CN105128157B - Manufacturing method for sapphire fingerprint recognition panel - Google Patents

Manufacturing method for sapphire fingerprint recognition panel Download PDF

Info

Publication number
CN105128157B
CN105128157B CN201510339660.7A CN201510339660A CN105128157B CN 105128157 B CN105128157 B CN 105128157B CN 201510339660 A CN201510339660 A CN 201510339660A CN 105128157 B CN105128157 B CN 105128157B
Authority
CN
China
Prior art keywords
crystal
chip
speed
temperature
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510339660.7A
Other languages
Chinese (zh)
Other versions
CN105128157A (en
Inventor
苏凤坚
刘俊
郝正平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangzhou Hui Jing Technology Co., Ltd.
Original Assignee
Jiangsu Sue And Optical Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangsu Sue And Optical Equipment Co Ltd filed Critical Jiangsu Sue And Optical Equipment Co Ltd
Priority to CN201510339660.7A priority Critical patent/CN105128157B/en
Publication of CN105128157A publication Critical patent/CN105128157A/en
Application granted granted Critical
Publication of CN105128157B publication Critical patent/CN105128157B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

The invention relates to a manufacturing method for a sapphire fingerprint recognition panel. The manufacturing method comprises the specific steps of crystal growth, crystal bar drawing, crystal cutting, laser wafer taking, grinding, chamfering, annealing, double-face polishing, film plating, ink smearing, hot drying and the like. According to the manufacturing method for the sapphire fingerprint recognition panel, the quality of finished wafers is high, the rejection rate is low, and the production efficiency is high.

