CN105096783A - Detection equipment and probe component thereof - Google Patents
Detection equipment and probe component thereof Download PDFInfo
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- CN105096783A CN105096783A CN201510479425.XA CN201510479425A CN105096783A CN 105096783 A CN105096783 A CN 105096783A CN 201510479425 A CN201510479425 A CN 201510479425A CN 105096783 A CN105096783 A CN 105096783A
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- probe
- fixation kit
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Abstract
The invention relates to detection equipment and a probe component thereof. The probe component comprises a fixing plate, a circuit board, probes and elastic members. The circuit board and the fixing plate are fixed. The circuit board is provided with test connecting parts. One end of each probe is connected with the test connecting parts, and the other end is used for being contact with the test points of a product so as to perform circuit testing on the product. The probes and the test connecting parts are elastically connected by the elastic members so that the probes and the test points of the product are enabled to be elastically contacted and scratching of the probes to the test points of the product can be reduced and poor contact can be avoided, and thus test precision and quality of the tested product can be enhanced.
Description
Technical field
The present invention relates to testing apparatus field, particularly relate to a kind of probe assembly and use the checkout equipment of this probe assembly.
Background technology
Along with LCD (LiquidCrystalDisplay, liquid crystal display) development of display technique, LTPS (LowTemperaturePoly-silicon, low-temperature polysilicon silicon technology) process faceplate is considered to one of current global high-end applications market main flow display technique most with prospects.There is the advantages such as high resolving power, reaction velocity are fast, high brightness, high aperture, low-power consumption, be widely used in the small-medium size display fields such as middle and high end smart mobile phone, panel computer.But because the array process complexity in LTPS process faceplate causes product yield not high, shipment demand gap is large.And array tester inspection can monitor LTPS processing procedure, feedback produces line, reaches the object improving constantly yield.So large voluminous line all can carry out the inspection of use array tester to product.
Present industry LTPS/AMOLED (Active-matrixorganiclightemittingdiode, active matrix organic light-emitting diode (AMOLED) panel) use Full connected type array tester testing equipment, mainly comprise COG (chipongrass, glass-chip) mode, (Full-PinContactProbing, full pin probe) and Demux (demodulation multiplexer) mode, in test point engaged test process in probe of the prior art and LCD display, probe needs enough amounts of sliding can to contact with the test point in the panel of LTPS technique, for ensureing test result degree of accuracy, there is not drain contact phenomenon.The probe of stationary probe needs enough pin card amounts of sliding guarantee probe to contact completely with test point, but because probe and test point are all meticulous, be difficult to control and the pin card amount of sliding when judging that probe will contact with test point, slide too fast, easily scrape damage test point, slided and slowly easily take for probe and all contact with test point, and caused occurring partial test point test leakage phenomenon.
Summary of the invention
The invention provides a kind of checkout equipment and probe assembly thereof, mainly solve prior art and carrying out in test process to the panel of LTPS technique, easily occur when probe contacts with test point that probe is scraped and damage the technical matters such as test point and contact test leakage.
For solving the problems of the technologies described above, the technical scheme that the present invention adopts is: provide a kind of probe fixation kit, it comprises fixed head, circuit board, probe and elastic component, and circuit board and fixed head fix, and circuit board has test connecting portion; Probe one end is connected with test connecting portion, and the other end is used for contacting with the test point of product, to carry out circuit test to product; Probe is connected with test connecting portion elasticity by elastic component, damages and loose contact scraping of the test point of product to make the test point Elastic Contact of probe and product thus to reduce probe.
Wherein, probe is multiple, and accordingly, test connecting portion is multiple, and multiple test connecting portion array arrangement is on circuit board.
Wherein, elastic component is multiple, with probe one_to_one corresponding.
Wherein, elastic component is one piece, and multiple probe array is on elastic component.
Wherein, elastic component is more than two pieces, and more than two pieces elastic component arrangements are located on circuit board, and wherein, every block elastic component is provided with plural probe.
Wherein, elastic component is spring.
Wherein, elastic component is silicagel pad or rubber blanket.
Wherein, fixed head has through hole, and circuit board is inserted in the inside of fixed head, elastic component be located at through hole and with abut to circuit board.
