CN103718024B - 平板玻璃检查装置、平板玻璃检查方法、平板玻璃制造装置以及平板玻璃制造方法 - Google Patents

平板玻璃检查装置、平板玻璃检查方法、平板玻璃制造装置以及平板玻璃制造方法 Download PDF

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Publication number
CN103718024B
CN103718024B CN201280034975.5A CN201280034975A CN103718024B CN 103718024 B CN103718024 B CN 103718024B CN 201280034975 A CN201280034975 A CN 201280034975A CN 103718024 B CN103718024 B CN 103718024B
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sheet glass
defect candidate
glass
defect
scope
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CN103718024A (zh
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谷田刚夫
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Nippon Electric Glass Co Ltd
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Nippon Electric Glass Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201280034975.5A 2011-09-15 2012-09-05 平板玻璃检查装置、平板玻璃检查方法、平板玻璃制造装置以及平板玻璃制造方法 Active CN103718024B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011-202283 2011-09-15
JP2011202283A JP5796430B2 (ja) 2011-09-15 2011-09-15 板ガラス検査装置、板ガラス検査方法、板ガラス製造装置、及び板ガラス製造方法
PCT/JP2012/072624 WO2013038972A1 (ja) 2011-09-15 2012-09-05 板ガラス検査装置、板ガラス検査方法、板ガラス製造装置、及び板ガラス製造方法

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CN103718024A CN103718024A (zh) 2014-04-09
CN103718024B true CN103718024B (zh) 2016-03-09

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CN201280034975.5A Active CN103718024B (zh) 2011-09-15 2012-09-05 平板玻璃检查装置、平板玻璃检查方法、平板玻璃制造装置以及平板玻璃制造方法

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JP (1) JP5796430B2 (ja)
KR (1) KR101935979B1 (ja)
CN (1) CN103718024B (ja)
TW (1) TWI548871B (ja)
WO (1) WO2013038972A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101755136B1 (ko) * 2014-02-21 2017-07-06 아반스트레이트 가부시키가이샤 유리판의 제조 방법 및 유리판의 제조 장치
KR101733018B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
JP6674138B2 (ja) * 2016-05-12 2020-04-01 日本電気硝子株式会社 ガラス板の製造装置およびガラス板の製造方法
CN114981218A (zh) * 2020-03-25 2022-08-30 日本电气硝子株式会社 玻璃板制造方法及其制造装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004125686A (ja) * 2002-10-04 2004-04-22 Nippon Steel Corp 鋼板の疵検出方法、鋼板の疵検出装置、コンピュータプログラム及びコンピュータ読み取り可能な記録媒体
JP2005069989A (ja) * 2003-08-27 2005-03-17 Apollo Mec:Kk 検査装置
CN102099672A (zh) * 2008-07-18 2011-06-15 旭硝子株式会社 用于缺陷检查的图像数据的处理装置及方法、使用它们的缺陷检查装置及方法、使用它们的板状体的制造方法、以及存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3218908B2 (ja) * 1995-03-23 2001-10-15 日本鋼管株式会社 表面疵検査方法及びその装置
KR100897223B1 (ko) * 2004-11-24 2009-05-14 아사히 가라스 가부시키가이샤 투명 판상체의 결함 검사 방법 및 장치
JP4626982B2 (ja) * 2005-02-10 2011-02-09 セントラル硝子株式会社 ガラス板の端面の欠陥検出装置および検出方法
US7283227B2 (en) * 2005-11-21 2007-10-16 Corning Incorporated Oblique transmission illumination inspection system and method for inspecting a glass sheet
JP5169194B2 (ja) * 2006-12-14 2013-03-27 日本電気硝子株式会社 板ガラス欠陥検出装置、板ガラスの製造方法
JP2010019834A (ja) * 2008-06-13 2010-01-28 Nippon Electric Glass Co Ltd 板ガラス欠陥検査装置及びフラットパネルディスプレイ用板ガラスの製造方法
JP5206697B2 (ja) * 2009-01-15 2013-06-12 新日鐵住金株式会社 連続欠陥判定方法、連続欠陥判定装置及びプログラム
JP5373593B2 (ja) * 2009-12-25 2013-12-18 シャープ株式会社 画像処理方法、画像処理装置、プログラムおよび記録媒体

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004125686A (ja) * 2002-10-04 2004-04-22 Nippon Steel Corp 鋼板の疵検出方法、鋼板の疵検出装置、コンピュータプログラム及びコンピュータ読み取り可能な記録媒体
JP2005069989A (ja) * 2003-08-27 2005-03-17 Apollo Mec:Kk 検査装置
CN102099672A (zh) * 2008-07-18 2011-06-15 旭硝子株式会社 用于缺陷检查的图像数据的处理装置及方法、使用它们的缺陷检查装置及方法、使用它们的板状体的制造方法、以及存储介质

Also Published As

Publication number Publication date
TWI548871B (zh) 2016-09-11
KR101935979B1 (ko) 2019-01-07
JP2013064615A (ja) 2013-04-11
JP5796430B2 (ja) 2015-10-21
KR20140060280A (ko) 2014-05-19
CN103718024A (zh) 2014-04-09
WO2013038972A1 (ja) 2013-03-21
TW201312097A (zh) 2013-03-16

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