Description

The preparation method of sapphire fingerprint recognition panel
Technical field
The present invention relates to a kind of preparation method of sapphire sheet, more particularly, to a kind of preparation of sapphire fingerprint recognition panel Method, belongs to technical field of sapphire treatment.
Background technology
Fingerprint identification technology is that a people is mapped with his fingerprint, by gathering his fingerprint and pre-saving Fingerprint is compared it is possible to verify his true identity.Obtaining good fingerprint image is a sufficiently complex problem.Cause Be for measurement fingerprint be only fairly small a piece of epidermis, so fingerprint collecting equipment should have resolution good enough to obtain The details of fingerprint, this just the requirement to fingerprint recognition machine scanning panel very high.
With scientific and technological progress, the finger scan panel application of sapphire material is more and more extensive.Sapphire has very well Thermal characteristicss, fabulous electrical characteristic and dielectric property, high intensity, excellent hot attribute and transmission can be kept at high temperature Rate, and anti-chemical corrosion.It is the finger scan panel that raw material is made with sapphire, high definition, third dimension are good, surface is scratch-resistant Wound, customer satisfaction is high.
Chinese patent literature zl201320527794.8 discloses a kind of fingerprint recognition machine, comprising: sapphire fingerprint machine is swept Retouch panel, fingerprint collecting equipment, fingerprint comparison module and feedback of the information equipment, wherein, described sapphire fingerprint machine scanning plane Plate covers on fingerprint collecting equipment, outer for protecting fingerprint machine inner member to be not exposed to, described fingerprint collecting equipment and institute State fingerprint comparison module to be connected, described fingerprint comparison module is connected with described information feedback device.Sapphire crystal is from true Empty ultraviolet, visible, near-infrared, until 5.5 μm of mid-infrared is respectively provided with high optical transmittance, can carry significantly in this, as panel Identification probability of high fingerprint machine, is allowed to be applied to factory, the efficiency of staff attendance can improve in office;Sapphire crystal has Have the hardness that safety glass can not compare and a mechanical strength, resistance to fall, damage resistant, be particularly well-suited to those and be constantly exposed to Damage fingerprint machine used in the canned food of hidden danger and the factory of other hard metal object and workshop condition.But the fingerprint of this invention is known Other panel still suffers from of poor quality, the low problem of yield rate.
Content of the invention
Present invention solves the technical problem that being: propose a kind of one-tenth tablet quality height, percent defective is low, the high sapphire of production efficiency The preparation method of fingerprint recognition panel.
In order to solve above-mentioned technical problem, technical scheme proposed by the present invention is: a kind of fingerprint recognition machine scanning panel Preparation method is it is characterised in that include step in detail below:
Step one, crystal growth;Pure al is loaded in the crucible of crystal growing furnace2o3Raw material, above described crucible It is provided with rotatable and lifting lifting rod, the lower end of lifting rod is folded with the seed crystal of c crystal orientation;By evacuation in crystal growing furnace simultaneously It is passed through protective gas, be warming up to 2100~2200 DEG C so that al2o3Melting, controls the liquid level temperature of melt to be 2055 DEG C, by seed Crystalline substance is placed in al2o3The upper surface of melt makes itself and melt contacts, continues 0.5~1h;After seed crystal is fully stained with profit with melt, lifting And rotate seed crystal, thus realize necking down to expand shoulder isodiametric growth;In the necking down stage, the liquid level temperature of melt is controlled to be 2050 DEG C, Seed crystal is lifted upwards with the speed of 3~5mm/h, seed crystal is rotated with the speed of 45~48r/min;Expand the shoulder stage, control melt Liquid level temperature is 2048 DEG C, lifts seed crystal upwards with the speed of 8~10mm/h, rotates seed crystal with the speed of 50~55r/min;Deng In the footpath stage, control the liquid level temperature of melt to be 2052 DEG C, seed crystal is lifted upwards with the speed of 5~8mm/h, with 48~50r/min Speed rotate seed crystal;After crystal growth terminates, the temperature in crystal growing furnace is down to 1580~1680 DEG C, then to crystal Being made annealing treatment, controlling temperature with the speed slow cooling of 80~100 DEG C/h and to continue 18~22h, thus obtaining crystal;
Step 2, crystal draw rod;Crystal being oriented, then carrying out drawing rod using drawing excellent machine, thus obtaining c to crystalline substance Rod;
Step 3, crystal-cut;Using carborundum line cutting equipment, crystal bar is cut, thus obtaining chip;
Step 4, laser take piece;Chip after polishing is put in laser cutting machine and is passed through protective gas, chip is pressed Demand cuts into correspondingly sized;