Wherein, probe fixation kit also comprises survey face camera and surveys high camera, surveys face camera, is located at the side of probe and is vertical at fixed head, for feeding back the positional information of measured object to facilitate the test point contraposition of probe and product; Survey the side that high camera is vertical at fixed head, for the environmental information of height residing for feedback probe fixation kit to facilitate the test point rapid-aligning of probe and product.
For solving the problems of the technologies described above, another technical solution used in the present invention is: provide a kind of array substrate detecting device, and array substrate detecting device comprises above-mentioned probe fixation kit.
The invention has the beneficial effects as follows: the situation being different from prior art, checkout equipment of the present invention and probe assembly thereof are connected by elastic component elasticity with test connecting portion at probe, when contacting with the test point of product to make probe, there is certain elasticity amount of sliding, thus reduce probe scraping damage and avoiding occurring loose contact phenomenon the test point of product, improve the quality of measuring accuracy and test product.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme in the embodiment of the present invention, below the accompanying drawing used required in describing embodiment is briefly described, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings, wherein:
Fig. 1 is the schematic cross-section of probe fixation kit one embodiment of the present invention;
Fig. 2 is the schematic cross-section of another embodiment of probe fixation kit of the present invention;
Fig. 3 is the schematic cross-section of another embodiment of probe fixation kit of the present invention;
Fig. 4 is the schematic cross-section of another embodiment of probe fixation kit of the present invention;
Fig. 4 a is the A cross section enlarged diagram of the probe fixation kit shown in Fig. 4;
Fig. 5 is the schematic cross-section of another embodiment of probe fixation kit of the present invention;
Fig. 6 is the schematic cross-section of another embodiment of probe fixation kit of the present invention;
Fig. 7 is another structural representation of securing member in Fig. 6;
Fig. 8 is another structural representation of securing member in Fig. 6;
Fig. 9 is another structural representation of securing member in Fig. 6;
Figure 10 is the structural representation of array substrate detecting device of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of protection of the invention.
Refer to Fig. 1, Fig. 1 is the schematic cross-section of probe fixation kit one embodiment of the present invention.Probe fixation kit 10 in the present embodiment comprises fixed head 100, circuit board 200, probe 300 and elastic component 400, and circuit board 200 and fixed head 100 fix, and circuit board 200 has test connecting portion 210.Probe 300 one end is connected with test connecting portion 210, and the other end is used for contacting with the test point of product, to carry out circuit test to product.Probe 300 is connected with test connecting portion 210 elasticity by elastic component 400, damages to make the test point Elastic Contact of probe 300 and product thus to reduce scraping of the test point of probe 300 pairs of products and avoids loose contact.The surface of fixed head 100 is located at by circuit board 200 in the present embodiment, and elastic component is covered in test connecting portion 210.
See also Fig. 2, Fig. 2 is the schematic cross-section of another embodiment of probe fixation kit of the present invention.In other embodiments, elastic component 400 can be elastic 420, the resilient material that this elastic 420 has elastic reaction by silica gel, rubber or leather etc. is made, probe fixation kit 10 comprises wire 500 further, this wire 500 is located in elastic component 400, its one end is connected with probe 300, the other end and the conducting of test connecting portion 210.Elastic 420 sticks on circuit board 200 by sticking materials of tool such as glue, hot melt adhesive or double faced adhesive tapes.
See also Fig. 3, Fig. 3 is the schematic cross-section of another embodiment of probe fixation kit of the present invention.Circuit board 200 in other embodiments might not limit is located at fixed head 100 surface, it also can be located at the inside of fixed head 100, particularly, fixed head 100 has a groove 110 and through hole 120, circuit board 200 is located in this groove 110, and elastic component 400 is located in through hole 120 and is also abutted to circuit board 200.Further, the probe fixation kit 10 of the present embodiment also comprises turn buckle 600, and this turn buckle 600 is located at the side of fixed head 100, skids off to prevent circuit board 200 for rotatably blocking groove 110 after circuit board 200 is inserted in groove 110.Turn buckle 600 is rotatably located at the side of fixed head 100 by fixture, and this fixture can be screw 610 or pillar.
Probe 300 of the present invention is multiple, and accordingly, test connecting portion 210 is multiple, and multiple test connecting portion 210 array arrangement is on circuit board 200.Elastic component 400 is multiple, with probe 300 one_to_one corresponding.
