CN103688140B - 包括浮桥的用于电容式测量的集成电路 - Google Patents

包括浮桥的用于电容式测量的集成电路 Download PDF

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Publication number
CN103688140B
CN103688140B CN201280029578.9A CN201280029578A CN103688140B CN 103688140 B CN103688140 B CN 103688140B CN 201280029578 A CN201280029578 A CN 201280029578A CN 103688140 B CN103688140 B CN 103688140B
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China
Prior art keywords
potential
referenced
integrated circuit
ground
electronic system
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CN201280029578.9A
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English (en)
Chinese (zh)
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CN103688140A (zh
Inventor
克里斯多夫·布隆丹
克丽汀·尼尔
迪迪埃·罗齐埃
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Fogale Nanotech SAS
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Fogale Nanotech SAS
Unity Semiconductor SAS
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Priority to CN201610526016.5A priority Critical patent/CN106123929B/zh
Publication of CN103688140A publication Critical patent/CN103688140A/zh
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electronic Switches (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
CN201280029578.9A 2011-06-16 2012-06-08 包括浮桥的用于电容式测量的集成电路 Active CN103688140B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610526016.5A CN106123929B (zh) 2011-06-16 2012-06-08 包括浮桥的用于电容式测量的集成电路

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1155288A FR2976675B1 (fr) 2011-06-16 2011-06-16 Circuit integre de mesure capacitive a pont flottant.
FR1155288 2011-06-16
PCT/FR2012/051290 WO2012172241A1 (fr) 2011-06-16 2012-06-08 Circuit intégré de mesure capacitive a pont flottant

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN201610526016.5A Division CN106123929B (zh) 2011-06-16 2012-06-08 包括浮桥的用于电容式测量的集成电路

Publications (2)

Publication Number Publication Date
CN103688140A CN103688140A (zh) 2014-03-26
CN103688140B true CN103688140B (zh) 2016-08-17

Family

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Family Applications (2)

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CN201280029578.9A Active CN103688140B (zh) 2011-06-16 2012-06-08 包括浮桥的用于电容式测量的集成电路
CN201610526016.5A Expired - Fee Related CN106123929B (zh) 2011-06-16 2012-06-08 包括浮桥的用于电容式测量的集成电路

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Country Status (7)

Country Link
US (1) US8933710B2 (enExample)
EP (1) EP2702363B1 (enExample)
JP (2) JP5955951B2 (enExample)
KR (1) KR102033183B1 (enExample)
CN (2) CN103688140B (enExample)
FR (1) FR2976675B1 (enExample)
WO (1) WO2012172241A1 (enExample)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9323398B2 (en) 2009-07-10 2016-04-26 Apple Inc. Touch and hover sensing
US9098138B2 (en) 2010-08-27 2015-08-04 Apple Inc. Concurrent signal detection for touch and hover sensing
FR2976724B1 (fr) * 2011-06-16 2013-07-12 Nanotec Solution Dispositif pour generer une difference de tension alternative entre des potentiels de reference de systemes electroniques.
FR2985048B1 (fr) * 2011-12-21 2014-08-15 Nanotec Solution Dispositif et procede de mesure capacitive sensible a la pression pour interfaces tactiles et sans contact
US9201547B2 (en) 2012-04-30 2015-12-01 Apple Inc. Wide dynamic range capacitive sensing
US9336723B2 (en) 2013-02-13 2016-05-10 Apple Inc. In-cell touch for LED
US9933879B2 (en) 2013-11-25 2018-04-03 Apple Inc. Reconfigurable circuit topology for both self-capacitance and mutual capacitance sensing
EP3796594B1 (en) 2013-12-13 2022-12-14 Apple Inc. Integrated touch and display architectures for self-capacitive touch sensors
US20150338958A1 (en) * 2014-05-20 2015-11-26 Semtech Corporation Measuring circuit for a capacitive touch-sensitive panel
WO2015178920A1 (en) 2014-05-22 2015-11-26 Onamp Research Llc Panel bootstrapping architectures for in-cell self-capacitance
FR3022342B1 (fr) * 2014-06-13 2016-07-01 Fogale Nanotech Procede de suivi temps reel de l'etat de fonctionnement d'un capteur capacitif
EP2975501B1 (en) * 2014-07-18 2023-08-02 Semtech Corporation A measuring circuit and measuring method for a capacitive touch-sensitive panel
JP6720195B2 (ja) * 2015-01-30 2020-07-08 ローディア ポリアミダ エ エスペシアリダデス エス.アー. 香料組成物およびエアケアデバイス
WO2016126525A1 (en) 2015-02-02 2016-08-11 Apple Inc. Flexible self-capacitance and mutual capacitance touch sensing system architecture
US10132651B2 (en) * 2015-03-23 2018-11-20 Iee International Electronics & Engineering S.A. Capacitive sensing system with hardware diagnostics concept for detection of sensor interruption
US10386962B1 (en) 2015-08-03 2019-08-20 Apple Inc. Reducing touch node electrode coupling
DE102016202403A1 (de) 2016-02-17 2017-08-17 Continental Teves Ag & Co. Ohg Sensor
DE102016202402A1 (de) * 2016-02-17 2017-08-17 Continental Teves Ag & Co. Ohg Sensor
FR3051266B1 (fr) 2016-05-12 2019-07-05 Fogale Nanotech Dispositif d'interface capacitive a structure d'electrodes mixtes, et appareil comprenant le dispositif
FR3051896B1 (fr) * 2016-05-25 2018-05-25 Fogale Nanotech Dispositif de detection capacitive a garde nulle
CN109564485B (zh) * 2016-07-29 2022-04-01 苹果公司 具有多电源域芯片配置的触摸传感器面板
JP6775774B2 (ja) * 2016-09-29 2020-10-28 天馬微電子有限公司 触覚提示装置及びその制御方法
KR102720533B1 (ko) * 2016-12-05 2024-10-24 삼성디스플레이 주식회사 터치 센서 및 이를 구비한 디스플레이 장치
FR3066131B1 (fr) * 2017-05-15 2019-06-14 Fogale Nanotech Robot dote d'une detection capacitive
KR102004518B1 (ko) * 2017-08-21 2019-07-26 김태윤 물체 접근 감지 장치 및 이를 이용한 충돌방지 안전시스템
FR3070294B1 (fr) * 2017-08-28 2021-01-22 Fogale Nanotech Dispositif de detection multi-distances pour un robot, et robot equipe de tel(s) dispositif(s)
US10990221B2 (en) 2017-09-29 2021-04-27 Apple Inc. Multi-power domain touch sensing
US11086463B2 (en) 2017-09-29 2021-08-10 Apple Inc. Multi modal touch controller
KR102256602B1 (ko) * 2017-12-14 2021-05-26 주식회사 엘지에너지솔루션 전압 측정 장치 및 방법
US10802072B2 (en) * 2018-05-11 2020-10-13 Fluke Corporation Non-contact DC voltage measurement device with oscillating sensor
US11016616B2 (en) 2018-09-28 2021-05-25 Apple Inc. Multi-domain touch sensing with touch and display circuitry operable in guarded power domain
FR3091759B1 (fr) * 2019-01-10 2021-01-01 Fogale Nanotech Procédé et dispositif de détection capacitive discriminante, et équipement pourvu d’un tel dispositif.
US11366544B2 (en) * 2019-09-27 2022-06-21 Novatek Microelectronics Corp. Touch scheme with an internal capacitor reduction method
US11662867B1 (en) 2020-05-30 2023-05-30 Apple Inc. Hover detection on a touch sensor panel
WO2024150744A1 (ja) * 2023-01-10 2024-07-18 株式会社ジャパンディスプレイ 検出装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2608751A1 (fr) * 1986-12-19 1988-06-24 Onera (Off Nat Aerospatiale) Chaine de mesure dimensionnelle capacitive
FR2756048A1 (fr) * 1996-11-15 1998-05-22 Nanotec Ingenierie Pont de mesure capacitif flottant et systeme de mesure multi-capacitif associe
US20080231292A1 (en) * 2005-11-24 2008-09-25 Frederic Ossart Device and Method for Capacitive Measurement by a Floating Bridge