Step 5, grinding;Using grinder, chip is ground;During grinding, add lapping liquid, abrasive disk to chip plus It is depressed into 0.02~0.022mpa, the rotating speed of abrasive disk is 1000~1200r/min;Washes of absolute alcohol is used after the completion of grinding;Institute State lapping liquid component to include by weight percentage: 0.5~2% granular size is 10~20 μm of cubic boron nitride powder, 14~ 16% alkylphenol polyoxyethylene, 4~6% glycerol, 9~11% polypropylene glycol 400, remaining is deionized water;
Step 6, chamfering;Skive using Digit Control Machine Tool carries out chamfered to the corner of chip;
Step 7, annealing;Place a wafer in annealing furnace, heated up with the speed of 180~220 DEG C/h and temperature is risen to 1600 DEG C, it is incubated 2~6h respectively at 300 DEG C, 800 DEG C, 1600 DEG C during intensification, is then lowered the temperature with the temperature of 200 DEG C/h, fall It is incubated 2~3h respectively at 1000 DEG C, 500 DEG C when warm and be cooled to room temperature taking-up;
Step 8, double side chemical polishing;First with dehydrated alcohol, chip is carried out, then the chip after cleaning is put into Fixing in Twp-sided polishing machine;During polishing, add polishing fluid, polishing disk is forced into 0.12~0.15 mpa to chip, polishing disk Rotating speed is 1000~1500r/min, by after polished chip washes of absolute alcohol, carry out natural cooling at room temperature;Institute State polishing fluid component to include by weight percentage: 0.5~2% granular size is 1~6 μm of cubic boron nitride powder, 14~ 16% alkylphenol polyoxyethylene, 4~6% glycerol, the nano silicon of 9~11% polypropylene glycol 400,0.5~2%, Make the alkaline solution for 11.0~13.0 for the polishing fluid ph value, remaining is deionized water;It is continuously replenished alkalescence molten in polishing process Liquid is to keep the ph value of polishing fluid;
Step 9, plating superhard film;Using magnetron sputtering coater, nitrogen is ionized into Nitrogen ion, then is bombarded with Nitrogen ion Silicon target, forms nitridation silicon cladding in wafer surface;
Step 10, inking;Chip after plated film is covered hollowed-out board, brushes ink in the edge of chip and repeat to brush Apply three layers;
Step 11, baking the affected part after applying some drugs;The chip being painted with ink is put into after baking the affected part after applying some drugs 2~3h in baking the affected part after applying some drugs machine, is air cooled to room temperature.
Technique scheme is improved to: in described step one, the temperature in crystal growing furnace is down to 1600 DEG C, then Crystal is made annealing treatment, controls temperature with the speed slow cooling of 100 DEG C/h and to continue 22h.
Technique scheme is improved to: in described step 3, a diameter of 0.14~0.16mm of carborundum line, Buddha's warrior attendant On sand line, the particle diameter of diamond is 30~40 μm, carborundum line in cutting with the motion of the speed of 12~15m/s, crystal phase for The translational speed of carborundum line is 0.2~0.3mm/min, constantly sprays cutting liquid, described cutting liquid to carborundum line during cutting In containing particle diameter be 20~30 μm diamond particles and corundum in granules that particle diameter is 50~60 μm.
Technique scheme is improved to: in described step 4, a diameter of 0.015~0.02mm of laser beam, cutting Speed is 3~5mm/s.
Technique scheme is improved to: in described step 4, described protective gas is nitrogen.
Technique scheme is improved to: in described step 5, the oxygen being 3~6 μm containing particle diameter in described lapping liquid Change alumina particles.
Technique scheme is improved to: in described step 7, during intensification, be incubated 2h at 300 DEG C, be incubated at 800 DEG C 3h, is incubated 4h at 1600 DEG C.
Technique scheme is improved to: in described step 8, described alkaline solution is koh.
Technique scheme is improved to: in described step 8, described polishing fluid ph value is 12.0.
Technique scheme is improved to: in described step 8, polishing disk is forced into 0.135mpa to chip.
The present invention has a positive effect:
(1) the fingerprint recognition panel preparation method of the present invention, first laser takes piece to grind again, polishes, and can improve grinding, throw The production efficiency of light, because sapphire hardness is big, must apply larger pressure during polishing, annealing before polishing. is conducive to disappearing Except internal stress produced by the machining operation such as wire cutting, grinding so that chip unsuitable fragmentation in polishing, effectively improve into Product rate.
(2) the fingerprint recognition panel preparation method of the present invention, strictly controls interface temperature during crystal growth, draws high speed Degree, rotary speed and annealing parameter, interface temperature is controlled at 2048~2052 DEG C, draws high speed controlling in 3~10mm/h, revolves Rotary speed controls in 45~55r/min, and annealing temperature controls at 1580~1680 DEG C (preferably 1600 DEG C), with 80~100 DEG C/h Speed slow cooling and continue 18~22h so that the production capacity of crystal is high, defect concentration is low, and quality is good, high yield rate, Production cost can be greatly reduced.