See also Fig. 4, Fig. 4 is the schematic cross-section of another embodiment of probe fixation kit of the present invention.Elastic component 400 in other embodiments can also be spring 430, and spring 430 is located at through hole 120 and is abutted the test connecting portion 210 to circuit board 200.For preventing spring 430 from excessively rocking, the diameter of through hole 120 only needs bigger 1.5-0.1mm than the radial breadth extreme of spring 430, preferred 0.2mm.
See also Fig. 4 a, Fig. 4 a is the A cross section enlarged diagram of the probe fixation kit shown in Fig. 4.In other embodiments, further, elastic component 400 also comprises stator 431, spring 430 one end and test connecting portion 210 conducting, the other end insert stator 431 and with probe 300 conducting.Fixed head 100 has blocked hole 140, insert port 150 and Access Division 160 further, blocked hole 140 two ends are communicated with through hole 120, insert port 150 respectively, stator 431 is inserted into blocked hole 140 to be stuck on Access Division 160 with certain angular slope, the depth ratio through hole 120 of blocked hole 140, insert port 150 are dark, have certain extendable room to make stator 431 along with elasticity 430.Stator 431 can be circular, ellipse, rectangle or square, and accordingly, blocked hole 140, insert port 150 are mated with stator 431.
See also Fig. 5, Fig. 5 is the schematic cross-section of another embodiment of probe fixation kit of the present invention.Elastic component 400 in other embodiments might not with the number one_to_one corresponding of elastic component 400, particularly, elastic component 400 can also be silicagel pad 440 or rubber blanket, now elastic component 400 is one piece, multiple probe 300 array is on elastic component 400, the thickness of elastic component 400 is more than 3cm, and probe 300 is at least 2.5cm toward silicagel pad 440 or rubber blanket insertion depth.Preferred 7cm, and probe 300 is 2.5cm, 4cm or more than 4cm toward silicagel pad 440 or rubber blanket insertion depth, to guarantee that probe 300 is not easy to rock after inserting silicagel pad 440 or rubber blanket.Further, silicagel pad 440 can be arranged multiple with the recess that mate of test connecting portion 210, wire 500 is exposed to this recess with in testing connecting portion 210 conducting.
Certainly, elastic component 400 also can be more than two pieces, and more than two pieces elastic component 400 arrangements are located on circuit board 200, and wherein, every block elastic component 400 is provided with plural probe 300.Elastic component 400 in Fig. 5 is 3 pieces, and every block elastic component 400 is provided with 2 row's probes 300.Preferably, elastic component 400 is 5 pieces, and every block elastic component 400 array 2 arranges probe 300, often arranges 17 or 10 probes 300.
Refer to Fig. 6, Fig. 6 is the schematic cross-section of another embodiment of probe fixation kit of the present invention, and further, pin fixation kit also comprises securing member 700, and this securing member 700 is located in silicagel pad 440, and securing member 700 mates with through hole 120.This securing member 700 can be restraint zone 710, fastening post or screw.Preferably, fastening post and silicagel pad 440 one-body molded.
Refer to Fig. 7, Fig. 7 is another structural representation of securing member in Fig. 6, restraint zone 710 one end is located in silicagel pad 440, the other end is removably located on fixed head 100, and particularly, restraint zone 710 has fixed part 711, connecting portion 712 and engaging portion 713, fixed part 711, engaging portion 713 are located at the two ends of connecting portion 712 respectively, fixed part 711 is fixed in silicagel pad 440, and fixed head 100 is provided with fastening post 140, and this fastening post 140 is located on fixed head 100 privately with circuit board 200 phase.Engaging portion 713 is removably sheathed in fastening post 140.
Refer to Fig. 8, Fig. 8 is another structural representation of securing member in Fig. 6, in other embodiments, fastening post is the first fastening post 711, first fastening post 711 has the soft portion 7112 of right cylinder and right cylinder huttriall 7113, the soft portion 7112 of right cylinder can be made up of silica gel or rubber elastic material, the soft portion 7113 of right cylinder is by metal, the hard materials such as pottery are made, right cylinder huttriall 7112 is located in the soft portion 7113 of right cylinder, for improving the hardness of the first fastening post 711, to facilitate the mating hole 170 the first fastening post 711 being inserted fixed head 100, the diameter 0.5-1mm less of right cylinder soft portion 7112 external diameter of mating hole 170, due to right cylinder, soft portion 7112 has elasticity, it flexibly can insert mating hole 170 and stably be fixed in mating hole 170.
