CN103403531A - 用于测试发光薄膜的方法和装置 - Google Patents

用于测试发光薄膜的方法和装置 Download PDF

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Publication number
CN103403531A
CN103403531A CN2011800619209A CN201180061920A CN103403531A CN 103403531 A CN103403531 A CN 103403531A CN 2011800619209 A CN2011800619209 A CN 2011800619209A CN 201180061920 A CN201180061920 A CN 201180061920A CN 103403531 A CN103403531 A CN 103403531A
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CN
China
Prior art keywords
light
luminescent film
luminescent
film
integrating sphere
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Pending
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CN2011800619209A
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English (en)
Chinese (zh)
Inventor
D·斯莫尼安
M·福克斯曼
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN103403531A publication Critical patent/CN103403531A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN2011800619209A 2010-12-22 2011-12-19 用于测试发光薄膜的方法和装置 Pending CN103403531A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201061425805P 2010-12-22 2010-12-22
US61/425805 2010-12-22
PCT/IB2011/055788 WO2012085824A1 (en) 2010-12-22 2011-12-19 Method and apparatus for testing luminescent films

Publications (1)

Publication Number Publication Date
CN103403531A true CN103403531A (zh) 2013-11-20

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Family Applications (1)

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CN2011800619209A Pending CN103403531A (zh) 2010-12-22 2011-12-19 用于测试发光薄膜的方法和装置

Country Status (6)

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US (1) US9029806B2 (cg-RX-API-DMAC7.html)
EP (1) EP2656050B1 (cg-RX-API-DMAC7.html)
JP (2) JP5970472B2 (cg-RX-API-DMAC7.html)
CN (1) CN103403531A (cg-RX-API-DMAC7.html)
TW (1) TWI591321B (cg-RX-API-DMAC7.html)
WO (1) WO2012085824A1 (cg-RX-API-DMAC7.html)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105158214A (zh) * 2015-09-12 2015-12-16 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
CN105910800A (zh) * 2016-06-17 2016-08-31 宜昌劲森光电科技股份有限公司 量子管用集测试、印码、分选一体的设备
CN109073801A (zh) * 2016-04-25 2018-12-21 日本特殊陶业株式会社 波长转换构件、其制造方法及发光装置
CN113252304A (zh) * 2020-02-12 2021-08-13 迪睿合株式会社 测定装置及成膜装置
CN114376547A (zh) * 2020-10-22 2022-04-22 鸿富成精密电子(成都)有限公司 测试装置及测试方法
US11867636B2 (en) 2018-02-08 2024-01-09 Yokogawa Electric Corporation Measurement device and measurement method for measuring a physical quantity of a sheet

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468650B (zh) * 2012-09-14 2015-01-11 Ind Tech Res Inst 光學檢測系統及其光學檢測裝置
JP6623711B2 (ja) * 2015-11-16 2019-12-25 ダイトロン株式会社 検査装置
CN105953915A (zh) * 2016-06-30 2016-09-21 维沃移动通信有限公司 一种光敏传感器的校准设备及光敏传感器的校准方法
KR102257204B1 (ko) * 2019-07-26 2021-05-27 한국광기술원 형광체 필름 및 그의 제조방법과 이를 이용한 광 특성 측정 장치 및 측정 방법

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DE2757196A1 (de) * 1977-12-22 1979-06-28 Vladimir Dipl Ing Blazek Photometrische anordnung
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5079678A (en) * 1990-12-24 1992-01-07 Eastman Kodak Company Integrating light source utilizing a fluorescing reflector for improved light emission and color balance
US5764352A (en) * 1995-08-05 1998-06-09 Balzers Und Leybold Deutschland Holding Ag Process and apparatus for spectral reflectance and transmission measurements
CN1207205A (zh) * 1996-01-11 1999-02-03 普林斯顿大学理事会 光检测器用的有机发光涂层
CN1547753A (zh) * 2001-06-01 2004-11-17 索尼公司 荧光面的形成方法和其形成装置以及阴极射线管
GB2429865A (en) * 2005-09-06 2007-03-07 Cintel Internat Ltd Optical scatter correction for film scanners
US20100301739A1 (en) * 2009-06-01 2010-12-02 Nitto Denko Corporation Luminescent ceramic and light-emitting device using the same

