CN102947741A - 图像生成装置 - Google Patents

图像生成装置 Download PDF

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Publication number
CN102947741A
CN102947741A CN2011800307103A CN201180030710A CN102947741A CN 102947741 A CN102947741 A CN 102947741A CN 2011800307103 A CN2011800307103 A CN 2011800307103A CN 201180030710 A CN201180030710 A CN 201180030710A CN 102947741 A CN102947741 A CN 102947741A
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CN
China
Prior art keywords
laser
characteristic
measured
image
illumination light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011800307103A
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English (en)
Chinese (zh)
Inventor
寺田浩敏
岩城吉刚
中村共则
高桥辉雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
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Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of CN102947741A publication Critical patent/CN102947741A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/001—Axicons, waxicons, reflaxicons

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN2011800307103A 2010-06-23 2011-06-17 图像生成装置 Pending CN102947741A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010142882A JP2012008261A (ja) 2010-06-23 2010-06-23 画像生成装置
JP2010-142882 2010-06-23
PCT/JP2011/063976 WO2011162187A1 (ja) 2010-06-23 2011-06-17 画像生成装置

Publications (1)

Publication Number Publication Date
CN102947741A true CN102947741A (zh) 2013-02-27

Family

ID=45371374

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800307103A Pending CN102947741A (zh) 2010-06-23 2011-06-17 图像生成装置

Country Status (7)

Country Link
US (1) US20130120563A1 (cg-RX-API-DMAC7.html)
EP (1) EP2587298A4 (cg-RX-API-DMAC7.html)
JP (1) JP2012008261A (cg-RX-API-DMAC7.html)
KR (1) KR20130092429A (cg-RX-API-DMAC7.html)
CN (1) CN102947741A (cg-RX-API-DMAC7.html)
TW (1) TW201213849A (cg-RX-API-DMAC7.html)
WO (1) WO2011162187A1 (cg-RX-API-DMAC7.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111564384A (zh) * 2015-02-10 2020-08-21 浜松光子学株式会社 检查装置及检查方法
CN111727495A (zh) * 2018-02-16 2020-09-29 浜松光子学株式会社 浓度测定方法及浓度测定装置
CN113302520A (zh) * 2019-01-16 2021-08-24 株式会社小糸制作所 成像装置、其运算处理装置、车辆用灯具、车辆、感测方法

Families Citing this family (12)

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JP6166032B2 (ja) * 2012-11-06 2017-07-19 浜松ホトニクス株式会社 半導体デバイス検査装置及び半導体デバイス検査方法
CN103054557B (zh) * 2013-01-08 2016-05-11 白宇 云纹图像成像装置
JP2015114420A (ja) 2013-12-10 2015-06-22 ソニー株式会社 画像取得装置及び画像取得方法
JP6357317B2 (ja) * 2014-01-30 2018-07-11 オリンパス株式会社 顕微鏡照明装置、顕微鏡照明方法および顕微鏡
US9690085B2 (en) * 2014-01-30 2017-06-27 Olympus Corporation Microscope illumination apparatus, microscope, and microscope illumination method
KR101759875B1 (ko) * 2015-06-24 2017-07-20 주식회사 엘지실트론 웨이퍼 연마장치의 스캔장치 및 스캔시스템
US10048485B2 (en) * 2015-08-28 2018-08-14 Panasonic Intellectual Property Management Co., Ltd. Image output device, image transmission device, image reception device, image output method, and non-transitory recording medium
CH711570B1 (de) * 2015-09-28 2019-02-15 Besi Switzerland Ag Vorrichtung für die Montage von Bauelementen auf einem Substrat.
JP6632327B2 (ja) * 2015-10-30 2020-01-22 浜松ホトニクス株式会社 画像生成方法、画像生成装置、画像生成プログラム及び記録媒体
KR102543948B1 (ko) 2016-05-17 2023-06-15 삼성전자주식회사 클럭 신호 생성기 및 기판 검사 장치
KR101934956B1 (ko) * 2017-10-18 2019-03-18 고려대학교 산학협력단 구조 조명과 위상 검출을 이용한 단분자 중심위치 측정 장치 및 방법
CN110007453B (zh) 2019-05-13 2023-11-21 中国科学院生物物理研究所 一种多照明模式的荧光信号测量装置及其测量方法和应用

Citations (5)

