CN103026555A - Electrical contact and testing platform - Google Patents
Electrical contact and testing platform Download PDFInfo
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- CN103026555A CN103026555A CN2011800377591A CN201180037759A CN103026555A CN 103026555 A CN103026555 A CN 103026555A CN 2011800377591 A CN2011800377591 A CN 2011800377591A CN 201180037759 A CN201180037759 A CN 201180037759A CN 103026555 A CN103026555 A CN 103026555A
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- Prior art keywords
- contact piece
- electric contact
- blade
- electric
- test
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2457—Contacts for co-operating by abutting resilient; resiliently-mounted consisting of at least two resilient arms contacting the same counterpart
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
- H01R13/405—Securing in non-demountable manner, e.g. moulding, riveting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Connecting Device With Holders (AREA)
Abstract
According to the present invention there is provided an electrical contact comprising three or more blades so as to facilitate the establishment of an electrical connection between at least two of the three or more blades by an electrical contact of a component. There is further provided a testing platform suitable for receiving an electrical component to be tested, wherein the testing platform comprising one or more of the aforementioned electrical contacts. There is further provided a test machine component, comprising a holder member which comprises any one of the aforementioned electrical contacts, wherein the test machine component is configured such that it can co-operate with a test machine.
Description
Technical field
The present invention relates to electric contact piece and test platform, particularly but not exclusively relate to electric contact piece and test platform for the detecting electric parts.
Background technology
The method of existing detecting electric parts relates to positioning parts to be tested on test platform.Test platform comprises for the electric contact piece to the electric component power supply.In case be powered, the performance of electric component is monitored.Based on the performance of electric component, can determine whether electric component has fault.
In order to ensure successful detecting electric parts, require the electric contact piece of parts to be electrically connected with electric contact piece on the test platform.Therefore this electric component must be with specific predefine orientation positions in very specific predefine position.Be oriented on the test platform the electric component status in this specific predefine position with described specific predefine, this is very difficult to realize that particularly test operation is implemented at a high speed and existed in the industrial environment of the machine parts in many motions therein.Because the physical change between the electric component, the location electric component becomes more difficult, for example because the mould of fabrication stage skew former thereby physical change between the electric component can occur.
Fig. 1 a-f explanation realizes how difficult the certain position that is electrically connected desired electric component 7 in order to ensure the electric contact piece of electric component 7 with electric contact piece on the test platform 1 has.Test platform 1 shown in Figure 1 comprises six electricity Kelvins (Kelvin) contact 3a-3f.Each electricity Kelvin contact 3a-3f comprises " I " blade 5a and relative " L " blade 5b.At the test period of electric component 7, " I " blade 5a forms the signal provision terminal and relative " L " blade 5b forms signal sensing terminal (perhaps vice versa).
Fig. 1 (a) illustrates when being positioned at be used to the electric component 7 of testing desired specific predefine position and when orientation.In this position, each pin 9a-f sets up " I " blade 5a among each respective electrical contact 3a-3f on the test platform 1 and the electrical connection between relative " L " blade 5b.In this position, electric component 7 can be tested as previously mentioned.
Fig. 1 (b) illustrates the electric component 7 that is offset at first direction along Y-axis.In this position, each described pin 9a-f fails to set up " I " blade 5a among each electric contact piece 3a-3f on the test platform 1 and the electrical connection between relative " L " blade 5b.Thereby electric component 7 can't be tested.
Fig. 1 (c) illustrates the electric component 7 that is offset in second direction along Y-axis.In this position, pin 9a-f fails to set up " I " blade 5a among each respective electrical contact 3a-3f on the test platform 1 and the electrical connection between relative " L " blade 5b.Thereby electric component 7 can't be tested.
Fig. 1 (d) illustrates the electric component 7 that is offset at first direction along X-axis.In this position, pin 9a, 9b and 9c fail to set up the electrical connection between electric contact piece 3a, 3b on the test platform 1 and " I " the blade 5a among the 3c and relative " L " blade 5b.Thereby electric component 7 can't be tested.