(3) the fingerprint recognition panel preparation method of the present invention, strict control grind and the parameter of polishing and lapping liquid and The composition of polishing fluid, is conducive to improving the efficiency ground and polish, and improves grinding and the yield rate of polishing, the chip knot prepared Structure is complete, no physical damnification, and surface is fine and smooth, and smooth, deformation is little.In lapping liquid and polishing fluid, appropriate cubic boron nitride powder Serve as abrasive material, hardness is high, wearability is good;It is outstanding that alkylphenol polyoxyethylene, glycerol, polypropylene glycol 400 and deionized water are formed Supernatant liquid viscosity and interfacial film stable in properties so that abrasive suspension is stable, good evenness, will not glue simultaneously, be conducive to improving grind and The quality of polishing and efficiency.Appropriate alkylphenol polyoxyethylene is a kind of nonionic surfactant, and its stable in properties has The multiple performances such as dispersion, emulsifying, moistening, are that suspension obtains the topmost composition of excellent properties;Glycerol proportion is suitable, with water and Organic solution has good dissolubility, is especially suitable for as auxiliary dispersants;Polypropylene glycol 400 has the work of emulsifying, moistening With, and can effectively thickening, the effectively viscosity of lifting suspension and interface film character.In addition, containing appropriate in polishing fluid Nanometer sio2, epigranular, good dispersion, planarization efficiency are high.It is alkalescence that alkaline solution koh makes polishing fluid, by chemistry Corrosion auxiliary polishing, thus polishing effect is more preferably, polishing efficiency is more preferable.In order to keep the stability of polishing fluid, thus ensureing to throw The efficiency of light and quality, it is necessary to constantly supplement alkaline solution, maintain polishing fluid ph value to be basically unchanged.
(4) the fingerprint recognition panel preparation method of the present invention, by brushing three layers of ink and then drying so that the side of chip Edge is light tight, can be effectively prevented light and enter from the side of chip, imaging is impacted.
(5) the fingerprint recognition panel of the present invention is made up of base material using sapphire, because sapphire hardness is high, wearability Good so that touch Panel is easy to wear and scratch;Sapphire c is 11.4 to dielectric constant, and a to m to being 9.4, this C is adopted to seed crystal it is ensured that the requirement to dielectric constant for the fingerprint recognition panel during bright crystal growth.By the sapphire of the present invention The fingerprint recognition panel that fingerprint recognition panel preparation method is made, highly polished, and become tablet quality high, percent defective is low, produces effect Rate is high, has a extensive future.
Specific embodiment
Embodiment 1
The sapphire fingerprint recognition panel preparation method of the present embodiment specifically includes following steps:
Step one, crystal growth;Pure al is loaded in the crucible of crystal growing furnace2o3Raw material, above described crucible It is provided with rotatable and lifting lifting rod, the lower end of lifting rod is folded with the seed crystal of c crystal orientation;By evacuation in crystal growing furnace simultaneously It is passed through protective gas, be warming up to 2200 DEG C so that al2o3Melting, controls the liquid level temperature of melt to be 2055 DEG C, seed crystal is placed in al2o3The upper surface of melt makes itself and melt contacts, continues 1h;After seed crystal is fully stained with profit with melt, lifts and rotate seed crystal, Thus realizing necking down to expand shoulder isodiametric growth;In the necking down stage, the liquid level temperature of melt is controlled to be 2050 DEG C, with the speed of 5mm/h Degree lifts seed crystal upwards, rotates seed crystal with the speed of 48r/min;Expand the shoulder stage, control the liquid level temperature of melt to be 2048 DEG C, with The speed of 10mm/h lifts seed crystal upwards, rotates seed crystal with the speed of 55r/min;In the isometrical stage, control the liquid level temperature of melt For 2052 DEG C, seed crystal is lifted upwards with the speed of 8mm/h, seed crystal is rotated with the speed of 50r/min;After crystal growth terminates, Temperature in crystal growing furnace is down to 1680 DEG C, then crystal is made annealing treatment, control temperature to delay with the speed of 100 DEG C/h Slowly lower the temperature and continue 22h, thus obtaining crystal;
Step 2, crystal draw rod;Crystal being oriented, then carrying out drawing rod using drawing excellent machine, thus obtaining c to crystalline substance Rod;
Step 3, crystal-cut;Using carborundum line cutting equipment, crystal bar is cut, thus obtaining chip;
Step 4, laser take piece;Chip after polishing is put in laser cutting machine and is passed through protective gas, chip is pressed Demand cuts into correspondingly sized;
Step 5, grinding;Using grinder, chip is ground;During grinding, add lapping liquid, abrasive disk to chip plus It is depressed into 0.022mpa, the rotating speed of abrasive disk is 1200r/min;Washes of absolute alcohol is used after the completion of grinding;Described lapping liquid component Include by weight percentage: 2% granular size is 20 μm of cubic boron nitride powder, 16% alkylphenol polyoxyethylene, 6% Glycerol, 11% polypropylene glycol 400, remaining be deionized water;
Step 6, chamfering;Skive using Digit Control Machine Tool carries out chamfered to the corner of chip;