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EP0724258A2 (en) * 1995-01-26 1996-07-31 Hamamatsu Photonics K.K. Optical feedback photodetecting apparatus
JP2003075514A (ja) * 2001-09-06 2003-03-12 Matsushita Electric Ind Co Ltd 検査装置および検査方法
US20070023686A1 (en) * 2005-07-22 2007-02-01 Ralf Wolleschensky Resolution-enhanced luminescence microscopy
CN101019018A (zh) * 2004-09-06 2007-08-15 浜松光子学株式会社 荧光显微镜及荧光相关光谱分析装置
WO2008081374A2 (en) * 2006-12-28 2008-07-10 Koninklijke Philips Electronics N.V. Reflection or single scattering spectroscopy and imaging

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US5034613A (en) * 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US5708371A (en) * 1995-03-16 1998-01-13 Mitsubishi Denki Kabushiki Kaisha Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen
JPH09230246A (ja) * 1996-02-22 1997-09-05 Olympus Optical Co Ltd 走査型光学顕微鏡
JP3411780B2 (ja) * 1997-04-07 2003-06-03 レーザーテック株式会社 レーザ顕微鏡及びこのレーザ顕微鏡を用いたパターン検査装置
US6078183A (en) * 1998-03-03 2000-06-20 Sandia Corporation Thermally-induced voltage alteration for integrated circuit analysis
JP2000292705A (ja) * 1999-04-05 2000-10-20 Olympus Optical Co Ltd 走査型顕微鏡
JP4429431B2 (ja) 1999-10-21 2010-03-10 オリンパス株式会社 光学装置
US20070196815A1 (en) * 2000-08-02 2007-08-23 Jason Lappe Positive Selection Procedure for Optically Directed Selection of Cells
EP1580586B1 (en) * 2004-03-25 2008-06-11 Olympus Corporation Scanning confocal microscope
JP4597744B2 (ja) * 2004-11-08 2010-12-15 株式会社トプコン 光画像計測装置及び光画像計測方法
EP1744194B1 (en) * 2005-07-11 2017-05-10 Olympus Corporation Laser scanning microscope and image acquiring method of laser scanning microscope
DE102005046755A1 (de) * 2005-09-29 2007-04-19 Carl Zeiss Jena Gmbh Vorrichtung und Verfahren zum Erzeugen eines Bildes eines Objektes
JP2007199572A (ja) 2006-01-30 2007-08-09 Nikon Corp 顕微鏡装置
WO2007109861A1 (en) * 2006-03-29 2007-10-04 The University Of Queensland Super resolution microscopy
US7838818B2 (en) * 2006-06-22 2010-11-23 Olympus Corporation Light-stimulus illumination apparatus which scans light-stimulus laser light in a direction intersecting an optical axis

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0724258A2 (en) * 1995-01-26 1996-07-31 Hamamatsu Photonics K.K. Optical feedback photodetecting apparatus
JP2003075514A (ja) * 2001-09-06 2003-03-12 Matsushita Electric Ind Co Ltd 検査装置および検査方法
CN101019018A (zh) * 2004-09-06 2007-08-15 浜松光子学株式会社 荧光显微镜及荧光相关光谱分析装置
US20070023686A1 (en) * 2005-07-22 2007-02-01 Ralf Wolleschensky Resolution-enhanced luminescence microscopy
WO2008081374A2 (en) * 2006-12-28 2008-07-10 Koninklijke Philips Electronics N.V. Reflection or single scattering spectroscopy and imaging

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111564384A (zh) * 2015-02-10 2020-08-21 浜松光子学株式会社 检查装置及检查方法
CN111564384B (zh) * 2015-02-10 2023-04-18 浜松光子学株式会社 检查装置及检查方法
CN111727495A (zh) * 2018-02-16 2020-09-29 浜松光子学株式会社 浓度测定方法及浓度测定装置
CN111727495B (zh) * 2018-02-16 2024-06-07 浜松光子学株式会社 浓度测定方法及浓度测定装置
CN113302520A (zh) * 2019-01-16 2021-08-24 株式会社小糸制作所 成像装置、其运算处理装置、车辆用灯具、车辆、感测方法

Also Published As

Publication number Publication date
TW201213849A (en) 2012-04-01
EP2587298A1 (en) 2013-05-01
WO2011162187A1 (ja) 2011-12-29
US20130120563A1 (en) 2013-05-16
KR20130092429A (ko) 2013-08-20
EP2587298A4 (en) 2014-03-05
JP2012008261A (ja) 2012-01-12

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Application publication date: 20130227