CN102901924A - Method for testing single event upset characteristics of partial triple modular redundancy static random access memory (SRAM) type field programmable gate arrays (FPGA) - Google Patents
Method for testing single event upset characteristics of partial triple modular redundancy static random access memory (SRAM) type field programmable gate arrays (FPGA) Download PDFInfo
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Abstract
The invention provides a method for testing single event upset characteristics of partialparts of triple modular redundancy static random access memory (SRAM) type field programmable gate arrays (FPGA). The method comprises the steps of irradiating a device to be tested under the preset fluence rate, recording one single-particle error when the output characteristic of the device is incorrect and functions of the device do not get right in time T1 for stopping particle beam irradiation, and calculating a single-particle error section after multiple repetition; continuously reducing the particle fluence rate until the single-particle error section tends to be stable; and providing another comparison device which is not subjected to triple modular redundancy fixing, irradiating the comparison device under the comparison fluence rate, calculating a single-particle error section, and then calculating the ratio of the single-particle error section of the comparison device to the single-particle error section of the device to be tested.
Description
Technical field
The invention belongs to the particle irradiation field tests, relate in particular to the method for testing of the single-particle inversion characteristic of the SRAM type FPGA after a kind of part triplication redundancy is reinforced.
Background technology
SRAM type FPGA is comprised of config memory, block storage, trigger, overall control register and half closedown structure etc., and the characteristics high with its integrated level, that dirigibility is strong, the construction cycle is short have obtained using more and more widely at space industry.Yet, the space environment of its work exists the high energy particles such as a large amount of γ photons, radiation belt electronics, high energy proton, and SRAM type FPGA is a kind of single-particle inversion Sensitive Apparatus, formed by config memory, block storage, trigger, overall control register and half closedown structure etc., every part all may produce single-particle inversion under the bombardment of high energy particle, this impact on SRAM type FPGA is particularly evident.
Modern FPGA technique is towards low-voltage, high integration future development, and this is so that the threshold value of generation space radiation response is more and more lower, and the probability that breaks down is increasing.The generation of Space Radiation Effects gently then can make the equipment operation irregularity, and is heavy then can cause equipment burnout, permanent failure.Therefore, FPGA must carry out High Reliability Design, the impact that prevents to greatest extent and solve Space Radiation Effects.
Triplication redundancy is reinforced (Triple Modular Redundancy, TMR), one of primary particle inversion resistant measure commonly used. three modules are carried out identical operation simultaneously, with the correct output of the identical output of majority as voting system, are commonly referred to three and get two.As long as two identical mistakes do not occur simultaneously, just can mask off the mistake of malfunctioning module, the output that the assurance system is correct in three modules.Because three modules are mutually independently, it is minimum probability events that mistake appears in two modules simultaneously, therefore can greatly improve the reliability of system.But triplication redundancy can increase device inside resource use amount, in some applications, owing to using resource large, and the device inside total resources is certain, can't accomplish all circuit are carried out the triplication redundancy design, the designer carries out triplication redundancy according to influence degree to affecting large part Key Circuit, and remainder is not taked triplication redundancy.Because only be partial redundance, rather than all circuit all carry out redundancy, therefore can't estimate whether can really improve behind the partial redundance the primary particle inversion resistant performance of device, device single-particle inversion characteristic test behind this part triplication redundancy is present international difficult point, does not also have a kind of method can test out the part triplication redundancy to the consolidation effect of device at present.
Summary of the invention
Therefore, the object of the present invention is to provide the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, can test out exactly the part triplication redundancy to the consolidation effect of device.