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4917173A (enExample) * 1972-06-02 1974-02-15
JPH0721418B2 (ja) * 1990-05-09 1995-03-08 株式会社ミツトヨ 変位測定回路
JPH05335925A (ja) * 1992-05-29 1993-12-17 Fujitsu Ltd タッチパネル入力装置
JPH09280806A (ja) * 1996-04-09 1997-10-31 Nissan Motor Co Ltd 静電容量式変位計
JP3456412B2 (ja) * 1998-04-15 2003-10-14 ぺんてる株式会社 導電体接近及び近接位置検出装置
JP3237629B2 (ja) * 1998-10-27 2001-12-10 ぺんてる株式会社 直接触式タッチパネル装置
US20020125537A1 (en) * 2000-05-30 2002-09-12 Ting-Wah Wong Integrated radio frequency circuits
JP2002014771A (ja) * 2000-06-29 2002-01-18 Pentel Corp 容量結合式タッチパネルにおける絶縁方法
JP4072030B2 (ja) * 2001-09-06 2008-04-02 東京エレクトロン株式会社 センサ容量検出装置及びセンサ容量検出方法
US7211966B2 (en) * 2004-07-12 2007-05-01 International Rectifier Corporation Fluorescent ballast controller IC
JP4531469B2 (ja) * 2004-07-15 2010-08-25 株式会社フジクラ 静電容量式近接センサ
US7560755B2 (en) * 2006-06-09 2009-07-14 Dsm Solutions, Inc. Self aligned gate JFET structure and method
JP4959370B2 (ja) * 2007-02-26 2012-06-20 オンセミコンダクター・トレーディング・リミテッド 静電容量変化検出回路及び半導体装置
DE102009029021B4 (de) * 2009-08-31 2022-09-22 Robert Bosch Gmbh Sensorsystem zur Umfeldüberwachung an einem mechanischen Bauteil und ein Verfahren zur Ansteuerung und Auswertung des Sensorsystems

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2608751A1 (fr) * 1986-12-19 1988-06-24 Onera (Off Nat Aerospatiale) Chaine de mesure dimensionnelle capacitive
FR2756048A1 (fr) * 1996-11-15 1998-05-22 Nanotec Ingenierie Pont de mesure capacitif flottant et systeme de mesure multi-capacitif associe
US20080231292A1 (en) * 2005-11-24 2008-09-25 Frederic Ossart Device and Method for Capacitive Measurement by a Floating Bridge

Also Published As

Publication number Publication date
FR2976675A1 (fr) 2012-12-21
US20140125357A1 (en) 2014-05-08
JP5955951B2 (ja) 2016-07-20
CN106123929A (zh) 2016-11-16
KR20140043395A (ko) 2014-04-09
WO2012172241A1 (fr) 2012-12-20
FR2976675B1 (fr) 2013-07-12
US8933710B2 (en) 2015-01-13
JP2014522614A (ja) 2014-09-04
EP2702363A1 (fr) 2014-03-05
CN106123929B (zh) 2019-09-27
CN103688140A (zh) 2014-03-26
EP2702363B1 (fr) 2015-01-07
JP2016192782A (ja) 2016-11-10
KR102033183B1 (ko) 2019-10-16
JP6469044B2 (ja) 2019-02-13

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Applicant before: Nanotec Solution

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