CN112660429A - LET (Lee-Lee - Google Patents
LET (Lee-Lee Download PDFInfo
- Publication number
- CN112660429A CN112660429A CN202011631371.1A CN202011631371A CN112660429A CN 112660429 A CN112660429 A CN 112660429A CN 202011631371 A CN202011631371 A CN 202011631371A CN 112660429 A CN112660429 A CN 112660429A
- Authority
- CN
- China
- Prior art keywords
- particle
- single event
- monitoring
- protection level
- devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002245 particle Substances 0.000 claims abstract description 59
- 230000005855 radiation Effects 0.000 claims abstract description 38
- 230000000694 effects Effects 0.000 claims abstract description 26
- 238000012544 monitoring process Methods 0.000 claims abstract description 25
- 238000001514 detection method Methods 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 claims abstract description 10
- 230000002159 abnormal effect Effects 0.000 claims description 7
- 150000002500 ions Chemical class 0.000 claims description 7
- 230000008569 process Effects 0.000 claims description 2
- 230000008878 coupling Effects 0.000 abstract description 2
- 238000010168 coupling process Methods 0.000 abstract description 2
- 238000005859 coupling reaction Methods 0.000 abstract description 2
- 238000001228 spectrum Methods 0.000 description 7
- 101100006960 Caenorhabditis elegans let-2 gene Proteins 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 101100293589 Kluyveromyces lactis (strain ATCC 8585 / CBS 2359 / DSM 70799 / NBRC 1267 / NRRL Y-1140 / WM37) NAR1 gene Proteins 0.000 description 2
- 101100409519 Schizosaccharomyces pombe (strain 972 / ATCC 24843) let1 gene Proteins 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 206010033799 Paralysis Diseases 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000007635 classification algorithm Methods 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000000191 radiation effect Effects 0.000 description 1
- 238000012502 risk assessment Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
Images
Landscapes
- Measurement Of Radiation (AREA)
Abstract
The invention discloses a single event risk group detection method based on LET (Leet) concomitant monitoring. The invention combines the type and probability of single event effect of the carried sensitive device when the spacecraft is in fault with LET monitoring space particle environment data, and forms a single event information group coupling detection mode by using the single event protection level of each sensitive device of the spacecraft, thereby realizing a risk identification mode combining point detection and satellite monitoring, being capable of accurately acquiring the particle radiation environment causing the single event effect of the device in a satellite cabin in real time and providing an effective monitoring method for early warning of the on-orbit risk of the satellite. The method utilizes the information multiplexing of the spacecraft sensitive device, does not increase additional devices, and has low cost and easy realization.
Description
Technical Field
The invention relates to the technical field of single event risk detection of on-orbit satellites, in particular to a single event risk group detection method based on LET (Low-emission orbit) accompanying monitoring, and discloses a risk self-monitoring method for fusion application of single-point LET detection and star single event faults.
Background
The single event effect is one of the most harmful radiation effects to the spacecraft electronics system. The single event effect can change the logic state of electronic devices for the satellite, cause the disorder of circuit logic function, cause the error of data processed by a computer, cause the error of instructions, cause programs to run away, cause the computer to be paralyzed, and cause bulk silicon CMOS devices and power devices to be burnt by the large current induced by the bulk silicon CMOS devices and the power devices, thereby causing the abnormality and the failure of the satellite and even causing the satellite to be in a catastrophic situation.
The probability of occurrence of a single-particle fault in a device is closely related to the energy transmission linear density (LET value) of rays in the device, risk early warning is carried out by the LET value in conventional detection, and the method has the defects of various related factors, such as satellite structure difference, device model selection difference, radiation environment position, satellite operation working condition and the like. The conventional single event risk false alarm rate is high, and the information is difficult to apply.
Disclosure of Invention
In view of the above, the invention provides a single event risk group detection method based on LET accompanying monitoring, which overcomes the defect that a single device and a simple layout are difficult to reflect the health state of a satellite on the basis of utilizing a finite point monitoring LET spectrum, fully integrates the single event risk information of the existing multiple sensitive devices of the whole satellite, and provides a practical means for monitoring the single event risk of the satellite by combining a risk classification algorithm.
The invention discloses a single event risk group detection method based on LET (Lee-Lee) concomitant monitoring, which comprises the following steps of:
step 1, carrying out protection level division on each device carried by a satellite according to the single-particle protection capability of each device;
step 2, counting the single event effect category and the occurrence probability of each protection level device when the satellite causes abnormity or failure due to the single event effect;
step 3, acquiring space particle radiation environment data of the satellite when the satellite is abnormal or fails due to the single particle effect;
step 4, obtaining the corresponding relation between the single event effect category and the occurrence probability of each protection level device and the space particle radiation environment according to the data in the step 2 and the step 3, and further obtaining the space particle radiation threshold value when the single event effect occurs on the protection level device;
and 5, monitoring the space particle radiation environment data, and giving an early warning if the space particle radiation environment data reaches a threshold value corresponding to a device of a certain protection level.