Fig. 1 (e) illustrates the electric component 7 that is offset in second direction along X-axis.In this position, pin 9c, 9d and 9f fail to set up the electrical connection between electric contact piece 3d, 3e on the test platform 1 and " I " the blade 5a among the 3f and relative " L " blade 5b.Thereby electric component 7 can't be tested.
Fig. 1 (f) illustrates electric component 7, and this electric component 7 is not positioned on the platform 1 with correct orientation; Electric component 7 is rotated with respect to platform 1.In this position, pin 9c and 9d fail to set up the electrical connection between electric contact piece 3c on the test platform 1 and " I " the blade 5a among the 3d and relative " L " blade 5b.Thereby electric component 7 can't be tested.
Take many measures, by the electric contact piece of electric component 7, promoted the foundation of the electrical connection between blade 5a, the 5b among the electric contact piece 3a-f on the test platform 1.A kind of such measure of explanation in Fig. 2 (a)-2 (f).Be different from the platform 1 of explanation among Fig. 1 (a)-1 (f), platform 10 illustrated in fig. 2 comprises six electric contact piece 30a-30f, and wherein each electric contact piece 30a-30f comprises two parallel " I " blade 50a, 50b.Each blade 50a, 50b have vertical configuration, and comprise the surface 51 on plane, and when chip 7 is positioned on the platform 10 when being used for test, the surface 51 on this plane is parallel to the plane 52 of chip 7.
The principle that is used for detecting electric parts 7 is identical with the principle of describing for platform 1 shown in Figure 1.Thereby, require electric component 7 to be tested to be positioned, so that each pin 9a-f sets up the electrical connection between described two " I " blade 50a, the 50b among each respective electrical contact 30a-30f on the test platform 10.Test period at electric component 7, at each electric contact piece 30a-30f place, signal is passed through pin 9a-f from first " I " blade 50a (it promotes the described signal of telecommunication), and measured (this signal of telecommunication of this second " I " blade 50b sensing, perhaps vice versa) by second " I " blade 50b.In the performance of each described six pin 9a-f place electric component 7 thereby can be determined.
Fig. 2 (a) illustrates when the electric component 7 when platform 10 is positioned at the hypothesis testing position.In this position, each pin 9a-f sets up the electrical connection between two parallel " I " blade 50a, the 50b among each respective electrical contact 30a-30f on the test platform 10.In this position, electric component 7 can be tested as previously mentioned.
From Fig. 2 (d)-(f) be apparent that, because the configuration of two " I " blade 50a, 50b among each electric contact piece 30a-30f, the pin 9a-f of electric component 7 can successfully set up among each electric contact piece 30a-30f the electrical connection between two parallel " I " blade 50a, the 50b, even when electric component 7 rotates (seeing Fig. 2 (f)) along X-axis skew (seeing Fig. 2 (d) and 2 (e)) or with respect to platform 10.Especially, when electric component 7 rotated (seeing Fig. 2 (f)) along X-axis skew (seeing Fig. 2 (d) and 2 (e)) or with respect to platform 10, vertical configuration of the configured in parallel of two " I " blade 50a, 50b and each " I " blade 50a, 50b all promoted to set up among each electric contact piece 30a-30f electrical connection between two parallel " I " blade 50a, the 50b by pin 9a-f.The surface 51 on the plane of each blade 50a, 50b also promotes the foundation that is electrically connected, sets up the contact area that electrically contacts because the surface on plane 51 has increased among each blade 50a, 50b available can being used for this blade 50a, 50b.Thereby even when electric component 7 is offset from the hypothesis testing position, this electric component 7 still can be tested.
