CN103826800B - 精制作业支援装置、精制作业支援方法及精制作业支援系统 - Google Patents

精制作业支援装置、精制作业支援方法及精制作业支援系统 Download PDF

Info

Publication number
CN103826800B
CN103826800B CN201280047127.8A CN201280047127A CN103826800B CN 103826800 B CN103826800 B CN 103826800B CN 201280047127 A CN201280047127 A CN 201280047127A CN 103826800 B CN103826800 B CN 103826800B
Authority
CN
China
Prior art keywords
mentioned
refining
work support
steel plate
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201280047127.8A
Other languages
English (en)
Chinese (zh)
Other versions
CN103826800A (zh
Inventor
中尾宪午
原田稔
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Publication of CN103826800A publication Critical patent/CN103826800A/zh
Application granted granted Critical
Publication of CN103826800B publication Critical patent/CN103826800B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00—Other grinding machines or devices
    • B24B27/033—Other grinding machines or devices for grinding a surface for cleaning purposes, e.g. for descaling or for grinding off flaws in the surface
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8809—Adjustment for highlighting flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • G01N2021/887—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing the measurements made in two or more directions, angles, positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Factory Administration (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
CN201280047127.8A 2012-02-06 2012-11-07 精制作业支援装置、精制作业支援方法及精制作业支援系统 Expired - Fee Related CN103826800B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012-023173 2012-02-06
JP2012023173 2012-02-06
PCT/JP2012/078838 WO2013118357A1 (ja) 2012-02-06 2012-11-07 精整作業支援装置、精整作業支援方法及び精整作業支援システム

Publications (2)

Publication Number Publication Date
CN103826800A CN103826800A (zh) 2014-05-28
CN103826800B true CN103826800B (zh) 2016-02-17

Family

ID=48947144

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280047127.8A Expired - Fee Related CN103826800B (zh) 2012-02-06 2012-11-07 精制作业支援装置、精制作业支援方法及精制作业支援系统

Country Status (5)

Country Link
JP (1) JP5382262B1 (ja)
KR (1) KR101513407B1 (ja)
CN (1) CN103826800B (ja)
BR (1) BR112014008297A2 (ja)
WO (1) WO2013118357A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104669064A (zh) * 2015-01-21 2015-06-03 苏州市国之福自动化设备有限公司 Cnc视觉辅助加工系统及方法
CN107407930A (zh) * 2015-04-01 2017-11-28 三菱电机株式会社 作业指示系统
JP6678298B2 (ja) * 2016-09-28 2020-04-08 パナソニックＩｐマネジメント株式会社 フィーダ配置支援システムおよびフィーダ配置支援方法
JP6580723B2 (ja) * 2018-01-16 2019-09-25 株式会社神鋼エンジニアリング＆メンテナンス 鋼板の形状矯正装置及び形状矯正方法
CN110666874A (zh) * 2019-10-12 2020-01-10 广东瑞洲科技有限公司 一种具有扫描、投影以及视觉定位功能的柔性材料切割机

