CN104538371B - A kind of capsulation body of semiconductor ship of high reliability and low cost - Google Patents

A kind of capsulation body of semiconductor ship of high reliability and low cost Download PDF

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Publication number
CN104538371B
CN104538371B CN201510015604.8A CN201510015604A CN104538371B CN 104538371 B CN104538371 B CN 104538371B CN 201510015604 A CN201510015604 A CN 201510015604A CN 104538371 B CN104538371 B CN 104538371B
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CN
China
Prior art keywords
base
pipe cap
ground metal
semiconductor chip
semiconductor
Prior art date
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Active
Application number
CN201510015604.8A
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Chinese (zh)
Other versions
CN104538371A (en
Inventor
刁睿
赵瑞华
闫志峰
常青松
郝永莉
王鹏
黎荣林
要志宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOWEI INTEGRATED CIRCUITS Co Ltd
Original Assignee
BOWEI INTEGRATED CIRCUITS Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by BOWEI INTEGRATED CIRCUITS Co Ltd filed Critical BOWEI INTEGRATED CIRCUITS Co Ltd
Priority to CN201510015604.8A priority Critical patent/CN104538371B/en
Publication of CN104538371A publication Critical patent/CN104538371A/en
Application granted granted Critical
Publication of CN104538371B publication Critical patent/CN104538371B/en
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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

The invention discloses a kind of capsulation body of semiconductor ship of high reliability and low cost, it is related to technical field of semiconductor encapsulation.Including base, pipe cap and sealing cap glue, the base and pipe cap are made using circuit board raw material, and the pipe cap is hollow closing box, and box one side is provided with groove, and the groove side of pipe cap is connected by sealing cap glue with base;The upper and lower surface of the base is covered with positive ground metal layer and back-side ground metal level, both ends are equipped with front lead and back side lead, the disk mesopore led to during several are additionally provided with the base up and down, the disk mesopore include the metal connecting piece for connecting positive ground metal layer with back-side ground metal level;By conductive adhesive in positive ground metal layer, the bonding pressure point of semiconductor chip is electrically connected semiconductor chip by bonding line and front lead;The semiconductor chip upper surface is covered with Protection glue.The present invention can be by harsh HAST, and cost is cheap, and reliability is high.

Description

A kind of capsulation body of semiconductor ship of high reliability and low cost
Technical field
The present invention relates to technical field of semiconductor encapsulation.
Background technology
Packaging body plays a part of protecting semiconductor chip, semiconductor chip can be isolated from the outside, prevent in air Corrosion of the impurity to chip circuit cause the decline of electric property.With the development of electronics industry, the application field of chip is got over Come more extensive, also can more and more higher, packaging pass through HAST to the requirement to environmental suitability(Highly Accelerated The hot and humid limit accelerated life tests of Temperature/Humidity Stress Test), it is that current measurement product is reliable The important indicator of property.Existing capsulation body of semiconductor ship mainly has plastic sealed and ceramic-type, although plastic sealed cost is cheap, It is when carrying out HAST experiments, due to being encapsulated using capsulation material, causes the product of batch production always to have because water absorption rate is different Portioned product can not be tested by HAST, have impact on the yield rate of product, reduce the reliability of product.And plastic sealed semiconductor Although chip packing-body reliability is higher, cost is also higher.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of capsulation body of semiconductor ship of high reliability and low cost, energy Enough by harsh HAST, cost is cheap, and reliability is high.
In order to solve the above technical problems, the technical solution used in the present invention is:
A kind of capsulation body of semiconductor ship of high reliability and low cost, including base, pipe cap and sealing cap glue, the base and Pipe cap is made using circuit board raw material, and the pipe cap is hollow closing box, and box one side is provided with groove, and the groove side of pipe cap leads to Sealing cap glue is crossed to be connected with base;The upper and lower surface of the base is covered with positive ground metal layer and back-side ground metal Layer, both ends are equipped with front lead and back side lead, the disk mesopore led to during several are additionally provided with the base up and down, the disk Mesopore includes the metal connecting piece for connecting positive ground metal layer with back-side ground metal level;Semiconductor chip passes through conducting resinl It is bonded in positive ground metal layer, the bonding pressure point of semiconductor chip is electrically connected by bonding line and front lead;It is described Semiconductor chip upper surface is covered with Protection glue.
Further technical scheme, the disk mesopore are circular port, and the electricity on circular port both sides is connected using metallization process Road, added with filler in disk mesopore.
Further technical scheme, the non-recessed face of the pipe cap is covered with metal level.
Further technical scheme, the quantity at least two of the semiconductor chip, lead between the semiconductor chip Cross bonding line electrical connection.
Further technical scheme, described Protection glue is does not react and the silicon rubber of good waterproof performance with chip.
It is using beneficial effect caused by above-mentioned technical proposal:The present invention is using general circuit board material as former Material, is fabricated to pipe cap and base, and graphic making is cheap using ripe circuit board machining process, cost;Bottom uses metal Change through hole to be grounded, and filled up hole using disk mesopore technique, reach the purpose of sealing, ensure passing through for HAST;Using Sealing cap gemel connection base and pipe cap, avoid moisture from entering package interior, ensure passing through for HAST;Meanwhile semiconductor chip Upper surface coats one layer of Protection glue, avoids moisture attack semiconductor chip, is further ensured that passing through for HAST;Two kinds of waterproofs are arranged Apply, further increase the reliability of semiconductor chip.
Brief description of the drawings
Fig. 1 is the structural representation of the embodiment of the present invention 1;
Fig. 2 is the outline drawing of the embodiment of the present invention 1;
Fig. 3 is the structural representation of the embodiment of the present invention 2;
In the accompanying drawings:1st, base, 2, pipe cap, 3, sealing cap glue, 4, front lead, 5, disk mesopore, 6, back side lead, 7, front Ground metal layer, 8, back-side ground metal level, 9, semiconductor chip, 10, conducting resinl, 11, bonding pressure point, 12, bonding line, 13, Protection glue, 14, groove, 15, metal level, 16, filler.
Embodiment
The present invention is further detailed explanation with reference to the accompanying drawings and detailed description.
Embodiment 1
As shown in figure 1, a kind of capsulation body of semiconductor ship of high reliability and low cost, including base 1, pipe cap 2 and sealing cap Glue 3, sealing cap glue 3 are nonconducting jointing materials that sealing can be achieved, and base 1 and pipe cap 2 are made using circuit board raw material. As shown in Fig. 2 pipe cap 2 is hollow closing box, box one side is provided with groove 14, and the groove side of pipe cap 2 passes through sealing cap glue 3 and base 1 Connection.Base 1 uses the circuit boards of double-level-metal to be made up of raw material, and the dielectric material of its circuit boards can be any 's.I.e. the upper and lower surface of base 1 is covered with positive ground metal layer 7 and back-side ground metal level 8, and both ends are equipped with just Face lead 4 and back side lead 6, be additionally provided with base 1 it is some up and down in the disk mesopore 5 that leads to, disk mesopore 5 includes front ground connection gold Belong to the metal connecting piece that layer 7 and back-side ground metal level 8 connect, disk mesopore 5 is circular port, is connected using metallization process circular The circuit on hole both sides, added with filler 16 in disk mesopore 5, filler 16 can be any material suitable for disk mesopore technique.Partly lead The ground plane of body chip 9 is bonded in positive ground metal layer 7 by conducting resinl 10, and the bonding pressure point 11 of semiconductor chip 9 is logical Bonding line 12 is crossed to be electrically connected with front lead 4;Covered with Protection glue 13, Protection glue 13 is and core the upper surface of semiconductor chip 9 Piece does not react and the silicon rubber of good waterproof performance.The non-recessed face of pipe cap 2 is covered with metal level 15.
Embodiment 2
As shown in figure 3, a kind of capsulation body of semiconductor ship of high reliability and low cost, as different from Example 1, base The quantity of semiconductor chip 9 on 1 is two, is electrically connected between semiconductor chip 9 by bonding line 12.

