CN102615422A - Laser repair method of organic electroluminescence display light emitting defect - Google Patents

Laser repair method of organic electroluminescence display light emitting defect Download PDF

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Publication number
CN102615422A
CN102615422A CN2012100891897A CN201210089189A CN102615422A CN 102615422 A CN102615422 A CN 102615422A CN 2012100891897 A CN2012100891897 A CN 2012100891897A CN 201210089189 A CN201210089189 A CN 201210089189A CN 102615422 A CN102615422 A CN 102615422A
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CN
China
Prior art keywords
fixing point
bad
aoi
inspection
reach
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Pending
Application number
CN2012100891897A
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Chinese (zh)
Inventor
宁养社
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd
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IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd
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Publication date
Application filed by IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd filed Critical IRICO FOSHAN FLAT PANEL DISPLAY CO Ltd
Priority to CN2012100891897A priority Critical patent/CN102615422A/en
Publication of CN102615422A publication Critical patent/CN102615422A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a laser repair method of a PM-OLED (Passive Matrix Organic Light-Emitting Diode) light emitting defect. The PM-OLED light emitting defect comprises common cathode, common anode and pixel black spots caused by electric leakage between an anode and a cathode. The method comprises badness reason investigation, badness classification statistics and a bad product repair method. The method is simple and practical, is less in investment and is high in repair rate. For the common cathode badness, if a device adopts a dry piece, the repair rate can reach more than 50%; and if a liquid desiccant is adopted, the repair rate can reach more than 95%. For the common anode badness, the repair rate can reach 40% or more. For the pixel black spots caused by electric leakage between the anode and the cathode, if the dry piece is adopted, the repair rate can reach more than 40%; and if the liquid desiccant is adopted, the repair rate can reach 80% or more.

Description

The laser repair method of the luminous defective of display of organic electroluminescence
Technical field:
The present invention relates to the repairing of the luminous defective of display of organic electroluminescence.The laser that relates in particular to the luminous defective of passive OLED display device is repaired.
Background technology:
Organic electroluminescent LED (Organic Light-Emitting Diode-OLED) is a kind of self-emitting display spare, and its processing procedure is simple, the visual angle is wide, image quality is even, reaction speed is fast, energy consumption is low, resolution ratio and brightness height, rich color, drive circuit are simple.Be considered to the emerging application technology of follow-on flat-panel screens.
The initial stage that PM-OLED is producing; Particularly under the situation that does not have the light shield cleaning machine, lean on the manual wiping light shield of people; The fixing point of light shield (gluing pair dust that on light shield, is not eliminated or the inherent shortcoming of light shield) is many, causes common the moon, positive altogether easily, directly influences the lifting of yield.Particularly general AOI equipment, camera lens does not have the differential interference function, only can sweep to planar graph, to the general scanning of the point in the crack less than, also can not find bad some during wiping.The method of repairing at present is many, and utilizing laser to interrupt aluminium film on the defect point is one of effective method the most.
Summary of the invention:
The objective of the invention is to utilize open office software; Be easy to find out the fixing point position on each sheet; And the picture of AOI (Automatic Optic Inspection) scanning compare; The reason that finds luminous defective to produce easily, the moon generally is that fixing point causes the insulated column figure bad when making owing to P4 (the 4th road figure-insulated column layer of PM-OLED figure engineering) altogether, causes adjacent cathode line short circuit; Sun generally is because P1, P2 (first, second road figure-metal level of PM-OLED figure engineering, ITO layer) fixing point or etching are unclean altogether, causes the short circuit of adjacent anode line.Clear and definite fixing point (the sticking dust that on light shield, is not eliminated or the inherent shortcoming of light shield of paying; Cause the graphic defects of each substrate fixed position through exposure, after developing) the position, produce the coordinate position of reason and fixing point; Be easy to smoothing reparation machine find bad point particular location, utilize laser reparation.Because AOI board and laser repairing machine be networking not, the last coordinate that marks of AOI needs artificial comparison as just reference, finds out the position of fixing point.
Utilize the scanning result of AOI simultaneously, when each production, the pipe fixed point of earlier AOI being swept to is confirmed.If it is bad that fixing point can cause, these slice, thin pieces are directly repaired without the LOI inspection at the sliver line identifier that advances, and repair the back and are checking, can enhance productivity like this.Bad as if not causing, can treat by normal procedure.
Utilize the perspective view table function of excel form, artificial position code with badness screen is input in the computer, the meeting automatic report generation, and (function that perspective view itself has) can count fixing point quantity easily through adding up.Because the fixing point of module statistics is more than the point of AOI surface sweeping, the cleaning that can be light shield like this provides foundation.Can with AOI sweep less than fixing point dispose when the next wiping.The window size of laser and energy are selected and can be confirmed according to actual conditions during reparation, can not be excessive.
Description of drawings:
Fig. 1 is a kind of common P1 graphic defects.
Fig. 2 is a kind of common P4 graphic defects.
Fig. 3 is a kind of common P2 graphic defects.
Fig. 4 is the statistical graph that computer generates automatically.
The specific embodiment:
1, after the gold-tinted production of each organic electroluminescent LED finishes, in time sends to the organic electroluminescent LED module to pipe fixed position and the picture of AOI (Automatic Optic Inspection).When module is produced at first display; The fixing point that AOI is swept to all identifies; Cutting display sliver carries out LOI (lighten inspiron inspection) inspection after reaching and wearing out, and is bad as if causing, and when subsequent production, will cause bad position to identify totally; Of Fig. 1-3 is several kinds of typical graphic defects.
2, bad to after the LOI inspection artificially is input to bad item and position in the excel form, utilizes the function of " PivotTables " among the excel, generates like the described statistical graph of Fig. 4; The automatic cumulative data of " PivotTables " function; Therefore the generation of bad point produces the amplitude much larger than good point owing to repeatedly superposeing; As shown in Figure 4; Said amplitude surpasses the about 30 times point one of normal point and is decided to be bad point, judges that rule of thumb points such as L01 wherein, A15, N08, A08, M16, J16 are fixing point;
3, the fixing point of Statistics Division in fixing point that AOI scans in the said step 1 of contrast and the step 2; To the fixing point that does not have in the step 1 to find; Confirm that at microscopically (fixing point causes the insulated column figure bad to poor prognostic cause when making, and causes adjacent cathode line short circuit; First, second road figure-metal level, ITO layer fixing point or the etching of PM-OLED figure engineering are unclean, cause the short circuit of adjacent anode line) and bad some position, for laser repairing provides foundation, for next light shield wiping foundation is provided simultaneously.
4, according to analyzing reason and the position that produces, implement laser repairing.

