CN103752527A - Method for automatically identifying defective products of electronic products - Google Patents
Method for automatically identifying defective products of electronic products Download PDFInfo
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- CN103752527A CN103752527A CN201410004780.7A CN201410004780A CN103752527A CN 103752527 A CN103752527 A CN 103752527A CN 201410004780 A CN201410004780 A CN 201410004780A CN 103752527 A CN103752527 A CN 103752527A
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- defective products
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Abstract
The invention discloses a method for automatically identifying defective products of electronic products, relating to the technical field of the detection of electronic products. The method comprises the following steps: S1, placing electronic products arranged on a disc or electronic products on the whole board in a testing machine conveyor belt; S2, sending the electronic products to a testing position; S3, testing the electronic products; S4, after the testing is ended, determining the positions of defective products according to testing results; and S5, identifying the defective products by controlling an identification device. The method for automatically identifying the defective products of the electronic products, disclosed by the invention, is capable of rapidly and accurately identifying the defective products in the electronic products arranged on the disc, thus the production efficiency is increased, and the labor intensity of workers is reduced.
Description
Technical field
The present invention relates to electronic product detection technique field, particularly a kind of method of Automatic Logos electronic product defective products.
Background technology
Along with the development of automatic technology, electronics production industry is all to adopt automatic production line to carry out manufacture electronic product substantially, electronic product is all employing dish dress form conventionally after producing or interconnects for a whole plate enters into next process, as detection, encapsulation, storage, transportation etc.On each material disc or each whole plate with the multiple electronic products of array format, for example, a material disc or a whole plate laterally have 15 electronic products, with English alphabet A～O, represent respectively; Longitudinally have 12 electronic products, with numeral 1～12, represent respectively, thereby can determine the position of each electronic product in material disc or whole plate.
Electronic product all will carry out performance test before dispatching from the factory, as shown in Figure 1, when carrying out electronic product performance test, first by all rotating toolings, electronic product to be tested is sent in the feed conveyor belt of test machine, by conveyer belt, electronic product is delivered to test point fixing, then carry out electronic product test, after test finishes, test machine prints the Map figure (non-defective unit testing out and the defective products location map on material disc or whole plate) of the electronic product of test, and electronic product is sent to all rotating toolings by workman, is taken off.Workman identifies out with oil pike by the defective products on material disc or whole plate according to the Map figure of test machine output, for example: the defective products position showing on Map figure is C8, workman will be laterally C, is longitudinally to mark on 8 electronic product, identifies defective products.The mode of this kind of artificial sign electronic product defective products has following deficiency:
One, poor accuracy, due to the small volume of electronic product, densely distributed and quantity is many again, workman is easy to miscount column or row when definite defective products position, thereby mislabels.
Two, the position of manually carrying out the to determine defective products rower note of going forward side by side, speed is slow, thus production efficiency is lower; And workman's labour intensity is large.
Summary of the invention
Technical problem to be solved by this invention is to provide a kind of method of Automatic Logos electronic product defective products, and the method can mark the defective products of dish dress electronics electronic product automatically, and sign is accurate, and production efficiency is high.
For solving the problems of the technologies described above, technical scheme of the present invention is:
A method for Automatic Logos electronic product defective products, comprises the following steps: S1, dish dress electronic product or whole plate electronic product are put into test machine conveyer belt; S2, described electronic product is delivered to test position; S3, described electronic product is tested; After S4, test finish, according to test result, determine the position of defective products; S5, control identity device identify described defective products.
Wherein, when described identity device is described marking device, described marking device is stencil sign on described defective products.
Wherein, when described identity device is described laser beam emitting device, described laser beam emitting device is in the enterprising eleven punch 11 sign of described defective products.
Wherein, when described identity device is described thimble or described push rod, described thimble or described push rod destroy described defective products.
As a kind of embodiment, at electronic product described in described step S5, maintain static, the position that described identity device runs to described defective products identifies.
As another kind of embodiment, at electronic product described in described step S5, to move, the operating point that described defective products is transported to described identity device identifies.