Yet, even the pin 9a-f of the measure of explanation by electric component 7 promotes to set up the electrical connection between blade 5a, the 5b of the electric contact piece 3a-f on the test platform 1 among Fig. 2 (a)-(f), this measure still is not gratifying, because when electric component 7 is offset along Y-axis, pin 9a-f still fails successfully to set up the electrical connection between two parallel " I " blade 50a, the 50b among each electric contact piece 30a-30f.Fig. 2 (b) and 2 (c) illustrate the situation when electric component 7 is offset along Y-axis.
Thereby, the electric contact piece 30a-f that comprises two parallel " I " blade 50a, 50b is provided, and each described blade comprises the surface on plane, when electric component 7 rotated along the X-axis skew or with respect to platform 10, this was promoting that it is effective setting up the required electrical connection of test that is used for parts 7.Yet when electric component 7 was offset along Y-axis, this electric contact piece 30a-f did not promote to set up electrical connection between blade 5a, the 5b of electric contact piece 3a-f on the test platform 1 by pin 9a-f.
The objective of the invention is to overcome or alleviate one or more aforesaid drawbacks.
Summary of the invention
According to an aspect of the present invention, provide a kind of electric contact piece, it comprises three or more blades, thereby promotes to set up the electrical connection between at least two of described blade by electrically contacting of parts.
According to a further aspect in the invention, a kind of test platform that is suitable for receiving parts to be tested is provided, wherein this test platform comprises one or more electric contact pieces, each described electric contact piece comprises three or more blades, thereby promotes to set up the electrical connection between at least two of described three or more blades by electrically contacting of parts.
This electrical connection can be that Kelvin connects.For the electric contact piece that will form Kelvin's contact, electrically contacting of these parts must electrically contact at least two of described three or more blades.
These parts can be electric components.
Described three or more blades can promote to set up electrical connection between two or more of described blade by electrically contacting of parts.
This electric contact piece can be the electric terminal of these parts.
Described three or more blades can longitudinally extend.
Described three or more blades can be arranged in parallel.
Each described three or more blade can be " I " blade.
At least some of described one or more electric contact pieces can be arranged in same orientation.Preferably, described one or more electric contact pieces whole are arranged in same orientation.
Each described three or more blade can comprise the surface on plane.In the time of on electric component to be tested is positioned at for the test platform of test, the surface on this plane can be parallel to the plane of this electric component.In use, the surface on this plane is parallel to the plane of just tested electric component.
Described three or more blades can be arranged to define two or more raceway grooves.Each described two or more raceway groove can be isolation channel.Isolation channel can be configured to make each described three or more blade electrically isolated from one.Some or all of described two or more raceway grooves can be isolated from each other.Each described two or more raceway groove can have the width between 0.1 μ m-50 μ m.Preferably, each described two or more raceway groove has the width less than 30 μ m.Most preferably, each described two or more raceway groove has the width less than 20 μ m.
The width of each described three or more blade can be so that two combined width in described two or more isolation channel adds that the width of individual blade is less than the width of the electric contact piece of electric component.Preferably, after considering the making tolerance, the width of each described three or more blade is so that two combined width in described two or more isolation channel adds that the width of individual blade is less than the width of the electric contact piece of electric component.The width of each described three or more blade can be so that the combined width of one of them of two or more isolation channel adds wherein two the width of the above three or more blade less than the width of the electric contact piece of electric component.Preferably, the width of each described three or more blade can so that, consider make tolerance after, the combined width of one of them of two or more isolation channel adds wherein two the width of the above three or more blade less than the width of the electric contact piece of electric component.Each described three or more blade can have 200 μ m or less width.Preferably, each described three or more blade has 150 μ m or less width.More preferably, each described three or more blade has 100 μ m or less width.
Some or all comprised conducting metals of blade.Preferably, some or all of blade are coated with metal.This metal can be noble metal.Some or all comprised gold of blade, BeCu and/or BeNi.Some or all of blade can be coated with gold.Some or all of blade can be coated with BeCu or BeNi material, perhaps show any other material of spring effect, electrical conductance and mar proof.
Some or all comprised sclerosis tips of blade.Preferably, some or all of blade comprise tungsten.Most preferably, some or all tip of blade comprises tungsten.