Claims (2)

1. the laser repair method of the luminous defective of display of organic electroluminescence is characterized in that, comprises the steps:
1) after the gold-tinted production of each organic electroluminescent LED finishes, sends to the organic electroluminescent LED module to the pipe fixed position and the picture of AOI (Automatic Optic Inspection) scanning; When module was produced at first display, the fixing point that AOI is swept to all identified, and cutting display sliver carries out LOI (light On inspection) inspection after reaching and wearing out, with causing bad position to identify;
2) bad to after the LOI inspection is input to bad item and position in the excel form, utilizes " PivotTables " function among the excel, generates statistical graph, the statistics fixing point;
3) the AOI fixing point and the step 2 that scan in the said step 1) of contrast) in the fixing point that counts, to there not be the fixing point of discovery in the step 1, in microscopically affirmation poor prognostic cause and bad some position;
4) according to analyzing reason and the position that produces, implement laser repairing.
2. laser repair method according to claim 1 is characterized in that, also comprises the steps: to utilize the scanning result of AOI between the said step 1), and when each production, the fixing point of earlier AOI being swept to is confirmed; If it is bad that fixing point can cause, these slice, thin pieces are directly repaired without the LOI inspection at the sliver line identifier that advances; Bad as if not causing, then carry out said step 1) again.
CN2012100891897A 2012-03-29 2012-03-29 Laser repair method of organic electroluminescence display light emitting defect Pending CN102615422A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012100891897A CN102615422A (en) 2012-03-29 2012-03-29 Laser repair method of organic electroluminescence display light emitting defect

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012100891897A CN102615422A (en) 2012-03-29 2012-03-29 Laser repair method of organic electroluminescence display light emitting defect

Publications (1)

Publication Number Publication Date
CN102615422A true CN102615422A (en) 2012-08-01

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CN (1) CN102615422A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412418A (en) * 2013-07-15 2013-11-27 彩虹(佛山)平板显示有限公司 LCM reworking method
CN109524574A (en) * 2018-11-22 2019-03-26 京东方科技集团股份有限公司 Flexible display panels test sample and preparation method thereof, defect analysis method
CN111933760A (en) * 2020-09-28 2020-11-13 苏州科韵激光科技有限公司 Miniature LED pixel repairing equipment and miniature LED pixel repairing method
WO2023050275A1 (en) * 2021-09-30 2023-04-06 京东方科技集团股份有限公司 Data processing method and system, and computer readable storage medium

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008068284A (en) * 2006-09-14 2008-03-27 Lasertec Corp Apparatus and method for correcting defect, and method for manufacturing pattern substrate
KR20090126614A (en) * 2008-06-04 2009-12-09 참앤씨(주) System and method for repairing bad pixel of organic light emitting diode display device
CN101673666A (en) * 2008-09-12 2010-03-17 奥林巴斯株式会社 Laser repair device and a laser repair method
CN102189331A (en) * 2010-03-05 2011-09-21 奥林巴斯株式会社 Defect correction device and defect tracking method
KR20110113089A (en) * 2010-04-08 2011-10-14 엘지디스플레이 주식회사 Method for repairing organic light emitting diode display

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008068284A (en) * 2006-09-14 2008-03-27 Lasertec Corp Apparatus and method for correcting defect, and method for manufacturing pattern substrate
KR20090126614A (en) * 2008-06-04 2009-12-09 참앤씨(주) System and method for repairing bad pixel of organic light emitting diode display device
CN101673666A (en) * 2008-09-12 2010-03-17 奥林巴斯株式会社 Laser repair device and a laser repair method
CN102189331A (en) * 2010-03-05 2011-09-21 奥林巴斯株式会社 Defect correction device and defect tracking method
KR20110113089A (en) * 2010-04-08 2011-10-14 엘지디스플레이 주식회사 Method for repairing organic light emitting diode display

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412418A (en) * 2013-07-15 2013-11-27 彩虹(佛山)平板显示有限公司 LCM reworking method
CN109524574A (en) * 2018-11-22 2019-03-26 京东方科技集团股份有限公司 Flexible display panels test sample and preparation method thereof, defect analysis method
CN109524574B (en) * 2018-11-22 2021-04-02 京东方科技集团股份有限公司 Flexible display panel test sample, manufacturing method thereof and defect analysis method
CN111933760A (en) * 2020-09-28 2020-11-13 苏州科韵激光科技有限公司 Miniature LED pixel repairing equipment and miniature LED pixel repairing method
CN111933760B (en) * 2020-09-28 2020-12-29 苏州科韵激光科技有限公司 Miniature LED pixel repairing equipment and miniature LED pixel repairing method
WO2023050275A1 (en) * 2021-09-30 2023-04-06 京东方科技集团股份有限公司 Data processing method and system, and computer readable storage medium

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Application publication date: 20120801