CN104698362A - 工作频率获取装置、芯片分类装置及方法 - Google Patents
工作频率获取装置、芯片分类装置及方法 Download PDFInfo
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108535630A (zh) * | 2018-04-02 | 2018-09-14 | 成都锐成芯微科技股份有限公司 | 一种芯片测试方法及芯片测试模块 |
CN112612660A (zh) * | 2020-12-16 | 2021-04-06 | 海光信息技术股份有限公司 | 规格信息数据库创建方法、芯片挑选方法及装置和系统 |
Citations (7)
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US20020140483A1 (en) * | 1999-03-01 | 2002-10-03 | Yasuo Miyamoto | Timing generation circuit and method for timing generation |
US20040103330A1 (en) * | 2002-11-25 | 2004-05-27 | Bonnett William B. | Adjusting voltage supplied to a processor in response to clock frequency |
US20050007154A1 (en) * | 2003-07-07 | 2005-01-13 | Patella Benjamin J. | System and method for evaluating the speed of a circuit |
CN1818688A (zh) * | 2005-02-12 | 2006-08-16 | 三星电子株式会社 | 包括运行速度检测装置的系统、运行速度检测装置及其方法 |
CN102254062A (zh) * | 2011-06-10 | 2011-11-23 | 中国航天科技集团公司第九研究院第七七一研究所 | 标准单元时序数据测试方法 |
CN102339120A (zh) * | 2010-07-16 | 2012-02-01 | 财团法人工业技术研究院 | 性能调整装置、方法以及具有性能调整装置的处理器 |
CN102928772A (zh) * | 2012-11-20 | 2013-02-13 | 上海宏力半导体制造有限公司 | 时序测试系统及其测试方法 |
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- 2013-12-10 CN CN201310674657.1A patent/CN104698362B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020140483A1 (en) * | 1999-03-01 | 2002-10-03 | Yasuo Miyamoto | Timing generation circuit and method for timing generation |
US20040103330A1 (en) * | 2002-11-25 | 2004-05-27 | Bonnett William B. | Adjusting voltage supplied to a processor in response to clock frequency |
US20050007154A1 (en) * | 2003-07-07 | 2005-01-13 | Patella Benjamin J. | System and method for evaluating the speed of a circuit |
CN1818688A (zh) * | 2005-02-12 | 2006-08-16 | 三星电子株式会社 | 包括运行速度检测装置的系统、运行速度检测装置及其方法 |
CN102339120A (zh) * | 2010-07-16 | 2012-02-01 | 财团法人工业技术研究院 | 性能调整装置、方法以及具有性能调整装置的处理器 |
CN102254062A (zh) * | 2011-06-10 | 2011-11-23 | 中国航天科技集团公司第九研究院第七七一研究所 | 标准单元时序数据测试方法 |
CN102928772A (zh) * | 2012-11-20 | 2013-02-13 | 上海宏力半导体制造有限公司 | 时序测试系统及其测试方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108535630A (zh) * | 2018-04-02 | 2018-09-14 | 成都锐成芯微科技股份有限公司 | 一种芯片测试方法及芯片测试模块 |
CN112612660A (zh) * | 2020-12-16 | 2021-04-06 | 海光信息技术股份有限公司 | 规格信息数据库创建方法、芯片挑选方法及装置和系统 |
CN112612660B (zh) * | 2020-12-16 | 2024-02-13 | 海光信息技术股份有限公司 | 规格信息数据库创建方法、芯片挑选方法及装置和系统 |
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Effective date of registration: 20190314 Address after: 101399 Building 8-07, Ronghui Garden 6, Shunyi Airport Economic Core Area, Beijing Patentee after: Xin Xin finance leasing (Beijing) Co.,Ltd. Address before: 201203 Shanghai Pudong New Area Pudong Zhangjiang hi tech park, 2288 Chong Nong Road, exhibition center, 1 building. Patentee before: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. |
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Application publication date: 20150610 Assignee: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. Assignor: Xin Xin finance leasing (Beijing) Co.,Ltd. Contract record no.: X2021110000008 Denomination of invention: Working frequency acquisition device, chip classification device and method Granted publication date: 20180126 License type: Exclusive License Record date: 20210317 |
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Effective date of registration: 20221025 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech park, Spreadtrum Center Building 1, Lane 2288 Patentee after: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. Address before: 101399 Building 8-07, Ronghui Garden 6, Shunyi Airport Economic Core Area, Beijing Patentee before: Xin Xin finance leasing (Beijing) Co.,Ltd. |
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