Refer to Fig. 9, Fig. 9 is another structural representation of securing member in Fig. 6, in other embodiments, fastening post can also be the second fastening post 712, the end of the second fastening post 712 has jack (not shown), this fixed head 100 comprises side opening (not shown) further, after the second fastening post 712 inserts mating hole 170, by plug-in unit 7121 successively through the jack of side opening, mating hole 170 and the second fastening post 712, so that the second fastening post 712 is fixed on fixed head 100.
In other embodiments, do not limit probe fixation kit 10 and only use a kind of fastening post, it can use the first fastening post 711 and the second fastening post 712 simultaneously, particularly, the outside of every block elastic component 400 is located at respectively by first fastening post 711 and the second fastening post 712, to be fixed to the surrounding of fixed head 100.
From the above, probe fixation kit 10 of the present invention makes silicagel pad 440 convenient disassembly owing to arranging securing member 700, so the block number of elastic component 400 can according to situation selection on the spot.For example, suppose fixed head 100 can arrange at most 8 pieces of silicagel pad 440, actually only can need 5 pieces, because silicagel pad 440 of the present invention can freely be dismantled, therefore only need, on fixed head 100,5 pieces of silicagel pad 440 are installed, 8 pieces need not be installed.Further, because silicagel pad 440 is for solid and have elasticity, the probe 300 inserted wherein can flexibly compress by silicagel pad 440, so the row of every block elastic component 400 array probes 300, often arranging the number of probe 300 etc. also can according to situation selection on the spot, for example, every block silicagel pad 440 has 2 row's probes 300, often arrange 17 probes 300, but during actual only needs 153 probes 300, so only need on fixed head 100, arrange 5 pieces of silicagel pad 440, 4 pieces are wherein had to stick with 8 row's probes 300, and the 5th piece only needs insertion 17 probes 300, 5th piece of silicagel pad 440 does not need monoblock to stick with probe 300, flexible and convenient to use.
Probe fixation kit 10 of the present invention also comprises survey face camera 800 and surveys high camera 900, survey face camera 800 is located at the side of probe 300 and is vertical at fixed head 100, for feeding back the positional information of measured object to facilitate probe 300 and the contraposition of product test point.Survey the side that high camera 900 is vertical at fixed head 100, for the residing environmental information highly of feedback probe fixation kit 10 to facilitate probe 300 and product test point rapid-aligning.
Refer to Figure 10, Figure 10 is the structural representation of array substrate detecting device of the present invention, and the present invention also provides a kind of array substrate detecting device 20, and array substrate detecting device 20 comprises above-mentioned probe fixation kit 10.
Checkout equipment of the present invention and probe assembly thereof are connected by elastic component 400 elasticity with test connecting portion at probe 300, when contacting with the test point of product to make probe 300, there is certain elasticity amount of sliding, thus reduce scraping damage and avoiding occurring loose contact phenomenon of the test point of probe 300 pairs of products, improve the quality of measuring accuracy and test product.
The foregoing is only embodiments of the invention; not thereby the scope of the claims of the present invention is limited; every utilize instructions of the present invention and accompanying drawing content to do equivalent structure or equivalent flow process conversion; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present invention.
Claims (10)
1. a probe fixation kit, is characterized in that, described probe fixation kit comprises:
Fixed head;
Circuit board, fixes with described fixed head, and described circuit board has test connecting portion;
Probe, one end is connected with described test connecting portion, and the other end is used for contacting with the test point of product, to carry out circuit test to described product;
Elastic component, is connected described probe with described test connecting portion elasticity, damages to make the test point Elastic Contact of described probe and described product thus to reduce described probe and avoids loose contact scraping of the test point of described product.
2. probe fixation kit according to claim 1, is characterized in that, described probe is multiple, and accordingly, described test connecting portion is multiple, and multiple described test connecting portion array arrangement is on described circuit board.
3. probe fixation kit according to claim 2, is characterized in that, described elastic component is multiple, with described probe one_to_one corresponding.
