CN104604131A - 环形振荡器的测试方案 - Google Patents

环形振荡器的测试方案 Download PDF

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Publication number
CN104604131A
CN104604131A CN201380046554.9A CN201380046554A CN104604131A CN 104604131 A CN104604131 A CN 104604131A CN 201380046554 A CN201380046554 A CN 201380046554A CN 104604131 A CN104604131 A CN 104604131A
Authority
CN
China
Prior art keywords
test
ring oscillator
ring
testing
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201380046554.9A
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English (en)
Chinese (zh)
Inventor
薛真成
H·权
A·吴
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lattice Semiconductor Corp
Original Assignee
Silicon Image Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silicon Image Inc filed Critical Silicon Image Inc
Publication of CN104604131A publication Critical patent/CN104604131A/zh
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0315—Ring oscillators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
CN201380046554.9A 2012-09-06 2013-08-15 环形振荡器的测试方案 Pending CN104604131A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/605,708 2012-09-06
US13/605,708 US8841974B2 (en) 2012-09-06 2012-09-06 Test solution for ring oscillators
PCT/US2013/055176 WO2014039226A1 (en) 2012-09-06 2013-08-15 Test solution for ring oscillators

Publications (1)

Publication Number Publication Date
CN104604131A true CN104604131A (zh) 2015-05-06

Family

ID=50186712

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380046554.9A Pending CN104604131A (zh) 2012-09-06 2013-08-15 环形振荡器的测试方案

Country Status (7)

Country Link
US (1) US8841974B2 (cg-RX-API-DMAC7.html)
EP (1) EP2893639A4 (cg-RX-API-DMAC7.html)
JP (1) JP2015534673A (cg-RX-API-DMAC7.html)
KR (1) KR20150054899A (cg-RX-API-DMAC7.html)
CN (1) CN104604131A (cg-RX-API-DMAC7.html)
TW (1) TWI593234B (cg-RX-API-DMAC7.html)
WO (1) WO2014039226A1 (cg-RX-API-DMAC7.html)

Cited By (3)

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CN106656460A (zh) * 2016-11-22 2017-05-10 浙江大学 一种针对密码芯片电磁脉冲故障分析的防御装置
CN106874177A (zh) * 2015-12-14 2017-06-20 中国航空工业第六八研究所 一种基于场景的锁存器测试方法
WO2020029141A1 (zh) * 2018-08-08 2020-02-13 深圳市汇顶科技股份有限公司 随机数发生器的建模方法、装置、介质及随机数发生器

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JP6423277B2 (ja) * 2015-01-09 2018-11-14 株式会社メガチップス 乱数生成装置及び乱数生成方法
US9891276B2 (en) 2015-07-28 2018-02-13 International Business Machines Corporation Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
US10078114B2 (en) * 2015-09-24 2018-09-18 Renesas Electronics Corporation Test point circuit, scan flip-flop for sequential test, semiconductor device and design device
US11316687B2 (en) * 2019-03-04 2022-04-26 Cypress Semiconductor Corporation Encrypted gang programming
US10761809B1 (en) * 2020-03-12 2020-09-01 Katholieke Universiteit Leuven Random number generator
TWI719917B (zh) * 2020-07-14 2021-02-21 金麗科技股份有限公司 將類比動態電路運用於數位測試工具的處理方法
CN112504519B (zh) * 2020-11-23 2022-05-20 深圳市绘王动漫科技有限公司 一种压力检测电路、装置及压力输入装置
KR20220168916A (ko) 2021-06-17 2022-12-26 삼성전자주식회사 오실레이터 클럭 신호의 주기를 조정하는 클럭 생성 회로 및 그 방법
US12032460B2 (en) * 2022-02-11 2024-07-09 Stmicroelectronics S.R.L. Systems and methods to test an asynchronous finite machine