Adopted after technique scheme, the invention has the beneficial effects as follows:
In method due to Automatic Logos electronic product defective products of the present invention, after the test of electronic product is finished, by program, according to test result, determine the position of defective products in material disc or whole plate, then control identity device and automatically defective products is made to sign.This kind of method has the following advantages compared with manually identifying defective products in prior art:
One, defective products position is determined according to test result by program, without artificial, determine, thus there will not be the problem that miscounts row or column, accurate positioning, thus there will not be situation about mislabeling, defective products sign accuracy rate is high.
Two, Automatic Logos, speed is fast, and production efficiency is high, and labor strength is low.
Accompanying drawing explanation
Fig. 1 is the flow chart that identifies electronic product defective products in background technology;
Fig. 2 is the flow chart of the method for Automatic Logos electronic product defective products of the present invention.
The specific embodiment
Below in conjunction with drawings and Examples, further set forth the present invention.
Embodiment mono-:
As shown in Figure 2, a kind of method of Automatic Logos electronic product defective products, before carrying out electronic product test, first the material disc that electronic product is housed is placed in all rotating toolings, by all rotating toolings, material disc is sent on the conveyer belt of test machine, then by conveyer belt, material disc is transported to test point position.Material disc arrives behind test point position, and material disc is positioned, and then the electronic product in material disc is carried out to performance test.After test finishes, by program, according to test result, determine defective products residing position in material disc, then material disc maintains static, and by programme-control identity device, moves to defective products position, and defective products is identified.Then the material disc that identified defective products is sent into all rotating toolings, by all rotating toolings, electronic product dish is sent into next process.
Identity device is marking device, laser beam emitting device, thimble or push rod.
When identity device is marking device, marking device is moved to the position of defective products by programme-control, at the tow sides of defective products, stamp ink sign, and defective products is distinguished.
When identity device is laser beam emitting device, laser beam emitting device is moved to the position of defective products by programme-control, launches laser beam at the enterprising eleven punch 11 of defective products, and defective products is distinguished.
When identity device is thimble or push rod, thimble or push rod are moved to the position of defective products by programme-control, and defective products is pushed up from electronic product dish.
The electronic product of placing in material disc can be the finished products such as mini microphone, Microspeaker, can be also some electronic components, as chip etc.
Embodiment bis-:
Present embodiment and embodiment mono-are basic identical, and its difference is:
Identity device is not done movement, but material disc moves.By programme-control charging tray, moved the position, operating point of defective products being delivered to identity device, then control identity device action, defective products is identified out.
Identity device in above-described embodiment or material disc can pass through stepper motor or driven by servomotor, due to stepper motor and servomotor, being applied in displacement scheme is accurately the common practise of this area, concrete application mode is also a lot, those skilled in the art do not need performing creative labour just can realize, and the content of this respect is not invention main points of the present invention, therefore be not described in detail in this.
Identity device in the present invention can be mounted in parts on test machine, shares a set of programme-control work with test machine; Also can be a set of independent device, its by carrying out data communication with test machine with test machine cooperating.
Above-described embodiment is that to coil dress electronic product be that example has been set forth the present invention, because of the embodiment that whole plate electronic product carried out to performance test with coil that to fill electronic product consistent, therefore the testing process of whole plate electronic product is repeated no more again for the present invention.
The present invention is not limited to above-mentioned concrete embodiment, and those of ordinary skill in the art is from above-mentioned design, and without performing creative labour, all conversion of having done, within all dropping on protection scope of the present invention.
Claims (7)
1. the method for Automatic Logos electronic product defective products, comprises the following steps:
S1, dish dress electronic product or whole plate electronic product are put into test machine conveyer belt;
S2, described electronic product is transported to test position;
S3, described electronic product is tested;
After S4, test finish, according to test result, determine the position of defective products;
S5, control identity device identify described defective products.
2. the method for Automatic Logos electronic product defective products according to claim 1, is characterized in that: the identity device described in described step S5 is marking device, laser beam emitting device, thimble or push rod.
3. the method for Automatic Logos electronic product defective products according to claim 2, is characterized in that: when described identity device is described marking device, described marking device is stencil sign on described defective products.