Described three or more blades can be fastened so that they relative to each other be in a fixed position.Preferably described three or more blades are fastened in the fabrication stage, so that they relative to each other are in a fixed position.Described three or more blades can be molded or glued together.
This electric contact piece can also comprise retaining member, and this retaining member keeps described three or more blades so that they relative to each other are in a fixed position.
According to a further aspect in the invention, provide a kind of test machine parts, it comprises the retainer member, and this retainer member comprises any aforementioned electric contact, and wherein this test machine component configuration becomes so that it can cooperate with this test machine.
These test machine parts can comprise a plurality of electric contact pieces.
These test machine parts can also comprise guiding device, and this guiding device promotes cooperating of these test machine parts and this test machine.For example, this guiding device can be to be suitable for the pin that cooperates with hole on the test machine, perhaps this guiding device can be suitable for test machine on the hole of pin cooperation.
According to a further aspect in the invention, provide a kind of test machine, it comprises the electric contact piece according to any aforementioned electric contact.
Description of drawings
With reference to the accompanying drawings, will embodiments of the invention be described by the mode of example only now, in the accompanying drawings:
Fig. 1 a-f: for the test that realizes enabling carrying out electric component desired, the difficulty of the certain position of electric component on the prior art test platform;
Fig. 2 a-f explanation prior art test platform, this test platform comprises electric contact piece, this electric contact piece is configured to promote to set up for the desired electrical connection of the test of electric component;
Fig. 3 provides the vertical view according to test platform of the present invention, and this test platform comprises according to electric contact piece of the present invention;
How Fig. 4 a-f explanation promotes to set up for the desired electrical connection of the test of electric component according to electric contact piece of the present invention; And
Fig. 5 a provides the zoomed-in view that the electric contact piece of the test machine parts shown in Fig. 5 a is provided according to the vertical view of test machine parts of the present invention and Fig. 5 b.
Embodiment
Fig. 3 provides the vertical view according to test platform 100 of the present invention.The electric component to be tested of chip 29 forms is positioned on the stand 25 of test platform 100.
According to the present invention, test platform 100 comprises six electric contact piece 51a-f, and each all is supported on described electric contact piece on the stand 25.All electric contact piece 51a-f of six are arranged in same orientation at stand 25.To understand, test platform 100 is not limited to have six electric contact pieces; Test platform 100 can have more or less electric contact piece.For example, test platform 100 can comprise 10 electric contact pieces or 4 electric contact pieces.
Each electric contact piece 51a-f comprises three blade 71a-c.Described three blade 71a-c longitudinally extend across the part of the width " g " of stand 25, and three blade 71a-c of each electric contact piece 51a-f are arranged in parallel.Three blade 71a-c can be secured to stand 25 in the fabrication stage, so that blade 71a-c keeps relative to each other fixing position.
Described three blade 71a-c definition two isolation channel 15a, 15b of each electric contact piece 51a- f.Isolation channel 15a, 15b are configured to make each described three blade 71a-c electrically isolated from one.In this concrete example, each all has the width " c " of 10 μ m isolation channel 15a, 15b.Yet, will understand, isolation channel 15a, 15b can have any other suitable dimension.
Each includes the surface 13 on plane described three blade 71a-c of each electric contact piece 51a-f.In the time of on chip 29 is positioned at for the test platform 100 of test, the surface 13 on the plane of each blade 71a-c is parallel to the plane 17 of chip 29.In this concrete example, each described three blade 71a-c has width " w ".The width of each blade 71a-c " w " be so that, consider make tolerance after, it (is 2w+c＜e) less than the width " e " of the pin 11a-f of electric component 29 that the combined width of isolation channel 15a, 15b " c " adds wherein two the width " w " of the above three or more blade.To understand, replacedly, the width of each described three or more blade " w " can for so that, consider make tolerance after, wherein two the combined width " c " of described isolation channel 15a, 15b adds that the width " w " of individual blade 71a-c (is 2c+w＜e) less than the width " e " of the pin 11a-f of electric component 29.In this concrete example, each described three blade 71a-c has the width " w " of 100 μ m, so the surface 13 on the plane of each blade will have the width of 100 μ m.Yet will understand, therefore the blade 71a-c surface 13 of plane (and) can have any other suitable dimension.In this concrete example, the width " e " of each electric contact piece 11a-f of just tested electric component 29 is 300 μ m.
