CN103620375B - 高通量准直照射器和均匀场照射的方法 - Google Patents

高通量准直照射器和均匀场照射的方法 Download PDF

Info

Publication number
CN103620375B
CN103620375B CN201280031845.6A CN201280031845A CN103620375B CN 103620375 B CN103620375 B CN 103620375B CN 201280031845 A CN201280031845 A CN 201280031845A CN 103620375 B CN103620375 B CN 103620375B
Authority
CN
China
Prior art keywords
light source
surface point
distance
secondary light
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201280031845.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN103620375A (zh
Inventor
J.R.雅斯帕斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Healthcare Diagnostics Inc
Original Assignee
Siemens Healthcare Diagnostics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Healthcare Diagnostics Inc filed Critical Siemens Healthcare Diagnostics Inc
Publication of CN103620375A publication Critical patent/CN103620375A/zh
Application granted granted Critical
Publication of CN103620375B publication Critical patent/CN103620375B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
CN201280031845.6A 2011-04-29 2012-04-27 高通量准直照射器和均匀场照射的方法 Active CN103620375B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161480426P 2011-04-29 2011-04-29
US61/480426 2011-04-29
PCT/US2012/035346 WO2012149243A1 (en) 2011-04-29 2012-04-27 High flux collimated illuminator and method of uniform field illumination

Publications (2)

Publication Number Publication Date
CN103620375A CN103620375A (zh) 2014-03-05
CN103620375B true CN103620375B (zh) 2016-06-29

Family

ID=47072763

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280031845.6A Active CN103620375B (zh) 2011-04-29 2012-04-27 高通量准直照射器和均匀场照射的方法

Country Status (6)

Country Link
US (1) US20140028857A1 (cg-RX-API-DMAC7.html)
EP (1) EP2691759B1 (cg-RX-API-DMAC7.html)
JP (1) JP6096173B2 (cg-RX-API-DMAC7.html)
CN (1) CN103620375B (cg-RX-API-DMAC7.html)
HU (1) HUE063638T2 (cg-RX-API-DMAC7.html)
WO (1) WO2012149243A1 (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6599721B2 (ja) * 2015-10-09 2019-10-30 栄研化学株式会社 試験片分析装置及び試験片分析方法
US11585804B2 (en) 2018-10-19 2023-02-21 Youcount Inc. Urinalysis device and test strip for home and point of care use
CA3049972A1 (en) 2019-07-15 2021-01-15 Youcount Inc. Urinalysis test strip for over-the-counter use
CN114585927A (zh) * 2019-10-31 2022-06-03 美国西门子医学诊断股份有限公司 针对样本和/或样本容器表征提供背景照明校准的方法和设备
MX2023001720A (es) * 2020-08-12 2023-02-22 Siemens Healthcare Diagnostics Inc Placa de circuito con fuentes de luz incorporadas.
KR102421127B1 (ko) * 2021-12-23 2022-07-15 주식회사 뷰온 에어리어 카메라가 구비된 검사 장치 및 에어리어 카메라가 구비된 검사 장치를 이용한 검사 방법

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717485A (en) * 1995-04-24 1998-02-10 Matsushita Electric Industrial Co., Ltd. Foreign substance inspection apparatus
US5877863A (en) * 1997-03-20 1999-03-02 Bayer Corporation Readhead for a photometric diagnostic instrument
CN101208594A (zh) * 2005-07-08 2008-06-25 伊雷克托科学工业股份有限公司 光源的平面阵列所发射的收敛光线的获得
US20100225929A1 (en) * 2009-03-06 2010-09-09 Industrial Technology Research Institute Positioning method and positioning system based on light intensity
US7852481B2 (en) * 2007-04-03 2010-12-14 Konica Minolta Sensing, Inc. Apparatus and method for measuring optical property

