CN105117576A - Spacecraft system-level single event upset effect analysis method based on fault propagation - Google Patents

Abstract

The present invention provides a spacecraft system-level single event upset effect analysis method based on fault propagation. The method comprises spatial radiation environmental effect estimation, system single event fault propagation modeling and device-level, single-machine-level and system-level oriented single event upset fault rate calculation. The method solves the systematic and quantitative problems of estimating the effect of a single event effect on a sensitive system during existing spacecraft design and can provide a necessary reference for selection of spacecraft components and optimization of an anti-radiation design scheme of a single machine and a system.

Description

Based on the Space Vehicle System level single-particle inversion impact analysis method of fault propagation

Technical field

The present invention relates to spacecraft technology field, particularly, relate to a kind of Space Vehicle System level single-particle inversion impact analysis method.

Background technology

In recent years, along with the development of spationautics and improving constantly of product index, the microelectronic component that volume is little, low in energy consumption, device as ultra-large in FPGA, DSP etc. obtains and applies more and more widely in aerospace engineering.These Primary Components are in space, be subject to from the high energy charged particles effect in galactic comic ray, solar cosmic ray, the radiation belt of the earth, easy generation single particle effect is (as single-particle inversion (SEU), locking single particle (SEL), single event burnout (SEB), single-particle grid puncture (SEGR) etc., wherein general with Single event upset effecf again), cause device temporary disturbance even permanent damage, serious meeting has influence on the reliability service of whole star.

At present, domestic and international researcher has carried out a large amount of ground simulation tests and simulation calculation work for the Single event upset effecf of components and parts, and to space environment distribution and the research of behavioral characteristics, and the understanding of microelectronic component radiation effect further deeply.Meanwhile, select from components and parts in Spacecraft guidance and control process, the many levels such as circuit design, overall design carried out the multiple guard technology research such as hardware, software, fault-tolerant technique, effectively reduce the probability that single-particle inversion fault occurs.But to the impact analysis of single particle effect, particularly the analysis of the quantification of system-oriented level but has no report.Due to the uncertainty of space environment, the upset of the LSI devices such as FPGA is difficult to avoid, even if locally there is SEU to ensure in the radiation tolerance design of satellite, but final system still function is normal, carrying out system-level single-particle inversion impact analysis is basis.

Given this, the present invention is based on Failure Mode Effective Analysis (FMEA) thought, from components and parts to unit, most Zhongdao subsystem, successively constructs fault-traverse technique, and sets forth the computing method of single-particle inversion failure rate.At present, by investigation, not yet find the explanation that same this method is similar or report, meanwhile, also not yet collect similar data both at home and abroad.

Summary of the invention

For defect of the prior art, the object of this invention is to provide a kind of Space Vehicle System level single-particle inversion impact analysis method based on fault propagation.

Technical matters to be solved by this invention is: the impact analysis lacking system level for space product single particle effect, thus cause the problem of system radiation hardening optimal design difficulty, establish Space Vehicle System single-particle inversion fault-traverse technique, and on this basis, consider the single-particle inversion safeguard procedures that system forms and system is taked, give the computing method of single-particle inversion failure rate from device, unit and system level.

According to a kind of Space Vehicle System level single-particle inversion impact analysis method based on fault propagation provided by the invention, comprise the steps:

Step 1: environmentally indicate pattern and screening model, determine the particle source affecting single-particle inversion, i.e. the power spectrum of proton and heavy ion;

Step 2: using responsive to single-particle in Space Vehicle System or that single-particle inversion threshold value is lower components and parts as initial level, successively set up from components and parts to unit, then the fault-traverse technique from unit to system;

Step 3: the σ-LET curve obtaining components and parts, then utilizes nonlinear fitting to obtain turn threshold, saturated upset cross section; The proton obtained in integrating step 1 again and the power spectrum of heavy ion, Computing Meta device single-particle inversion failure rate, wherein, components and parts single-particle inversion failure rate comprises proton single-particle inversion failure rate R _pwith heavy ion single-particle inversion failure rate R _h; Calculate proton single-particle inversion failure rate R _pwith heavy ion single-particle inversion failure rate R _hafter, components and parts single-particle inversion failure rate R equals both sums, and formula is shown below:

R＝R _p+R _H

Step 4: according to the quantity of the single-particle Sensitive Apparatus that unit uses, in conjunction with the single-particle inversion safeguard procedures that unit is taked, obtain unit single-particle inversion failure rate;

Step 5: according to the incidence relation between intrasystem unit composition and unit, computing system single-particle inversion failure rate, computing formula is as follows:

(1) cascade system

Suppose that the failure rate of each unit generation single-particle inversion in n platform unit is respectively R ₁, R ₂..., R _n, then the single-particle inversion failure rate R of this cascade system _sfor:

Wherein, R _irepresent i-th unit;

(2) parallel system

Suppose main part unit of parallel system, backup unit single-particle inversion failure rate be respectively R _main, R _standbyif main part unit is at moment t ₀there occurs single-particle inversion, reload and need time Δ t, as long as backup unit single-particle inversion does not occur in this time period Δ t simultaneously, then whole system can non-stop run; The single-particle inversion failure rate of this parallel system is:

Wherein, N=day/ Δ t, day represents 1 day; [] represents peek value, not containing unit;

(3) combined hybrid system

The combined hybrid system be made up of multiple unit, cascade system or the parallel system of local is decomposed into according to the reliability block diagram of this combined hybrid system, again according to the single-particle inversion failure rate of cascade system, parallel system, calculate the single-particle inversion failure rate of combined hybrid system.

Preferably, components and parts single-particle inversion failure rate, computing formula is as follows:

(1) proton single-particle inversion failure rate:

Wherein, R _pfor proton single-particle inversion failure rate, E ₀for single-particle inversion proton energy threshold value, E _maxfor Spacial Proton ceiling capacity, Φ (E) is proton differential energy spectrum, and σ (E) is Proton Single Event Upset Cross Section, and E is proton energy;

(2) heavy ion single-particle inversion failure rate:

Wherein, R _hfor heavy ion single-particle inversion failure rate; L is heavy ion LET value; φ _e(L) be the equivalent heavy ion Differential Spectrum that is variable with LET value; σ (L) for LET value be the heavy ion upset cross section of L; φ (L) is heavy ion differential energy spectrum; θ is incident angle, θ _cfor critical dip, and θ _c=arcos (L/L _c); L _cfor heavy ion single-particle inversion LET threshold value.

Preferably, for the σ-LET curve that heavy ion accelerator ground experiment produces, be described by Weibull funtcional relationship, namely

Wherein, σ _hi(L) be the heavy ion upset cross section that is variable with LET value, L is heavy ion LET value, L ₀for heavy ion turn threshold, σ ₀for the saturated cross section of device upset, S, W are respectively form factor, the width factor of Weibull function.

Preferably, in step 4, unit single-particle inversion failure rate be following any one or appoint multiple:

Adopt the unit single-particle inversion failure rate R under the single-particle inversion safeguard procedures of resource derate η _deratefor: R _derate=R × η;

The refresh interval time is adopted to be T _refreshperiodic refreshing single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _refreshfor: R _refresh=R × T _refresh;

Start T.T. is adopted to be T _ocseparated shutdown single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{switching on and shutting down}for: R _{switching on and shutting down}=R × T _oc;

Unit duty cycle is adopted to be T _device, the satellite general assignment cycle is T _totalreduction task time single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{reduce task time}for: R _{reduce task time}=R × T _device/ T _total;

The upset rate of employing equipment part part is R _backupchip or unit inside backup single-particle inversion safeguard procedures under Hot Spare, cold standby unit single-particle inversion failure rate R _{hot Spare}, R _{cold standby}be respectively: R _{hot Spare}=R+R _backup, R _{cold standby}=R;

It is T that interval time is read back check in employing _{retaking of a year or grade}the single-particle inversion safeguard procedures read back check under unit single-particle inversion failure rate R _{retaking of a year or grade}for: R _{retaking of a year or grade}=R × T _{retaking of a year or grade};

Adopt that the program code of influential system function accounts for the η of total code, the time interval of function self-inspection is T _{self-inspection}function self-inspection single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{self-inspection}for: R _{self-inspection}=R ÷ η × T _{self-inspection};