In this concrete example, each described three blade 71a-c is coated with gold, and is provided with tungsten at the tip 19 of each blade 71a-c.Tungsten makes tip 19 sclerosis of each blade 71a-c.To understand, blade 71a-c can be coated with any other suitable metal or not coated, and for example blade 71a-c can be coated with any noble metal.Blade 71a-c can comprise BeNi or BeCu or any other power spring material.
Test for chip 29, require chip 29 to be positioned on the stand 25, so that for each electric contact piece 51a-f, the pin 11a-f bridge joint isolation channel 15a of chip 29, at least one of 15b, thus electrical connection between among described three blade 71a-c at least two is provided.At the test period of chip 29, one of them of two blade 71a-c that are electrically connected by pin 11a-f will be served as the signal provision terminal at test period, and another of this two blade 71a-c will serve as the signal sensing terminal, and perhaps vice versa.At the test period of chip 29, electric current passes through pin 11a-f from the blade 71a-c that (a plurality of) signal provision terminal is provided, and voltage is by the blade 71a-c sensing or the measurement that form (a plurality of) signal sensing terminal.Performance at each described six pin 11a-f place chip 29 can be monitored, and therefore the overall performance of chip 29 can be determined.
As shown in Figure 3, if and when chip 29 be positioned at for the test ideal position the time, pin 11a-11f be illustrated as bridge joint isolation channel 15a, 15b the two so that each pin 11a-11f touches three blade 71a-c, thereby be electrically connected each described three blade 71a-c.Therefore, chip 29 is located in for the ideal position of testing in particular cases therein, thereby any one of described three blade 71a-c or two test periods that can be selected at chip 29 provide the signal provision terminal, thereby and any rest blade 71a-c test period that can be selected at chip 29 the signal sensing terminal is provided.
Illustrated such as Fig. 4 (a)-(f), the configuration of electric contact piece 51a-f illustrated in fig. 3 promotes to set up the desired electrical connection of test that is used for chip 29.Fig. 4 (a) illustrate chip 29 be in the hypothesis testing position (such as preamble with reference to figure 3 description).Be similar to the electric contact piece 30a-f at the prior art test platform 10 of Fig. 2 (a)-(f) describe, the electric contact piece 51a-f of the test platform 100 of describing among Fig. 4 (a)-4 (f) promotes the wherein electrical connection between two that the pin 11a-f of chip 29 successfully sets up described three the blade 71a-c among each electric contact piece 51a-f, even when chip 29 rotates along X-axis skew (seeing Fig. 4 (d) and 4 (e)) or with respect to stand 25 (seeing Fig. 4 (f)).More specifically, dispose each blade 71a-c so that it is longitudinally; Dispose the blade 71a-c of same electric contact piece 51a-f so that blade 71a-c is parallel; And dispose each blade 71a-c so that it comprises the surface 13 on plane, then each all promotes the pin 11a-f of chip 29 to set up desired electrical connection.For example, provide 13 on the surface on plane to promote the pin 11a-f of chip 29 to set up desired electrical connection, can be used for setting up the available contact area that electrically contacts with blade 71a-c because the surface on plane 13 increases.Similarly, the vertical configuration of each blade 71a-c increases blade 71a-c along the size of X-axis, even therefore when chip 29 during along the X-axis displacement, the pin 11a-f of chip 29 can still contact blade 71a-c.The configured in parallel of blade 71a-c is favourable, even because when chip 29 during along the X-axis displacement, it makes it possible to set up desired electrical connection.