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL72673C (cg-RX-API-DMAC7.html) * 1949-04-13
DE1284830B (de) * 1967-11-30 1968-12-05 Agfa Gevaert Ag Mikrofilm-Aufnahmegeraet
US3535688A (en) * 1969-05-09 1970-10-20 Du Pont Magnetic buffer storage
US3830591A (en) * 1973-05-04 1974-08-20 Eastman Kodak Co Illumination apparatus
JPS5685975A (en) * 1979-12-14 1981-07-13 Fujitsu Ltd Uniform illumination method
US4728848A (en) * 1981-11-09 1988-03-01 Duro-Test Corporation Energy-efficient incandescent reflector lamp
US4755058A (en) 1984-06-19 1988-07-05 Miles Laboratories, Inc. Device and method for measuring light diffusely reflected from a nonuniform specimen
US4731854A (en) * 1986-07-17 1988-03-15 Perceptics Corporation Optical system for producing an image for a set of characters
CA2009129C (en) * 1989-02-04 1995-02-14 Mitsubishi Chemical Corporation Image pickup head for image pickup device
JPH03181807A (ja) * 1989-12-12 1991-08-07 Omron Corp 視覚装置
JP2529043B2 (ja) * 1991-09-30 1996-08-28 株式会社スタビック 照明撮像装置
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
EP0726456A4 (en) * 1993-10-26 1998-11-25 Asahi Chemical Ind METHOD AND APPARATUS FOR MEASURING THE UNIFORMITY OF BRIGHTNESS AND THICKNESS OF A PRINTED IMAGE
JPH08186743A (ja) * 1994-12-29 1996-07-16 Fuji Photo Film Co Ltd 画像入力装置用照明装置
US5751910A (en) * 1995-05-22 1998-05-12 Eastman Kodak Company Neural network solder paste inspection system
US5518689A (en) 1995-09-05 1996-05-21 Bayer Corporation Diffused light reflectance readhead
JPH09259253A (ja) * 1996-03-22 1997-10-03 Nec Corp 画像入力装置
US5654803A (en) 1996-05-09 1997-08-05 Bayer Corporation Apparatus and method for determination of non-hemolyzed levels of occult blood in urine
AU702209B2 (en) * 1996-07-16 1999-02-18 Roche Diagnostics Gmbh Analytical system with means for detecting too small sample volumes
JPH10170242A (ja) * 1996-12-12 1998-06-26 Sharp Corp シール剤塗布検査方法及びその装置
TW402856B (en) * 1996-12-26 2000-08-21 Palite Corp LED illuminator
US6105869A (en) * 1997-10-31 2000-08-22 Microscan Systems, Incorporated Symbol reading device including optics for uniformly illuminating symbology
US20040114035A1 (en) * 1998-03-24 2004-06-17 Timothy White Focusing panel illumination method and apparatus
JP2001118158A (ja) * 1999-10-20 2001-04-27 Nippon Aleph Corp 複合型センサ
US7038208B2 (en) * 2002-08-31 2006-05-02 The Research Foundation of the City of New York Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
FR2846424B1 (fr) * 2002-10-25 2006-02-03 Bsn Glasspack Procede et dispositif d'eclairage pour detecter des defaut et/ou de manque de matiere sur la bague d'un recipient transparent ou translucide
JP4444838B2 (ja) 2002-11-14 2010-03-31 シーシーエス株式会社 光量調整システム
KR100966544B1 (ko) * 2002-12-24 2010-06-29 주식회사 포스코 코일 표면의 선형 요철성 결함 검출 장치
JP2005028100A (ja) * 2003-06-18 2005-02-03 Seiko Epson Corp 遊技機
US7092094B2 (en) * 2003-09-29 2006-08-15 General Electric Company Coordinated polarization for shiny surface measurement
US7070293B2 (en) * 2004-07-22 2006-07-04 Herbert E. Seymour Lighting array for wall hangings
JP2006115288A (ja) * 2004-10-15 2006-04-27 Canon Inc 画像形成装置
CN102973247B (zh) * 2004-12-28 2015-05-13 超级医药成像有限公司 在全身生理学和休克的判定、评估和监测中的超光谱/多光谱成像
US8350957B2 (en) * 2006-05-09 2013-01-08 Technion Research And Development Foundation Ltd. Imaging systems and methods for recovering object visibility
US7852564B2 (en) * 2006-09-27 2010-12-14 Microscan Systems, Inc. Devices and/or systems for illuminating a component
US20080267446A1 (en) * 2007-04-18 2008-10-30 Dale Capewell Chemistry strip reader and method
US20100239137A1 (en) * 2007-10-09 2010-09-23 Siemens Healthcare Diagnostics Inc. Two Dimensional Imaging of Reacted Areas On a Reagent
EP2370797A4 (en) 2008-11-19 2013-03-06 Siemens Healthcare Diagnostics POLARIZED OPTICS FOR AN OPTICAL DIAGNOSTIC DEVICE
KR100928159B1 (ko) * 2008-12-24 2009-11-23 한성엘컴텍 주식회사 광원모듈과 이를 이용한 조명장치
JP2011075534A (ja) * 2009-10-01 2011-04-14 Hikichi Seiko Kk 曲面外観検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717485A (en) * 1995-04-24 1998-02-10 Matsushita Electric Industrial Co., Ltd. Foreign substance inspection apparatus
US5877863A (en) * 1997-03-20 1999-03-02 Bayer Corporation Readhead for a photometric diagnostic instrument
CN101208594A (zh) * 2005-07-08 2008-06-25 伊雷克托科学工业股份有限公司 光源的平面阵列所发射的收敛光线的获得
US7852481B2 (en) * 2007-04-03 2010-12-14 Konica Minolta Sensing, Inc. Apparatus and method for measuring optical property
US20100225929A1 (en) * 2009-03-06 2010-09-09 Industrial Technology Research Institute Positioning method and positioning system based on light intensity

