CN104567947A - 磁性传感器电路 - Google Patents
磁性传感器电路 Download PDFInfo
- Publication number
- CN104567947A CN104567947A CN201410574022.9A CN201410574022A CN104567947A CN 104567947 A CN104567947 A CN 104567947A CN 201410574022 A CN201410574022 A CN 201410574022A CN 104567947 A CN104567947 A CN 104567947A
- Authority
- CN
- China
- Prior art keywords
- circuit
- voltage
- output
- magnetic sensor
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0017—Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
Abstract
Description
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013222587A JP6158682B2 (ja) | 2013-10-25 | 2013-10-25 | 磁気センサ回路 |
JP2013-222587 | 2013-10-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104567947A true CN104567947A (zh) | 2015-04-29 |
CN104567947B CN104567947B (zh) | 2018-01-23 |
Family
ID=52994691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410574022.9A Active CN104567947B (zh) | 2013-10-25 | 2014-10-24 | 磁性传感器电路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9638761B2 (zh) |
JP (1) | JP6158682B2 (zh) |
KR (1) | KR102105034B1 (zh) |
CN (1) | CN104567947B (zh) |
TW (1) | TWI619958B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107167164A (zh) * | 2016-03-08 | 2017-09-15 | 精工半导体有限公司 | 磁传感器和磁传感器装置 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6600471B2 (ja) * | 2014-06-26 | 2019-10-30 | エイブリック株式会社 | 磁気センサ装置 |
CN105444787B (zh) * | 2015-11-19 | 2017-07-11 | 国电南瑞科技股份有限公司 | 一种高可靠性直流变送器 |
JP6625236B2 (ja) * | 2016-10-25 | 2019-12-25 | 三菱電機株式会社 | インクリメンタル型エンコーダのパルス化変換装置およびパルス化変換方法 |
US20200150195A1 (en) * | 2018-11-14 | 2020-05-14 | Crocus Technology Inc. | Two pin magnetic field detector |
KR102500418B1 (ko) | 2020-09-29 | 2023-02-16 | 삼성전기주식회사 | 홀 센서 오프셋 저감 장치 및 렌즈 모듈 제어 장치 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1051997A (zh) * | 1989-11-20 | 1991-06-05 | 海门科技国际公司 | 检出磁换能器产生的原始数据信号中数据脉冲的方法和装置 |
JPH03252526A (ja) * | 1990-03-01 | 1991-11-11 | Fujitsu Ltd | センサー出力回路 |
US5351005A (en) * | 1992-12-31 | 1994-09-27 | Honeywell Inc. | Resetting closed-loop magnetoresistive magnetic sensor |
CN1400471A (zh) * | 2001-07-26 | 2003-03-05 | 松下电器产业株式会社 | 磁传感器 |
CN101779137A (zh) * | 2007-08-21 | 2010-07-14 | 精工电子有限公司 | 磁性传感器电路 |
US20120062222A1 (en) * | 2010-09-15 | 2012-03-15 | Kabushiki Kaisha Toshiba | Magnetic detection device |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5493219A (en) * | 1993-04-15 | 1996-02-20 | Nippondenso Co., Ltd. | MRE sensor signal detector |
WO1996004630A1 (en) * | 1994-08-03 | 1996-02-15 | Drexelbrook Controls, Inc. | High reliability instrument system |
JPH08129020A (ja) * | 1994-09-07 | 1996-05-21 | Yazaki Corp | 走行センサ |
JP3141816B2 (ja) * | 1997-06-19 | 2001-03-07 | 日本電気株式会社 | 発振回路 |
US6154027A (en) * | 1997-10-20 | 2000-11-28 | Analog Devices, Inc. | Monolithic magnetic sensor having externally adjustable temperature compensation |
JP2000174254A (ja) * | 1998-12-07 | 2000-06-23 | Sharp Corp | 磁気検出用半導体集積回路 |
US6674383B2 (en) * | 2000-11-01 | 2004-01-06 | Onix Microsystems, Inc. | PWM-based measurement interface for a micro-machined electrostatic actuator |