Step 7, annealing;Place a wafer in annealing furnace, heated up with the speed of 220 DEG C/h and temperature is risen to 1600 DEG C, during intensification 300 DEG C, 800 DEG C, 1600 DEG C respectively be incubated 6h, then lowered the temperature with the temperature of 200 DEG C/h, during cooling 1000 DEG C, 500 DEG C are incubated 3h respectively and are cooled to room temperature taking-up;
Step 8, double side chemical polishing;First with dehydrated alcohol, chip is carried out, then the chip after cleaning is put into Fixing in Twp-sided polishing machine;During polishing, add polishing fluid, polishing disk is forced into 0.15 mpa to chip, and the rotating speed of polishing disk is 1500r/min, by after polished chip washes of absolute alcohol, carry out natural cooling at room temperature;Described polishing fluid component Include by weight percentage: 2% granular size is 6 μm of cubic boron nitride powder, 16% alkylphenol polyoxyethylene, 6% Glycerol, 11% polypropylene glycol 400, so that the alkaline solution for 13.0 for the polishing fluid ph value, remaining is 2% nano silicon Deionized water;It is continuously replenished alkaline solution to keep the ph value of polishing fluid in polishing process;
Step 9, plating superhard film;Using magnetron sputtering coater, nitrogen is ionized into Nitrogen ion, then is bombarded with Nitrogen ion Silicon target, forms nitridation silicon cladding in wafer surface;
Step 10, inking;Chip after plated film is covered hollowed-out board, brushes ink in the edge of chip and repeat to brush Apply three layers;
Step 11, baking the affected part after applying some drugs;The chip being painted with ink is put into after baking the affected part after applying some drugs 3h in baking the affected part after applying some drugs machine, is air cooled to room temperature.
Embodiment 2
The sapphire fingerprint recognition panel preparation method of the present embodiment specifically includes following steps:
Step one, crystal growth;Pure al is loaded in the crucible of crystal growing furnace2o3Raw material, above described crucible It is provided with rotatable and lifting lifting rod, the lower end of lifting rod is folded with the seed crystal of c crystal orientation;By evacuation in crystal growing furnace simultaneously It is passed through protective gas, be warming up to 2100 DEG C so that al2o3Melting, controls the liquid level temperature of melt to be 2055 DEG C, seed crystal is placed in al2o3The upper surface of melt makes itself and melt contacts, continues 0.5h;After seed crystal is fully stained with profit with melt, lifts and rotate seed Crystalline substance, thus realize necking down to expand shoulder isodiametric growth;In the necking down stage, the liquid level temperature of melt is controlled to be 2050 DEG C, with 3mm/h's Speed lifts seed crystal upwards, rotates seed crystal with the speed of 45r/min;Expand the shoulder stage, control the liquid level temperature of melt to be 2048 DEG C, Seed crystal is lifted upwards with the speed of 8mm/h, seed crystal is rotated with the speed of 50r/min;In the isometrical stage, control the liquid level temperature of melt For 2052 DEG C, seed crystal is lifted upwards with the speed of 5mm/h, seed crystal is rotated with the speed of 48r/min;After crystal growth terminates, Temperature in crystal growing furnace is down to 1580 DEG C, then crystal is made annealing treatment, control temperature to delay with the speed of 80 DEG C/h Slowly lower the temperature and continue 18h, thus obtaining crystal;
Step 2, crystal draw rod;Crystal being oriented, then carrying out drawing rod using drawing excellent machine, thus obtaining c to crystalline substance Rod;
Step 3, crystal-cut;Using carborundum line cutting equipment, crystal bar is cut, thus obtaining chip;
Step 4, laser take piece;Chip after polishing is put in laser cutting machine and is passed through protective gas, chip is pressed Demand cuts into correspondingly sized;
Step 5, grinding;Using grinder, chip is ground;During grinding, add lapping liquid, abrasive disk to chip plus It is depressed into 0.02mpa, the rotating speed of abrasive disk is 1000r/min;Washes of absolute alcohol is used after the completion of grinding;Described lapping liquid component is pressed Percentage by weight includes: 0.5% granular size is 10 μm of cubic boron nitride powder, 14% alkylphenol polyoxyethylene, and 4% Glycerol, 9% polypropylene glycol 400, remaining be deionized water;
Step 6, chamfering;Skive using Digit Control Machine Tool carries out chamfered to the corner of chip;
Step 7, annealing;Place a wafer in annealing furnace, heated up with the speed of 180 DEG C/h and temperature is risen to 1600 DEG C, during intensification 300 DEG C, 800 DEG C, 1600 DEG C respectively be incubated 2h, then lowered the temperature with the temperature of 200 DEG C/h, during cooling 1000 DEG C, 500 DEG C are incubated 2h respectively and are cooled to room temperature taking-up;
Step 8, double side chemical polishing;First with dehydrated alcohol, chip is carried out, then the chip after cleaning is put into Fixing in Twp-sided polishing machine;During polishing, add polishing fluid, polishing disk is forced into 0.12 mpa to chip, and the rotating speed of polishing disk is 1000r/min, by after polished chip washes of absolute alcohol, carry out natural cooling at room temperature;Described polishing fluid component Include by weight percentage: 0.5% granular size is 1 μm of cubic boron nitride powder, 14% alkylphenol polyoxyethylene, 4% Glycerol, 9% polypropylene glycol 400,0.5% nano silicon so that the alkaline solution for 11.0 for the polishing fluid ph value, remaining For deionized water;It is continuously replenished alkaline solution to keep the ph value of polishing fluid in polishing process;
