2010-01-13 2011-07-27 Sensirion AG Sensorvorrichtung
JP5595230B2 (ja) 2010-11-05 2014-09-24 フィガロ技研株式会社 ガスセンサ
EP2482310B1 (de) 2011-01-27 2020-09-23 Sensirion AG Durchkontaktierungen in einem Sensorchip
US8907433B2 (en) 2012-09-28 2014-12-09 Agilent Technologies, Inc. Thin film with improved temperature range
US9379081B2 (en) * 2014-03-24 2016-06-28 King Dragon Nternational Inc. Semiconductor device package and method of the same

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1193227C (zh) * 2000-07-19 2005-03-16 Lg电子株式会社 绝对湿度传感器
CN1279348C (zh) * 2002-03-20 2006-10-11 株式会社电装 电容型湿度传感器
CN1533741A (zh) * 2003-03-31 2004-10-06 ��ʿͨ��ʽ���� 用于指纹识别的半导体装置
EP2481703A1 (de) * 2011-01-27 2012-08-01 Sensirion AG Sensorschutz
EP2620768A1 (de) * 2012-01-25 2013-07-31 Sensirion AG Tragbare Detektionsvorrichtung
CN103969311A (zh) * 2013-01-31 2014-08-06 盛思锐股份公司 化学传感器及用于制造该化学传感器的方法
DE202013102632U1 (de) * 2013-06-19 2013-12-20 Sensirion Ag Sensorbaustein

Also Published As

Publication number Publication date
EP3001186A1 (de) 2016-03-30
KR20160037119A (ko) 2016-04-05
EP3001186B1 (de) 2018-06-06
US9506885B2 (en) 2016-11-29
KR102361998B1 (ko) 2022-02-10
JP2016070931A (ja) 2016-05-09
US20160091446A1 (en) 2016-03-31
CN105466463A (zh) 2016-04-06
JP6713259B2 (ja) 2020-06-24

Similar Documents

Publication Publication Date Title
CN105466463B (zh) 传感器芯片
JP7065094B2 (ja) 指紋感知モジュール及びその方法
EP2720034B1 (de) Integrierte Schaltung mit relativem Feuchtigkeitssensor und Wärmeleitfähigkeits Gassensor
US20210247345A1 (en) Gas Sensor with a Gas Permeable Region
US9105479B2 (en) Integrated circuit including an environmental sensor
JP6129341B2 (ja) 半導体回路上に一体化された容量センサ
KR20150028929A (ko) 정전용량형 습도센서
US7868362B2 (en) SOI on package hypersensitive sensor
JP2016070931A5 (de)
KR20110137900A (ko) 온습도 복합센서 및 그 제조방법
CN110494744B (zh) 湿度传感器
JP6300301B2 (ja) 半導体装置および半導体装置の製造方法
EP3239681B1 (de) Sensorvorrichtung mit einem drucksensor und einem feuchtigkeitssensor
CN106093138B (zh) 通过金属氧化物检测气体的传感器的制造方法及传感器
JP6803579B2 (ja) Memsガスセンサ、memsガスセンサ実装体、memsガスセンサ・パッケージ、memsガスセンサ組立体、及びmemsガスセンサの製造方法
JP2011080833A (ja) 湿度検出センサ
CN109100398B (zh) 一种酒精浓度检测系统封装结构及其制造方法
TWI674653B (zh) 氣體感測器封裝結構
KR20190068267A (ko) 가스 센서
TWI591768B (zh) 封裝結構及其製法
KR20130055819A (ko) 테이프자동본딩 방법을 이용한 습도 센서 제작 방법
JP2009047701A (ja) 高温プラットフォームチップ
JP2017150819A (ja) ガスセンサ
JP2015034718A (ja) 可燃性ガス検出装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant