CN104749390B - 定位框架结构 - Google Patents

定位框架结构 Download PDF

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Publication number
CN104749390B
CN104749390B CN201310752418.3A CN201310752418A CN104749390B CN 104749390 B CN104749390 B CN 104749390B CN 201310752418 A CN201310752418 A CN 201310752418A CN 104749390 B CN104749390 B CN 104749390B
Authority
CN
China
Prior art keywords
integrated chip
positioning
frame structure
cavity
magnet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201310752418.3A
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English (en)
Chinese (zh)
Other versions
CN104749390A (zh
Inventor
吴天顺
黄程伟
徐小迟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yuxin Technology Shanghai Co ltd
Original Assignee
SENSATA TECHNOLOGY (CHANGZHOU) CO LTD
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SENSATA TECHNOLOGY (CHANGZHOU) CO LTD filed Critical SENSATA TECHNOLOGY (CHANGZHOU) CO LTD
Priority to CN201310752418.3A priority Critical patent/CN104749390B/zh
Priority to JP2014263987A priority patent/JP6291412B2/ja
Priority to US14/584,207 priority patent/US9564351B2/en
Priority to KR1020140193614A priority patent/KR20150079466A/ko
Priority to EP14200644.4A priority patent/EP2896966B1/en
Publication of CN104749390A publication Critical patent/CN104749390A/zh
Application granted granted Critical
Publication of CN104749390B publication Critical patent/CN104749390B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/24—Housings ; Casings for instruments
    • G01D11/245—Housings for sensors
    • H10P95/00—
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/30—Supports specially adapted for an instrument; Supports specially adapted for a set of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P1/00—Details of instruments
    • G01P1/02—Housings
    • G01P1/026—Housings for speed measuring devices, e.g. pulse generator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/42—Devices characterised by the use of electric or magnetic means
    • G01P3/44—Devices characterised by the use of electric or magnetic means for measuring angular speed
    • G01P3/48—Devices characterised by the use of electric or magnetic means for measuring angular speed by measuring frequency of generated current or voltage
    • G01P3/481—Devices characterised by the use of electric or magnetic means for measuring angular speed by measuring frequency of generated current or voltage of pulse signals
    • G01P3/488—Devices characterised by the use of electric or magnetic means for measuring angular speed by measuring frequency of generated current or voltage of pulse signals delivered by variable reluctance detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/6735—Closed carriers
    • H01L21/67353—Closed carriers specially adapted for a single substrate
    • H10P72/50—

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Magnetic Bearings And Hydrostatic Bearings (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
CN201310752418.3A 2013-12-31 2013-12-31 定位框架结构 Active CN104749390B (zh)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN201310752418.3A CN104749390B (zh) 2013-12-31 2013-12-31 定位框架结构
JP2014263987A JP6291412B2 (ja) 2013-12-31 2014-12-26 位置決めフレーム構造
US14/584,207 US9564351B2 (en) 2013-12-31 2014-12-29 Positioning frame structure
KR1020140193614A KR20150079466A (ko) 2013-12-31 2014-12-30 포지셔닝 프레임 구조체
EP14200644.4A EP2896966B1 (en) 2013-12-31 2014-12-30 Positioning frame structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310752418.3A CN104749390B (zh) 2013-12-31 2013-12-31 定位框架结构

Publications (2)

Publication Number Publication Date
CN104749390A CN104749390A (zh) 2015-07-01
CN104749390B true CN104749390B (zh) 2020-07-03

Family

ID=52423542

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310752418.3A Active CN104749390B (zh) 2013-12-31 2013-12-31 定位框架结构

Country Status (5)

Country Link
US (1) US9564351B2 (enExample)
EP (1) EP2896966B1 (enExample)
JP (1) JP6291412B2 (enExample)
KR (1) KR20150079466A (enExample)
CN (1) CN104749390B (enExample)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN203772882U (zh) * 2013-12-31 2014-08-13 森萨塔科技（常州）有限公司 定位框架结构

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JPH11153452A (ja) * 1997-11-20 1999-06-08 Hitachi Ltd 回転検出装置
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CN203772882U (zh) * 2013-12-31 2014-08-13 森萨塔科技（常州）有限公司 定位框架结构

Also Published As

Publication number Publication date
KR20150079466A (ko) 2015-07-08
JP2015132601A (ja) 2015-07-23
EP2896966B1 (en) 2021-06-23
CN104749390A (zh) 2015-07-01
EP2896966A1 (en) 2015-07-22
JP6291412B2 (ja) 2018-03-14
US20150187623A1 (en) 2015-07-02
US9564351B2 (en) 2017-02-07

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Effective date of registration: 20250704

Address after: 201800 1st and 2nd floors, building 4, 5018 Liuxiang Road, Xuxing Town, Jiading District, Shanghai

Patentee after: YUXIN TECHNOLOGY (SHANGHAI) CO.,LTD.

Country or region after: China

Address before: 213031, 18 innovation Avenue, Xinbei District, Jiangsu, Changzhou

Patentee before: SENSATA TECHNOLOGIES, Inc.

Country or region before: China