Step 9, plating superhard film;Using magnetron sputtering coater, nitrogen is ionized into Nitrogen ion, then is bombarded with Nitrogen ion Silicon target, forms nitridation silicon cladding in wafer surface;
Step 10, inking;Chip after plated film is covered hollowed-out board, brushes ink in the edge of chip and repeat to brush Apply three layers;
Step 11, baking the affected part after applying some drugs;The chip being painted with ink is put into after baking the affected part after applying some drugs 2h in baking the affected part after applying some drugs machine, is air cooled to room temperature.
Embodiment 3
The sapphire fingerprint recognition panel preparation method of the present embodiment specifically includes following steps:
Step one, crystal growth;Pure al is loaded in the crucible of crystal growing furnace2o3Raw material, above described crucible It is provided with rotatable and lifting lifting rod, the lower end of lifting rod is folded with the seed crystal of c crystal orientation;By evacuation in crystal growing furnace simultaneously It is passed through protective gas, be warming up to 2150 DEG C so that al2o3Melting, controls the liquid level temperature of melt to be 2055 DEG C, seed crystal is placed in al2o3The upper surface of melt makes itself and melt contacts, continues 1h;After seed crystal is fully stained with profit with melt, lifts and rotate seed crystal, Thus realizing necking down to expand shoulder isodiametric growth;In the necking down stage, the liquid level temperature of melt is controlled to be 2050 DEG C, with 3~5mm/h's Speed lifts seed crystal upwards, rotates seed crystal with the speed of 46r/min;Expand the shoulder stage, control the liquid level temperature of melt to be 2048 DEG C, Seed crystal is lifted upwards with the speed of 9mm/h, seed crystal is rotated with the speed of 50r/min;In the isometrical stage, control the liquid level temperature of melt For 2052 DEG C, seed crystal is lifted upwards with the speed of 5mm/h, seed crystal is rotated with the speed of 48r/min;After crystal growth terminates, Temperature in crystal growing furnace is down to 1600 DEG C, then crystal is made annealing treatment, control temperature to delay with the speed of 90 DEG C/h Slowly lower the temperature and continue 20h, thus obtaining crystal;
Step 2, crystal draw rod;Crystal being oriented, then carrying out drawing rod using drawing excellent machine, thus obtaining c to crystalline substance Rod;
Step 3, crystal-cut;Using carborundum line cutting equipment, crystal bar is cut, thus obtaining chip;
Step 4, laser take piece;Chip after polishing is put in laser cutting machine and is passed through protective gas, chip is pressed Demand cuts into correspondingly sized;
Step 5, grinding;Using grinder, chip is ground;During grinding, add lapping liquid, abrasive disk to chip plus It is depressed into 0.02mpa, the rotating speed of abrasive disk is 1100r/min;Washes of absolute alcohol is used after the completion of grinding;Described lapping liquid component is pressed Percentage by weight includes: 1% granular size is 15 μm of cubic boron nitride powder, 15% alkylphenol polyoxyethylene, 5% Glycerol, 10% polypropylene glycol 400, remaining is deionized water;
Step 6, chamfering;Skive using Digit Control Machine Tool carries out chamfered to the corner of chip;
Step 7, annealing;Place a wafer in annealing furnace, heated up with the speed of 200 DEG C/h and temperature is risen to 1600 DEG C, during intensification 300 DEG C, 800 DEG C, 1600 DEG C respectively be incubated 4h, then lowered the temperature with the temperature of 200 DEG C/h, during cooling 1000 DEG C, 500 DEG C are incubated 2.5h respectively and are cooled to room temperature taking-up;
Step 8, double side chemical polishing;First with dehydrated alcohol, chip is carried out, then the chip after cleaning is put into Fixing in Twp-sided polishing machine;During polishing, add polishing fluid, polishing disk is forced into 0.13 mpa to chip, and the rotating speed of polishing disk is 1200r/min, by after polished chip washes of absolute alcohol, carry out natural cooling at room temperature;Described polishing fluid component Include by weight percentage: 1% granular size is 3 μm of cubic boron nitride powder, 15% alkylphenol polyoxyethylene, 5% Glycerol, 10% polypropylene glycol 400, so that the alkaline solution for 12.0 for the polishing fluid ph value, remaining is 1% nano silicon Deionized water;It is continuously replenished alkaline solution to keep the ph value of polishing fluid in polishing process;
Step 9, plating superhard film;Using magnetron sputtering coater, nitrogen is ionized into Nitrogen ion, then is bombarded with Nitrogen ion Silicon target, forms nitridation silicon cladding in wafer surface;
Step 10, inking;Chip after plated film is covered hollowed-out board, brushes ink in the edge of chip and repeat to brush Apply three layers;
Step 11, baking the affected part after applying some drugs;The chip being painted with ink is put into after baking the affected part after applying some drugs 2h in baking the affected part after applying some drugs machine, is air cooled to room temperature.
The preparation method of the sapphire fingerprint recognition panel of the present invention is not limited to the particular technique described in above-described embodiment Scheme, all technical schemes using equivalent formation are the protection domain of application claims.

