CN102879730B - The method of testing of the single-particle inversion characteristic of part triplication redundancy SRAM type FPGA - Google Patents
The method of testing of the single-particle inversion characteristic of part triplication redundancy SRAM type FPGA Download PDFInfo
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Abstract
The invention provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy FPGA, comprise: the tested device of irradiation under the fluence rate of setting, when device output characteristics is incorrect and stop device function in the particle beam irradiation T1 time not recover normal, then record 1 single-particle mistake, repeatedly repeat rear calculating single-particle mistake cross section; Particle fluence rate is constantly reduced, until tend towards stability in single-particle mistake cross section; Above-mentioned steps is repeated altogether under at least 5 Different L ET values.
Description
Technical field
The invention belongs to particle irradiation field tests, particularly relate to the method for testing of the single-particle inversion characteristic of the SRAM type FPGA after the reinforcing of a kind of part triplication redundancy.
Background technology
SRAM type FPGA is made up of config memory, block storage, trigger, overall control register and half closedown structure etc., and the feature high with its integrated level, dirigibility is strong, the construction cycle is short, obtains at space industry and apply more and more widely.But, the space environment of its work also exists the high energy particles such as a large amount of γ photon, radiation belt electronics, high energy proton, and SRAM type FPGA is a kind of single-particle inversion Sensitive Apparatus, be made up of config memory, block storage, trigger, overall control register and half closedown structure etc., every part all may produce single-particle inversion under the bombardment of high energy particle, and this is particularly evident on the impact of SRAM type FPGA.
Modern FPGA technique is towards low-voltage, high integration future development, and this makes the threshold value that space radiation response occurs more and more lower, and the probability broken down is increasing.The generation of Space Radiation Effects, gently then can make equipment operation irregularity, heavy then can cause equipment burnout, permanent failure.Therefore, FPGA must carry out High Reliability Design, prevents and solve the impact of Space Radiation Effects to greatest extent.
Triplication redundancy reinforces (Triple Modular Redundancy, TMR), one of conventional primary particle inversion resistant measure. three modules perform identical operation simultaneously, using the identical output of majority as the correct output of voting system, are commonly referred to three and get two.As long as asynchronously there are two identical mistakes in three modules, just can mask off the mistake of malfunctioning module, ensure the output that system is correct.Because three modules are that mutually independently two modules occur that mistake is minimum probability event, therefore greatly can improve the reliability of system simultaneously.But triplication redundancy can increase device inside resource use amount, in some applications, owing to using resource large, and device inside total resources is certain, cannot accomplish to carry out triplication redundancy design to all circuit, designer is according to influence degree, and carry out triplication redundancy to the large Partial key circuit of impact, remainder does not take triplication redundancy.Device single-particle inversion characteristic test after this part triplication redundancy is current international difficult point, can not test out the single-particle inversion characteristic of the SRAM type FPGA after the reinforcing of part triplication redundancy exactly.
Summary of the invention
Therefore, the object of the present invention is to provide the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, can exactly part of detecting triplication redundancy reinforce after the single-particle inversion characteristic of SRAM type FPGA.
The invention provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, the flow process of the method as shown in Figure 1, comprising:
1) high energy particle of turn threshold is greater than by LET value, irradiation measured device under the fluence rate of setting, when device output characteristics is incorrect and device function does not recover normal in the time T1 stopping particle beam irradiation, then record 1 single-particle mistake, reconfigure FPGA device function, and repeatedly repetitive irradiation measured device, to obtain the single-particle mistake added up, and calculates single-particle mistake cross section;
2) make the LET value of particle constant and fluence rate reduces, and repeat above-mentioned steps 1), obtain another single-particle mistake cross section, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is less than a predetermined value, then get the final single-particle mistake cross section value that this single-particle mistake cross section is measured device, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is greater than a predetermined value, then continue to repeat this step 2);
3) change the LET value of particle, under at least 5 Different L ET values, repeat step 1) to 2 altogether).
According to method provided by the invention, also comprise the relation curve that step 3) draws LET value and corresponding final single-particle mistake cross section value.
According to method provided by the invention, also comprise step 4) and adopt Weibull method that data point is fitted to curve, utilize this curve to carry out error rate in-orbit and estimate.