Thereby, even when chip 29 is offset from the hypothesis testing position along X-axis or with respect to stand 25 rotation so that it when no longer being in the hypothesis testing position, chip 29 still can be tested.
Advantageously, such as Fig. 4 b-c explanation, the configuration of electric contact piece 51a-f promotes that further when chip 29 was offset along Y-axis, the pin 11a-f of chip 29 set up the wherein electrical connection between two of described three the blade 71a-c among each electric contact piece 51a-f.More specifically, comprise the 3rd blade thereby dispose electric contact piece 51a-f, then promote the wherein electrical connection between two that the pin 11a-f of chip 29 sets up described three the blade 71a-c among each electric contact piece 51a-f when chip 29 is offset along Y-axis.
Shown in Fig. 4 (b), chip 29 to be tested is offset at first direction (to the right) along Y-axis.Provide the 3rd blade 71a-c to guarantee that when chip 29 moved along Y-axis right avertence, the pin 11a-f of chip 29 still can set up the blade 71b of each electric contact piece 5a-f and the electrical connection between the 71c.Therefore, blade 71b can be used for providing the signal provision terminal at the test period of chip 29, and blade 71c can be used at the test period of chip 29 providing the signal sensing terminal, and perhaps vice versa.Thereby, although the skew along Y-axis from the hypothesis testing position of chip 29 still can be implemented the successful test of chip 29.Shown in Fig. 4 (c), chip 29 to be tested is offset in second direction (left) along Y-axis.Provide the 3rd blade 71a-c to guarantee when chip 29 to be tested moves along the Y-axis left avertence, the pin 11a-f of chip 29 can set up the blade 71a of each electric contact piece 51a-c and the electrical connection between the 71b, so that blade 71a can be used for providing the signal provision terminal at the test period of chip 29, and blade 71b can provide at the test period of chip 29 the signal sensing terminal, and perhaps vice versa.Even when chip 29 moves away its hypothesis testing position along the Y-axis left avertence, thereby still can implement the successful test of chip 29.Thereby electric contact piece 51a-c is so that they comprise three or more blades in configuration, and this guarantees that chip 29 still can be tested, even work as it along Y-axis, X-axis skew or relatively stand 25 or platform 100 rotations.
Fig. 5 a provides the vertical view according to test machine parts 110 of the present invention.Test machine parts 110 comprise retainer member 101, and this retainer member 101 relative to each other remains on the fixed position with three electric contact piece 103a-c.Fig. 5 b provides the zoomed-in view of electric contact piece 103a-c.Each described three electric contact piece 103a-c is connected to retainer member 101 by root member 109a-i.Alternatively, three electric contact piece 103a-c can be integrated into retainer member 101.Each described root member 109a-i from retainer member 101 convergents to form blade 107a-c.Each described three electric contact piece 103a-c comprises three blade 107a-c.Each blade 107a-c has vertically " I " configuration and each described three blade 107a-c is parallel.In addition, each described three blade 107a-c comprises the surface 8 on plane.
Thereby one or more test machine (not shown) that can be connected to of test machine parts 110 define platform in test machine, and this platform class is similar to the platform 100 of describing among Fig. 3.Retainer member 101 also comprises the guiding device of hole 105a-d form.When test machine parts 110 were corrected to test machine, hole 105a-d provided convenience for the user.For example, when test machine parts 110 were connected to test machine, each hole 105a-d may be received in pin or the screw on the test machine, thus the guiding of the tram on test machine and fastening retainer member 101.
Various adjustment and change to described embodiment of the present invention will be apparent to those skilled in the art, and not deviate from the scope of the present invention that defines in claims.Although the present invention is described in conjunction with certain preferred embodiment, should be understood that the present invention for required protection should exceedingly not be subject to this specific embodiment.
Claims (15)
1. electric contact piece, thus it comprises that three or more blades promote to set up electrical connection between at least two of described three or more blades by the electric contact piece of parts.
2. according to claim 1 electric contact piece, wherein said three or more blades longitudinally extend.