Claims (9)

1. a kind of preparation method of sapphire fingerprint recognition panel is it is characterised in that include step in detail below:
Step one, crystal growth;Pure al is loaded in the crucible of crystal growing furnace2o3Raw material, is provided with above described crucible Lifting rod that is rotatable and lifting, the lower end of lifting rod is folded with the seed crystal of c crystal orientation;By evacuation in crystal growing furnace and be passed through Protective gas, is warming up to 2100~2200 DEG C so that al2o3Melting, controls the liquid level temperature of melt to be 2055 DEG C, seed crystal is put In al2o3The upper surface of melt makes itself and melt contacts, continues 0.5~1h;After seed crystal is fully stained with profit with melt, lifts and turn Dynamic seed crystal, thus realize necking down to expand shoulder isodiametric growth;In the necking down stage, the liquid level temperature of melt is controlled to be 2050 DEG C, with 3~ The speed of 5mm/h lifts seed crystal upwards, rotates seed crystal with the speed of 45~48r/min;Expand the shoulder stage, control the liquid level temperature of melt Spend for 2048 DEG C, seed crystal is lifted upwards with the speed of 8~10mm/h, seed crystal is rotated with the speed of 50~55r/min;Isometrical rank Section, controls the liquid level temperature of melt to be 2052 DEG C, lifts seed crystal upwards with the speed of 5~8mm/h, with the speed of 48~50r/min Degree rotates seed crystal;After crystal growth terminates, the temperature in crystal growing furnace is down to 1580~1680 DEG C, then crystal is carried out Annealing, controls temperature with the speed slow cooling of 80~100 DEG C/h and to continue 18~22h, thus obtaining crystal;
Step 2, crystal draw rod;Crystal being oriented, then carrying out drawing rod using drawing excellent machine, thus obtaining c to crystal bar;
Step 3, crystal-cut;Using carborundum line cutting equipment, crystal bar is cut, thus obtaining chip;
Step 4, laser take piece;Chip after polishing is put in laser cutting machine and is passed through protective gas, by chip on demand Cut into correspondingly sized;
Step 5, grinding;Using grinder, chip is ground;During grinding, add lapping liquid, abrasive disk is forced into chip 0.02~0.022mpa, the rotating speed of abrasive disk is 1000~1200r/min;Washes of absolute alcohol is used after the completion of grinding;Described grind Grinding fluid component includes: 0.5~2% granular size is 10~20 μm of cubic boron nitride powder, 14~16% alkyl phenol polyoxy Vinyl Ether, 4~6% glycerol, 9~11% polypropylene glycol 400, remaining is deionized water;
Step 6, chamfering;Skive using Digit Control Machine Tool carries out chamfered to the corner of chip;
Step 7, annealing;Place a wafer in annealing furnace, heated up with the speed of 180~220 DEG C/h and temperature is risen to 1600 DEG C, it is incubated 2~6h respectively at 300 DEG C, 800 DEG C, 1600 DEG C during intensification, then lowered the temperature with the temperature of 200 DEG C/h, during cooling It is incubated 2~3h respectively at 1000 DEG C, 500 DEG C and be cooled to room temperature taking-up;
Step 8, double side chemical polishing;First with dehydrated alcohol, chip is carried out, then the chip after cleaning is put into two-sided Fixing in buffing machine;During polishing, add polishing fluid, polishing disk is forced into 0.12~0.15 mpa, the rotating speed of polishing disk to chip For 1000~1500r/min, by after polished chip washes of absolute alcohol, carry out natural cooling at room temperature;Described throwing Light liquid component includes: 0.5~2% granular size is 1~6 μm of cubic boron nitride powder, 14~16% alkyl phenol polyoxy second Alkene ether, 4~6% glycerol, the nano silicon of 9~11% polypropylene glycol 400,0.5~2% is so that polishing fluid ph value is 11.0~13.0 alkaline solution, remaining is deionized water;It is continuously replenished alkaline solution to keep polishing fluid in polishing process Ph value;
Step 9, plating superhard film;Using magnetron sputtering coater, nitrogen is ionized into Nitrogen ion, then bombards silicon target with Nitrogen ion Material, forms nitridation silicon cladding in wafer surface;
Step 10, inking;Chip after plated film is covered hollowed-out board, brushes ink and repeat to brush three in the edge of chip Layer;
Step 11, baking the affected part after applying some drugs;The chip being painted with ink is put into after baking the affected part after applying some drugs 2~3h in baking the affected part after applying some drugs machine, is air cooled to room temperature.
2. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step one, Temperature in crystal growing furnace is down to 1600 DEG C, then crystal is made annealing treatment, control temperature with the speed of 100 DEG C/h Slow cooling simultaneously continues 22h.
3. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 3, A diameter of 0.14~0.16mm of carborundum line, on carborundum line, the particle diameter of diamond is 30~40 μm, and carborundum line is in cutting When be 0.2~0.3mm/min with the motion of the speed of 12~15m/s, crystal phase for the translational speed of carborundum line, during cutting not Break to carborundum line spray cutting liquid, in described cutting liquid containing particle diameter be 20~30 μm diamond particles and particle diameter be 50 ~60 μm of corundum in granules.
4. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 4, A diameter of 0.015~0.02mm of laser beam, cutting speed is 3~5mm/s.
5. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 4, Described protective gas is nitrogen.
6. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 7, During intensification, it is incubated 2h at 300 DEG C, is incubated 3h at 800 DEG C, be incubated 4h at 1600 DEG C.
7. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 8, Described alkaline solution is koh.
8. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 8, Described polishing fluid ph value is 12.0.
9. according to claim 1 sapphire fingerprint recognition panel preparation method it is characterised in that: in described step 8, Polishing disk is forced into 0.135mpa to chip.
CN201510339660.7A 2015-06-18 2015-06-18 Manufacturing method for sapphire fingerprint recognition panel Active CN105128157B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510339660.7A CN105128157B (en) 2015-06-18 2015-06-18 Manufacturing method for sapphire fingerprint recognition panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510339660.7A CN105128157B (en) 2015-06-18 2015-06-18 Manufacturing method for sapphire fingerprint recognition panel