4. probe fixation kit according to claim 2, is characterized in that, described elastic component is one piece, and multiple described probe array is on described elastic component.
5. probe fixation kit according to claim 4, is characterized in that, described elastic component is more than two pieces, and two pieces of the above elastic component arrangements are located on described circuit board, and wherein, described in every block, elastic component is provided with plural probe.
6. probe fixation kit according to claim 3, is characterized in that, described elastic component is spring.
7. probe fixation kit according to claim 5, is characterized in that, described elastic component is silicagel pad or rubber blanket.
8. probe fixation kit according to claim 6, is characterized in that, described fixed head has through hole, and described circuit board is inserted in the inside of described fixed head, and described elastic component is located at described through hole and is abutted to described circuit board.
9. probe fixation kit according to claim 1, is characterized in that, described probe fixation kit also comprises:
Survey face camera, is located at the side of described probe and is vertical at described fixed head, for feeding back the positional information of measured object to facilitate the test point contraposition of described probe and described product;
Survey high camera, be vertical at the side of described fixed head, for the environmental information of height residing for feedback probe fixation kit to facilitate the test point rapid-aligning of described probe and described product.
10. an array substrate detecting device, is characterized in that, described array substrate detecting device comprises the probe fixation kit in claim 1-9 described in any one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510479425.XA CN105096783A (en) | 2015-08-03 | 2015-08-03 | Detection equipment and probe component thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510479425.XA CN105096783A (en) | 2015-08-03 | 2015-08-03 | Detection equipment and probe component thereof |
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| CN105096783A true CN105096783A (en) | 2015-11-25 |
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| CN201510479425.XA Pending CN105096783A (en) | 2015-08-03 | 2015-08-03 | Detection equipment and probe component thereof |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105549237A (en) * | 2016-03-01 | 2016-05-04 | 苏州华兴源创电子科技有限公司 | Automatic aligning mechanism for detecting liquid crystal display panel |
| CN106814478A (en) * | 2016-01-27 | 2017-06-09 | 北京瑞荣达电子技术有限公司 | Method for positioning of probe and system during liquid crystal panel lighting test |
| CN107364641A (en) * | 2017-09-01 | 2017-11-21 | 佛山市富乐喜电子信息技术有限公司 | A kind of Package Testing device of straight cutting terminal magnetic switch |
| CN107402318A (en) * | 2017-08-31 | 2017-11-28 | 京东方科技集团股份有限公司 | Probe assembly and test equipment |
| CN107728041A (en) * | 2017-10-11 | 2018-02-23 | 李贺满 | A kind of electronic circuit board electric property detection device |
| CN108426984A (en) * | 2018-06-21 | 2018-08-21 | 重庆文理学院 | One kind being used for Natural Medicine Analysis sampler and its Pharmaceutical Analysis method |
| CN108717132A (en) * | 2018-07-18 | 2018-10-30 | 罗日伟 | A kind of FPC test benches |
| TWI672512B (en) * | 2018-09-12 | 2019-09-21 | 啟端光電股份有限公司 | Light emitting diode sensing system |
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| CN1896749A (en) * | 2005-07-13 | 2007-01-17 | 安捷伦科技有限公司 | Inspection device for display panel and interface used therein |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106814478A (en) * | 2016-01-27 | 2017-06-09 | 北京瑞荣达电子技术有限公司 | Method for positioning of probe and system during liquid crystal panel lighting test |
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| CN107364641A (en) * | 2017-09-01 | 2017-11-21 | 佛山市富乐喜电子信息技术有限公司 | A kind of Package Testing device of straight cutting terminal magnetic switch |
| CN107728041A (en) * | 2017-10-11 | 2018-02-23 | 李贺满 | A kind of electronic circuit board electric property detection device |
| CN108426984A (en) * | 2018-06-21 | 2018-08-21 | 重庆文理学院 | One kind being used for Natural Medicine Analysis sampler and its Pharmaceutical Analysis method |
| CN108717132A (en) * | 2018-07-18 | 2018-10-30 | 罗日伟 | A kind of FPC test benches |
| TWI672512B (en) * | 2018-09-12 | 2019-09-21 | 啟端光電股份有限公司 | Light emitting diode sensing system |
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Application publication date: 20151125 |