CN102901924B - The method of the single-particle inversion characteristic of a kind of part of detecting triplication redundancy FPGA - Google Patents
The method of the single-particle inversion characteristic of a kind of part of detecting triplication redundancy FPGA Download PDFInfo
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- CN102901924B CN102901924B CN201210355797.8A CN201210355797A CN102901924B CN 102901924 B CN102901924 B CN 102901924B CN 201210355797 A CN201210355797 A CN 201210355797A CN 102901924 B CN102901924 B CN 102901924B
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Abstract
The invention provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, comprise: the tested device of irradiation under the fluence rate of setting, when device output characteristics is incorrect and stop device function in the particle beam irradiation T1 time not recover normal, then record 1 single-particle mistake, repeatedly repeat rear calculating single-particle mistake cross section; Particle fluence rate is constantly reduced, until tend towards stability in single-particle mistake cross section; There is provided another not carry out the comparative device of triplication redundancy reinforcing, under contrast fluence rate, radiation contrast's device also calculates the ratio that the single-particle mistake cross section of comparative device and the single-particle mistake cross section of measured device are calculated in single-particle mistake cross section.
Description
Technical field
The invention belongs to particle irradiation field tests, particularly relate to the method for testing of the single-particle inversion characteristic of the SRAM type FPGA after the reinforcing of a kind of part triplication redundancy.
Background technology
SRAM type FPGA is made up of config memory, block storage, trigger, overall control register and half closedown structure etc., and the feature high with its integrated level, dirigibility is strong, the construction cycle is short, obtains at space industry and apply more and more widely.But, the space environment of its work also exists the high energy particles such as a large amount of γ photon, radiation belt electronics, high energy proton, and SRAM type FPGA is a kind of single-particle inversion Sensitive Apparatus, be made up of config memory, block storage, trigger, overall control register and half closedown structure etc., every part all may produce single-particle inversion under the bombardment of high energy particle, and this is particularly evident on the impact of SRAM type FPGA.
Modern FPGA technique is towards low-voltage, high integration future development, and this makes the threshold value that space radiation response occurs more and more lower, and the probability broken down is increasing.The generation of Space Radiation Effects, gently then can make equipment operation irregularity, heavy then can cause equipment burnout, permanent failure.Therefore, FPGA must carry out High Reliability Design, prevents and solve the impact of Space Radiation Effects to greatest extent.
Triplication redundancy reinforces (Triple Modular Redundancy, TMR), one of conventional primary particle inversion resistant measure. three modules perform identical operation simultaneously, using the identical output of majority as the correct output of voting system, are commonly referred to three and get two.As long as asynchronously there are two identical mistakes in three modules, just can mask off the mistake of malfunctioning module, ensure the output that system is correct.Because three modules are that mutually independently two modules occur that mistake is minimum probability event, therefore greatly can improve the reliability of system simultaneously.But triplication redundancy can increase device inside resource use amount, in some applications, owing to using resource large, and device inside total resources is certain, cannot accomplish to carry out triplication redundancy design to all circuit, designer is according to influence degree, and carry out triplication redundancy to the large Partial key circuit of impact, remainder does not take triplication redundancy.Because be only partial redundance, instead of all circuit all carry out redundancy, the primary particle inversion resistant performance of device therefore whether really cannot can be improved after desired portion redundancy, the device single-particle inversion characteristic test after this part triplication redundancy
Summary of the invention
Therefore, the object of the present invention is to provide the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, can test out the consolidation effect of part triplication redundancy to device exactly.
The invention provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, the flow process of the method as shown in Figure 1, comprising:
1) high energy particle of turn threshold is greater than by LET value, irradiation measured device under the fluence rate of setting, when device output characteristics is incorrect and device function does not recover normal in the time T1 stopping particle beam irradiation, then record 1 single-particle mistake, reconfigure FPGA device function, and repeatedly repetitive irradiation measured device, to obtain the single-particle mistake added up, and calculates single-particle mistake cross section;
2) make the LET value of particle constant and fluence rate reduces, and repeat above-mentioned steps 1), obtain another single-particle mistake cross section, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is less than a predetermined value, then get the final single-particle mistake cross section value that this single-particle mistake cross section is measured device, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is greater than a predetermined value, then continue to repeat this step 2);
3) comparative device of not carrying out triplication redundancy reinforcing that another is identical with measured device is provided, with the high energy particle identical with the LET value in step 1), under contrast fluence rate, radiation contrast's device, when device output characteristics incorrect and stop particle beam irradiation time T1 in device function do not recover normal, then record 1 single-particle mistake, and repeatedly repetitive irradiation comparative device, to obtain repeatedly single-particle mistake, and calculates single-particle mistake cross section;
4) the single-particle mistake cross section of comparative device and step 2 that non-triplication redundancy reinforces is calculated) ratio in the final single-particle mistake cross section of measured device that obtains.
According to method provided by the invention, according to the ratio in judgement consolidation effect that step 4) obtains, ratio is larger, then illustrate that triplication redundancy consolidation effect is large, ratio is less, illustrates that triplication redundancy consolidation effect is less.