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CN101373203A (zh) * 2007-08-21 2009-02-25 中芯国际集成电路制造(上海)有限公司 环形振荡器速度测试结构
JP2009117894A (ja) * 2007-11-01 2009-05-28 Univ Of Tokyo 注入同期型発振器
CN101819515A (zh) * 2010-02-08 2010-09-01 清华大学 基于环型振荡器的真随机数发生电路及真随机数发生器
US20110163818A1 (en) * 2008-09-22 2011-07-07 Markus Dichtl Apparatus and method for generating a random bit sequence

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US5963104A (en) * 1996-04-15 1999-10-05 Vlsi Technology, Inc. Standard cell ring oscillator of a non-deterministic randomizer circuit
US6069849A (en) * 1996-09-17 2000-05-30 Xilinx, Inc. Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator
JP2000183694A (ja) * 1998-12-18 2000-06-30 Mitsumi Electric Co Ltd 発振回路
JP2002311091A (ja) * 2001-04-10 2002-10-23 Mitsubishi Electric Corp 半導体装置
JP2004096237A (ja) * 2002-08-29 2004-03-25 Nec Electronics Corp 発振回路及び半導体集積回路
US6798230B1 (en) * 2003-01-15 2004-09-28 Advanced Micro Devices, Inc. Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
US7233212B2 (en) * 2005-03-31 2007-06-19 International Business Machines Corporation Oscillator array with row and column control
US7675372B2 (en) * 2006-08-09 2010-03-09 Qualcomm Incorporated Circuit simulator parameter extraction using a configurable ring oscillator
US7532078B2 (en) * 2007-02-09 2009-05-12 International Business Machines Corporation Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics
US8676870B2 (en) * 2007-09-18 2014-03-18 Seagate Technology Llc Active test and alteration of sample times for a ring based random number generator
JP4427581B2 (ja) * 2008-01-08 2010-03-10 株式会社東芝 乱数生成回路
US8081037B2 (en) * 2008-06-11 2011-12-20 Qualcomm Incorporated Ring oscillator using analog parallelism
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
US8381144B2 (en) * 2010-03-03 2013-02-19 Qualcomm Incorporated System and method of test mode gate operation

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CN101373203A (zh) * 2007-08-21 2009-02-25 中芯国际集成电路制造(上海)有限公司 环形振荡器速度测试结构
JP2009117894A (ja) * 2007-11-01 2009-05-28 Univ Of Tokyo 注入同期型発振器
US20110163818A1 (en) * 2008-09-22 2011-07-07 Markus Dichtl Apparatus and method for generating a random bit sequence
CN101819515A (zh) * 2010-02-08 2010-09-01 清华大学 基于环型振荡器的真随机数发生电路及真随机数发生器

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106874177A (zh) * 2015-12-14 2017-06-20 中国航空工业第六八研究所 一种基于场景的锁存器测试方法
CN106656460A (zh) * 2016-11-22 2017-05-10 浙江大学 一种针对密码芯片电磁脉冲故障分析的防御装置
WO2020029141A1 (zh) * 2018-08-08 2020-02-13 深圳市汇顶科技股份有限公司 随机数发生器的建模方法、装置、介质及随机数发生器
CN111010880A (zh) * 2018-08-08 2020-04-14 深圳市汇顶科技股份有限公司 随机数发生器的建模方法、装置、介质及随机数发生器

Also Published As

Publication number Publication date
JP2015534673A (ja) 2015-12-03
US8841974B2 (en) 2014-09-23
EP2893639A4 (en) 2016-06-22
TWI593234B (zh) 2017-07-21
EP2893639A1 (en) 2015-07-15
WO2014039226A1 (en) 2014-03-13
US20140062606A1 (en) 2014-03-06
KR20150054899A (ko) 2015-05-20
TW201419758A (zh) 2014-05-16

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Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C41 Transfer of patent application or patent right or utility model
TA01 Transfer of patent application right

Effective date of registration: 20151030

Address after: oregon

Applicant after: LATTICE SEMICONDUCTOR CORPORATION

Address before: American California

Applicant before: Silicon Image Inc. A. Delaware C.

C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20150506