The invention provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, the flow process of the method comprises as shown in Figure 1:
1) with the high energy particle of LET value greater than turn threshold, irradiation measured device under the fluence rate of setting, incorrect and when the time T 1 interior device function that stops particle beam irradiation not recovering normal when the device output characteristics, then record the single-particle mistake 1 time, reconfigure the FPGA device function, and repeatedly the repetitive irradiation measured device and calculates single-particle mistake cross section obtaining the single-particle mistake of accumulative total;
2) make that the LET value of particle is constant and fluence rate reduces, and repetition above-mentioned steps 1), obtain another single-particle mistake cross section, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is less than a predetermined value, then getting this time single-particle mistake cross section is the final single-particle mistake cross section value of measured device, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section then continues to repeat this step 2 greater than a predetermined value);
3) provide another comparative device of not carrying out triplication redundancy reinforcing identical with measured device, with the high energy particle identical with LET value in the step 1), under the contrast fluence rate, the irradiation comparative device, incorrect and do not recover normal at the time T 1 interior device function that stops particle beam irradiation when the device output characteristics, then record the single-particle mistake 1 time, and repeatedly the repetitive irradiation comparative device and is calculated single-particle mistake cross section obtaining repeatedly single-particle mistake;
4) calculate single-particle mistake cross section and the step 2 of the comparative device that triplication redundancy not reinforces) ratio in the final single-particle mistake cross section of the measured device that obtains.
According to method provided by the invention, according to the ratio in judgement consolidation effect that step 4) obtains, ratio is larger, illustrates that then the triplication redundancy consolidation effect is large, and ratio is less, illustrates that the triplication redundancy consolidation effect is less.
According to method provided by the invention, wherein above-mentioned steps 1) and step 3) in, the time T 1 that stops irradiation is 20 to 50 seconds.
According to method provided by the invention, wherein above-mentioned steps 1) in, repetitive irradiation measured device repeatedly is until accumulation stops irradiation when the single-particle mistake of pre-determined number occurring.
According to method provided by the invention, wherein above-mentioned steps 1) in, repeatedly the repetitive irradiation measured device stops irradiation until irradiation is accumulated when fluence reaches scheduled volume.
According to method provided by the invention, wherein above-mentioned steps 3), repetitive irradiation comparative device repeatedly is until accumulation stops irradiation when the single-particle mistake of pre-determined number occurring.
According to method provided by the invention, wherein above-mentioned steps 3) in, repeatedly the repetitive irradiation comparative device stops irradiation until irradiation is accumulated when fluence reaches scheduled volume.
According to method provided by the invention, wherein in the above-mentioned steps 3), described contrast fluence rate is worth large two orders of magnitude of corresponding fluence rate than the final single-particle mistake cross section described in the step 1).
According to method provided by the invention, wherein step 2) described in predetermined value between 0-10%.
Method provided by the invention can test out the part triplication redundancy exactly to the consolidation effect of device.
Description of drawings
Fig. 1 is the schematic diagram of the method according to this invention.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer, below in conjunction with specific embodiment, the present invention is described in more detail.Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
The present embodiment provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, comprising:
1) tested FPGA device being carried out the part triplication redundancy reinforces;
2) use the LET(linear energy transfer) value is greater than the high energy particle of the turn threshold of FPGA device, the fluence rate (10 of setting
2Individual particle/cm
2S) lower irradiation measured device, and during irradiation the output characteristics of test component;
3) when the device output characteristics is incorrect, stop particle beam irradiation, continue simultaneously monitoring device output characteristics;
4) if stopping irradiation T1=30 in the time of second, it is normal that device function recovers, then continue irradiation, if stop irradiation T1=30 in the time of second, it is normal that device function does not recover, then record the single-particle mistake 1 time, stop the time T 1 of irradiation by setting, that comes abatement device self repairs the impact that test result is caused;
