CN103412418A - LCM reworking method - Google Patents

LCM reworking method Download PDF

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Publication number
CN103412418A
CN103412418A CN2013102965902A CN201310296590A CN103412418A CN 103412418 A CN103412418 A CN 103412418A CN 2013102965902 A CN2013102965902 A CN 2013102965902A CN 201310296590 A CN201310296590 A CN 201310296590A CN 103412418 A CN103412418 A CN 103412418A
Authority
CN
China
Prior art keywords
lcm
screen
short circuit
acf
lead district
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2013102965902A
Other languages
Chinese (zh)
Inventor
宁养社
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd
Original Assignee
IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd filed Critical IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd
Priority to CN2013102965902A priority Critical patent/CN103412418A/en
Publication of CN103412418A publication Critical patent/CN103412418A/en
Pending legal-status Critical Current

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Abstract

The invention relates to an LCM reworking method which can overcome defects caused by the factors of material supply and manufacturing procedures. In the process of LCM production, defects can be caused in all the procedures of cleaning, ACF attachment, COG pre-pressing and main pressing, FOG pre-pressing and main pressing, adhesive dispensing and electrical logging due to the factors of the material supply and operation; by carrying out microscopic analysis on the factors causing the defects and adopting the reasonable reworking method, the reworking yield can be improved to more than 70%, and LCM production cost can be reduced.

Description

A kind of method of LCM heavy industry
Technical field
The present invention relates to a kind of method of heavy industry, be specifically related to a kind of method of LCM heavy industry.
Background technology
Along with popularizing of lcd technology, the processing profit of LCM is more and more less, the processing charges of small size LCM are reduced to every cun 1 yuan of left and right by every cun 3 yuan, therefore the lifting of yield is the task of top priority, and the enforcement of heavy industry is to improve one of effective means of yield, but the rework method of existing LCM all adopts single separation method to carry out heavy industry, simultaneously after heavy industry, the yields of LCM is low, thus the minimizing strengthened the processing profit of LCM.
Summary of the invention
The object of the present invention is to provide a kind of method of LCM heavy industry, can effectively improve the yields of described LCM heavy industry.
For achieving the above object, the method for described LCM heavy industry comprises the following steps:
1) LCM is placed and to detect under the microscope, check that whether described LCM damages because of the ITO short circuit of the screen lead district of LCM;
2) when described LCM damages because of the ITO short circuit of the screen lead district of LCM, directly on the laser repairing machine, with laser, short circuit place is interrupted and gets final product;
3) when described LCM be not screen lead district ITO short circuit because of LCM while damaging, under the condition of constant temperature, push away the FPC of LCM, IC and screen separated with bakelite;
4) with dust-free cotton bud, dip in ACF removal liquid and smear the ACF on screen, with bakelite, remove the ACF on screen after immersion, what can shield reuses.
Compared with prior art, the present invention has following beneficial effect:
The method of LCM heavy industry of the present invention is classified by the LCM to bad, and adopt corresponding rework method to carry out the heavy industry processing according to the bad reason of described LCM, especially when LCM damages because of the screen lead district ITO short circuit of LCM, by on the laser repairing machine, with laser, short circuit place being interrupted and repairs, thereby effectively improved the yields of described LCM heavy industry, thereby effectively reduced the production cost of described LCM.
Embodiment
Below in conjunction with embodiment, the present invention is described in further detail, following embodiment is only be used to the present invention is described, but the practical range be not intended to limit the present invention.
For achieving the above object, the method for described LCM heavy industry comprises the following steps:
1) LCM is placed and to detect under the microscope, check that whether described LCM damages because of the ITO short circuit of the screen lead district of LCM;
2) when described LCM damages because of the ITO short circuit of the screen lead district of LCM, directly on the laser repairing machine, with laser, short circuit place is interrupted and gets final product;
3) when described LCM be not screen lead district ITO short circuit because of LCM while damaging, under the condition of constant temperature, push away the FPC of LCM, IC and screen separated with bakelite;
4) with dust-free cotton bud, dip in ACF removal liquid and smear the ACF on screen, with bakelite, remove the ACF on screen after immersion, what can shield reuses.
When the method for LCM heavy industry of the present invention is carried out heavy industry at the LCM to bad, can be according to described LCM whether because the ITO short circuit of the screen lead district of LCM damages, when described LCM damages because of the screen lead district ITO short circuit of LCM, directly by the laser repairing machine, repair, method by LCM heavy industry of the present invention can make the yields of heavy industry reach more than 70%, thereby reduces the production cost of described LCM.