According to method provided by the invention, wherein above-mentioned steps 1) and step 3) in, the time T1 stopping irradiation is 20 to 50 seconds.
According to method provided by the invention, wherein above-mentioned steps 1) in, repeatedly repetitive irradiation measured device, until stop irradiation when the single-particle mistake of pre-determined number appears in accumulation.
According to method provided by the invention, wherein above-mentioned steps 1) in, repeatedly repetitive irradiation measured device, until stop irradiation when irradiation accumulation fluence reaches scheduled volume.
According to method provided by the invention, wherein above-mentioned steps 3), repeatedly repetitive irradiation comparative device, until stop irradiation when the single-particle mistake of pre-determined number appears in accumulation.
According to method provided by the invention, wherein above-mentioned steps 3) in, repeatedly repetitive irradiation comparative device, until stop irradiation when irradiation accumulation fluence reaches scheduled volume.
According to method provided by the invention, wherein in above-mentioned steps 3), described contrast fluence rate two orders of magnitude larger than the fluence rate corresponding to the final single-particle mistake cross section value described in step 1).
According to method provided by the invention, wherein step 2) described in predetermined value between 0-10%.
Method provided by the invention can test out the consolidation effect of part triplication redundancy to device exactly.
Accompanying drawing explanation
Fig. 1 is the schematic diagram according to method of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with specific embodiment, the present invention is described in more detail.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
The present embodiment provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, comprising:
1) tested FPGA device is carried out the reinforcing of part triplication redundancy;
2) LET(linear energy transfer is used) value is greater than the high energy particle of the turn threshold of FPGA device, at the fluence rate (10 of setting
2individual particle/cm
2s) irradiation measured device under, and during irradiation the output characteristics of test component;
3) when device output characteristics is incorrect, stop particle beam irradiation, continue monitoring devices output characteristics simultaneously;
4) if within the time stopping irradiation T1=30 second, device function recovers normal, then continue irradiation, if stop in the time of irradiation T1=30 second, device function does not recover normal, then record 1 single-particle mistake, by arranging the time T1 stopping irradiation, that carrys out abatement device self repairs the impact caused test result;
5) reconfigure FPGA device function, repeat step 2)-4), until stop irradiation during accumulation appearance 100 single-particle mistakes;
6) calculate single-particle mistake cross section, wherein single-particle mistake cross section equals total single-particle error number divided by total incident particle fluence;
7) particle fluence rate is made to reduce by 1 order of magnitude, fluence rate (10 the particle/cm after reduction
2s) irradiation measured device under, and during irradiation the output characteristics of test component, then repeat above-mentioned steps 3)-6), the single-particle mistake cross section under the fluence rate after being reduced;
8) fluence rate of relatively more last setting and the difference in the single-particle mistake cross section under the last fluence rate set, such as, both if substantially identical (difference is less than a predetermined value, differs within 10%), then stops irradiation, continues to perform step 9); If both differences are large, (difference is greater than a predetermined value, such as differ more than 10%), then repeat step 7), namely constantly particle fluence rate is reduced, until tend to be steady substantially in single-particle mistake cross section, thus remove fluence rate impact that test result is caused, get fluence rate minimum time single-particle mistake cross section value corresponding to (under the fluence rate set for the last time) as the final single-particle mistake cross section value of measured device;
9) comparative device providing another identical with measured device, this comparative device does not carry out triplication redundancy reinforcing;
10) with the high energy particle that LET value is identical with the LET value in step 1), at contrast fluence rate (10
2individual particle/cm
2s) under, radiation contrast's device, the output characteristics of test component during irradiation, described contrast fluence rate two orders of magnitude larger than the fluence rate of the last setting described in step 8);
11) when device output characteristics is incorrect, stop particle beam irradiation, continue monitoring devices output characteristics, if within the time stopping irradiation T1=30 second, device function recovers normal, then continue irradiation, if stop in the time of irradiation T1=30 second, device function does not recover normal, then record 1 single-particle mistake;
12) step 10)-11 is repeated), until stop irradiation during accumulation appearance 100 single-particle mistakes;
13) calculate single-particle mistake cross section, single-particle mistake cross section equals single-particle error number divided by the total fluence of incident particle;
14) ratio in the single-particle mistake cross section of the single-particle mistake cross section of comparative device that non-triplication redundancy reinforces and the measured device that step 8) obtains is calculated, this ratio is larger, then illustrate that triplication redundancy consolidation effect is larger, ratio is less, illustrate that triplication redundancy consolidation effect is little, then illustrate that designer answers the design proposal of adjustment member redundancy.
According to other embodiments of the invention, wherein above-mentioned steps 8) in, whether substantially identical predetermined value is not limited to 10% in single-particle mistake cross section, also can be 3%, 5%, 8% etc., be preferably 0-10%, those skilled in the art can adopt different predetermined values according in practical application to the needs of measuring accuracy.
According to other embodiments of the invention, wherein above-mentioned steps 4) and step 11) in, the time T1 of described stopping irradiation is preferably within 20-50 second.