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US5406070A (en) 1993-12-16 1995-04-11 International Business Machines Corporation Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data
JPH07225150A (ja) * 1994-02-14 1995-08-22 Mitsubishi Electric Corp レーザ光検出装置
JPH1073486A (ja) * 1996-09-02 1998-03-17 Matsushita Electric Ind Co Ltd 蛍光体光学特性測定装置と蛍光体光学特性測定方法
US5963335A (en) * 1997-06-25 1999-10-05 Waters Instruments, Inc. Means and method for measuring absorption of radiation-scattering samples
US5929994A (en) 1998-05-20 1999-07-27 Ahead Optoelectronics, Inc. Intergrating sphere ellipsometer
JP3611015B2 (ja) * 1998-12-24 2005-01-19 松下電器産業株式会社 蛍光体試料の光学特性測定方法と装置
JP2003004631A (ja) * 2001-06-18 2003-01-08 Kawasaki Kiko Co Ltd 成分計測装置
JP2004361149A (ja) * 2003-06-02 2004-12-24 Tdk Corp 含水量測定装置
JP2006214935A (ja) 2005-02-04 2006-08-17 Omron Corp 薄膜検査装置および薄膜検査方法
JP4767706B2 (ja) * 2006-01-27 2011-09-07 浜松ホトニクス株式会社 積分球用アダプタ及びこれを備える光検出装置
JP5220392B2 (ja) * 2007-11-21 2013-06-26 川上産業株式会社 気泡シート体成形情報検出装置、及び気泡シート体成形情報検出方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2757196A1 (de) * 1977-12-22 1979-06-28 Vladimir Dipl Ing Blazek Photometrische anordnung
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5079678A (en) * 1990-12-24 1992-01-07 Eastman Kodak Company Integrating light source utilizing a fluorescing reflector for improved light emission and color balance
US5764352A (en) * 1995-08-05 1998-06-09 Balzers Und Leybold Deutschland Holding Ag Process and apparatus for spectral reflectance and transmission measurements
CN1207205A (zh) * 1996-01-11 1999-02-03 普林斯顿大学理事会 光检测器用的有机发光涂层
CN1547753A (zh) * 2001-06-01 2004-11-17 索尼公司 荧光面的形成方法和其形成装置以及阴极射线管
GB2429865A (en) * 2005-09-06 2007-03-07 Cintel Internat Ltd Optical scatter correction for film scanners
US20100301739A1 (en) * 2009-06-01 2010-12-02 Nitto Denko Corporation Luminescent ceramic and light-emitting device using the same

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105158214A (zh) * 2015-09-12 2015-12-16 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
CN105158214B (zh) * 2015-09-12 2017-11-24 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
CN109073801A (zh) * 2016-04-25 2018-12-21 日本特殊陶业株式会社 波长转换构件、其制造方法及发光装置
CN105910800A (zh) * 2016-06-17 2016-08-31 宜昌劲森光电科技股份有限公司 量子管用集测试、印码、分选一体的设备
US11867636B2 (en) 2018-02-08 2024-01-09 Yokogawa Electric Corporation Measurement device and measurement method for measuring a physical quantity of a sheet
CN113252304A (zh) * 2020-02-12 2021-08-13 迪睿合株式会社 测定装置及成膜装置
CN113252304B (zh) * 2020-02-12 2024-06-25 迪睿合株式会社 测定装置及成膜装置
CN114376547A (zh) * 2020-10-22 2022-04-22 鸿富成精密电子(成都)有限公司 测试装置及测试方法
CN114376547B (zh) * 2020-10-22 2023-06-30 鸿富成精密电子(成都)有限公司 测试装置及测试方法

Also Published As

Publication number Publication date
TWI591321B (zh) 2017-07-11
US20130313444A1 (en) 2013-11-28
EP2656050B1 (en) 2021-03-31
TW201237390A (en) 2012-09-16
EP2656050A1 (en) 2013-10-30
US9029806B2 (en) 2015-05-12
JP2014500514A (ja) 2014-01-09
JP2016183969A (ja) 2016-10-20
JP5970472B2 (ja) 2016-08-17
WO2012085824A1 (en) 2012-06-28
JP6216831B2 (ja) 2017-10-18

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Application publication date: 20131120

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