Claims (1)

1. the method for a LCM heavy industry, is characterized in that, comprises the following steps:
1) LCM is placed and to detect under the microscope, check that whether described LCM damages because of the ITO short circuit of the screen lead district of LCM;
2) when described LCM damages because of the ITO short circuit of the screen lead district of LCM, directly on the laser repairing machine, with laser, short circuit place is interrupted and gets final product;
3) when described LCM be not screen lead district ITO short circuit because of LCM while damaging, under the condition of constant temperature, push away the FPC of LCM, IC and screen separated with bakelite;
4) with dust-free cotton bud, dip in ACF removal liquid and smear the ACF on screen, with bakelite, remove the ACF on screen after immersion, what can shield reuses.
CN2013102965902A 2013-07-15 2013-07-15 LCM reworking method Pending CN103412418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2013102965902A CN103412418A (en) 2013-07-15 2013-07-15 LCM reworking method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2013102965902A CN103412418A (en) 2013-07-15 2013-07-15 LCM reworking method

Publications (1)

Publication Number Publication Date
CN103412418A true CN103412418A (en) 2013-11-27

Family

ID=49605445

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2013102965902A Pending CN103412418A (en) 2013-07-15 2013-07-15 LCM reworking method

Country Status (1)

Country Link
CN (1) CN103412418A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113568199A (en) * 2021-07-12 2021-10-29 信利(仁寿)高端显示科技有限公司 Analysis method, improvement structure and improvement method for electrostatic damage of GOA panel

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1402053A (en) * 2001-08-24 2003-03-12 瀚宇彩晶股份有限公司 Pressurizing device for liquid crystal display and laser correction method with pressurizing process
CN101281303A (en) * 2008-05-19 2008-10-08 华映视讯(吴江)有限公司 Method for restoring LCD module short circuit
CN201548773U (en) * 2009-09-27 2010-08-11 苏州绿叶物流装备有限公司 Bakelite scraper
CN101852928A (en) * 2009-04-01 2010-10-06 达辉(上海)电子有限公司 Removal method of anisotropic conductive adhesive of liquid crystal display
CN101866067A (en) * 2009-04-15 2010-10-20 友达光电(厦门)有限公司 Rework method of integrated circuit of display panel
CN102193217A (en) * 2010-03-11 2011-09-21 苏州优伯特电子科技有限公司 Scraper
CN102615422A (en) * 2012-03-29 2012-08-01 彩虹(佛山)平板显示有限公司 Laser repair method of organic electroluminescence display light emitting defect

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1402053A (en) * 2001-08-24 2003-03-12 瀚宇彩晶股份有限公司 Pressurizing device for liquid crystal display and laser correction method with pressurizing process
CN101281303A (en) * 2008-05-19 2008-10-08 华映视讯(吴江)有限公司 Method for restoring LCD module short circuit
CN101852928A (en) * 2009-04-01 2010-10-06 达辉(上海)电子有限公司 Removal method of anisotropic conductive adhesive of liquid crystal display
CN101866067A (en) * 2009-04-15 2010-10-20 友达光电(厦门)有限公司 Rework method of integrated circuit of display panel
CN201548773U (en) * 2009-09-27 2010-08-11 苏州绿叶物流装备有限公司 Bakelite scraper
CN102193217A (en) * 2010-03-11 2011-09-21 苏州优伯特电子科技有限公司 Scraper
CN102615422A (en) * 2012-03-29 2012-08-01 彩虹(佛山)平板显示有限公司 Laser repair method of organic electroluminescence display light emitting defect

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113568199A (en) * 2021-07-12 2021-10-29 信利(仁寿)高端显示科技有限公司 Analysis method, improvement structure and improvement method for electrostatic damage of GOA panel

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Application publication date: 20131127