Employing total volume is M _total, TMR overlay area M _tMRtriplication redundancy TMR single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{three moulds}for: R _{three moulds}=R × (1-M _tMR/ M _total);

Employing total volume is M _total, three get two overlay area M _{three get two}three get unit single-particle inversion failure rate R under the single-particle inversion safeguard procedures of two votings _{three get two}for: R _{three get two}=R × (1-M _{three get two}/ M _total);

Employing total volume is M _total, EDAC overlay area M _eDACeDAC single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _eDACfor: R _eDAC=R × (1-M _eDAC/ M _total);

Adopt that the program code of impact accounts for the η of total code, timer is accumulated as T _regularlyhouse dog single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _regularlyfor: R _regularly=R ÷ η × T _regularly.

Preferably, the unit single-particle inversion failure rate under the single-particle inversion safeguard procedures adopting code error detecting or jump instruction is ignored.

Compared with prior art, the present invention has following beneficial effect:

1, the present invention can evaluate the impact of single particle effect on spacecraft from system perspective, more meets the design requirement that current space product pursues system optimization;

2, the invention provides the computing formula of spacecraft device level, unit level and system-level single-particle inversion failure rate, can be spacecraft radiation tolerance design and in-orbit reliability index demonstration the design considerations of quantification is provided, there is significant realistic meaning and construction value.

Accompanying drawing explanation

By reading the detailed description done non-limiting example with reference to the following drawings, other features, objects and advantages of the present invention will become more obvious:

Fig. 1 is spacecraft space radiation environment analysis process figure in-orbit in the present invention;

Fig. 2 is Space Vehicle System single-particle inversion fault propagation modeling procedure figure in the present invention;

Fig. 3 is components and parts single-particle inversion failure rate calculation flow chart in the present invention;

Fig. 4 is certain satellite analysis result of galactic comic ray heavy ion Flux Spectrum in space radiation environment in-orbit in the present invention;

Fig. 5 is certain satellite analysis result of solar proton Flux Spectrum in space radiation environment in-orbit in the present invention;

Fig. 6 is the VirtexII Series FPGA single-particle σ-LET trial curve that in the present invention, embodiment uses;

Fig. 7 is method flow schematic diagram of the present invention.

Embodiment

Below in conjunction with specific embodiment, the present invention is described in detail.Following examples will contribute to those skilled in the art and understand the present invention further, but not limit the present invention in any form.It should be pointed out that to those skilled in the art, without departing from the inventive concept of the premise, some changes and improvements can also be made.These all belong to protection scope of the present invention.

The invention provides a kind of Space Vehicle System level single-particle inversion impact analysis method based on fault propagation, comprise: space radiation environment effective matrix, the modeling of system single-particle fault propagation, calculates towards device level, unit level and system-level single-particle inversion failure rate.Systematization affect sensory system at assessment single particle effect when the invention solves existing Spacecraft guidance and control and quantification problem, can be spacecraft components selection, the radiation proof design proposal optimization of unit, system provides the reference of necessity.

The present embodiment to as if certain satellite TT&C system.It is 610km that this satellite is positioned at orbit altitude, and the low sun synchronous orbit at 75 °, inclination angle, is not less than 4 years designed life.TT&C system on star employs the telemetry and telecommand of 2 integrated spread spectrum answering machines realizations to satellite, wherein integrated spread spectrum answering machine A uses a slice Xilinx company 3,000,000 SRAM type FPGA (XQR2V3000), and integrated spread spectrum answering machine B uses a slice Xilinx company 6,000,000 SRAM type FPGA (XQR2V6000) and a slice Actel company 3.2 ten thousand anti-fuse FPGA (A54SX32).Satellite in orbit time, integrated spread spectrum answering machine A is main part, and integrated spread spectrum answering machine B works as its Hot Spare.

Step 1: according to spacecraft orbit parameter, designed life, utilize space radiation environment specialty indication software (as: SpaceRadiation, SPENVIS or domestic independent development ForeCast etc.), (the general radiation belt of the earth selects AP-8 protonic mode and AE-8 electronic pattern to select appropriate environment indication pattern, solar cosmic ray selects JPL-91 pattern, galactic cosmic line options CREME pattern) and screening model (as: SHIELDOSE model), analysis provides affects the topmost particle source of single-particle inversion, i.e. energy-the Flux Spectrum of proton and heavy ion.Analysis process is shown in shown in accompanying drawing 1.