5) reconfigure the FPGA device function, repeating step 2)-4), stop irradiation when 100 single-particle mistakes occurring until accumulate;
6) calculate single-particle mistake cross section, wherein single-particle mistake cross section equals total single-particle mistake number divided by total incident particle fluence;
7) make particle fluence rate reduce by 1 order of magnitude, (10 the particle/cm of the fluence rate after reduction
2S) lower irradiation measured device, and during irradiation the output characteristics of test component, then repeat above-mentioned steps 3)-6), the single-particle mistake cross section under the fluence rate after being reduced;
8) difference in the single-particle mistake cross section under the relatively more last fluence rate of setting and the last fluence rate of setting if both basic identical (difference for example differs in 10% less than a predetermined value) then stop irradiation, continues execution in step 9); (difference is greater than a predetermined value if both differences are large, for example differ more than 10%), then repeating step 7), namely constantly reduce particle fluence rate, until tend to be steady substantially in single-particle mistake cross section, thereby remove fluence rate to the impact that test result causes, get fluence rate when minimum (under the fluence rate of last setting) corresponding single-particle mistake cross section value as the final single-particle mistake cross section value of measured device;
9) provide another comparative device identical with measured device, this comparative device is not carried out triplication redundancy and is reinforced;
10) with the LET value high energy particle identical with LET value in the step 1), at contrast fluence rate (10
2Individual particle/cm
2S) under, the irradiation comparative device, the output characteristics of test component during the irradiation, described contrast fluence rate is than large two orders of magnitude of fluence rate of the last setting described in the step 8);
11) when the device output characteristics is incorrect, stop particle beam irradiation, continue monitoring device output characteristics, if stopping irradiation T1=30 in the time of second, it is normal that device function recovers, and then continues irradiation, if stop irradiation T1=30 in the time of second, device function does not recover normally, then records the single-particle mistake 1 time;
12) repeating step 10)-11), stop irradiation when 100 single-particle mistakes occurring until accumulate;
13) calculate single-particle mistake cross section, single-particle mistake cross section equals single-particle mistake number divided by the total fluence of incident particle;
14) calculate the ratio in the single-particle mistake cross section of the single-particle mistake cross section of the comparative device that triplication redundancy not reinforces and the measured device that step 8) obtains, this ratio is larger, illustrate that then the triplication redundancy consolidation effect is larger, ratio is less, illustrate that the triplication redundancy consolidation effect is little, illustrate that then the designer answers the design proposal of adjustment member redundancy.
According to other embodiments of the invention, wherein above-mentioned steps 8) in, whether essentially identical predetermined value is not limited to 10% in single-particle mistake cross section, also can be 3%, 5%, 8% etc., be preferably 0-10%, those skilled in the art can adopt different predetermined values according to the needs to measuring accuracy in the practical application.
According to other embodiments of the invention, wherein above-mentioned steps 4) and step 11) in, the described time T 1 that stops irradiation is preferably at 20-50 in second.
In the step 5) and step 12) in the present embodiment, adopt repeated mode to obtain a plurality of samples, and with the number of times that repeats to reach certain as the foundation that repeats to finish, thereby draw the single-particle mistake cross section on the statistical significance, the number of times that repeats is more, the sample that obtains is more, and the single-particle mistake cross section on the resulting statistical significance is more near exact value, and wherein the number of times of accumulation appearance is preferably about 100 times.According to other embodiments of the invention, the total accumulation fluence that can also take to reach certain is as the foundation that repeats to finish, and the accumulation fluence preferably reaches 10
7Individual particle/cm
2About.
It should be noted last that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described.Although with reference to embodiment the present invention is had been described in detail, those of ordinary skill in the art is to be understood that, technical scheme of the present invention is made amendment or is equal to replacement, do not break away from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of the claim scope of the present invention.