According to method provided by the invention, wherein above-mentioned steps 1) in, repeatedly repetitive irradiation measured device, until stop irradiation when the single-particle mistake of pre-determined number appears in accumulation.
According to method provided by the invention, wherein above-mentioned steps 1) in, repeatedly repetitive irradiation measured device, until stop irradiation when irradiation accumulation fluence reaches scheduled volume.
According to method provided by the invention, wherein above-mentioned steps 4) in, the time T1 stopping irradiation is 20 to 50 seconds.
According to method provided by the invention, wherein step 2) described in predetermined value between 0-10%.
The present invention can test out the single-particle inversion characteristic of the SRAM type FPGA after the reinforcing of part triplication redundancy exactly.
Accompanying drawing explanation
Fig. 1 is the schematic diagram according to method of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with specific embodiment, the present invention is described in more detail.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
The present embodiment provides the method for testing of the single-particle inversion characteristic of a kind of part triplication redundancy SRAM type FPGA, comprising:
1) tested FPGA device is carried out the reinforcing of part triplication redundancy;
2) LET(linear energy transfer is used) value is greater than the high energy particle of the turn threshold of FPGA device, at the fluence rate (10 of setting
2individual particle/cm
2s) irradiation measured device under, and during irradiation the output characteristics of test component;
3) when device output characteristics is incorrect, stop particle beam irradiation, continue monitoring devices output characteristics simultaneously;
4) if within the time stopping irradiation T1=30 second, device function recovers normal, then continue irradiation, if stop in the time of irradiation T1=30 second, device function does not recover normal, then record 1 single-particle mistake, by arranging the time T1 stopping irradiation, that carrys out abatement device self repairs the impact caused test result;
5) reconfigure FPGA device function, repeat step 2)-4), until stop irradiation during accumulation appearance 100 single-particle mistakes;
6) calculate single-particle mistake cross section, wherein single-particle mistake cross section equals total single-particle error number divided by total incident particle fluence;
7) particle fluence rate is made to reduce by 1 order of magnitude, fluence rate (10 the particle/cm after reduction
2s) irradiation measured device under, and during irradiation the output characteristics of test component, then repeat above-mentioned steps 3)-6), the single-particle mistake cross section under the fluence rate after being reduced;
8) fluence rate of relatively more last setting and the difference in the single-particle mistake cross section under the last fluence rate set, such as, both if substantially identical (difference is less than a predetermined value, differs within 10%), then stops irradiation, continues to perform step 9); Such as, if both differences large (difference is greater than a predetermined value, differs more than 10%), then repeat step 7), namely constantly reduce particle fluence rate, until tend to be steady substantially in single-particle mistake cross section, thus the impact that removal fluence rate causes test result;
9) the LET value of particle is changed, step 2 is repeated altogether under at least 5 Different L ET values) to 8), each LET value is obtained respectively to the single-particle mistake cross section value under a series of different fluence rate, and get fluence rate minimum time single-particle mistake cross section value corresponding to (last setting fluence rate under) as the final single-particle mistake cross section value corresponding to each LET value;
10) with at least 5 different LET values for horizontal ordinate, with the final single-particle mistake cross section value corresponding to each LET value for ordinate, draw relation curve.
In actual applications, can adopt Weibull method that data point is fitted to curve, utilize this curve can carry out error rate in-orbit and estimate.
According to other embodiments of the invention, wherein above-mentioned steps 8) in, whether substantially identical predetermined value is not limited to 10% in single-particle mistake cross section, also can be 3%, 5%, 8% etc., be preferably 0-10%, those skilled in the art can adopt different predetermined values according in practical application to the needs of measuring accuracy.
According to other embodiments of the invention, wherein above-mentioned steps 4) in, the time T1 of described stopping irradiation is preferably within 20-50 second.
In step 5) in the present embodiment, repeated mode is adopted to obtain multiple sample, and will repeat to reach certain number of times as the foundation repeating to terminate, thus draw the single-particle mistake cross section on statistical significance, the number of times repeated is more, the sample obtained is more, and the single-particle mistake cross section on the statistical significance obtained is more close to exact value, and the number of times wherein accumulating appearance is preferably about 100 times.According to other embodiments of the invention, can also take to reach certain total accumulation fluence as the foundation repeating to terminate, accumulation fluence preferably reaches 10
7individual particle/cm
2left and right.
