CN104241075B - 利用不同电子电离能量的电子电离 - Google Patents

利用不同电子电离能量的电子电离 Download PDF

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Publication number
CN104241075B
CN104241075B CN201410222159.8A CN201410222159A CN104241075B CN 104241075 B CN104241075 B CN 104241075B CN 201410222159 A CN201410222159 A CN 201410222159A CN 104241075 B CN104241075 B CN 104241075B
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China
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electron energy
electron
ion
sample
energy
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Chinese (zh)
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CN104241075A (zh
Inventor
H.F.普雷斯特
M.王
J.T.科南
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Agilent Technologies Inc
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Agilent Technologies Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/08Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • H01J49/0031Step by step routines describing the use of the apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201410222159.8A 2013-06-24 2014-05-23 利用不同电子电离能量的电子电离 Active CN104241075B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/925,470 US20140374583A1 (en) 2013-06-24 2013-06-24 Electron ionization (ei) utilizing different ei energies
US13/925,470 2013-06-24

Publications (2)

Publication Number Publication Date
CN104241075A CN104241075A (zh) 2014-12-24
CN104241075B true CN104241075B (zh) 2018-06-08

Family

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CN201410222159.8A Active CN104241075B (zh) 2013-06-24 2014-05-23 利用不同电子电离能量的电子电离

Country Status (6)

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US (2) US20140374583A1 (enExample)
EP (1) EP2819148B1 (enExample)
JP (1) JP6522284B2 (enExample)
CN (1) CN104241075B (enExample)
ES (1) ES2773134T3 (enExample)
GB (1) GB2515886A (enExample)

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GB2518122B (en) * 2013-02-19 2018-08-08 Markes International Ltd An electron ionisation apparatus
GB2562170B (en) * 2013-02-19 2019-02-06 Markes International Ltd A method of ionising analyte molecules for analysis
US9401266B2 (en) * 2014-07-25 2016-07-26 Bruker Daltonics, Inc. Filament for mass spectrometric electron impact ion source
US10176977B2 (en) 2014-12-12 2019-01-08 Agilent Technologies, Inc. Ion source for soft electron ionization and related systems and methods
US20170089915A1 (en) * 2015-09-30 2017-03-30 Agilent Technologies, Inc. Methods of analyte derivatization and enhanced soft ionization
GB2561378B (en) * 2017-04-12 2022-10-12 Micromass Ltd Optimised targeted analysis
CN111223747A (zh) * 2018-11-27 2020-06-02 中国科学院大连化学物理研究所 一种用于质谱的能量可调放电光电离源
EP3918624A1 (en) * 2019-02-01 2021-12-08 DH Technologies Development Pte. Ltd. A system and method to conduct correlated chemical mapping
DE102019208278A1 (de) 2019-06-06 2019-08-01 Carl Zeiss Smt Gmbh Ionisierungseinrichtung und Massenspektrometer
JP7320249B2 (ja) * 2019-07-18 2023-08-03 日本金属化学株式会社 ガス分析装置
CN111175397A (zh) * 2020-01-09 2020-05-19 大连理工大学 一种基于GC-QTOF构建的VOCs非目标筛查方法
US11430643B2 (en) * 2020-09-29 2022-08-30 Tokyo Electron Limited Quantification of processing chamber species by electron energy sweep
CN116635976A (zh) 2020-12-23 2023-08-22 万机仪器公司 使用质谱测定法监测自由基粒子浓度
EP4441771A1 (en) * 2021-12-03 2024-10-09 DH Technologies Development Pte. Ltd. High throughput mass spectral data generation
GB2613890A (en) * 2021-12-20 2023-06-21 Thermo Fisher Scient Bremen Gmbh A method of determining operational parameters of a spectrometer, a mass spectrometer and computer software configured to perform the method

Citations (1)

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CN103069539A (zh) * 2010-08-19 2013-04-24 莱克公司 具有积聚电子碰撞离子源的飞行时间质谱仪

Also Published As

Publication number Publication date
JP6522284B2 (ja) 2019-05-29
US20180277348A1 (en) 2018-09-27
ES2773134T3 (es) 2020-07-09
EP2819148A2 (en) 2014-12-31
GB201408113D0 (en) 2014-06-25
CN104241075A (zh) 2014-12-24
EP2819148B1 (en) 2019-12-04
GB2515886A (en) 2015-01-07
EP2819148A3 (en) 2015-03-25
US20140374583A1 (en) 2014-12-25
JP2015007614A (ja) 2015-01-15

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