JP2005127762A (ja) * | 2003-10-22 | 2005-05-19 | Canon Inc | センサ信号処理装置 |
EP1637898A1 (en) * | 2004-09-16 | 2006-03-22 | Liaisons Electroniques-Mecaniques Lem S.A. | Continuously calibrated magnetic field sensor |
CN100409136C (zh) * | 2005-07-21 | 2008-08-06 | 崇贸科技股份有限公司 | 一次侧控制电源供应器的切换式控制装置 |
EP1790988B1 (en) * | 2005-11-29 | 2017-01-18 | STMicroelectronics Srl | Detection circuit using a differential capacitive sensor with input-common-mode control in a sense interface |
GB0620307D0 (en) * | 2006-10-16 | 2006-11-22 | Ami Semiconductor Belgium Bvba | Auto-calibration of magnetic sensor |
JP4902390B2 (ja) * | 2007-02-17 | 2012-03-21 | セイコーインスツル株式会社 | カレント検出回路及び電流モード型スイッチングレギュレータ |
JP2011043331A (ja) * | 2009-08-19 | 2011-03-03 | Rohm Co Ltd | 磁気センサ装置及びこれを用いた電子機器 |
JP5285585B2 (ja) * | 2009-12-02 | 2013-09-11 | セイコーインスツル株式会社 | 磁気センサ装置 |
JP5736288B2 (ja) * | 2011-09-27 | 2015-06-17 | セイコーインスツル株式会社 | 磁気センサ装置 |
JP5926081B2 (ja) * | 2012-03-22 | 2016-05-25 | エスアイアイ・セミコンダクタ株式会社 | センサ装置 |
-
2013
- 2013-10-25 JP JP2013222587A patent/JP6158682B2/ja active Active
-
2014
- 2014-09-25 TW TW103133305A patent/TWI619958B/zh active
- 2014-10-20 US US14/518,427 patent/US9638761B2/en active Active
- 2014-10-23 KR KR1020140144255A patent/KR102105034B1/ko active IP Right Grant
- 2014-10-24 CN CN201410574022.9A patent/CN104567947B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1051997A (zh) * | 1989-11-20 | 1991-06-05 | 海门科技国际公司 | 检出磁换能器产生的原始数据信号中数据脉冲的方法和装置 |
JPH03252526A (ja) * | 1990-03-01 | 1991-11-11 | Fujitsu Ltd | センサー出力回路 |
US5351005A (en) * | 1992-12-31 | 1994-09-27 | Honeywell Inc. | Resetting closed-loop magnetoresistive magnetic sensor |
CN1400471A (zh) * | 2001-07-26 | 2003-03-05 | 松下电器产业株式会社 | 磁传感器 |
CN101779137A (zh) * | 2007-08-21 | 2010-07-14 | 精工电子有限公司 | 磁性传感器电路 |
US20120062222A1 (en) * | 2010-09-15 | 2012-03-15 | Kabushiki Kaisha Toshiba | Magnetic detection device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107167164A (zh) * | 2016-03-08 | 2017-09-15 | 精工半导体有限公司 | 磁传感器和磁传感器装置 |
CN107167164B (zh) * | 2016-03-08 | 2020-11-06 | 艾普凌科有限公司 | 磁传感器和磁传感器装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2015083946A (ja) | 2015-04-30 |
CN104567947B (zh) | 2018-01-23 |
JP6158682B2 (ja) | 2017-07-05 |
KR102105034B1 (ko) | 2020-04-27 |
TWI619958B (zh) | 2018-04-01 |
US9638761B2 (en) | 2017-05-02 |
US20150115942A1 (en) | 2015-04-30 |
TW201530175A (zh) | 2015-08-01 |
KR20150048059A (ko) | 2015-05-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20160304 Address after: Chiba County, Japan Applicant after: DynaFine Semiconductor Co.,Ltd. Address before: Chiba, Chiba, Japan Applicant before: Seiko Instruments Inc. |
|
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: ABLIC Inc. Address before: Chiba County, Japan Patentee before: DynaFine Semiconductor Co.,Ltd. |
|
CP01 | Change in the name or title of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: Nagano Patentee after: ABLIC Inc. Address before: Chiba County, Japan Patentee before: ABLIC Inc. |
|
CP02 | Change in the address of a patent holder |