Claims (9)
1. the method for testing of the single-particle inversion characteristic of a part triplication redundancy SRAM type FPGA comprises:
1) with the high energy particle of LET value greater than turn threshold, irradiation measured device under the fluence rate of setting, incorrect and when the time T 1 interior device function that stops particle beam irradiation not recovering normal when the device output characteristics, then record the single-particle mistake 1 time, reconfigure the FPGA device function, and repeatedly the repetitive irradiation measured device and calculates single-particle mistake cross section obtaining the single-particle mistake of accumulative total;
2) make that the LET value of particle is constant and fluence rate reduces, and repetition above-mentioned steps 1), obtain another single-particle mistake cross section, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is less than a predetermined value, then getting this time single-particle mistake cross section is the final single-particle mistake cross section value of measured device, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section then continues to repeat this step 2 greater than a predetermined value);
3) provide another comparative device of not carrying out triplication redundancy reinforcing identical with measured device, with the high energy particle identical with LET value in the step 1), under the contrast fluence rate, the irradiation comparative device, incorrect and do not recover normal at the time T 1 interior device function that stops particle beam irradiation when the device output characteristics, then record the single-particle mistake 1 time, and repeatedly the repetitive irradiation comparative device and is calculated single-particle mistake cross section obtaining repeatedly single-particle mistake;
4) calculate single-particle mistake cross section and the step 2 of the comparative device that triplication redundancy not reinforces) ratio in the final single-particle mistake cross section of the measured device that obtains.
2. method according to claim 1, according to the ratio in judgement consolidation effect that step 4) obtains, ratio is larger, illustrates that then the triplication redundancy consolidation effect is large, and ratio is less, illustrates that the triplication redundancy consolidation effect is less.
3. method according to claim 1, wherein above-mentioned steps 1) and step 3) in, the time T 1 that stops irradiation is 20 to 50 seconds.
4. method according to claim 1, wherein above-mentioned steps 1) in, repetitive irradiation measured device repeatedly is until accumulation stops irradiation when the single-particle mistake of pre-determined number occurring.
5. method according to claim 1, wherein above-mentioned steps 1) in, repetitive irradiation measured device repeatedly is until irradiation accumulation fluence stops irradiation when reaching scheduled volume.
6. method according to claim 1, wherein above-mentioned steps 3), repetitive irradiation comparative device repeatedly is until accumulation stops irradiation when the single-particle mistake of pre-determined number occurring.
7. method according to claim 1, wherein above-mentioned steps 3) in, repetitive irradiation comparative device repeatedly is until irradiation accumulation fluence stops irradiation when reaching scheduled volume.
8. method according to claim 1 is wherein in the above-mentioned steps 3), described contrast fluence rate is worth large two orders of magnitude of corresponding fluence rate than the final single-particle mistake cross section described in the step 1).
9. method according to claim 1, wherein step 2) described in predetermined value between 0-10%.
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| CN104268253A (en) * | 2014-10-09 | 2015-01-07 | 中国科学院自动化研究所 | Partial triplication redundancy method based on lookup table configuration bit statistics |
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| CN105204389A (en) * | 2015-10-08 | 2015-12-30 | 武汉聚鑫源机电工程设备有限公司 | Programmable rotating speed signal device based on software and hardware dual TMR type |
| CN114968685A (en) * | 2022-05-30 | 2022-08-30 | 中国人民解放军国防科技大学 | Method for testing single-particle upset section of EDAC (electronic design automation) reinforced microprocessor |
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| CN103577643A (en) * | 2013-11-06 | 2014-02-12 | 中国空间技术研究院 | SRAM type FPGA single event upset effect simulation method |
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| CN104462658A (en) * | 2014-11-06 | 2015-03-25 | 北京空间飞行器总体设计部 | Triple-modular redundancy protection structure FPGA single event upset failure probability assessment method |
| CN104462658B (en) * | 2014-11-06 | 2017-07-28 | 北京空间飞行器总体设计部 | A kind of triplication redundancy safeguard structure FPGA single particle overturns the appraisal procedure of failure probability |
| CN105204389A (en) * | 2015-10-08 | 2015-12-30 | 武汉聚鑫源机电工程设备有限公司 | Programmable rotating speed signal device based on software and hardware dual TMR type |
| CN114968685A (en) * | 2022-05-30 | 2022-08-30 | 中国人民解放军国防科技大学 | Method for testing single-particle upset section of EDAC (electronic design automation) reinforced microprocessor |
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