Step 2: using responsive to single-particle in Space Vehicle System or that single-particle inversion threshold value is lower device as initial level, incidence relation in coupling system composition and system between each element, successively set up from device to unit by FMEA, fault-traverse technique again from unit to system, is shown in shown in accompanying drawing 2.

Step 3: according to literature survey or ground experiment, obtains the σ-LET curve of components and parts, then utilizes nonlinear fitting to obtain the parameter such as turn threshold, saturated upset cross section.The Space Particle power spectrum obtained in integrating step 1 again, Computing Meta device single-particle inversion failure rate, computing formula is as follows.Analysis process is shown in shown in accompanying drawing 3.

1. proton single-particle inversion failure rate:

In above formula, R _pfor proton single-particle inversion failure rate (d ^-1bit ^-1), Φ (E) is proton differential energy spectrum (cm ^-2d ^-1meV ^-1), σ (E) is Proton Single Event Upset Cross Section (cm ²/ bit), E is proton energy (MeV), E ₀for single-particle inversion proton energy threshold value (MeV), E _maxfor Spacial Proton ceiling capacity (MeV).If known Spacial Proton power spectrum take proton energy as the integral energy spectrum of parameter, then need to convert Proton integration power spectrum to differential energy spectrum, and obtain the SEU cross section of different-energy proton.

2. heavy ion single-particle inversion failure rate:

In above formula, R _hfor heavy ion single-particle inversion failure rate; L is heavy ion LET value; L _cfor heavy ion single-particle inversion LET threshold value; The equivalent heavy ion Differential Spectrum that Φ e (L) is is variable with LET value; Φ (L) is heavy ion differential energy spectrum; σ (L) for LET value be the heavy ion upset cross section of L; θ _cfor critical dip, and θ _c=arcos (L/L _c).

σ-LET the curve that heavy ion accelerator ground experiment produces, also can be described by Weibull funtcional relationship, namely sometimes

In above formula, σ ₀for the saturated cross section of device upset, S, W are respectively shape and the width factor of Weibull function.

Calculate proton single-particle inversion failure rate R _pwith heavy ion single-particle inversion failure rate R _hafter, the single-particle inversion failure rate R of components and parts equals both sums, and formula is as shown in (1-4).

R＝R _p+R _H(1-4)

Step 4: according to the quantity of the single-particle Sensitive Apparatus that unit uses, (active method mainly comprises resource derate, TMR, periodic refreshing etc. to the active/passive single-particle inversion safeguard procedures taked in conjunction with unit, effectively can reduce single event upset rate; Passive method comprise read back check, the method such as function check, the method effectively can not reduce single event upset rate, but effectively can monitor single-particle inversion, and by related measures such as heavy duties, in-orbit switching on and shutting down, avoid or reduce the harm because single-particle inversion causes), calculate unit single-particle inversion failure rate, computing formula is as shown in table 1.

Table 1 single-particle inversion safeguard procedures are on the impact (unit is: Upsets/deviceday) of failure rate

Step 5: according to the incidence relation (as: series, parallel, series-parallel connection etc.) between intrasystem unit composition and unit, computing system single-particle inversion failure rate, computing formula is as follows.

1. cascade system

The cascade system be made up of multiple unit, the arbitrary link in system breaks down and systemic-function all can be caused abnormal.The failure rate supposing every platform unit generation single-particle inversion is R ₁, R ₂..., R _n, then the single-particle inversion failure rate of this cascade system is:

2. parallel system

The parallel system be made up of multiple unit, although parallel way can increase the probability of happening of single-particle inversion, reduces the impact of single event on whole system.Suppose that main part of parallel system and the single-particle inversion failure rate of backup unit are respectively R _mainand R _standbyif main part is at t ₀moment there occurs single-particle inversion, reloads and needs the Δ t time, as long as backup single-particle inversion does not occur within this time period simultaneously, then whole system can non-stop run.The single-particle inversion failure rate of this parallel system is:

In above formula, N=day/ Δ t, [R _main] represent peek value, not containing unit.

