CN105304447B - 电离室 - Google Patents

电离室 Download PDF

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Publication number
CN105304447B
CN105304447B CN201510204565.6A CN201510204565A CN105304447B CN 105304447 B CN105304447 B CN 105304447B CN 201510204565 A CN201510204565 A CN 201510204565A CN 105304447 B CN105304447 B CN 105304447B
Authority
CN
China
Prior art keywords
ionisation chamber
pipe
opening
inlet portion
quality analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201510204565.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN105304447A (zh
Inventor
福井航
向畑和男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN105304447A publication Critical patent/CN105304447A/zh
Application granted granted Critical
Publication of CN105304447B publication Critical patent/CN105304447B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN201510204565.6A 2014-06-27 2015-04-27 电离室 Expired - Fee Related CN105304447B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014132302A JP6194858B2 (ja) 2014-06-27 2014-06-27 イオン化室
JP2014-132302 2014-06-27

Publications (2)

Publication Number Publication Date
CN105304447A CN105304447A (zh) 2016-02-03
CN105304447B true CN105304447B (zh) 2017-03-29

Family

ID=54931296

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510204565.6A Expired - Fee Related CN105304447B (zh) 2014-06-27 2015-04-27 电离室

Country Status (3)

Country Link
US (1) US9396920B2 (sl)
JP (1) JP6194858B2 (sl)
CN (1) CN105304447B (sl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015208250A1 (de) * 2015-05-05 2016-11-10 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. On-line Massenspektrometer zur Echtzeiterfassung flüchtiger Komponenten aus der Gas- und Flüssigphase zur Prozessanalyse
CN106531609A (zh) * 2016-11-10 2017-03-22 宁波大学 离子束强化装置及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10185876A (ja) * 1996-12-25 1998-07-14 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2002107344A (ja) * 2000-10-04 2002-04-10 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2001343363A (ja) 2000-06-05 2001-12-14 Shimadzu Corp 質量分析装置
US7095019B1 (en) * 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
WO2009124298A2 (en) * 2008-04-04 2009-10-08 Agilent Technologies, Inc. Ion sources for improved ionization
US8242440B2 (en) * 2009-05-01 2012-08-14 Thermo Finnigan Llc Method and apparatus for an ion transfer tube and mass spectrometer system using same
US8058611B2 (en) * 2009-09-23 2011-11-15 Thermo Finnigan Llc System for preventing backflow in an ion source
KR101763444B1 (ko) * 2010-02-12 2017-07-31 고쿠리츠다이가쿠호징 야마나시다이가쿠 이온화 장치 및 이온화 분석 장치
JP2013007639A (ja) * 2011-06-24 2013-01-10 Hitachi High-Technologies Corp 液体クロマトグラフ質量分析装置
JP5802566B2 (ja) * 2012-01-23 2015-10-28 株式会社日立ハイテクノロジーズ 質量分析装置
EP3005401B1 (en) * 2013-06-03 2022-04-06 PerkinElmer Health Sciences, Inc. Ion guide or filters with selected gas conductance

Also Published As

Publication number Publication date
US9396920B2 (en) 2016-07-19
JP2016011847A (ja) 2016-01-21
US20150380226A1 (en) 2015-12-31
JP6194858B2 (ja) 2017-09-13
CN105304447A (zh) 2016-02-03

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20170329

Termination date: 20200427

CF01 Termination of patent right due to non-payment of annual fee