CN103454576A - 芯片成品测试机 - Google Patents
芯片成品测试机 Download PDFInfo
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- CN103454576A CN103454576A CN2013104119960A CN201310411996A CN103454576A CN 103454576 A CN103454576 A CN 103454576A CN 2013104119960 A CN2013104119960 A CN 2013104119960A CN 201310411996 A CN201310411996 A CN 201310411996A CN 103454576 A CN103454576 A CN 103454576A
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- 238000012360 testing method Methods 0.000 title claims abstract description 28
- 238000007689 inspection Methods 0.000 claims abstract description 39
- 238000006073 displacement reaction Methods 0.000 claims abstract description 28
- 238000001514 detection method Methods 0.000 claims abstract description 20
- 238000012546 transfer Methods 0.000 claims description 27
- 238000009954 braiding Methods 0.000 claims description 19
- 230000002950 deficient Effects 0.000 claims description 6
- 238000012545 processing Methods 0.000 abstract description 2
- 230000002411 adverse Effects 0.000 abstract 1
- 230000007306 turnover Effects 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000005538 encapsulation Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
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CN201310411996.0A CN103454576B (zh) | 2013-09-10 | 2013-09-10 | 芯片成品测试机 |
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CN201310411996.0A CN103454576B (zh) | 2013-09-10 | 2013-09-10 | 芯片成品测试机 |
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CN103454576A true CN103454576A (zh) | 2013-12-18 |
CN103454576B CN103454576B (zh) | 2015-08-26 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105510805A (zh) * | 2016-01-08 | 2016-04-20 | 上海恒浥智能科技股份有限公司 | 芯片自动检测装置 |
CN107185853A (zh) * | 2017-04-13 | 2017-09-22 | 江苏理工学院 | 细纱机纲领表面尺寸及精度全自动检测装置 |
CN111630397A (zh) * | 2018-01-23 | 2020-09-04 | 德克萨斯仪器股份有限公司 | 在自动化测试中处理集成电路 |
CN113900009A (zh) * | 2021-09-26 | 2022-01-07 | 杭州旗捷科技有限公司 | 一种芯片自动测试系统及芯片测试方法 |
CN114690024A (zh) * | 2022-05-31 | 2022-07-01 | 广东东博自动化设备有限公司 | 一种全自动芯片测试机 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11297791A (ja) * | 1998-04-14 | 1999-10-29 | Advantest Corp | トレイ移送アーム及びこれを用いたトレイの移載装置、ic試験装置並びにトレイの取り廻し方法 |
CN101149415A (zh) * | 2006-09-20 | 2008-03-26 | 未来产业株式会社 | 处理机 |
CN101470168A (zh) * | 2007-12-28 | 2009-07-01 | 未来产业株式会社 | 测试处理机以及封装芯片装载与制造方法 |
CN101520488A (zh) * | 2008-02-26 | 2009-09-02 | 塔工程有限公司 | 用于测试芯片并缠绕容纳有已测试芯片的载带的装置 |
CN102654559A (zh) * | 2012-05-10 | 2012-09-05 | 致茂电子(苏州)有限公司 | 测试半导体封装堆叠晶片的测试系统及其半导体自动化测试机台 |
CN203519778U (zh) * | 2013-09-10 | 2014-04-02 | 嘉兴景焱智能装备技术有限公司 | 芯片成品测试机 |
-
2013
- 2013-09-10 CN CN201310411996.0A patent/CN103454576B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11297791A (ja) * | 1998-04-14 | 1999-10-29 | Advantest Corp | トレイ移送アーム及びこれを用いたトレイの移載装置、ic試験装置並びにトレイの取り廻し方法 |
CN101149415A (zh) * | 2006-09-20 | 2008-03-26 | 未来产业株式会社 | 处理机 |
CN101470168A (zh) * | 2007-12-28 | 2009-07-01 | 未来产业株式会社 | 测试处理机以及封装芯片装载与制造方法 |
CN101520488A (zh) * | 2008-02-26 | 2009-09-02 | 塔工程有限公司 | 用于测试芯片并缠绕容纳有已测试芯片的载带的装置 |
CN102654559A (zh) * | 2012-05-10 | 2012-09-05 | 致茂电子(苏州)有限公司 | 测试半导体封装堆叠晶片的测试系统及其半导体自动化测试机台 |
CN203519778U (zh) * | 2013-09-10 | 2014-04-02 | 嘉兴景焱智能装备技术有限公司 | 芯片成品测试机 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105510805A (zh) * | 2016-01-08 | 2016-04-20 | 上海恒浥智能科技股份有限公司 | 芯片自动检测装置 |
CN107185853A (zh) * | 2017-04-13 | 2017-09-22 | 江苏理工学院 | 细纱机纲领表面尺寸及精度全自动检测装置 |
CN107185853B (zh) * | 2017-04-13 | 2019-05-07 | 江苏理工学院 | 细纱机纲领表面尺寸及精度全自动检测装置 |
CN111630397A (zh) * | 2018-01-23 | 2020-09-04 | 德克萨斯仪器股份有限公司 | 在自动化测试中处理集成电路 |
CN113900009A (zh) * | 2021-09-26 | 2022-01-07 | 杭州旗捷科技有限公司 | 一种芯片自动测试系统及芯片测试方法 |
CN114690024A (zh) * | 2022-05-31 | 2022-07-01 | 广东东博自动化设备有限公司 | 一种全自动芯片测试机 |
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CN103454576B (zh) | 2015-08-26 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
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Denomination of invention: Chip finished product testing machine Effective date of registration: 20230526 Granted publication date: 20150826 Pledgee: Shanghai Rural Commercial Bank Co.,Ltd. Zhejiang Yangtze River Delta Integrated Demonstration Zone Sub branch Pledgor: JIAXING JINGYAN INTELLIGENT EQUIPMENT TECHNOLOGY Co.,Ltd. Registration number: Y2023980041808 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right |
Granted publication date: 20150826 Pledgee: Shanghai Rural Commercial Bank Co.,Ltd. Zhejiang Yangtze River Delta Integrated Demonstration Zone Sub branch Pledgor: JIAXING JINGYAN INTELLIGENT EQUIPMENT TECHNOLOGY Co.,Ltd. Registration number: Y2023980041808 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Chip finished product testing machine Granted publication date: 20150826 Pledgee: Shanghai Rural Commercial Bank Co.,Ltd. Zhejiang Yangtze River Delta Integrated Demonstration Zone Sub branch Pledgor: JIAXING JINGYAN INTELLIGENT EQUIPMENT TECHNOLOGY Co.,Ltd. Registration number: Y2024980018023 |