CN104136325B - 异常接触检测方法、电子元器件保持装置以及电子元器件搬运装置 - Google Patents

异常接触检测方法、电子元器件保持装置以及电子元器件搬运装置 Download PDF

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Publication number
CN104136325B
CN104136325B CN201280070781.0A CN201280070781A CN104136325B CN 104136325 B CN104136325 B CN 104136325B CN 201280070781 A CN201280070781 A CN 201280070781A CN 104136325 B CN104136325 B CN 104136325B
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China
Prior art keywords
electronic devices
components
rod member
maintaining body
rising
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Expired - Fee Related
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CN201280070781.0A
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English (en)
Chinese (zh)
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CN104136325A (zh
Inventor
南日出夫
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Ueno Seiki Co Ltd
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Ueno Seiki Co Ltd
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Publication of CN104136325A publication Critical patent/CN104136325A/zh
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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/082—Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Sorting Of Articles (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN201280070781.0A 2012-02-28 2012-02-28 异常接触检测方法、电子元器件保持装置以及电子元器件搬运装置 Expired - Fee Related CN104136325B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2012/054874 WO2013128560A1 (ja) 2012-02-28 2012-02-28 異常接触検出方法、電子部品保持装置、及び電子部品搬送装置

Publications (2)

Publication Number Publication Date
CN104136325A CN104136325A (zh) 2014-11-05
CN104136325B true CN104136325B (zh) 2015-09-30

Family

ID=49081814

Family Applications (1)

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CN201280070781.0A Expired - Fee Related CN104136325B (zh) 2012-02-28 2012-02-28 异常接触检测方法、电子元器件保持装置以及电子元器件搬运装置

Country Status (8)

Country Link
JP (1) JP5300111B1 (ja)
KR (1) KR101520677B1 (ja)
CN (1) CN104136325B (ja)
HK (1) HK1202101A1 (ja)
MY (1) MY167646A (ja)
SG (1) SG11201404990XA (ja)
TW (1) TWI583272B (ja)
WO (1) WO2013128560A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6533112B2 (ja) * 2015-07-21 2019-06-19 株式会社Ｆｕｊｉ 回路形成方法
JP6164624B1 (ja) * 2016-10-18 2017-07-19 上野精機株式会社 電子部品移動装置及び電子部品搬送装置
JP7188735B2 (ja) * 2018-08-01 2022-12-13 Thk株式会社 アクチュエータ
TWI778647B (zh) * 2021-06-01 2022-09-21 天正國際精密機械股份有限公司 改良式電子元件植入裝置及植入方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1241958A (zh) * 1996-12-25 2000-01-19 松下电器产业株式会社 元件吸持头、元件装配装置及元件吸持方法
JP2000264305A (ja) * 1999-03-15 2000-09-26 Shin Etsu Polymer Co Ltd キャリアテープの検査方法
JP2005096789A (ja) * 2003-09-24 2005-04-14 Ricoh Co Ltd キャリアテープ及びその製造方法、並びにそのキャリアテープを用いた電子部品の実装方法及び外観検査方法
JP2007145365A (ja) * 2005-11-28 2007-06-14 Ueno Seiki Kk テーピング装置及びその制御方法
JP4202102B2 (ja) * 2002-12-03 2008-12-24 上野精機株式会社 半導体装置のテーピング装置
JP4462705B2 (ja) * 2000-03-30 2010-05-12 三井金属鉱業株式会社 電子部品実装用フィルムキャリアテープの最終不良マーキング装置
JP2010129718A (ja) * 2008-11-27 2010-06-10 Juki Corp 部品実装装置
JP2010131680A (ja) * 2008-12-02 2010-06-17 Ueno Seiki Kk 保持手段駆動装置
CN101873792A (zh) * 2009-04-23 2010-10-27 东京威尔斯股份有限公司 工件插入机构以及工件插入方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004328846A (ja) * 2003-04-22 2004-11-18 Olympus Corp 荷重制御装置、荷重制御式アクチュエータ及び荷重制御方法
JP2005142313A (ja) * 2003-11-06 2005-06-02 Tdk Corp 実装処理装置用接触開始検出装置及び該装置を備えた実装処理装置
CN103229610B (zh) * 2010-11-30 2016-01-20 上野精机株式会社 电子零件的保持装置、检查装置以及分类装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1241958A (zh) * 1996-12-25 2000-01-19 松下电器产业株式会社 元件吸持头、元件装配装置及元件吸持方法
JP2000264305A (ja) * 1999-03-15 2000-09-26 Shin Etsu Polymer Co Ltd キャリアテープの検査方法
JP4462705B2 (ja) * 2000-03-30 2010-05-12 三井金属鉱業株式会社 電子部品実装用フィルムキャリアテープの最終不良マーキング装置
JP4202102B2 (ja) * 2002-12-03 2008-12-24 上野精機株式会社 半導体装置のテーピング装置
JP2005096789A (ja) * 2003-09-24 2005-04-14 Ricoh Co Ltd キャリアテープ及びその製造方法、並びにそのキャリアテープを用いた電子部品の実装方法及び外観検査方法
JP2007145365A (ja) * 2005-11-28 2007-06-14 Ueno Seiki Kk テーピング装置及びその制御方法
JP2010129718A (ja) * 2008-11-27 2010-06-10 Juki Corp 部品実装装置
JP2010131680A (ja) * 2008-12-02 2010-06-17 Ueno Seiki Kk 保持手段駆動装置
CN101873792A (zh) * 2009-04-23 2010-10-27 东京威尔斯股份有限公司 工件插入机构以及工件插入方法

Also Published As

Publication number Publication date
SG11201404990XA (en) 2014-11-27
KR20140103185A (ko) 2014-08-25
CN104136325A (zh) 2014-11-05
JPWO2013128560A1 (ja) 2015-07-30
HK1202101A1 (zh) 2015-09-18
WO2013128560A1 (ja) 2013-09-06
MY167646A (en) 2018-09-21
KR101520677B1 (ko) 2015-05-15
TW201343022A (zh) 2013-10-16
TWI583272B (zh) 2017-05-11
JP5300111B1 (ja) 2013-09-25

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