Also Published As

Publication number Publication date
JP6096173B2 (ja) 2017-03-15
WO2012149243A1 (en) 2012-11-01
JP2014517271A (ja) 2014-07-17
US20140028857A1 (en) 2014-01-30
HUE063638T2 (hu) 2024-01-28
EP2691759B1 (en) 2023-05-31
EP2691759A1 (en) 2014-02-05
CN103620375A (zh) 2014-03-05
EP2691759A4 (en) 2015-07-29

Similar Documents

Publication Publication Date Title
US9590122B2 (en) Fish eye lens analyzer
CN103620375B (zh) 高通量准直照射器和均匀场照射的方法
US9041930B1 (en) Digital pathology system
EP3270120B1 (en) Measurement method, measurement device, and program
CN110187093B (zh) 一种检测荧光免疫和胶体金试剂条的跨平台检测装置
US9733063B2 (en) Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths
US20120057164A1 (en) Biological information measuring apparatus
KR20160098222A (ko) 화상 해석 장치, 화상 해석 방법, 및 프로그램, 및 조명 장치
CN110290297A (zh) 用于摄像的装置
US9970868B2 (en) Nephelometry method and apparatus for determining the concentration of suspended particles in an array of sample containers
EP2406618A2 (en) Apparatus and method for measuring haze of sheet materials or other materials
JP2014517271A5 (cg-RX-API-DMAC7.html)
JP2025063227A (ja) 内蔵光源を有する回路板
JP2002174592A (ja) 評価装置
JP2006081154A (ja) 光学検査システムのためのカメラモジュールおよび関連する使用方法
JP6474148B2 (ja) 検査装置
EP1914529B1 (en) Method for analyzing the apparent colour and the gonio reflectance of an object
TW202426879A (zh) 用於測定試樣的至少一個影像之成像品質的裝置和方法
US7623240B2 (en) Optical measuring device for test strips
JP7482257B2 (ja) 検査装置、情報処理方法およびプログラム
WO2023210313A1 (ja) 測定方法、測定システム、および情報処理方法
JP2016130667A (ja) 光学測定方法及び光学測定装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant