CN104241075B - 利用不同电子电离能量的电子电离 - Google Patents
利用不同电子电离能量的电子电离 Download PDFInfo
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- CN104241075B CN104241075B CN201410222159.8A CN201410222159A CN104241075B CN 104241075 B CN104241075 B CN 104241075B CN 201410222159 A CN201410222159 A CN 201410222159A CN 104241075 B CN104241075 B CN 104241075B
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- electron energy
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/08—Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/925,470 US20140374583A1 (en) | 2013-06-24 | 2013-06-24 | Electron ionization (ei) utilizing different ei energies |
| US13/925,470 | 2013-06-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104241075A CN104241075A (zh) | 2014-12-24 |
| CN104241075B true CN104241075B (zh) | 2018-06-08 |
Family
ID=50721677
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410222159.8A Active CN104241075B (zh) | 2013-06-24 | 2014-05-23 | 利用不同电子电离能量的电子电离 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20140374583A1 (enExample) |
| EP (1) | EP2819148B1 (enExample) |
| JP (1) | JP6522284B2 (enExample) |
| CN (1) | CN104241075B (enExample) |
| ES (1) | ES2773134T3 (enExample) |
| GB (1) | GB2515886A (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2518122B (en) * | 2013-02-19 | 2018-08-08 | Markes International Ltd | An electron ionisation apparatus |
| GB2562170B (en) * | 2013-02-19 | 2019-02-06 | Markes International Ltd | A method of ionising analyte molecules for analysis |
| US9401266B2 (en) * | 2014-07-25 | 2016-07-26 | Bruker Daltonics, Inc. | Filament for mass spectrometric electron impact ion source |
| US10176977B2 (en) | 2014-12-12 | 2019-01-08 | Agilent Technologies, Inc. | Ion source for soft electron ionization and related systems and methods |
| US20170089915A1 (en) * | 2015-09-30 | 2017-03-30 | Agilent Technologies, Inc. | Methods of analyte derivatization and enhanced soft ionization |
| GB2561378B (en) * | 2017-04-12 | 2022-10-12 | Micromass Ltd | Optimised targeted analysis |
| CN111223747A (zh) * | 2018-11-27 | 2020-06-02 | 中国科学院大连化学物理研究所 | 一种用于质谱的能量可调放电光电离源 |
| EP3918624A1 (en) * | 2019-02-01 | 2021-12-08 | DH Technologies Development Pte. Ltd. | A system and method to conduct correlated chemical mapping |
| DE102019208278A1 (de) | 2019-06-06 | 2019-08-01 | Carl Zeiss Smt Gmbh | Ionisierungseinrichtung und Massenspektrometer |
| JP7320249B2 (ja) * | 2019-07-18 | 2023-08-03 | 日本金属化学株式会社 | ガス分析装置 |
| CN111175397A (zh) * | 2020-01-09 | 2020-05-19 | 大连理工大学 | 一种基于GC-QTOF构建的VOCs非目标筛查方法 |
| US11430643B2 (en) * | 2020-09-29 | 2022-08-30 | Tokyo Electron Limited | Quantification of processing chamber species by electron energy sweep |
| CN116635976A (zh) | 2020-12-23 | 2023-08-22 | 万机仪器公司 | 使用质谱测定法监测自由基粒子浓度 |
| EP4441771A1 (en) * | 2021-12-03 | 2024-10-09 | DH Technologies Development Pte. Ltd. | High throughput mass spectral data generation |
| GB2613890A (en) * | 2021-12-20 | 2023-06-21 | Thermo Fisher Scient Bremen Gmbh | A method of determining operational parameters of a spectrometer, a mass spectrometer and computer software configured to perform the method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103069539A (zh) * | 2010-08-19 | 2013-04-24 | 莱克公司 | 具有积聚电子碰撞离子源的飞行时间质谱仪 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3924134A (en) * | 1974-11-29 | 1975-12-02 | Ibm | Double chamber ion source |