3. combined hybrid system

The combined hybrid system be made up of multiple unit, can be decomposed into the serial or parallel connection system of local, then according to the computing formula of above-mentioned Series-parallel Systems, calculate the single-particle inversion failure rate of combined hybrid system according to its reliability block diagram.

In preferably implementing at one, the step that the present invention includes is as follows:

Step 1: space radiation environment analysis.European Space Agency SPENVIS space environment is utilized to indicate software, input satellite orbit parameter and in-orbit life-span, select radiation belt of the earth proton AP8 and electronics AE8 model respectively again, solar proton JPL-91 model, and galactic comic ray CREME model, analyze the proton and heavy ion energy spectrogram that obtain in space environment, shown in accompanying drawing 4.

Step 2: TT&C system single-particle inversion fault propagation modeling.Because the turn threshold of anti-fuse FPGA is higher, and low based on the turn threshold of the FPGA of SRAM type, comparatively responsive to single particle effect, therefore when analysis list particle effect is on the affecting of whole system, only consider SRAM type FPGA.According to accompanying drawing 2 method establishment system single-particle inversion fault-traverse technique, and the single-particle inversion safeguard procedures that statistical integration spread spectrum answering machine A/B uses, as shown in table 2.

The anti-single particle overturn safeguard procedures that the integrated spread spectrum answering machine A/B of table 2 uses

Step 3:FPGA device single-particle inversion failure rate calculates.Single-particle σ-LET the trial curve of the VirtexII Series FPGA that the FPGA manufacturer Xilinx company with reference to the accompanying drawings shown in 5 provides, utilizes formula (1-3) to carry out curve fitting, obtains correlation parameter as shown in table 3.Then integrating step 1 obtain proton and heavy ion omnidirectional differential energy spectrum, formula (1-1) is utilized to calculate proton single-particle inversion failure rate respectively, utilize formula (1-2) to calculate heavy ion single-particle inversion failure rate, result of calculation is as shown in table 4.

Table 3VirtexII Series FPGA single-particle σ-LET trial curve fitting parameter

Table 4VirtexII Series FPGA single-particle inversion failure rate

Step 4: integrated spread spectrum answering machine A/B single-particle inversion failure rate calculates.

For the single-particle inversion failure rate R of integrated spread spectrum answering machine A, 3,000,000 FPGA ₀for 1.07Upsets/deviceday.According to the formula in table 1, after the active defense measures such as resource derate, periodic refreshing, the single-particle inversion failure rate of integrated spread spectrum answering machine A is reduced to:

R _{active defense A}=R ₀× η _derate× T _refresh/ day=0.68Upsets/deviceday

Again after the passive protection measures such as function self-inspection, triplication redundancy, the single-particle inversion failure rate of integrated spread spectrum answering machine A is reduced to:

R _{answering machine A}=R _{active defense A}× (1-M _tMR/ M _total) × T _{self-inspection}/ day=1.18 × 10 ^-2upsets/deviceday

For the single-particle inversion failure rate R of integrated spread spectrum answering machine B, 6,000,000 FPGA ₀for 1.97Upsets/deviceday.According to the formula in table 1, after the active defense measures such as resource derate, the single-particle inversion failure rate of integrated spread spectrum answering machine B is reduced to:

R _{active defense B}=R ₀× η _derate=1.48Upsets/deviceday

Again through reading back check, after the passive protection measure such as triplication redundancy, the single-particle inversion failure rate of integrated spread spectrum answering machine B is reduced to:

R _{answering machine B}=R _{active defense B}× (1-M _tMR/ M _total) × T _{retaking of a year or grade}/ day=0.03Upsets/deviceday

Step 5: TT&C system single-particle inversion failure rate calculates.Because two spread spectrum answering machines are Hot Spare, and after unit generation single-particle mistake the time of reloading be no more than 5s.If namely two units all single event upset occur at synchronization key position, then think thrashing.Can be calculated according to formula (1-6), the single-particle inversion failure rate of TT&C system is:

R _{observing and controlling}=R _{answering machine A}× R _{answering machine B}× 5s/day=2.05 × 10 ^-8upsets/systemday

In sum, period causes TT&C system the probability of continuous working to be 2.05 × 10 because of single-particle inversion to this satellite in-orbit ^-8upsets/systemday, follow-uply can carry out radiation hardening optimal design according to this analysis result further.

Above specific embodiments of the invention are described.It is to be appreciated that the present invention is not limited to above-mentioned particular implementation, those skilled in the art can make a variety of changes within the scope of the claims or revise, and this does not affect flesh and blood of the present invention.

Claims (5)

1., based on a Space Vehicle System level single-particle inversion impact analysis method for fault propagation, it is characterized in that, comprise the steps:

Step 1: environmentally indicate pattern and screening model, determine the particle source affecting single-particle inversion, i.e. the power spectrum of proton and heavy ion;

Step 2: using responsive to single-particle in Space Vehicle System or that single-particle inversion threshold value is lower components and parts as initial level, successively set up from components and parts to unit, then the fault-traverse technique from unit to system;

Step 3: the σ-LET curve obtaining components and parts, then utilizes nonlinear fitting to obtain turn threshold, saturated upset cross section; The proton obtained in integrating step 1 again and the power spectrum of heavy ion, Computing Meta device single-particle inversion failure rate, wherein, components and parts single-particle inversion failure rate comprises proton single-particle inversion failure rate R _pwith heavy ion single-particle inversion failure rate R _h; Calculate proton single-particle inversion failure rate R _pwith heavy ion single-particle inversion failure rate R _hafter, components and parts single-particle inversion failure rate R equals both sums, and formula is shown below:

R＝R _p+R _H

Step 4: according to the quantity of the single-particle Sensitive Apparatus that unit uses, in conjunction with the single-particle inversion safeguard procedures that unit is taked, obtain unit single-particle inversion failure rate;

Step 5: according to the incidence relation between intrasystem unit composition and unit, computing system single-particle inversion failure rate, computing formula is as follows:

(1) cascade system

Suppose that the failure rate of each unit generation single-particle inversion in n platform unit is respectively R ₁, R ₂..., R _n, then the single-particle inversion failure rate R of this cascade system _sfor:

$R_S=\underset{i=1}{\overset{n}{\Σ}}{R}_i$

Wherein, R _irepresent the single-particle inversion failure rate of i-th unit;

(2) parallel system

Suppose main part unit of parallel system, backup unit single-particle inversion failure rate be respectively R _main, R _standbyif main part unit is at moment t ₀there occurs single-particle inversion, reload and need time Δ t, as long as backup unit single-particle inversion does not occur in this time period Δ t simultaneously, then whole system can non-stop run; The single-particle inversion failure rate of this parallel system is:

Wherein, N=day/ Δ t, day represents 1 day; [] represents peek value, not containing unit;

(3) combined hybrid system

The combined hybrid system be made up of multiple unit, cascade system or the parallel system of local is decomposed into according to the reliability block diagram of this combined hybrid system, again according to the single-particle inversion failure rate of cascade system, parallel system, calculate the single-particle inversion failure rate of combined hybrid system.

2. the Space Vehicle System level single-particle inversion impact analysis method based on fault propagation according to claim 1, it is characterized in that, components and parts single-particle inversion failure rate, computing formula is as follows:

(1) proton single-particle inversion failure rate:

$R_p=\underset{E_0}{\overset{E_{\max }}{\∫}}\mathrm{\φ}\left(E\right)\mathrm{\σ}\left(E\right)dE$

Wherein, R _pfor proton single-particle inversion failure rate, E ₀for single-particle inversion proton energy threshold value, E _maxfor Spacial Proton ceiling capacity, Φ (E) is proton differential energy spectrum, and σ (E) is Proton Single Event Upset Cross Section, and E is proton energy;

(2) heavy ion single-particle inversion failure rate:

$R_H=\underset{0}{\overset{\mathrm{\∞}}{\∫}}{\mathrm{\φ}}_e\left(L\right)\mathrm{\σ}\left(L\right)dL$