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666523A (ja) * 1992-08-18 1994-03-08 Yoshikawa Kogyo Co Ltd 板の寸法測定方法
JPH07308852A (ja) * 1994-05-16 1995-11-28 Noritake Co Ltd 疵取り用研削装置
JPH1010054A (ja) * 1996-06-26 1998-01-16 Nissan Motor Co Ltd 表面欠陥検査装置
JPH10277912A (ja) * 1997-04-04 1998-10-20 Nippon Steel Corp 鋼片の表面疵処理方法
JP2002289377A (ja) * 2001-03-28 2002-10-04 Toshiba Lighting & Technology Corp 照明制御システム
JP2009053122A (ja) * 2007-08-28 2009-03-12 Panasonic Electric Works Co Ltd 透明フィルム外観検査システム
JP4260451B2 (ja) * 2002-09-30 2009-04-30 関東自動車工業株式会社 車両塗面検査用欠陥マーキング装置
JP2011075301A (ja) * 2009-09-29 2011-04-14 Koike Sanso Kogyo Co Ltd 寸法検査システム及び寸法検査方法
JP2011239029A (ja) * 2010-05-06 2011-11-24 Hitachi Consumer Electronics Co Ltd 映像表示装置、省電力制御装置、及び省電力方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006268212A (ja) * 2005-03-23 2006-10-05 Hiroshi Mitsumata 命令入力装置
CN100460099C (zh) * 2006-12-08 2009-02-11 广州珠江钢铁有限责任公司 一种薄规格热轧钢板的轧制操作方法
KR101102242B1 (ko) * 2009-11-25 2012-01-03 주식회사 프라이머스코즈 의사 손동작으로 제어되는 수술실용 환자정보 디스플레이 장치와 그 제어방법
CN202155373U (zh) * 2011-06-24 2012-03-07 武汉点线科技有限公司 一种热轧钢板几何尺寸测量装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666523A (ja) * 1992-08-18 1994-03-08 Yoshikawa Kogyo Co Ltd 板の寸法測定方法
JPH07308852A (ja) * 1994-05-16 1995-11-28 Noritake Co Ltd 疵取り用研削装置
JPH1010054A (ja) * 1996-06-26 1998-01-16 Nissan Motor Co Ltd 表面欠陥検査装置
JPH10277912A (ja) * 1997-04-04 1998-10-20 Nippon Steel Corp 鋼片の表面疵処理方法
JP2002289377A (ja) * 2001-03-28 2002-10-04 Toshiba Lighting & Technology Corp 照明制御システム
JP4260451B2 (ja) * 2002-09-30 2009-04-30 関東自動車工業株式会社 車両塗面検査用欠陥マーキング装置
JP2009053122A (ja) * 2007-08-28 2009-03-12 Panasonic Electric Works Co Ltd 透明フィルム外観検査システム
JP2011075301A (ja) * 2009-09-29 2011-04-14 Koike Sanso Kogyo Co Ltd 寸法検査システム及び寸法検査方法
JP2011239029A (ja) * 2010-05-06 2011-11-24 Hitachi Consumer Electronics Co Ltd 映像表示装置、省電力制御装置、及び省電力方法

Also Published As

Publication number Publication date
KR101513407B1 (ko) 2015-04-17
JP5382262B1 (ja) 2014-01-08
BR112014008297A2 (pt) 2017-04-18
KR20140046486A (ko) 2014-04-18
WO2013118357A1 (ja) 2013-08-15
CN103826800A (zh) 2014-05-28
JPWO2013118357A1 (ja) 2015-05-11

Similar Documents

Publication Publication Date Title
CN103826800B (zh) 精制作业支援装置、精制作业支援方法及精制作业支援系统
TW383238B (en) Process and device for the automatical detection and removal of surface flaws of continuous casting products
CN106233827B (zh) 管理装置
KR101231347B1 (ko) 다이 본더의 치공구 관리 방법 및 다이 본더
CN102531367B (zh) 基板加工方法
WO2018092250A1 (ja) セットアップ支援装置
JP5620890B2 (ja) 切断方法及び切断装置
US20070282718A1 (en) Stone cutting management system
KR20110067112A (ko) 전자 부품 실장용 장치 및 전자 부품 실장용 장치에서의 조작 지시 방법
JP5481105B2 (ja) 切断装置
US10197989B2 (en) Robot controller of robot used with machine tool, and processing system
JP2018142572A (ja) パッケージ基板の分割方法
JP4796462B2 (ja) 実装機の部品集合体割付方法および部品集合体割付装置、実装機
CN104339241B (zh) 切削余量的均匀化方法和板材的周缘磨削装置
Sousa et al. Zero-Defect Manufacturing using data-driven technologies to support the natural stone industry
CN109108404A (zh) 一种电火花加工装置、系统及方法
US6876898B1 (en) Method of identifying workstations that performed work on a workpiece
CN211565317U (zh) 钻孔加工系统
JP2005353750A (ja) 電子部品搭載装置の保守管理装置
KR20130129086A (ko) 스크라이브 처리 시스템
CN108620745B (zh) 一种短行程切割长零件的卷料连续切割装置及其切割方法
KR101279313B1 (ko) 슬라브 형상 측정장치가 구비된 그라인딩 장치
KR102592786B1 (ko) 가공 장치의 관리 방법 및 가공 장치
JP7153822B2 (ja) セットアップ支援装置
CN111201493A (zh) 机床装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CP01 Change in the name or title of a patent holder

Address after: Tokyo, Japan

Patentee after: Nippon Iron & Steel Corporation

Address before: Tokyo, Japan

Patentee before: Nippon Steel Corporation

CP01 Change in the name or title of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160217

Termination date: 20201107

CF01 Termination of patent right due to non-payment of annual fee