| US5107109A (en) * | 1986-03-07 | 1992-04-21 | Finnigan Corporation | Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer |
| IL90970A (en) * | 1989-07-13 | 1993-07-08 | Univ Ramot | Mass spectrometer method and apparatus for analyzing materials |
| JPH04267045A (ja) * | 1991-02-22 | 1992-09-22 | Shimadzu Corp | 電子衝撃型イオン源 |
| EP0515352A1 (de) * | 1991-05-24 | 1992-11-25 | IMS Ionen Mikrofabrikations Systeme Gesellschaft m.b.H. | Ionenquelle |
| RU2084085C1 (ru) * | 1995-07-14 | 1997-07-10 | Центральный научно-исследовательский институт машиностроения | Ускоритель с замкнутым дрейфом электронов |
| JP3623025B2 (ja) * | 1995-09-29 | 2005-02-23 | 日機装株式会社 | 混合気体成分分析装置 |
| JP2820083B2 (ja) * | 1995-11-08 | 1998-11-05 | 日本電気株式会社 | 質量分析装置及びラジカル計測方法 |
| US6630664B1 (en) * | 1999-02-09 | 2003-10-07 | Syagen Technology | Atmospheric pressure photoionizer for mass spectrometry |
| US6617771B2 (en) * | 2002-01-24 | 2003-09-09 | Aviv Amirav | Electron ionization ion source |
| CA2518568C (en) * | 2003-04-09 | 2012-09-25 | Mds Inc., Doing Business Through Its Mds Sciex Division | Dynamic background signal exclusion in chromatography/mass spectrometry data-dependent, data acquisition |
| US7462821B2 (en) * | 2003-04-25 | 2008-12-09 | Griffin Analytical Technologies, L.L.C. | Instrumentation, articles of manufacture, and analysis methods |
| US7291845B2 (en) * | 2005-04-26 | 2007-11-06 | Varian, Inc. | Method for controlling space charge-driven ion instabilities in electron impact ion sources |
| IL168688A (en) * | 2005-05-19 | 2010-02-17 | Aviv Amirav | Method for sample identification by mass spectrometry |
| US7329864B2 (en) * | 2005-09-12 | 2008-02-12 | Yang Wang | Mass spectrometry with multiple ionization sources and multiple mass analyzers |
| US7482580B2 (en) * | 2005-10-20 | 2009-01-27 | Agilent Technologies, Inc. | Dynamic adjustment of ion monitoring periods |
| WO2009044900A1 (ja) * | 2007-10-05 | 2009-04-09 | Hokkaido University | 糖鎖自動前処理装置 |
| WO2009147894A1 (ja) * | 2008-06-05 | 2009-12-10 | 株式会社日立ハイテクノロジーズ | イオンビーム装置 |
| JP5526379B2 (ja) * | 2009-06-25 | 2014-06-18 | 独立行政法人製品評価技術基盤機構 | 新規化合物の同定法 |
| US20120267525A1 (en) * | 2011-04-22 | 2012-10-25 | Horiba Stec, Co., Ltd. | Gas analyzer |
| GB2518122B (en) * | 2013-02-19 | 2018-08-08 | Markes International Ltd | An electron ionisation apparatus |
-
2013
- 2013-06-24 US US13/925,470 patent/US20140374583A1/en not_active Abandoned
-
2014
- 2014-05-08 GB GB1408113.7A patent/GB2515886A/en not_active Withdrawn
- 2014-05-16 EP EP14168583.4A patent/EP2819148B1/en active Active
- 2014-05-16 ES ES14168583T patent/ES2773134T3/es active Active
- 2014-05-20 JP JP2014103955A patent/JP6522284B2/ja active Active
- 2014-05-23 CN CN201410222159.8A patent/CN104241075B/zh active Active
-
2018
- 2018-06-01 US US15/996,033 patent/US20180277348A1/en not_active Abandoned
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103069539A (zh) * | 2010-08-19 | 2013-04-24 | 莱克公司 | 具有积聚电子碰撞离子源的飞行时间质谱仪 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6522284B2 (ja) | 2019-05-29 |
| US20180277348A1 (en) | 2018-09-27 |
| ES2773134T3 (es) | 2020-07-09 |
| EP2819148A2 (en) | 2014-12-31 |
| GB201408113D0 (en) | 2014-06-25 |
| CN104241075A (zh) | 2014-12-24 |
| EP2819148B1 (en) | 2019-12-04 |
| GB2515886A (en) | 2015-01-07 |
| EP2819148A3 (en) | 2015-03-25 |
| US20140374583A1 (en) | 2014-12-25 |
| JP2015007614A (ja) | 2015-01-15 |
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| GR01 | Patent grant |