In step 5) in the present embodiment and step 12), repeated mode is adopted to obtain multiple sample, and will repeat to reach certain number of times as the foundation repeating to terminate, thus draw the single-particle mistake cross section on statistical significance, the number of times repeated is more, the sample obtained is more, and the single-particle mistake cross section on the statistical significance obtained is more close to exact value, and the number of times wherein accumulating appearance is preferably about 100 times.According to other embodiments of the invention, can also take to reach certain total accumulation fluence as the foundation repeating to terminate, accumulation fluence preferably reaches 10
7individual particle/cm
2left and right.
It should be noted last that, above embodiment is only in order to illustrate technical scheme of the present invention and unrestricted.Although with reference to embodiment to invention has been detailed description, those of ordinary skill in the art is to be understood that, modify to technical scheme of the present invention or equivalent replacement, do not depart from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of right of the present invention.
Claims (9)
1. a method of testing for the single-particle inversion characteristic of part triplication redundancy SRAM type FPGA, comprising:
1) high energy particle of turn threshold is greater than by LET value, the tested FPGA device of irradiation under the fluence rate of setting, when described tested FPGA device output characteristics is incorrect and described tested FPGA device function does not recover normal in the time T1 stopping particle beam irradiation, then record 1 single-particle mistake, reconfigure described tested FPGA device function, and repeatedly tested FPGA device described in repetitive irradiation, to obtain the single-particle mistake added up, and calculates single-particle mistake cross section;
2) make the LET value of particle constant and fluence rate reduces, and repeat above-mentioned steps 1), obtain another single-particle mistake cross section, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is less than a predetermined value, then get the final single-particle mistake cross section value that this single-particle mistake cross section is described tested FPGA device, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is greater than a predetermined value, then continue to repeat this step 2);
3) the contrast FPGA device not carrying out triplication redundancy reinforcing that another is identical with described tested FPGA device is provided, with with step 1) in the identical high energy particle of LET value, under contrast fluence rate, FPGA device is contrasted described in irradiation, when described contrast FPGA device output characteristics incorrect and in the time T1 stopping particle beam irradiation described contrast FPGA device function do not recover normal, then record 1 single-particle mistake, and repeatedly contrast FPGA device described in repetitive irradiation to obtain repeatedly single-particle mistake, and calculate single-particle mistake cross section;
4) single-particle mistake cross section and the step 2 of the described contrast FPGA device that non-triplication redundancy is reinforced is calculated) ratio in the final single-particle mistake cross section of described tested FPGA device that obtains.
2. method according to claim 1, according to step 4) the ratio in judgement consolidation effect that obtains, ratio is larger, then illustrate that triplication redundancy consolidation effect is large, ratio is less, illustrates that triplication redundancy consolidation effect is less.
3. method according to claim 1, wherein above-mentioned steps 1) and step 3) in, the time T1 stopping irradiation is 20 to 50 seconds.
4. method according to claim 1, wherein above-mentioned steps 1) in, repeatedly tested FPGA device described in repetitive irradiation, until stop irradiation when the single-particle mistake of pre-determined number appears in accumulation.
5. method according to claim 1, wherein above-mentioned steps 1) in, repeatedly tested FPGA device described in repetitive irradiation, until stop irradiation when irradiation accumulation fluence reaches scheduled volume.
6. method according to claim 1, wherein above-mentioned steps 3), repeatedly contrast FPGA device described in repetitive irradiation, until stop irradiation when the single-particle mistake of pre-determined number appears in accumulation.
7. method according to claim 1, wherein above-mentioned steps 3) in, repeatedly contrast FPGA device described in repetitive irradiation, until stop irradiation when irradiation accumulation fluence reaches scheduled volume.
8. method according to claim 1, wherein in above-mentioned steps 3), described contrast fluence rate is than step 1) described in large two orders of magnitude of fluence rate corresponding to the value of final single-particle mistake cross section.
9. method according to claim 1, wherein step 2) described in predetermined value between 0-10%.
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| CN103323715B (en) * | 2013-06-20 | 2015-08-05 | 中国空间技术研究院 | Particle fluence rate system of selection in large scale integrated circuit accelerator single particle experiment |
| CN103577643B (en) * | 2013-11-06 | 2016-06-01 | 中国空间技术研究院 | A kind of SRAM type FPGA single particle upset effect emulation method |
| CN104268253B (en) * | 2014-10-09 | 2017-10-27 | 中国科学院自动化研究所 | A kind of part triplication redundancy method counted based on look-up table configuration bit |
| CN104462658B (en) * | 2014-11-06 | 2017-07-28 | 北京空间飞行器总体设计部 | A kind of triplication redundancy safeguard structure FPGA single particle overturns the appraisal procedure of failure probability |
| CN105204389A (en) * | 2015-10-08 | 2015-12-30 | 武汉聚鑫源机电工程设备有限公司 | Programmable rotating speed signal device based on software and hardware dual TMR type |
| CN114968685B (en) * | 2022-05-30 | 2024-07-26 | 中国人民解放军国防科技大学 | Method for testing single-particle overturning section of EDAC reinforced microprocessor |
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