Preferably, the single particle protection level of the device is divided into 3 types: the single particle protection level of the industrial device with low product price and weak single particle protection capability is level 1; the single event protection level of the device with physical redundancy is level 2; the single particle protection level of the aerospace special device with high product price is level 3.
Preferably, the spatial particle radiation environment data includes radiation doses of electrons, protons and heavy ions in the spatial environment; and respectively obtaining the corresponding relations between the single event effect type and the occurrence probability of a device at a certain protection level and the radiation doses of electrons, protons and heavy ions in the space environment to obtain corresponding threshold values.
Preferably, LET detection is used to obtain spatial particle radiation environment data.
Preferably, the devices include memory devices, devices fabricated using CMOS processes, MOSFET devices, analog devices, radio frequency devices, power supply devices, processors, FPGAs, EEPROMs, FLASH and VCOs.
Has the advantages that:
the invention combines the type and probability of single event effect of the carried sensitive device when the spacecraft is in fault with LET monitoring space particle environment data, and forms a single event information group coupling detection mode by using the single event protection level of each sensitive device of the spacecraft, thereby realizing a risk identification mode combining point detection and satellite monitoring, being capable of accurately acquiring the particle radiation environment causing the single event effect of the device in a satellite cabin in real time and providing an effective monitoring method for early warning of the on-orbit risk of the satellite.
The method utilizes the information multiplexing of the spacecraft sensitive device, does not increase additional devices, and has low cost and easy realization.
Drawings
FIG. 1 is a flow chart of the method of the present invention.
Fig. 2 is a schematic diagram of a particle radiation detector.
Detailed Description
The invention is described in detail below by way of example with reference to the accompanying drawings.
The invention provides a single event risk group detection method based on LET (leave-behind) accompanying monitoring, which is based on a satellite body rich with sensitive devices such as an FPGA (field programmable gate array) and an SRAM (static random access memory), firstly, the satellite sensitive devices are classified according to the single event protection level of the devices, then, the occurrence type and probability of satellite on-orbit single event are counted, the relation between the single event of the devices with different protection levels corresponding to LET spectrum data carried by the satellite and telemetering data of a particle radiation detector is searched, finally, the self-monitoring is carried out on the single event risk of the satellite according to the found relation and the real-time data of the particle radiation detector, and early warning is carried out when the radiation energy or the accumulated dose of particles is found to be close to or exceed the threshold value of the single event radiation type and dose of. The single event risk self-monitoring method and the device thereof effectively realize the single event risk self-monitoring of the satellite body by detecting through the particle radiation detector carried by the satellite and combining with the multiplexing of the sensitive device carried by the satellite, realize the self-sensing detection with low cost, large scale and multiple thresholds, and can be used for the single event effect risk assessment of the in-orbit spacecraft.
The flow chart of the invention is shown in fig. 1, and specifically comprises the following steps:
step 1, satellite device characteristic statistics is carried out.
In order to maintain normal operation, a satellite generally needs to carry hundreds of single-particle sensitive devices, the types of which include an FPGA, an SRAM and the like, and the radiation resistance grades of the devices are different and are generally the main bodies of failure performance.
The invention firstly grades the commonly used sensitive devices of the satellite, and the commonly used sensitive devices are divided into three protection levels: the protection level 1 is an industrial device and is characterized by low product price and weak single-particle protection capability; the protection level 2 is a device with physical redundancy, and is characterized in that although single-particle protection of a single device is weak, a plurality of same devices form backup, such as modes of triple modular redundancy, physical hot backup and the like, the device with physical redundancy can counteract the influence caused by partial single-particle effect, so that the single-particle protection capability of the protection level 2 is higher than that of the protection level 1; the protection level 3 is a special aerospace level device and is characterized in that the single-particle protection effect is considered in design, so that the single-particle protection capability of the device is higher than that of the first two protection levels, and the device price of the corresponding level protection 3 is also higher.
And 2, carrying out satellite abnormal fault statistics.
And (3) counting satellite in-orbit abnormal data, dividing and counting the abnormal or fault caused by the single event effect according to the device protection level determined in the step (1), and counting the type and the occurrence probability of the single event effect of each protection level device.
And 3, carrying out concomitant monitoring on the LET environmental effect value.
And acquiring historical data of the particle radiation detector carried by the satellite to obtain particle radiation environment data when the satellite is abnormal or fails. The particle radiation detector adopts three groups of probes LET1, LET2 and LET3 to realize the detection of the wide energy spectrum of the instrument according to the characteristics of space electron, proton and heavy ion energy spectrums. The LET1 is mainly used for detecting an electronic LET spectrum in a space, the electron flux is strong, the particle count is large, and the probe mainly breaks through the key technology of low-noise and high-count acquisition; LET2 is mainly used for detecting LET spectrum of light ions such as proton alpha particles in space; LET3 is mainly used for LET spectrum detection of heavy ions; the LET2 and LET3 probes focus on the large dynamic range of the detection range and low background counts, and the schematic diagram of the particle radiation detector is shown in FIG. 2.
And 4, determining the star single particle risk equivalent threshold.
After obtaining the type, the occurrence probability and the particle radiation environment data of the single event effect, finding out the corresponding particle radiation environment data when the single event effect occurs by a statistical method, obtaining the relationship between the single event radiation type and the dose of each device of the occurring protection level, and obtaining the single event effect occurrence threshold value of the device of the protection level according to the relationship.
And 5, carrying out risk early warning according to the LET environmental effect threshold value.
And (3) acquiring satellite particle radiation detector data in real time, comparing the threshold values of the corresponding protection level devices acquired in the step (3), performing early warning when the particle radiation energy or the accumulated dose is found to be close to or exceed the threshold value of the single particle radiation type and dose of a device of a certain protection level obtained by statistics, and closing a sensitive single machine if necessary.
In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. A single particle risk group detection method based on LET accompanying monitoring is characterized by comprising the following steps:
step 1, carrying out protection level division on each device carried by a spacecraft according to the single-particle protection capability of each device;
step 2, counting the single event effect category and the occurrence probability of each protection level device when the spacecraft is abnormal or failed due to the single event effect;
step 3, acquiring space particle radiation environment data when the spacecraft is abnormal or fails due to the single particle effect;
step 4, obtaining the corresponding relation between the single event effect category and the occurrence probability of each protection level device and the space particle radiation environment according to the data in the step 2 and the step 3, and further obtaining the space particle radiation threshold value when the single event effect occurs on the protection level device;
and 5, monitoring the space particle radiation environment data, and giving an early warning if the space particle radiation environment data reaches a threshold value corresponding to a device of a certain protection level.
2. The LET accompanying monitoring-based single particle risk group detection method according to claim 1, wherein the single particle protection levels of the devices are divided into 3 types: the single particle protection level of the industrial device with low product price and weak single particle protection capability is level 1; the single event protection level of the device with physical redundancy is level 2; the single particle protection level of the aerospace special device with high product price is level 3.
3. The LET concomitant monitoring-based single particle risk group detection method of claim 1, wherein the spatial particle radiation environment data comprises radiation doses of electrons, protons, and heavy ions in the spatial environment; and respectively obtaining the corresponding relations between the single event effect type and the occurrence probability of a device at a certain protection level and the radiation doses of electrons, protons and heavy ions in the space environment to obtain corresponding threshold values.
4. The LET concomitant monitoring-based single particle risk group detection method according to claim 1 or 3, wherein LET detection is adopted to obtain spatial particle radiation environment data.
5. The LET companion monitoring-based single event risk group detection method of claim 1, wherein said devices comprise memory devices, devices fabricated using CMOS processes, MOSFET devices, analog devices, radio frequency devices, power supply devices, processors, FPGAs, EEPROMs, FLASH and VCOs.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202011631371.1A CN112660429A (en) | 2020-12-30 | 2020-12-30 | LET (Lee-Lee |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202011631371.1A CN112660429A (en) | 2020-12-30 | 2020-12-30 | LET (Lee-Lee |
Publications (1)
Publication Number | Publication Date |
---|---|
CN112660429A true CN112660429A (en) | 2021-04-16 |
Family
ID=75412936
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202011631371.1A Pending CN112660429A (en) | 2020-12-30 | 2020-12-30 | LET (Lee-Lee |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN112660429A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113392287A (en) * | 2021-06-13 | 2021-09-14 | 国家卫星气象中心(国家空间天气监测预警中心) | Multi-satellite space environment risk prediction and real-time early warning subsystem and related device |