4. the method for Automatic Logos electronic product defective products according to claim 2, is characterized in that: when described identity device is described laser beam emitting device, described laser beam emitting device is in the enterprising eleven punch 11 sign of described defective products.
5. the method for Automatic Logos electronic product defective products according to claim 2, is characterized in that: when described identity device is described thimble or described push rod, described thimble or described push rod destroy described defective products.
6. according to the method for the Automatic Logos electronic product defective products described in claim 3 to 5 any one claim, it is characterized in that: at electronic product described in described step S5, maintain static, the position that described identity device moves to described defective products identifies.
7. according to the method for the Automatic Logos electronic product defective products described in claim 3 to 5 any one claim, it is characterized in that: at electronic product described in described step S5, move, the operating point that described defective products is transported to described identity device identifies.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410004780.7A CN103752527A (en) | 2014-01-06 | 2014-01-06 | Method for automatically identifying defective products of electronic products |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410004780.7A CN103752527A (en) | 2014-01-06 | 2014-01-06 | Method for automatically identifying defective products of electronic products |
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| CN103752527A true CN103752527A (en) | 2014-04-30 |
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| CN201410004780.7A Pending CN103752527A (en) | 2014-01-06 | 2014-01-06 | Method for automatically identifying defective products of electronic products |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109031087A (en) * | 2018-06-11 | 2018-12-18 | 苏州福莱盈电子有限公司 | A kind of method of board to board connector whole plate electrical measurement |
| CN112108776A (en) * | 2020-09-17 | 2020-12-22 | 广东吉洋视觉技术有限公司 | High-precision laser marking method for LED lamp bead defective product marking |
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| CN101493495A (en) * | 2009-03-06 | 2009-07-29 | 江都市东元机电设备有限公司 | Semiconductor device testing and sorting machine |
| CN101806856A (en) * | 2009-12-25 | 2010-08-18 | 陈奕平 | Full-automatic circuit board testing machine |
| JP2011025134A (en) * | 2009-07-23 | 2011-02-10 | Yanmar Co Ltd | Object sorter |
| CN102921644A (en) * | 2012-11-17 | 2013-02-13 | 吴华 | Turret test selector |
| CN103372544A (en) * | 2012-04-12 | 2013-10-30 | 未来产业株式会社 | Sorting system for semiconductor element |
| CN203356078U (en) * | 2013-07-29 | 2013-12-25 | 东莞市联友自动化科技有限公司 | Automatic sorting machine for strain meters |
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2014
- 2014-01-06 CN CN201410004780.7A patent/CN103752527A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101493495A (en) * | 2009-03-06 | 2009-07-29 | 江都市东元机电设备有限公司 | Semiconductor device testing and sorting machine |
| JP2011025134A (en) * | 2009-07-23 | 2011-02-10 | Yanmar Co Ltd | Object sorter |
| CN101806856A (en) * | 2009-12-25 | 2010-08-18 | 陈奕平 | Full-automatic circuit board testing machine |
| CN103372544A (en) * | 2012-04-12 | 2013-10-30 | 未来产业株式会社 | Sorting system for semiconductor element |
| CN102921644A (en) * | 2012-11-17 | 2013-02-13 | 吴华 | Turret test selector |
| CN203356078U (en) * | 2013-07-29 | 2013-12-25 | 东莞市联友自动化科技有限公司 | Automatic sorting machine for strain meters |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109031087A (en) * | 2018-06-11 | 2018-12-18 | 苏州福莱盈电子有限公司 | A kind of method of board to board connector whole plate electrical measurement |
| CN112108776A (en) * | 2020-09-17 | 2020-12-22 | 广东吉洋视觉技术有限公司 | High-precision laser marking method for LED lamp bead defective product marking |
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Address after: 261031 Dongfang Road, Weifang high tech Industrial Development Zone, Shandong, China, No. 268 Applicant after: Goertek Inc. Address before: 261031 Dongfang Road, Weifang high tech Industrial Development Zone, Shandong, China, No. 268 Applicant before: Goertek Inc. |
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Application publication date: 20140430 |
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