Publications (2)

Publication Number Publication Date
CN105128157A CN105128157A (en) 2015-12-09
CN105128157B true CN105128157B (en) 2017-01-25

Family

ID=54713893

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510339660.7A Active CN105128157B (en) 2015-06-18 2015-06-18 Manufacturing method for sapphire fingerprint recognition panel

Country Status (1)

Country Link
CN (1) CN105128157B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106181747B (en) * 2016-06-13 2018-09-04 江苏吉星新材料有限公司 A kind of large-size sapphire ultrathin double-face polishing window slice processing method
CN107868937B (en) * 2017-09-29 2020-06-19 江西沃格光电股份有限公司 Anti-dazzle sapphire screen and preparation method thereof
CN111775354B (en) * 2020-06-19 2021-10-01 山东省科学院新材料研究所 Method for processing and manufacturing potassium tantalate niobate monocrystal substrate element
CN114101901B (en) * 2021-12-06 2024-01-05 苏州晶生新材料有限公司 Processing technology capable of integrating micro-nano optical structure

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101857970B (en) * 2010-04-16 2012-11-21 镇江市丹徒区黄墟润蓝晶体制造厂 Growing method of large-size flaky sapphire crystals
CN104111553B (en) * 2013-04-22 2017-09-05 瀚宇彩晶股份有限公司 Touch control liquid crystal panel and its manufacture method
CN104120487A (en) * 2013-08-23 2014-10-29 江苏中电振华晶体技术有限公司 Growth method and growth equipment of platelike sapphire crystals
CN104088017A (en) * 2014-06-20 2014-10-08 常州市好利莱光电科技有限公司 Sapphire mobile phone panel processing method
CN104708724B (en) * 2015-03-09 2016-06-15 江苏苏博瑞光电设备科技有限公司 A kind of sapphire window sheet production technique

Also Published As

Publication number Publication date
CN105128157A (en) 2015-12-09

Similar Documents

Publication Publication Date Title
CN105128157B (en) Manufacturing method for sapphire fingerprint recognition panel
CN104999365B (en) Sapphire wafer abrasive polishing method
TWI656036B (en) Cover glass
TW563115B (en) Substrate for information recording media and manufacturing method thereof, information recording medium, and starting material glass plate
CN105141812B (en) Production method of sapphire camera window sheet
EP2712851B1 (en) Method of producing a transparent diffusive oled substrate
US10081569B2 (en) Process for producing glass substrate, and glass substrate
CN101016439A (en) Chemical mechanical polishing pulp for sapphire substrate underlay
CN104977638B (en) The preparation method of cutoff filter
CN105171941A (en) Preparing method for sapphire touch screen panel
CN109290853A (en) A kind of preparation method of ultra-thin sapphire sheet
CN108747597A (en) A kind of alumina ceramic substrate method of surface finish
CN102172859A (en) Processing method for ultrathin plain glass based on consolidated abrasive
Duan et al. Surface roughness of optical quartz substrate by chemical mechanical polishing
CN105160286A (en) Preparation method of sapphire fingerprint identification panel
CN105150031B (en) The production method of sapphire Rimless touch Panel
US8663781B2 (en) Ceramic article and method for making same, and electronic device using same
CN105171940B (en) Manufacturing method for sapphire frame-free touch screen panel
CN105171583A (en) Preparing method for sapphire touch screen panel
CN110577412A (en) Antifouling treatment process for soft-light brick
CN105154968A (en) Preparation method for sapphire LED filament substrate
CN106346317A (en) Method for processing and preparing sapphire wafer
CN105150394B (en) The production method of sapphire touch Panel
CN108485532A (en) The sapphire polishing liquid and its polishing process of high surface smoothness
CN105185877A (en) Sapphire LED filament preparation method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20180105

Address after: Changshou District, Chongqing city Wei 401220 No. 13 Building 2 3 unit 1-1

Patentee after: Chen Deyan

Address before: 225775 Xinghua City Economic Development Zone, Taizhou, east of the road on the south side of science and technology innovation center, building No. 1 plant

Patentee before: JIANGSU SUE AND OPTICAL EQUIPMENT CO., LTD.

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20180524

Address after: 510440 one of the six alley of Taoyuan North Temple Park, Shima village, Yun He street, Baiyun District, Guangzhou, Guangdong, China. 2

Patentee after: Guangzhou Hui Jing Technology Co., Ltd.

Address before: 401220 3, unit 2, No. 13, Wei Gu Road, Changshou District, Chongqing, 1-1

Patentee before: Chen Deyan