${\mathrm{\φ}}_e\left(L\right)=\frac{\mathrm{\φ}\left(L\right)}{2\mathrm{\π}}{\∫}_{{\mathrm{\θ}}_c}^{\mathrm{\π}/2}cos\mathrm{\θ}d\mathrm{\θ}=\frac{\mathrm{\φ}\left(L\right)}{2}{\cos }^2{\mathrm{\θ}}_c$

Wherein, R _hfor heavy ion single-particle inversion failure rate; L is heavy ion LET value; φ _e(L) be the equivalent heavy ion Differential Spectrum that is variable with LET value; σ (L) for LET value be the heavy ion upset cross section of L; φ (L) is heavy ion differential energy spectrum; θ is incident angle, θ _cfor critical dip, and θ _c=arcos (L/L _c); L _cfor heavy ion single-particle inversion LET threshold value.

3. the Space Vehicle System level single-particle inversion impact analysis method based on fault propagation according to claim 1, is characterized in that, for the σ-LET curve that heavy ion accelerator ground experiment produces, is described, namely by Weibull funtcional relationship

${\mathrm{\&sigma;}}_{hi}\left(L\right)=\left\{\begin{array}{cc}{\mathrm{\&sigma;}}_0\{1-\exp \&lsqb;-{\left(\frac{L-L_0}{W}\right)}^S\&rsqb;\},& L\&GreaterEqual;L_0\\ 0,& L<L_0\end{array}\right.---(1-3)$

Wherein, σ _hi(L) be the heavy ion upset cross section that is variable with LET value, L is heavy ion LET value, L ₀for heavy ion turn threshold, σ ₀for the saturated cross section of device upset, S, W are respectively form factor, the width factor of Weibull function.

4. the Space Vehicle System level single-particle inversion impact analysis method based on fault propagation according to claim 1, is characterized in that, in step 4, unit single-particle inversion failure rate be following any one or appoint multiple:

Adopt the unit single-particle inversion failure rate R under the single-particle inversion safeguard procedures of resource derate η _deratefor: R _derate=R × η;

The refresh interval time is adopted to be T _refreshperiodic refreshing single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _refreshfor: R _refresh=R × T _refresh;

Start T.T. is adopted to be T _ocseparated shutdown single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{switching on and shutting down}for: R _{switching on and shutting down}=R × T _oc;

Unit duty cycle is adopted to be T _device, the satellite general assignment cycle is T _totalreduction task time single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{reduce task time}for: R _{reduce task time}=R × T _device/ T _total;

The upset rate of employing equipment part part is R _backupchip or unit inside backup single-particle inversion safeguard procedures under Hot Spare, cold standby unit single-particle inversion failure rate R _{hot Spare}, R _{cold standby}be respectively: R _{hot Spare}=R+R _backup, R _{cold standby}=R;

It is T that interval time is read back check in employing _{retaking of a year or grade}the single-particle inversion safeguard procedures read back check under unit single-particle inversion failure rate R _{retaking of a year or grade}for: R _{retaking of a year or grade}=R × T _{retaking of a year or grade};

Adopt that the program code of influential system function accounts for the η of total code, the time interval of function self-inspection is T _{self-inspection}function self-inspection single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{self-inspection}for: R _{self-inspection}=R ÷ η × T _{self-inspection};

Employing total volume is M _total, TMR overlay area M _tMRtriplication redundancy TMR single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _{three moulds}for: R _{three moulds}=R × (1-M _tMR/ M _total);

Employing total volume is M _total, three get two overlay area M _{three get two}three get unit single-particle inversion failure rate R under the single-particle inversion safeguard procedures of two votings _{three get two}for: R _{three get two}=R × (1-M _{three get two}/ M _total);

Employing total volume is M _total, EDAC overlay area M _eDACeDAC single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _eDACfor: R _eDAC=R × (1-M _eDAC/ M _total);

Adopt that the program code of impact accounts for the η of total code, timer is accumulated as T _regularlyhouse dog single-particle inversion safeguard procedures under unit single-particle inversion failure rate R _regularlyfor: R _regularly=R ÷ η × T _regularly.

5. the Space Vehicle System level single-particle inversion impact analysis method based on fault propagation according to claim 1, is characterized in that, ignores the unit single-particle inversion failure rate under the single-particle inversion safeguard procedures adopting code error detecting or jump instruction.