Claims (4)

1. a kind of capsulation body of semiconductor ship of high reliability and low cost, it is characterised in that including base(1), pipe cap(2)And envelope Cap glue(3), the base(1)And pipe cap(2)Made using circuit board raw material, the base(1)With the pipe cap(2)Adopt Made of circuit board machining process;The pipe cap(2)For hollow closing box, box one side is provided with groove(14), pipe cap(2)Groove While pass through sealing cap glue(3)With base(1)Connection;The base(1)Upper and lower surface be covered with positive ground metal layer (7)With back-side ground metal level(8), both ends are equipped with front lead(4)With back side lead(6), the base(1)On be additionally provided with The disk mesopore led in above and below several(5), the disk mesopore(5)Including by positive ground metal layer(7)With back-side ground metal Layer(8)The metal connecting piece of connection;The disk mesopore(5)In added with filler(16);Semiconductor chip(9)Pass through conducting resinl(10) It is bonded in positive ground metal layer(7)On, semiconductor chip(9)Bonding pressure point(11)Pass through bonding line(12)With front lead (4)Electrical connection;The semiconductor chip(9)Upper surface is covered with Protection glue(13), Protection glue(13)Not reacted with chip And the silicon rubber of good waterproof performance.
2. the capsulation body of semiconductor ship of a kind of high reliability and low cost according to claim 1, it is characterised in that described Disk mesopore(5)For circular port, the circuit on circular port both sides is connected using metallization process.
3. the capsulation body of semiconductor ship of a kind of high reliability and low cost according to claim 1, it is characterised in that described Pipe cap(2)Non-recessed face covered with metal level(15).
A kind of 4. capsulation body of semiconductor ship of high reliability and low cost according to claim 1 or 2, it is characterised in that institute State semiconductor chip(9)Quantity at least two, the semiconductor chip(9)Between pass through bonding line(12)Electrical connection.
CN201510015604.8A 2015-01-13 2015-01-13 A kind of capsulation body of semiconductor ship of high reliability and low cost Active CN104538371B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510015604.8A CN104538371B (en) 2015-01-13 2015-01-13 A kind of capsulation body of semiconductor ship of high reliability and low cost

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510015604.8A CN104538371B (en) 2015-01-13 2015-01-13 A kind of capsulation body of semiconductor ship of high reliability and low cost

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CN104538371B true CN104538371B (en) 2018-01-09

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115986433B (en) * 2023-03-21 2023-08-04 成都雷电微力科技股份有限公司 TR module architecture and process method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1445831A (en) * 2002-03-18 2003-10-01 美新半导体(无锡)有限公司 Cavity type packaging method of microelectronic circuit
CN101908493A (en) * 2010-07-07 2010-12-08 天水天光半导体有限责任公司 Process for producing hybrid integrated circuit
CN102194782A (en) * 2010-03-08 2011-09-21 瑞萨电子株式会社 Semiconductor package, substrate, electronic component, and method of mounting semiconductor package

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202034361U (en) * 2010-09-15 2011-11-09 晶诚(郑州)科技有限公司 Semiconductor packaging structure
CN103681593A (en) * 2013-12-02 2014-03-26 江苏省宜兴电子器件总厂 Leadless ceramic chip carrier packaging structure and process for manufacturing same
CN103681619B (en) * 2013-12-18 2016-09-07 中国电子科技集团公司第五十八研究所 A kind of silica-based hermetic sealing structure and manufacture method thereof
CN104201113B (en) * 2014-09-04 2017-06-16 中国电子科技集团公司第五十八研究所 The hermetic sealing structure and its manufacture method of system in package
CN204348705U (en) * 2015-01-13 2015-05-20 河北博威集成电路有限公司 A kind of capsulation body of semiconductor ship of high reliability and low cost

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1445831A (en) * 2002-03-18 2003-10-01 美新半导体(无锡)有限公司 Cavity type packaging method of microelectronic circuit
CN102194782A (en) * 2010-03-08 2011-09-21 瑞萨电子株式会社 Semiconductor package, substrate, electronic component, and method of mounting semiconductor package
CN101908493A (en) * 2010-07-07 2010-12-08 天水天光半导体有限责任公司 Process for producing hybrid integrated circuit

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