CN113772121A (en) * | 2021-09-01 | 2021-12-10 | 中国人民解放军63921部队 | Satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1192907A (en) * | 1955-04-06 | 1959-10-29 | Electronique & Physique | Improvements to space exploration systems associated with radiation detectors |
CN101887088A (en) * | 2009-05-14 | 2010-11-17 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and system for evaluating single-particle effect index of satellite device |
CN104809338A (en) * | 2015-04-16 | 2015-07-29 | 北京空间飞行器总体设计部 | Satellite in orbit space-environment-influence early warning method based on correlation relationship |
US20150244362A1 (en) * | 2014-01-28 | 2015-08-27 | Gedex Inc. | System and method for protection of spacecraft electronics |
CN105117576A (en) * | 2015-07-13 | 2015-12-02 | 上海卫星工程研究所 | Spacecraft system-level single event upset effect analysis method based on fault propagation |
CN108791954A (en) * | 2018-05-30 | 2018-11-13 | 兰州空间技术物理研究所 | A kind of fault early warning method based on the in-orbit interior charged effect dynamic base table of spacecraft |
-
2020
- 2020-12-30 CN CN202011631371.1A patent/CN112660429A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1192907A (en) * | 1955-04-06 | 1959-10-29 | Electronique & Physique | Improvements to space exploration systems associated with radiation detectors |
CN101887088A (en) * | 2009-05-14 | 2010-11-17 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and system for evaluating single-particle effect index of satellite device |
US20150244362A1 (en) * | 2014-01-28 | 2015-08-27 | Gedex Inc. | System and method for protection of spacecraft electronics |
CN104809338A (en) * | 2015-04-16 | 2015-07-29 | 北京空间飞行器总体设计部 | Satellite in orbit space-environment-influence early warning method based on correlation relationship |
CN105117576A (en) * | 2015-07-13 | 2015-12-02 | 上海卫星工程研究所 | Spacecraft system-level single event upset effect analysis method based on fault propagation |
CN108791954A (en) * | 2018-05-30 | 2018-11-13 | 兰州空间技术物理研究所 | A kind of fault early warning method based on the in-orbit interior charged effect dynamic base table of spacecraft |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113392287A (en) * | 2021-06-13 | 2021-09-14 | 国家卫星气象中心(国家空间天气监测预警中心) | Multi-satellite space environment risk prediction and real-time early warning subsystem and related device |
CN113392287B (en) * | 2021-06-13 | 2024-02-02 | 国家卫星气象中心(国家空间天气监测预警中心) | Multi-star space environment risk prediction and real-time early warning subsystem and related device |
CN113772121A (en) * | 2021-09-01 | 2021-12-10 | 中国人民解放军63921部队 | Satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103605835B (en) | Design evaluation method of spacecraft system-level anti-single particles | |
Ciani et al. | A fault tolerant architecture to avoid the effects of Single Event Upset (SEU) in avionics applications | |
CN112660429A (en) | LET (Lee-Lee | |
CN103679378B (en) | Method and device based on telemetry assessment heath state of spacecraft | |
CN105718713B (en) | Space radiation environment analysis method for reliability | |
CN102879730A (en) | Single event upset characteristic testing method for partially triple modular redundancy reinforced SRAM (static random access memory) type FPGA (field programmable gate array) | |
Allen et al. | Single-event upset (SEU) results of embedded error detect and correct enabled block random access memory (block RAM) within the xilinx XQR5VFX130 | |
CN113946932A (en) | Method and device for evaluating reliability of space radiation environment | |
CN104809338A (en) | Satellite in orbit space-environment-influence early warning method based on correlation relationship | |
Sterpone et al. | A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs | |
Andjelkovic et al. | A review of particle detectors for space-borne self-adaptive fault-tolerant systems | |
CN102901924A (en) | Method for testing single event upset characteristics of partial triple modular redundancy static random access memory (SRAM) type field programmable gate arrays (FPGA) | |
JP5373659B2 (en) | Electronics | |
EP3144936B1 (en) | Systems and methods for particle detection and error correction in an integrated circuit | |
Li et al. | Single event upset analysis: On-orbit performance of the alpha magnetic spectrometer digital signal processor memory aboard the international space station | |
US20050137736A1 (en) | Fuzzy reasoning model for semiconductor process fault detection using wafer acceptance test data | |
He et al. | Radiation-Induced Failures for Integrated Circuits in Space and Design Philosophy | |
Zimmerman et al. | Impacts of single event upsets on protective relays | |
Tsiligiannis et al. | Evaluating a radiation monitor for mixed-field environments based on SRAM technology | |
Hu et al. | A Quantitative Method for the Fault Diagnosability of Affine Nonlinear System | |
Catelani et al. | Diagnostic and error correction system for avionics devices in presence of single event upset (SEU) | |
Mutuel | Appreciating the effectiveness of single event effect mitigation techniques | |
Dong et al. | Software Simulation Error Injection in RAM on RISC-V of PolarFire FPGA | |
Dominik | System mitigation techniques for single event effects | |
Salmin et al. | Algorithms of Processing and Analysis of Telemetric Information of Small Satellite of the" AIST" Series for the Purpose of Prompt Detection of Failures of on-Board Equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20210416 |