3. according to claim 1 and 2 electric contact piece, wherein said three or more blades are arranged in parallel.
4. according to the electric contact piece of arbitrary aforementioned claim, some or all of wherein said three or more blades comprise the surface on plane.
5. according to claim 4 electric contact piece, wherein the surface configuration on this plane becomes so that it is parallel to the plane of electric component, this electric component can with the electric contact piece cooperative operation.
6. according to the electric contact piece of arbitrary aforementioned claim, wherein said three or more blade arrangement become two or more isolation channel of definition, and described channel arrangements becomes to make each described three or more blade electrically isolated from one.
7. according to claim 6 electric contact piece, wherein the width of each described three or more blade is for so that two combined width in described two or more isolation channel adds that the width of individual blade is less than the width of the electric contact piece of electric component.
8. according to the electric contact piece of arbitrary aforementioned claim, at least a among some or all comprised gold of wherein said blade, noble metal, BeNi or the BeCu.
9. according to the electric contact piece of arbitrary aforementioned claim, some or all of wherein said blade comprise tungsten.
10. according to the electric contact piece of arbitrary aforementioned claim, wherein this electric contact piece also comprises retaining member, and this retaining member keeps described three or more blades so that they relative to each other are in a fixed position.
11. a test platform that is suitable for receiving electric component to be tested, wherein this test platform comprises the electric contact piece of any one in according to claim 1 one or more-10.
12. test platform according to claim 11, at least some of wherein said one or more electric contact pieces are arranged in same orientation.
13. test machine parts comprise the retainer member, this retainer member comprises any one of electric contact piece of any one during at least one according to claim 1-10, and wherein this test machine component configuration becomes so that it can cooperate with this test machine.
14. test machine parts according to claim 13, wherein this test machine comprises the electric contact piece of any one in according to claim 1 a plurality of-10.
15. according to claim 13 or 14 test machine parts, also comprise guiding device, this guiding device is configured to promote cooperating of these test machine parts and this test machine.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| MYPI2010004583 | 2010-09-30 | ||
| MYPI2010004583 | 2010-09-30 | ||
| PCT/EP2011/065146 WO2011141582A1 (en) | 2010-09-30 | 2011-09-01 | An electrical contact and testing platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103026555A true CN103026555A (en) | 2013-04-03 |
Family
ID=44584176
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011800377591A Pending CN103026555A (en) | 2010-09-30 | 2011-09-01 | Electrical contact and testing platform |
Country Status (7)
| Country | Link |
|---|---|
| EP (1) | EP2622691A1 (en) |
| JP (1) | JP2013541006A (en) |
| KR (1) | KR20130124451A (en) |
| CN (1) | CN103026555A (en) |
| SG (1) | SG188185A1 (en) |
| TW (1) | TWI497084B (en) |
| WO (1) | WO2011141582A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105008941A (en) * | 2012-12-19 | 2015-10-28 | 伊斯梅卡半导体控股公司 | Device and method for limiting force |
| CN106249002A (en) * | 2015-06-10 | 2016-12-21 | 先进科技新加坡有限公司 | Electrical connector for detecting electric parts |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021772A (en) * | 2013-07-17 | 2015-02-02 | サンダース アンド アソシエイツ エルエルシー | Quartz oscillator measurement device |
| JP2016090306A (en) * | 2014-10-31 | 2016-05-23 | 新電元工業株式会社 | Inspection probe, inspection device and inspection method |
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Also Published As
| Publication number | Publication date |
|---|---|
| WO2011141582A1 (en) | 2011-11-17 |
| JP2013541006A (en) | 2013-11-07 |
| TWI497084B (en) | 2015-08-21 |
| SG188185A1 (en) | 2013-04-30 |
| TW201231978A (en) | 2012-08-01 |
| EP2622691A1 (en) | 2013-08-07 |
| KR20130124451A (en) | 2013-11-14 |
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Application publication date: 20130403 |
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