It should be noted last that, above embodiment is only in order to illustrate technical scheme of the present invention and unrestricted.Although with reference to embodiment to invention has been detailed description, those of ordinary skill in the art is to be understood that, modify to technical scheme of the present invention or equivalent replacement, do not depart from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of right of the present invention.
Claims (6)
1. a method of testing for the single-particle inversion characteristic of part triplication redundancy SRAM type FPGA, comprising:
1) high energy particle of turn threshold is greater than by LET value, the tested FPGA device of irradiation under the fluence rate of setting, when described tested FPGA device output characteristics is incorrect and described tested FPGA device function does not recover normal in the time T1 stopping particle beam irradiation, then record 1 single-particle mistake, reconfigure described tested FPGA device function, and repeatedly tested FPGA device described in repetitive irradiation, to obtain the single-particle mistake added up, and calculates single-particle mistake cross section;
2) make the LET value of particle constant and fluence rate reduces, and repeat above-mentioned steps 1), obtain another single-particle mistake cross section, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is less than a predetermined value, then get the final single-particle mistake cross section value that this single-particle mistake cross section is described tested FPGA device, if the difference in this single-particle mistake cross section and a front single-particle mistake cross section is greater than a predetermined value, then continue to repeat this step 2);
3) change the LET value of particle, under at least 5 Different L ET values, repeat step 1 altogether) to 2).
2. method according to claim 1, also comprises step 4) draw the relation curve of LET value and corresponding final single-particle mistake cross section value.
3. method according to claim 1, wherein above-mentioned steps 1) in, repeatedly tested FPGA device described in repetitive irradiation, until stop irradiation when the single-particle mistake of pre-determined number appears in accumulation.
4. method according to claim 1, wherein above-mentioned steps 1) in, repeatedly tested FPGA device described in repetitive irradiation, until stop irradiation when irradiation accumulation fluence reaches scheduled volume.
5. method according to claim 1, wherein above-mentioned steps 4) in, the time T1 stopping irradiation is 20 to 50 seconds.
6. method according to claim 1, wherein step 2) described in predetermined value between 0-10%.
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| CN103323715B (en) * | 2013-06-20 | 2015-08-05 | 中国空间技术研究院 | Particle fluence rate system of selection in large scale integrated circuit accelerator single particle experiment |
| CN103577643B (en) * | 2013-11-06 | 2016-06-01 | 中国空间技术研究院 | A kind of SRAM type FPGA single particle upset effect emulation method |
| CN103616631B (en) * | 2013-11-15 | 2017-02-15 | 中国空间技术研究院 | Method for conducting device proton signal-event test through accelerator high-energy proton |
| CN105204389A (en) * | 2015-10-08 | 2015-12-30 | 武汉聚鑫源机电工程设备有限公司 | Programmable rotating speed signal device based on software and hardware dual TMR type |
| CN105869679B (en) * | 2016-03-28 | 2018-09-18 | 北京空间飞行器总体设计部 | A kind of SRAM type FPGA single particle soft error and circuit malfunction rate relationship rapid assay methods |
| CN106405385B (en) * | 2016-08-31 | 2019-03-05 | 西北核技术研究所 | Logic circuit single particle effect test method based on chain of flip-flops |
| CN109947608B (en) * | 2019-03-06 | 2020-04-24 | 清华大学 | Method and device for detecting single event upset fault of FPGA addition tree |
| CN110083081B (en) * | 2019-03-11 | 2020-08-04 | 北京时代民芯科技有限公司 | Automatic single-particle irradiation test control system and method |
| CN111338833B (en) * | 2020-02-19 | 2022-02-01 | 北京航空航天大学 | BRAM detection-based dynamic self-adaptive SRAM type FPGA system fault tolerance method |
| CN111650452B (en) * | 2020-05-07 | 2022-11-04 | 西北核技术研究院 | Method for estimating device space on-orbit low-energy proton single-particle turnover rate |
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